{"id":"https://openalex.org/W3104210366","doi":"https://doi.org/10.1016/j.tsf.2020.138424","title":"Formation and stability of W coating on a flexible polyimide substrate","display_name":"Formation and stability of W coating on a flexible polyimide substrate","publication_year":2020,"publication_date":"2020-11-09","ids":{"openalex":"https://openalex.org/W3104210366","doi":"https://doi.org/10.1016/j.tsf.2020.138424","mag":"3104210366"},"language":"en","primary_location":{"id":"doi:10.1016/j.tsf.2020.138424","doi":"https://doi.org/10.1016/j.tsf.2020.138424","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.tsf.2020.138424","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040064153","display_name":"Sergey Viktorovich Zaitsev","orcid":"https://orcid.org/0000-0003-0122-1908","observed_orcids":["https://orcid.org/0000-0003-0122-1908"]},"institutions":[{"id":"https://openalex.org/I2803070147","display_name":"Belgorod State Technological University","ror":"https://ror.org/02v40vz65","country_code":"RU","type":"education","lineage":["https://openalex.org/I2803070147"]}],"countries":["RU"],"is_corresponding":true,"raw_author_name":"S.V. Zaitsev","raw_affiliation_strings":["Belgorod State Technological University named after V.G. Shoukhov, Belgorod, 308012, Kostyukov str., 46 Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Belgorod State Technological University named after V.G. Shoukhov, Belgorod, 308012, Kostyukov str., 46 Russia","institution_ids":["https://openalex.org/I2803070147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040355238","display_name":"Natalia Igorevna Cherkashina","orcid":"https://orcid.org/0000-0003-0161-3266","observed_orcids":["https://orcid.org/0000-0003-0161-3266"]},"institutions":[{"id":"https://openalex.org/I2803070147","display_name":"Belgorod State Technological University","ror":"https://ror.org/02v40vz65","country_code":"RU","type":"education","lineage":["https://openalex.org/I2803070147"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"N.I. Cherkashina","raw_affiliation_strings":["Belgorod State Technological University named after V.G. Shoukhov, Belgorod, 308012, Kostyukov str., 46 Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Belgorod State Technological University named after V.G. Shoukhov, Belgorod, 308012, Kostyukov str., 46 Russia","institution_ids":["https://openalex.org/I2803070147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070778023","display_name":"\u0412. \u0418. \u041f\u0430\u0432\u043b\u0435\u043d\u043a\u043e","orcid":"https://orcid.org/0000-0002-3464-1880","observed_orcids":["https://orcid.org/0000-0002-3464-1880"]},"institutions":[{"id":"https://openalex.org/I2803070147","display_name":"Belgorod State Technological University","ror":"https://ror.org/02v40vz65","country_code":"RU","type":"education","lineage":["https://openalex.org/I2803070147"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"V.I. Pavlenko","raw_affiliation_strings":["Belgorod State Technological University named after V.G. Shoukhov, Belgorod, 308012, Kostyukov str., 46 Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Belgorod State Technological University named after V.G. Shoukhov, Belgorod, 308012, Kostyukov str., 46 Russia","institution_ids":["https://openalex.org/I2803070147"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027776779","display_name":"\u0414. \u0421. \u041f\u0440\u043e\u0445\u043e\u0440\u0435\u043d\u043a\u043e\u0432","orcid":"https://orcid.org/0000-0002-6455-8172","observed_orcids":["https://orcid.org/0000-0002-6455-8172"]},"institutions":[{"id":"https://openalex.org/I2803070147","display_name":"Belgorod State Technological University","ror":"https://ror.org/02v40vz65","country_code":"RU","type":"education","lineage":["https://openalex.org/I2803070147"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"D.S. Prochorenkov","raw_affiliation_strings":["Belgorod State Technological University named after V.G. Shoukhov, Belgorod, 308012, Kostyukov str., 46 Russia"],"raw_orcid":"https://orcid.org/0000-0002-6455-8172","affiliations":[{"raw_affiliation_string":"Belgorod State Technological University named after V.G. Shoukhov, Belgorod, 308012, Kostyukov str., 46 Russia","institution_ids":["https://openalex.org/I2803070147"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5040064153"],"corresponding_institution_ids":["https://openalex.org/I2803070147"],"apc_list":{"value":2900,"currency":"USD","value_usd":2900},"apc_paid":null,"fwci":0.944,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.65364644,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":96},"biblio":{"volume":"715","issue":null,"first_page":"138424","last_page":"138424"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.8187999725341797,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.8187999725341797,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11200","display_name":"Electrodeposition