{"id":"https://openalex.org/W3093661028","doi":"https://doi.org/10.1088/1361-6668/abdba6","title":"Enhancing the performance of superconducting nanowire-based detectors with high-filling factor by using variable thickness","display_name":"Enhancing the performance of superconducting nanowire-based detectors with high-filling factor by using variable thickness","publication_year":2021,"publication_date":"2021-01-14","ids":{"openalex":"https://openalex.org/W3093661028","doi":"https://doi.org/10.1088/1361-6668/abdba6","mag":"3093661028"},"language":"en","primary_location":{"id":"doi:10.1088/1361-6668/abdba6","doi":"https://doi.org/10.1088/1361-6668/abdba6","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1361-6668/abdba6","pdf_url":null,"source":{"id":"https://openalex.org/S93909106","display_name":"Superconductor Science and Technology","issn_l":"0953-2048","issn":["0953-2048","1361-6668"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Superconductor Science and Technology","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["arxiv","crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2010.11938","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066589214","display_name":"Reza Baghdadi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Reza Baghdadi","raw_affiliation_strings":["Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075706432","display_name":"Ekkehart Schmidt","orcid":"https://orcid.org/0000-0002-7594-5637","observed_orcids":["https://orcid.org/0000-0002-7594-5637"]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]},{"id":"https://openalex.org/I122411786","display_name":"California Institute of Technology","ror":"https://ror.org/05dxps055","country_code":"US","type":"education","lineage":["https://openalex.org/I122411786"]},{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["DE","US"],"is_corresponding":false,"raw_author_name":"Ekkehart Schmidt","raw_affiliation_strings":["Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, United States of America"],"raw_orcid":"https://orcid.org/0000-0002-7594-5637","affiliations":[{"raw_affiliation_string":"Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, United States of America","institution_ids":["https://openalex.org/I122411786","https://openalex.org/I1334627681"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045029387","display_name":"Saman Jahani","orcid":"https://orcid.org/0000-0003-4831-2276","observed_orcids":["https://orcid.org/0000-0003-4831-2276"]},"institutions":[{"id":"https://openalex.org/I122411786","display_name":"California Institute of Technology","ror":"https://ror.org/05dxps055","country_code":"US","type":"education","lineage":["https://openalex.org/I122411786"]},{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saman Jahani","raw_affiliation_strings":["Birck Nanotechnology Center and Purdue Quantum Center, Purdue University, West Lafayette, IN, United States of America","Department of Electrical Engineering, California Institute of Technology, Pasadena, CA, United States of America"],"raw_orcid":"https://orcid.org/0000-0003-4831-2276","affiliations":[{"raw_affiliation_string":"Birck Nanotechnology Center and Purdue Quantum Center, Purdue University, West Lafayette, IN, United States of America","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Department of Electrical Engineering, California Institute of Technology, Pasadena, CA, United States of America","institution_ids":["https://openalex.org/I122411786"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065202953","display_name":"Ilya Charaev","orcid":"https://orcid.org/0000-0002-4036-0778","observed_orcids":["https://orcid.org/0000-0002-4036-0778"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ilya Charaev","raw_affiliation_strings":["Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America"],"raw_orcid":"https://orcid.org/0000-0002-4036-0778","affiliations":[{"raw_affiliation_string":"Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Michael G W M\u00fcller","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael G W M\u00fcller","raw_affiliation_strings":["Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058328394","display_name":"Marco Colangelo","orcid":"https://orcid.org/0000-0001-7611-0351","observed_orcids":["https://orcid.org/0000-0001-7611-0351"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Marco Colangelo","raw_affiliation_strings":["Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America"],"raw_orcid":"https://orcid.org/0000-0001-7611-0351","affiliations":[{"raw_affiliation_string":"Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052966323","display_name":"Di Zhu","orcid":"https://orcid.org/0000-0003-0210-1860","observed_orcids":["https://orcid.org/0000-0003-0210-1860"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Di Zhu","raw_affiliation_strings":["Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Konstantin Ilin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Konstantin Ilin","raw_affiliation_strings":["Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Alexej D