{"id":"https://openalex.org/W3084889350","doi":"https://doi.org/10.1109/cpem49742.2020.9191820","title":"Temperature influence on the establishment of a digital voltage reference","display_name":"Temperature influence on the establishment of a digital voltage reference","publication_year":2020,"publication_date":"2020-08-01","ids":{"openalex":"https://openalex.org/W3084889350","doi":"https://doi.org/10.1109/cpem49742.2020.9191820","mag":"3084889350"},"language":"en","primary_location":{"id":"doi:10.1109/cpem49742.2020.9191820","doi":"https://doi.org/10.1109/cpem49742.2020.9191820","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cpem49742.2020.9191820","pdf_url":null,"source":{"id":"https://openalex.org/S4306418090","display_name":"Conference on Precision Electromagnetic Measurements","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034351678","display_name":"Yolanda A. Sanmamed","orcid":"https://orcid.org/0000-0002-7632-5560","observed_orcids":["https://orcid.org/0000-0002-7632-5560"]},"institutions":[{"id":"https://openalex.org/I4210111132","display_name":"Centro Espa\u00f1ol de Metrolog\u00eda","ror":"https://ror.org/022r8xe61","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210111132"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Y.A. Sanmamed","raw_affiliation_strings":["Centro Espa\u00f1ol de Metrolog\u00eda (CEM), c/ del Alfar, n\u00ba2., Tres Cantos (Madrid), Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro Espa\u00f1ol de Metrolog\u00eda (CEM), c/ del Alfar, n\u00ba2., Tres Cantos (Madrid), Spain","institution_ids":["https://openalex.org/I4210111132"]}]},{"author_position":"middle","author":{"id":null,"display_name":"J. Diaz de Aguilar","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210111132","display_name":"Centro Espa\u00f1ol de Metrolog\u00eda","ror":"https://ror.org/022r8xe61","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210111132"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Diaz de Aguilar","raw_affiliation_strings":["Centro Espa\u00f1ol de Metrolog\u00eda (CEM), c/ del Alfar, n\u00ba2., Tres Cantos (Madrid), Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro Espa\u00f1ol de Metrolog\u00eda (CEM), c/ del Alfar, n\u00ba2., Tres Cantos (Madrid), Spain","institution_ids":["https://openalex.org/I4210111132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043383977","display_name":"Raul Caballero Santos","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210111132","display_name":"Centro Espa\u00f1ol de Metrolog\u00eda","ror":"https://ror.org/022r8xe61","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210111132"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Caballero Santos","raw_affiliation_strings":["Centro Espa\u00f1ol de Metrolog\u00eda (CEM), c/ del Alfar, n\u00ba2., Tres Cantos (Madrid), Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro Espa\u00f1ol de Metrolog\u00eda (CEM), c/ del Alfar, n\u00ba2., Tres Cantos (Madrid), Spain","institution_ids":["https://openalex.org/I4210111132"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038486525","display_name":"J.R. Salinas","orcid":"https://orcid.org/0000-0003-2782-9874","observed_orcids":["https://orcid.org/0000-0003-2782-9874"]},"institutions":[{"id":"https://openalex.org/I82767444","display_name":"Universidad de M\u00e1laga","ror":"https://ror.org/036b2ww28","country_code":"ES","type":"education","lineage":["https://openalex.org/I82767444"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. R. Salinas","raw_affiliation_strings":["ETSI Telecomunicaci\u00f3n, Universidad de M\u00e1laga, B. L. Pasteur 35., M\u00e1laga, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETSI Telecomunicaci\u00f3n, Universidad de M\u00e1laga, B. L. Pasteur 35., M\u00e1laga, Spain","institution_ids":["https://openalex.org/I82767444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3506,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4399597,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.001500000013038516,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/temperature-dependence","display_name":"temperature dependence","score":0.7879999876022339},{"id":"https://openalex.org/keywords/digital-multimeter","display_name":"digital multimeter","score":0.6179999709129333},{"id":"https://openalex.org/keywords/phase-displacement","display_name":"phase displacement","score":0.7419999837875366},{"id":"https://openalex.org/keywords/resistive-voltage-divider","display_name":"resistive voltage divider","score":0.7680000066757202},{"id":"https://openalex.org/keywords/frequency-response","display_name":"frequency response","score":0.7390000224113464},{"id":"https://openalex.org/keywords/amplitude-variation","display_name":"amplitude variation","score":0.753000020980835}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.7289540767669678},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6453776955604553},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.5777989625930786},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.5738913416862488},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5501022934913635},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4933737814426422},{"id":"https://openalex.org/C78336883","wikidata":"https://www.wikidata.org/wiki/Q4779385","display_name":"Aperture (computer memory)","level":2,"score":0.49135223031044006},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.45893973112106323},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4480399191379547},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.427990585565567},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3854072093963623},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37195053696632385},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.29630619287490845},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25622469186782837},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.24931085109710693},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22227320075035095},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cpem49742.2020.9191820","doi":"https://doi.org/10.1109/cpem49742.2020.9191820","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cpem49742.2020.9191820","pdf_url":null,"source":{"id":"https://openalex.org/S4306418090","display_name":"Conference on Precision Electromagnetic Measurements","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2906737468"],"related_works":["https://openalex.org/W2052433532","https://openalex.org/W2899286157","https://openalex.org/W7143698892","https://openalex.org/W1973614755","https://openalex.org/W1990987171","https://openalex.org/W1597872458","https://openalex.org/W2366030170","https://openalex.org/W1983785161","https://openalex.org/W4367179073","https://openalex.org/W2923890576"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,10,13,17,27,45,54],"experimental":[4],"set-up":[5],"and":[6,44,59],"results":[7],"obtained":[8],"on":[9],"evaluation":[11],"of":[12,16,20,38,47,65],"temperature":[14,39],"influence":[15],"main":[18],"components":[19],"a":[21,36,48,63],"digital":[22,33],"voltage":[23,50],"set-up.":[24],"In":[25],"particular,":[26],"phase":[28,57],"displacement":[29,58],"between":[30],"two":[31],"3458A":[32],"multimeters":[34],"as":[35,62],"function":[37,64],"for":[40],"different":[41],"aperture":[42],"times":[43],"characterization":[46],"resistive":[49],"divider":[51],"prototype,":[52],"including":[53],"frequency":[55],"response,":[56],"amplitude":[60],"variation":[61],"temperature.":[66]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2026-10-05T09:50:58.205359","created_date":"2020-09-21T00:00:00"}
