{"id":"https://openalex.org/W3045304624","doi":"https://doi.org/10.1016/0039-6028(85)90152-9","title":"The effect of interdiffusion on the growth mode of copper on Al{111}","display_name":"The effect of interdiffusion on the growth mode of copper on Al{111}","publication_year":1985,"publication_date":"1985-04-01","ids":{"openalex":"https://openalex.org/W3045304624","doi":"https://doi.org/10.1016/0039-6028(85)90152-9","mag":"3045304624"},"language":"en","primary_location":{"id":"doi:10.1016/0039-6028(85)90152-9","doi":"https://doi.org/10.1016/0039-6028(85)90152-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0039-6028(85)90152-9","pdf_url":null,"source":{"id":"https://openalex.org/S137865625","display_name":"Surface Science","issn_l":"0039-6028","issn":["0039-6028","1879-2758"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Science","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112744454","display_name":"H. Asonen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387152565","display_name":"Tampere University of Technology","ror":"https://ror.org/02ba3pt07","country_code":"FI","type":"education","lineage":["https://openalex.org/I166825849","https://openalex.org/I4387152565"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"H. Asonen","raw_affiliation_strings":["Department of Physics, Tampere University of Technology, SF-33101 Tampere 10, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Tampere University of Technology, SF-33101 Tampere 10, Finland","institution_ids":["https://openalex.org/I4387152565"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106076930","display_name":"Christopher J. Barnes","orcid":"https://orcid.org/0000-0001-9682-0748","observed_orcids":["https://orcid.org/0000-0001-9682-0748"]},"institutions":[{"id":"https://openalex.org/I4387152565","display_name":"Tampere University of Technology","ror":"https://ror.org/02ba3pt07","country_code":"FI","type":"education","lineage":["https://openalex.org/I166825849","https://openalex.org/I4387152565"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"C.J. Barnes","raw_affiliation_strings":["Department of Physics, Tampere University of Technology, SF-33101 Tampere 10, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Tampere University of Technology, SF-33101 Tampere 10, Finland","institution_ids":["https://openalex.org/I4387152565"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006509362","display_name":"Arto K. Salokatve","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387152565","display_name":"Tampere University of Technology","ror":"https://ror.org/02ba3pt07","country_code":"FI","type":"education","lineage":["https://openalex.org/I166825849","https://openalex.org/I4387152565"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"A. Salokatve","raw_affiliation_strings":["Department of Physics, Tampere University of Technology, SF-33101 Tampere 10, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Tampere University of Technology, SF-33101 Tampere 10, Finland","institution_ids":["https://openalex.org/I4387152565"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113611370","display_name":"M. Pessa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387152565","display_name":"Tampere University of Technology","ror":"https://ror.org/02ba3pt07","country_code":"FI","type":"education","lineage":["https://openalex.org/I166825849","https://openalex.org/I4387152565"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"M. Pessa","raw_affiliation_strings":["Department of Physics, Tampere University of Technology, SF-33101 Tampere 10, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Tampere University of Technology, SF-33101 Tampere 10, Finland","institution_ids":["https://openalex.org/I4387152565"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4387152565"],"apc_list":{"value":3340,"currency":"USD","value_usd":3340},"apc_paid":null,"fwci":1.2083,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.78221114,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"152-153","issue":null,"first_page":"262","last_page":"269"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.961899995803833,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.961899995803833,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.01940000057220459,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.009499999694526196,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/copper-thin-films","display_name":"copper thin films","score":0.8949999809265137},{"id":"https://openalex.org/keywords/interdiffusion","display_name":"interdiffusion","score":0.9319999814033508},{"id":"https://openalex.org/keywords/growth-mode","display_name":"growth mode","score":0.7200000286102295},{"id":"https://openalex.org/keywords/frank-van-der-merwe-growth","display_name":"layer-by-layer growth","score":0.9629999995231628},{"id":"https://openalex.org/keywords/lattice-mismatch","display_name":"lattice mismatch","score":0.6449999809265137},{"id":"https://openalex.org/keywords/interface-mixing","display_name":"interface mixing","score":0.6349999904632568},{"id":"https://openalex.org/keywords/auger-electron-spectroscopy","display_name":"Auger electron spectroscopy","score":0.7110000252723694},{"id":"https://openalex.org/keywords/low-energy-electron-diffraction","display_name":"low-energy electron diffraction","score":0.8460000157356262},{"id":"https://openalex.org/keywords/lattice-strain-relaxation","display_name":"lattice strain relaxation","score":0.5649999976158142},{"id":"https://openalex.org/keywords/al-cu-interface","display_name":"Cu/Al interface","score":0.6729999780654907}],"concepts":[{"id":"https://openalex.org/C25442681","wikidata":"https://www.wikidata.org/wiki/Q28087","display_name":"Auger electron spectroscopy","level":2,"score":0.8367749452590942},{"id":"https://openalex.org/C2780646311","wikidata":"https://www.wikidata.org/wiki/Q1142501","display_name":"Auger","level":2,"score":0.744555652141571},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.7083557844161987},{"id":"https://openalex.org/C544778455","wikidata":"https://www.wikidata.org/wiki/Q753","display_name":"Copper","level":2,"score":0.7034450173377991},{"id":"https://openalex.org/C100083437","wikidata":"https://www.wikidata.org/wiki/Q905977","display_name":"Low-energy electron diffraction","level":4,"score":0.6456358432769775},{"id":"https://openalex.org/C7070889","wikidata":"https://www.wikidata.org/wiki/Q902488","display_name":"Monolayer","level":2,"score":0.5956145524978638},{"id":"https://openalex.org/C77557913","wikidata":"https://www.wikidata.org/wiki/Q864822","display_name":"Electron diffraction","level":3,"score":0.5194596648216248},{"id":"https://openalex.org/C2781204021","wikidata":"https://www.wikidata.org/wiki/Q6497091","display_name":"Lattice (music)","level":2,"score":0.49607858061790466},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.4894501268863678},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.4656561017036438},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.45697909593582153},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.45667338371276855},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.44339612126350403},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.39662423729896545},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3883787989616394},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.3442244827747345},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.1826399862766266},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.13362285494804382},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.11796838045120239},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.11573997139930725},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0039-6028(85)90152-9","doi":"https://doi.org/10.1016/0039-6028(85)90152-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0039-6028(85)90152-9","pdf_url":null,"source":{"id":"https://openalex.org/S137865625","display_name":"Surface Science","issn_l":"0039-6028","issn":["0039-6028","1879-2758"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Science","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1967986681","https://openalex.org/W2028167853","https://openalex.org/W2028785031","https://openalex.org/W2094989359"],"related_works":["https://openalex.org/W2058535488","https://openalex.org/W2030602722","https://openalex.org/W2047733552","https://openalex.org/W2160471175","https://openalex.org/W1999326163","https://openalex.org/W2028277837","https://openalex.org/W2016835636","https://openalex.org/W902775438","https://openalex.org/W1984848283","https://openalex.org/W2066095531"],"abstract_inverted_index":null,"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2020-07-29T00:00:00"}