{"id":"https://openalex.org/W3032201260","doi":"https://doi.org/10.11591/csit.v1i1.pp26-31","title":"Extraction of series resistance and mobility degradation parameter in MOSFETs using iterative method","display_name":"Extraction of series resistance and mobility degradation parameter in MOSFETs using iterative method","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3032201260","doi":"https://doi.org/10.11591/csit.v1i1.pp26-31","mag":"3032201260"},"language":"en","primary_location":{"id":"doi:10.11591/csit.v1i1.pp26-31","doi":"https://doi.org/10.11591/csit.v1i1.pp26-31","is_oa":true,"landing_page_url":"http://dx.doi.org/10.11591/csit.v1i1.pp26-31","pdf_url":null,"source":{"id":"https://openalex.org/S4210218571","display_name":"Computer Science and Information Technologies","issn_l":"2722-3221","issn":["2722-3221","2722-323X"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315009","host_organization_name":"Institute of Advanced Engineering and Science (IAES)","host_organization_lineage":["https://openalex.org/P4310315009"],"host_organization_lineage_names":["Institute of Advanced Engineering and Science (IAES)"],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computer Science and Information Technologies","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"http://dx.doi.org/10.11591/csit.v1i1.pp26-31","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003355379","display_name":"Noureddine Maouhoub","orcid":"https://orcid.org/0000-0001-7525-5305","observed_orcids":["https://orcid.org/0000-0001-7525-5305"]},"institutions":[{"id":"https://openalex.org/I4210088687","display_name":"Universit\u00e9 Ibn Zohr","ror":"https://ror.org/006sgpv47","country_code":"MA","type":"education","lineage":["https://openalex.org/I4210088687"]}],"countries":["MA"],"is_corresponding":false,"raw_author_name":"Noureddine Maouhoub","raw_affiliation_strings":["Ibn Zohr University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ibn Zohr University","institution_ids":["https://openalex.org/I4210088687"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041442329","display_name":"Khalid Rais","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210125507","display_name":"Chouaib Doukkali University","ror":"https://ror.org/036kgyt43","country_code":"MA","type":"education","lineage":["https://openalex.org/I4210125507"]}],"countries":["MA"],"is_corresponding":false,"raw_author_name":"Khalid Rais","raw_affiliation_strings":["Chouaib Doukkali University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chouaib Doukkali University","institution_ids":["https://openalex.org/I4210125507"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.086,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.38131397,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"1","issue":"1","first_page":"26","last_page":"31"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.007799999788403511,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/series-resistance-extraction","display_name":"series resistance extraction","score":0.7990000247955322},{"id":"https://openalex.org/keywords/short-channel-mosfet","display_name":"short-channel MOSFET","score":0.8880000114440918},{"id":"https://openalex.org/keywords/low-field-mobility","display_name":"low-field mobility","score":0.7440000176429749},{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"parasitic extraction","score":0.6399999856948853},{"id":"https://openalex.org/keywords/device-scaling","display_name":"device scaling","score":0.5910000205039978}],"concepts":[{"id":"https://openalex.org/C14485415","wikidata":"https://www.wikidata.org/wiki/Q5384730","display_name":"Equivalent series resistance","level":3,"score":0.6444110870361328},{"id":"https://openalex.org/C151376022","wikidata":"https://www.wikidata.org/wiki/Q168698","display_name":"Exponential function","level":2,"score":0.5458498597145081},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.5311896800994873},{"id":"https://openalex.org/C39927690","wikidata":"https://www.wikidata.org/wiki/Q11197","display_name":"Logarithm","level":2,"score":0.517166793346405},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4856080412864685},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.47349223494529724},{"id":"https://openalex.org/C159694833","wikidata":"https://www.wikidata.org/wiki/Q2321565","display_name":"Iterative method","level":2,"score":0.44899624586105347},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.42545533180236816},{"id":"https://openalex.org/C139945424","wikidata":"https://www.wikidata.org/wiki/Q1940696","display_name":"Mean squared error","level":2,"score":0.4113556444644928},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3987971544265747},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3616144061088562},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3542786240577698},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3423428237438202},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.27619612216949463},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.22622010111808777},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1630958914756775},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15977531671524048},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13426071405410767},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.11372435092926025},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09953606128692627},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":6,"locations":[{"id":"doi:10.11591/csit.v1i1.pp26-31","doi":"https://doi.org/10.11591/csit.v1i1.pp26-31","is_oa":true,"landing_page_url":"http://dx.doi.org/10.11591/csit.v1i1.pp26-31","pdf_url":null,"source":{"id":"https://openalex.org/S4210218571","display_name":"Computer