Semenov","orcid":"https://orcid.org/0000-0001-7047-7355","observed_orcids":["https://orcid.org/0000-0001-7047-7355"]},"institutions":[{"id":"https://openalex.org/I2898391981","display_name":"Deutsches Zentrum f\u00fcr Luft- und Raumfahrt e. V. (DLR)","ror":"https://ror.org/04bwf3e34","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I2898391981"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alexej D Semenov","raw_affiliation_strings":["Institute of Optical Sensor Systems, German Aerospace Center, Berlin, Germany"],"raw_orcid":"https://orcid.org/0000-0001-7047-7355","affiliations":[{"raw_affiliation_string":"Institute of Optical Sensor Systems, German Aerospace Center, Berlin, Germany","institution_ids":["https://openalex.org/I2898391981"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Zubin Jacob","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zubin Jacob","raw_affiliation_strings":["Birck Nanotechnology Center and Purdue Quantum Center, Purdue University, West Lafayette, IN, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Birck Nanotechnology Center and Purdue Quantum Center, Purdue University, West Lafayette, IN, United States of America","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Michael Siegel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Siegel","raw_affiliation_strings":["Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001962263","display_name":"Karl K. Berggren","orcid":"https://orcid.org/0000-0001-7453-9031","observed_orcids":["https://orcid.org/0000-0001-7453-9031","https://orcid.org/0000-0001-7937-4387"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Karl K Berggren","raw_affiliation_strings":["Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America"],"raw_orcid":"https://orcid.org/0000-0001-7453-9031","affiliations":[{"raw_affiliation_string":"Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, United States of America","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5001962263"],"corresponding_institution_ids":["https://openalex.org/I63966007"],"apc_list":{"value":2850,"currency":"USD","value_usd":2850},"apc_paid":null,"fwci":1.175,"has_fulltext":true,"cited_by_count":22,"citation_normalized_percentile":{"value":0.75375902,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":"34","issue":"3","first_page":"035010","last_page":"035010"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.0017999999690800905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10020","display_name":"Quantum Information and Cryptography","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/superconducting-nanowire-single-photon-detectors","display_name":"superconducting nanowire single-photon detectors","score":0.9449999928474426},{"id":"https://openalex.org/keywords/current-crowding","display_name":"current crowding","score":0.9269999861717224},{"id":"https://openalex.org/keywords/filling-factor","display_name":"filling factor","score":0.8240000009536743},{"id":"https://openalex.org/keywords/critical-current-suppression","display_name":"critical current suppression","score":0.968999981880188},{"id":"https://openalex.org/keywords/detection-efficiency","display_name":"detection efficiency","score":0.9660000205039978},{"id":"https://openalex.org/keywords/dark-count-rate","display_name":"dark count rate","score":0.9589999914169312}],"concepts":[{"id":"https://openalex.org/C115900370","wikidata":"https://www.wikidata.org/wiki/Q5195096","display_name":"Current crowding","level":3,"score":0.7552000284194946},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.7494999766349792},{"id":"https://openalex.org/C74214498","wikidata":"https://www.wikidata.org/wiki/Q631739","display_name":"Nanowire","level":2,"score":0.7425000071525574},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7240999937057495},{"id":"https://openalex.org/C2987373456","wikidata":"https://www.wikidata.org/wiki/Q5186713","display_name":"Critical current","level":3,"score":0.6542999744415283},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5583999752998352},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5303000211715698},{"id":"https://openalex.org/C182365436","wikidata":"https://www.wikidata.org/wiki/Q50701","display_name":"Variable (mathematics)","level":2,"score":0.5020999908447266},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.4934000074863434},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.4675000011920929},{"id":"https://openalex.org/C207740977","wikidata":"https://www.wikidata.org/wiki/Q234072","display_name":"Current density","level":2,"score":0.45739999413490295},{"id":"https://openalex.org/C82558694","wikidata":"https://www.wikidata.org/wiki/Q1545619","display_name":"Aspect ratio (aeronautics)","level":2,"score":0.41659998893737793},{"id":"https://openalex.org/C9508911","wikidata":"https://www.wikidata.org/wiki/Q5448831","display_name":"Filling factor","level":2,"score":0.35339999198913574},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3488999903202057},{"id":"https://openalex.org/C83928957","wikidata":"https://www.wikidata.org/wiki/Q5186780","display_name":"Critical