{"id":"https://openalex.org/W3036332276","doi":"https://doi.org/10.1017/s0424820100061161","title":"The Properties of a Quadrupole Quadruplet Projector","display_name":"The Properties of a Quadrupole Quadruplet Projector","publication_year":1967,"publication_date":"1967-09-01","ids":{"openalex":"https://openalex.org/W3036332276","doi":"https://doi.org/10.1017/s0424820100061161","mag":"3036332276"},"language":"en","primary_location":{"id":"doi:10.1017/s0424820100061161","doi":"https://doi.org/10.1017/s0424820100061161","is_oa":false,"landing_page_url":"http://doi.org/10.1017/s0424820100061161","pdf_url":null,"source":{"id":"https://openalex.org/S4210239783","display_name":"Proceedings annual meeting Electron Microscopy Society of America","issn_l":"0424-8201","issn":["0424-8201","2690-1315"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings, annual meeting, Electron Microscopy Society of America","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078599825","display_name":"Hisazo Kawakatsu","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"H. Kawakatsu","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079368577","display_name":"Kirby G. Vosburgh","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K. Vosburgh","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5006705548","display_name":"Benjamin M. Siegel","orcid":"https://orcid.org/0000-0002-4943-5967","observed_orcids":["https://orcid.org/0000-0002-4943-5967"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"B. Siegel","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.38262911,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"25","issue":null,"first_page":"230","last_page":"231"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.0038999998942017555,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11367","display_name":"Particle accelerators and beam dynamics","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-lens","display_name":"electron lenses","score":0.5389999747276306},{"id":"https://openalex.org/keywords/high-resolution-electron-microscopy","display_name":"high-resolution electron microscopy","score":0.6890000104904175},{"id":"https://openalex.org/keywords/electric-field-distribution","display_name":"electric field distribution","score":0.6129999756813049},{"id":"https://openalex.org/keywords/ray-trajectories","display_name":"ray trajectories","score":0.9369999766349792},{"id":"https://openalex.org/keywords/electron-optics","display_name":"electron optics","score":0.38100001215934753}],"concepts":[{"id":"https://openalex.org/C2776865275","wikidata":"https://www.wikidata.org/wiki/Q311666","display_name":"Projector","level":2,"score":0.8239990472793579},{"id":"https://openalex.org/C44074806","wikidata":"https://www.wikidata.org/wiki/Q1066790","display_name":"Inscribed figure","level":2,"score":0.6697467565536499},{"id":"https://openalex.org/C39984356","wikidata":"https://www.wikidata.org/wiki/Q2121987","display_name":"Quadrupole","level":2,"score":0.5908017754554749},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5306605100631714},{"id":"https://openalex.org/C178635117","wikidata":"https://www.wikidata.org/wiki/Q747499","display_name":"RADIUS","level":2,"score":0.51137775182724},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.417263388633728},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4099924862384796},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3787716329097748},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29145270586013794},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28257906436920166},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.2070426046848297},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.07910206913948059},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1017/s0424820100061161","doi":"https://doi.org/10.1017/s0424820100061161","is_oa":false,"landing_page_url":"http://doi.org/10.1017/s0424820100061161","pdf_url":null,"source":{"id":"https://openalex.org/S4210239783","display_name":"Proceedings annual meeting Electron Microscopy Society of America","issn_l":"0424-8201","issn":["0424-8201","2690-1315"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings, annual meeting, Electron Microscopy Society of America","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W1991798983"],"related_works":["https://openalex.org/W1972992062","https://openalex.org/W2098804638","https://openalex.org/W2003845421","https://openalex.org/W4312352042","https://openalex.org/W2036242938","https://openalex.org/W1969087912","https://openalex.org/W7014147668","https://openalex.org/W2886883333","https://openalex.org/W4313053047","https://openalex.org/W252310060"],"abstract_inverted_index":{"The":[0,17,67],"properties":[1],"of":[2,20,58,71],"a":[3,12,31,42,54],"quadruplet":[4,18,60,73],"projector":[5],"have":[6],"been":[7,63],"studied":[8],"for":[9,53],"use":[10],"in":[11,77],"high":[13],"resolution":[14],"electron":[15],"microscope.":[16],"consists":[19],"four":[21],"identical":[22],"quadrupoles":[23],"each":[24],"with":[25],"poles":[26],"having":[27],"an":[28],"inscribed":[29],"radius,":[30],"=":[32],"1.5":[33],"cm":[34],"and":[35,46,49,65],"length":[36],"1=3":[37],"cm.":[38],"Fig.":[39,78],"1":[40],"shows":[41],"typical":[43],"field":[44],"distribution":[45],"the":[47,59,72],"X-Z":[48],"Y-Z":[50],"ray":[51],"trajectories":[52],"particular":[55],"stigmatic":[56],"setting":[57],"which":[61],"has":[62],"built":[64],"studied.":[66],"first":[68],"order":[69],"characteristics":[70],"system":[74],"are":[75],"shown":[76],"2.":[79]},"counts_by_year":[],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2020-06-25T00:00:00"}