Science and Information Technologies","issn_l":"2722-3221","issn":["2722-3221","2722-323X"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315009","host_organization_name":"Institute of Advanced Engineering and Science (IAES)","host_organization_lineage":["https://openalex.org/P4310315009"],"host_organization_lineage_names":["Institute of Advanced Engineering and Science (IAES)"],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computer Science and Information Technologies","raw_type":"journal-article"},{"id":"doi:10.11591/csit.v1i1.p26-31","doi":"https://doi.org/10.11591/csit.v1i1.p26-31","is_oa":true,"landing_page_url":"https://doi.org/10.11591/csit.v1i1.p26-31","pdf_url":"http://iaesprime.com/index.php/csit/article/download/11/20","source":{"id":"https://openalex.org/S4210218571","display_name":"Computer Science and Information Technologies","issn_l":"2722-3221","issn":["2722-3221","2722-323X"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315009","host_organization_name":"Institute of Advanced Engineering and Science (IAES)","host_organization_lineage":["https://openalex.org/P4310315009"],"host_organization_lineage_names":["Institute of Advanced Engineering and Science (IAES)"],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computer Science and Information Technologies","raw_type":"journal-article"},{"id":"pmh:oai:zenodo.org:3891701","doi":null,"is_oa":true,"landing_page_url":"https://zenodo.org/record/3891701","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Computer Science and Information Technologies 1(1) 26-31","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:zenodo.org:4063533","doi":null,"is_oa":true,"landing_page_url":"https://zenodo.org/record/4063533","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Computer Science and Information Technologies 1(1) 26-31","raw_type":"info:eu-repo/semantics/article"},{"id":"doi:10.5281/zenodo.4063532","doi":"https://doi.org/10.5281/zenodo.4063532","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.4063532","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article-journal"},{"id":"doi:10.5281/zenodo.4063533","doi":"https://doi.org/10.5281/zenodo.4063533","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.4063533","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article-journal"}],"best_oa_location":{"id":"doi:10.11591/csit.v1i1.pp26-31","doi":"https://doi.org/10.11591/csit.v1i1.pp26-31","is_oa":true,"landing_page_url":"http://dx.doi.org/10.11591/csit.v1i1.pp26-31","pdf_url":null,"source":{"id":"https://openalex.org/S4210218571","display_name":"Computer Science and Information Technologies","issn_l":"2722-3221","issn":["2722-3221","2722-323X"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315009","host_organization_name":"Institute of Advanced Engineering and Science (IAES)","host_organization_lineage":["https://openalex.org/P4310315009"],"host_organization_lineage_names":["Institute of Advanced Engineering and Science (IAES)"],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computer Science and Information Technologies","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3032201260.pdf","grobid_xml":"https://content.openalex.org/works/W3032201260.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W1510719853","https://openalex.org/W1560732293","https://openalex.org/W2006742014","https://openalex.org/W2008775696","https://openalex.org/W2019254955","https://openalex.org/W2021075524","https://openalex.org/W2045397412","https://openalex.org/W2052087062","https://openalex.org/W2077945421","https://openalex.org/W2115740234","https://openalex.org/W2128558836","https://openalex.org/W2138027191","https://openalex.org/W2309656305","https://openalex.org/W2314442952","https://openalex.org/W2397489994","https://openalex.org/W2567778225","https://openalex.org/W2945606931"],"related_works":["https://openalex.org/W4230130211","https://openalex.org/W2990051761","https://openalex.org/W4205893958","https://openalex.org/W2309656305","https://openalex.org/W2104969373","https://openalex.org/W2006742014","https://openalex.org/W2732651210","https://openalex.org/W2567778225","https://openalex.org/W2055366235","https://openalex.org/W2137147860"],"abstract_inverted_index":{"Series":[0],"resistance":[1,28,77],"and":[2,29,61,78],"mobility":[3,30,60,82,87,90],"attenuation":[4,91],"parameter":[5,32,92],"are":[6,71],"parasitic":[7],"phenomena":[8],"that":[9],"limit":[10],"the":[11,26,43,55,62,75,79,86,101,122],"scaling":[12],"of":[13,49,58,85],"advanced":[14],"MOSFETs.":[15,36],"In":[16],"this":[17,50,112],"work,":[18],"an":[19,96],"iterative":[20,97],"method":[21,51],"is":[22,52,93],"proposed":[23],"to":[24,41,73,99],"extract":[25,42],"series":[27,76],"degradation":[31],"in":[33],"short":[34,117],"channel":[35,118],"It":[37],"also":[38],"allows":[39],"us":[40],"surface":[44],"roughness":[45],"amplitude.":[46],"The":[47,89,108],"principle":[48],"based":[53],"on":[54],"exponential":[56],"model":[57],"effective":[59],"least":[63],"squares":[64],"methods.":[65],"From":[66],"these,":[67],"two":[68],"analytical":[69],"equations":[70],"obtained":[72,110],"determine":[74],"low":[80],"field":[81],"as":[83],"function":[84],"degradation.":[88],"extracted":[94],"using":[95],"procedure":[98],"minimize":[100],"root":[102],"means":[103],"squared":[104],"error":[105],"(RMSE)":[106],"value.":[107],"results":[109],"by":[111],"technique":[113],"for":[114],"a":[115],"single":[116],"device":[119],"have":[120],"shown":[121],"good":[123],"agreement":[124],"with":[125],"measurements":[126],"data":[127],"at":[128],"strong":[129],"inversion.":[130]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2020-06-05T00:00:00"}