variable","level":3,"score":0.3156000077724457},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.29760000109672546},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.2563000023365021}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1088/1361-6668/abdba6","doi":"https://doi.org/10.1088/1361-6668/abdba6","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1361-6668/abdba6","pdf_url":null,"source":{"id":"https://openalex.org/S93909106","display_name":"Superconductor Science and Technology","issn_l":"0953-2048","issn":["0953-2048","1361-6668"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Superconductor Science and Technology","raw_type":"journal-article"},{"id":"pmh:oai:arXiv.org:2010.11938","doi":null,"is_oa":true,"landing_page_url":"http://arxiv.org/abs/2010.11938","pdf_url":"https://arxiv.org/pdf/2010.11938","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"pmh:oai:elib.dlr.de:141289","doi":null,"is_oa":false,"landing_page_url":"https://elib.dlr.de/141289/","pdf_url":null,"source":{"id":"https://openalex.org/S4377196266","display_name":"elib (German Aerospace Center)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2898391981","host_organization_name":"Deutsches Zentrum f\u00fcr Luft- und Raumfahrt e. V. (DLR)","host_organization_lineage":["https://openalex.org/I2898391981"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Zeitschriftenbeitrag"},{"id":"doi:10.48550/arxiv.2010.11938","doi":"https://doi.org/10.48550/arxiv.2010.11938","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2010.11938","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article-journal"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2010.11938","doi":null,"is_oa":true,"landing_page_url":"http://arxiv.org/abs/2010.11938","pdf_url":"https://arxiv.org/pdf/2010.11938","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G3830285209","display_name":null,"funder_award_id":"W911NF-16-2-0192","funder_id":"https://openalex.org/F4320332180","funder_display_name":"Defense Advanced Research Projects Agency"},{"id":"https://openalex.org/G7127108642","display_name":null,"funder_award_id":"W911NF-16-2-0192","funder_id":"https://openalex.org/F4320338281","funder_display_name":"Army Research Office"},{"id":"https://openalex.org/G7452299184","display_name":null,"funder_award_id":"W911NF","funder_id":"https://openalex.org/F4320338281","funder_display_name":"Army Research Office"}],"funders":[{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"},{"id":"https://openalex.org/F4320338281","display_name":"Army Research Office","ror":"https://ror.org/05epdh915"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3093661028.pdf","grobid_xml":"https://content.openalex.org/works/W3093661028.grobid-xml"},"referenced_works_count":20,"referenced_works":["https://openalex.org/W1509274476","https://openalex.org/W1590071748","https://openalex.org/W1992130858","https://openalex.org/W1992529481","https://openalex.org/W2005176151","https://openalex.org/W2007399377","https://openalex.org/W2009276263","https://openalex.org/W2010623452","https://openalex.org/W2021790085","https://openalex.org/W2045473120","https://openalex.org/W2050641122","https://openalex.org/W2059631537","https://openalex.org/W2069981020","https://openalex.org/W2085941317","https://openalex.org/W2094817489","https://openalex.org/W2142531082","https://openalex.org/W2210116723","https://openalex.org/W2509681139","https://openalex.org/W2951367297","https://openalex.org/W3015387158"],"related_works":["https://openalex.org/W4221063526","https://openalex.org/W4408938478","https://openalex.org/W2138719569","https://openalex.org/W1977556382","https://openalex.org/W2007399377","https://openalex.org/W7034058622","https://openalex.org/W7125505537","https://openalex.org/W7115977767","https://openalex.org/W2530687931","https://openalex.org/W1996125371"],"abstract_inverted_index":{"Abstract":[0],"Current":[1],"crowding":[2,42],"at":[3],"bends":[4,62],"of":[5,13,20,39,52,61,68,81],"superconducting":[6],"nanowire":[7,70],"single-photon":[8],"detector":[9],"(SNSPD)":[10],"is":[11,50],"one":[12],"the":[14,18,37,40,66,74,79,82],"main":[15],"factors":[16],"limiting":[17],"performance":[19],"meander-style":[21],"detectors":[22],"with":[23,55,111,117],"large":[24],"filling":[25],"factors.":[26],"In":[27],"this":[28],"paper,":[29],"we":[30],"propose":[31],"a":[32,44,96,112],"new":[33],"concept":[34],"to":[35,65,94],"reduce":[36],"influence":[38],"current":[41,75,84,87],"effect,":[43],"so-called":[45],"variable":[46,91],"thickness":[47,60,67,92,115],"SNSPD,":[48],"which":[49],"composed":[51],"two":[53],"regions":[54],"different":[56],"thicknesses.":[57],"A":[58],"larger":[59],"in":[63,109],"comparison":[64,110],"straight":[69],"sections":[71],"locally":[72],"reduces":[73,78],"density":[76],"and":[77,104,121],"suppression":[80],"critical":[83,98],"caused":[85],"by":[86],"crowding.":[88],"This":[89],"allows":[90],"SNSPD":[93,116],"have":[95],"higher":[97],"current,":[99],"an":[100,118],"improved":[101],"detection":[102],"efficiency,":[103],"decreased":[105],"dark":[106],"count":[107],"rate":[108],"standard":[113],"uniform":[114],"identical":[119],"geometry":[120],"film":[122],"quality.":[123]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":3}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2020-10-29T00:00:00"}