{"id":"https://openalex.org/W3022845458","doi":"https://doi.org/10.1109/ted.2020.2989731","title":"Drain Current Optimization in DIBS-Grown MgZnO/CdZnO HFET","display_name":"Drain Current Optimization in DIBS-Grown MgZnO/CdZnO HFET","publication_year":2020,"publication_date":"2020-05-08","ids":{"openalex":"https://openalex.org/W3022845458","doi":"https://doi.org/10.1109/ted.2020.2989731","mag":"3022845458"},"language":"en","primary_location":{"id":"doi:10.1109/ted.2020.2989731","doi":"https://doi.org/10.1109/ted.2020.2989731","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ted.2020.2989731","pdf_url":null,"source":{"id":"https://openalex.org/S162355128","display_name":"IEEE Transactions on Electron Devices","issn_l":"0018-9383","issn":["0018-9383","1557-9646"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","norway-2","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electron Devices","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054897202","display_name":"Md Arif Khan","orcid":"https://orcid.org/0000-0003-4503-8136","observed_orcids":["https://orcid.org/0000-0003-4503-8136"]},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Md Arif Khan","raw_affiliation_strings":["Hybrid Nanodevice Research Group (HNRG), Electrical Engineering, IIT Indore, Indore, India"],"raw_orcid":"https://orcid.org/0000-0003-4503-8136","affiliations":[{"raw_affiliation_string":"Hybrid Nanodevice Research Group (HNRG), Electrical Engineering, IIT Indore, Indore, India","institution_ids":["https://openalex.org/I64295750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102009323","display_name":"Pawan Kumar","orcid":"https://orcid.org/0000-0003-2968-172X","observed_orcids":["https://orcid.org/0000-0003-2968-172X"]},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pawan Kumar","raw_affiliation_strings":["Hybrid Nanodevice Research Group (HNRG), Electrical Engineering, IIT Indore, Indore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hybrid Nanodevice Research Group (HNRG), Electrical Engineering, IIT Indore, Indore, India","institution_ids":["https://openalex.org/I64295750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029973124","display_name":"Mangal Das","orcid":"https://orcid.org/0000-0001-7596-3133","observed_orcids":["https://orcid.org/0000-0001-7596-3133"]},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mangal Das","raw_affiliation_strings":["Hybrid Nanodevice Research Group (HNRG), Electrical Engineering, IIT Indore, Indore, India"],"raw_orcid":"https://orcid.org/0000-0001-7596-3133","affiliations":[{"raw_affiliation_string":"Hybrid Nanodevice Research Group (HNRG), Electrical Engineering, IIT Indore, Indore, India","institution_ids":["https://openalex.org/I64295750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113718797","display_name":"Myo Than Htay","orcid":"https://orcid.org/0000-0001-5372-8060","observed_orcids":["https://orcid.org/0000-0001-5372-8060"]},"institutions":[{"id":"https://openalex.org/I137975476","display_name":"Shinshu University","ror":"https://ror.org/0244rem06","country_code":"JP","type":"education","lineage":["https://openalex.org/I137975476"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Myo Than Htay","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Hashimoto-Myo Laboratory, Shinshu University, Nagano, Japan"],"raw_orcid":"https://orcid.org/0000-0001-5372-8060","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Hashimoto-Myo Laboratory, Shinshu University, Nagano, Japan","institution_ids":["https://openalex.org/I137975476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082742623","display_name":"Ajay Agarwal","orcid":"https://orcid.org/0000-0003-2204-9553","observed_orcids":["https://orcid.org/0000-0003-2204-9553"]},"institutions":[{"id":"https://openalex.org/I41763900","display_name":"Central Electronics Engineering Research Institute","ror":"https://ror.org/01hh45364","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I41763900","https://openalex.org/I4210134808","https://openalex.org/I66760702"]},{"id":"https://openalex.org/I66760702","display_name":"Council of Scientific and Industrial Research","ror":"https://ror.org/021wm7p51","country_code":"IN","type":"government","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210134808","https://openalex.org/I66760702"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ajay Agarwal","raw_affiliation_strings":["Smart Sensors Area and Nano Biosensors Group, CSIR\u2013Central Electronics Engineering Research Institute, Pilani, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Smart Sensors Area and Nano Biosensors Group, CSIR\u2013Central Electronics Engineering Research Institute, Pilani, India","institution_ids":["https://openalex.org/I41763900","https://openalex.org/I66760702"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012314390","display_name":"Shaibal Mukherjee","orcid":"https://orcid.org/0000-0002-9879-7278","observed_orcids":["https://orcid.org/0000-0002-9879-7278"]},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shaibal Mukherjee","raw_affiliation_strings":["Hybrid Nanodevice Research Group (HNRG), Electrical Engineering, IIT Indore, Indore, India"],"raw_orcid":"https://orcid.org/0000-0002-9879-7278","affiliations":[{"raw_affiliation_string":"Hybrid Nanodevice Research Group (HNRG), Electrical Engineering, IIT