and Electroless Coatings","score":0.03739999979734421,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.03180000185966492,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tungsten-coatings","display_name":"tungsten coatings","score":0.8629999756813049},{"id":"https://openalex.org/keywords/flexible-polyimide-substrate","display_name":"flexible polyimide substrate","score":0.9850000143051147},{"id":"https://openalex.org/keywords/cryogenic-treatment","display_name":"cryogenic treatment","score":0.9959999918937683},{"id":"https://openalex.org/keywords/dual-magnetron-sputtering","display_name":"dual magnetron sputtering","score":0.8870000243186951},{"id":"https://openalex.org/keywords/deposition-power","display_name":"deposition power","score":0.7319999933242798},{"id":"https://openalex.org/keywords/110-texture","display_name":"(110) texture","score":0.8600000143051147},{"id":"https://openalex.org/keywords/columnar-microstructure","display_name":"columnar microstructure","score":0.9100000262260437},{"id":"https://openalex.org/keywords/electrical-resistivity","display_name":"electrical resistivity","score":0.8360000252723694},{"id":"https://openalex.org/keywords/coating-adhesion","display_name":"coating adhesion","score":0.9440000057220459},{"id":"https://openalex.org/keywords/coating-stability","display_name":"coating stability","score":0.4269999861717224}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8366403579711914},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.7708615064620972},{"id":"https://openalex.org/C2780965675","wikidata":"https://www.wikidata.org/wiki/Q145958","display_name":"Polyimide","level":3,"score":0.7599072456359863},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.7557841539382935},{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.6930640935897827},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.6387081146240234},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.614130973815918},{"id":"https://openalex.org/C61427134","wikidata":"https://www.wikidata.org/wiki/Q847609","display_name":"Sputter deposition","level":4,"score":0.4914592504501343},{"id":"https://openalex.org/C192191005","wikidata":"https://www.wikidata.org/wiki/Q466491","display_name":"Grain size","level":2,"score":0.43658357858657837},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.36469006538391113},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.2839853763580322},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.19005930423736572},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.15684542059898376},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.tsf.2020.138424","doi":"https://doi.org/10.1016/j.tsf.2020.138424","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.tsf.2020.138424","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320324099","display_name":"Russian Science Foundation","ror":"https://ror.org/03y2gwe85"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1970327753","https://openalex.org/W1975812769","https://openalex.org/W1981467456","https://openalex.org/W1987003353","https://openalex.org/W1992367394","https://openalex.org/W1994070158","https://openalex.org/W2004052854","https://openalex.org/W2008985734","https://openalex.org/W2019267373","https://openalex.org/W2030815043","https://openalex.org/W2046529700","https://openalex.org/W2068185060","https://openalex.org/W2074022173","https://openalex.org/W2076287213","https://openalex.org/W2141584823","https://openalex.org/W2160059552","https://openalex.org/W2161665136","https://openalex.org/W2276566611","https://openalex.org/W2297874245","https://openalex.org/W2311595584","https://openalex.org/W2461646590","https://openalex.org/W2480471473","https://openalex.org/W2532382897","https://openalex.org/W2887970407","https://openalex.org/W2891406048","https://openalex.org/W2892197233","https://openalex.org/W2895818386","https://openalex.org/W2911673254","https://openalex.org/W2915146071","https://openalex.org/W2940986896","https://openalex.org/W2941279614","https://openalex.org/W2977806735","https://openalex.org/W2981555552","https://openalex.org/W2985702275","https://openalex.org/W2990517793","https://openalex.org/W4246782771"],"related_works":["https://openalex.org/W1968526952","https://openalex.org/W2981555552","https://openalex.org/W2386760371","https://openalex.org/W2515082196","https://openalex.org/W1965504720","https://openalex.org/W1972555768","https://openalex.org/W2036830065","https://openalex.org/W4254391739","https://openalex.org/W1997343971","https://openalex.org/W2118970190"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2020-11-23T00:00:00"}