Indore, Indore, India","institution_ids":["https://openalex.org/I64295750"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2045,"currency":"USD","value_usd":2045},"apc_paid":null,"fwci":1.0272,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.72323933,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"67","issue":"6","first_page":"2276","last_page":"2281"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.5859000086784363,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.5859000086784363,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.19910000264644623,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.050599999725818634,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dual-ion-beam-sputtering","display_name":"dual ion beam sputtering","score":0.9110000133514404},{"id":"https://openalex.org/keywords/interface-roughness","display_name":"interface roughness","score":0.7900000214576721},{"id":"https://openalex.org/keywords/contact-resistivity","display_name":"contact resistivity","score":0.6809999942779541},{"id":"https://openalex.org/keywords/source-drain-contacts","display_name":"source/drain contacts","score":0.7239999771118164},{"id":"https://openalex.org/keywords/drain-current","display_name":"drain current","score":0.7310000061988831},{"id":"https://openalex.org/keywords/electron-mobility","display_name":"electron mobility","score":0.7269999980926514},{"id":"https://openalex.org/keywords/sheet-carrier-density","display_name":"sheet carrier density","score":0.734000027179718},{"id":"https://openalex.org/keywords/power-devices","display_name":"power devices","score":0.5759999752044678},{"id":"https://openalex.org/keywords/sensors","display_name":"sensors","score":0.7630000114440918}],"concepts":[{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.45126935839653015},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39341211318969727},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3524198532104492},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3245953321456909},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2930833101272583}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ted.2020.2989731","doi":"https://doi.org/10.1109/ted.2020.2989731","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ted.2020.2989731","pdf_url":null,"source":{"id":"https://openalex.org/S162355128","display_name":"IEEE Transactions on Electron Devices","issn_l":"0018-9383","issn":["0018-9383","1557-9646"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","norway-2","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electron Devices","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G3326259494","display_name":null,"funder_award_id":"EMR/2016/006847","funder_id":"https://openalex.org/F4320334771","funder_display_name":"Science and Engineering Research Board"}],"funders":[{"id":"https://openalex.org/F4320334771","display_name":"Science and Engineering Research Board","ror":"https://ror.org/03ffdsr55"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1976044271","https://openalex.org/W1980722477","https://openalex.org/W1993644338","https://openalex.org/W1999800158","https://openalex.org/W2007905148","https://openalex.org/W2026962002","https://openalex.org/W2027633497","https://openalex.org/W2040957232","https://openalex.org/W2054475943","https://openalex.org/W2056191680","https://openalex.org/W2062388100","https://openalex.org/W2086125165","https://openalex.org/W2090958982","https://openalex.org/W2092907199","https://openalex.org/W2095538582","https://openalex.org/W2113488710","https://openalex.org/W2134165364","https://openalex.org/W2149955678","https://openalex.org/W2163438333","https://openalex.org/W2167745958","https://openalex.org/W2525040413","https://openalex.org/W2528987042","https://openalex.org/W2578172029","https://openalex.org/W2791695151","https://openalex.org/W2802641655","https://openalex.org/W2805476414","https://openalex.org/W2810571812","https://openalex.org/W2902818903"],"related_works":["https://openalex.org/W4386361453","https://openalex.org/W4398763309","https://openalex.org/W2987401534","https://openalex.org/W2295319437","https://openalex.org/W4286212533","https://openalex.org/W1971446937","https://openalex.org/W2375195167","https://openalex.org/W1926422501","https://openalex.org/W3133715574","https://openalex.org/W1995035115"],"abstract_inverted_index":{"This":[0],"article":[1,21],"reports":[2],"the":[3,31,34,42,46,49,56,65,83,86,91,113,119,127,144,157],"fabrication":[4,158],"of":[5,33,48,85,95,106,126,159],"a":[6,26,134,149],"dual-ion":[7],"beam":[8],"sputtering":[9],"(DIBS)-grown":[10],"MgZnO/CdZnO":[11],"(MCO)-based":[12],"gateless":[13],"heterostructure":[14,51,147],"field-effect":[15],"transistor":[16],"(HFET).":[17],"In":[18,117],"addition,":[19,118],"this":[20],"presents":[22],"that":[23,82],"by":[24],"introducing":[25],"30-nm":[27],"yttria":[28,87,129],"spacer":[29,88],"layer,":[30],"crystallinity":[32],"CdZnO":[35],"buffer":[36],"layer":[37,89],"can":[38,52],"be":[39,53],"enhanced":[40],"and":[41,58,76,100,163],"interface":[43],"roughness":[44],"at":[45],"heterojunction":[47],"MCO":[50,107,131,146],"reduced.":[54],"Furthermore,":[55],"source":[57],"drain":[59,120,136],"metal":[60,74],"contacts":[61],"were":[62],"optimized":[63],"for":[64,152,156],"least":[66],"specific":[67],"contact":[68],"resistivity":[69],"($\\boldsymbol":[70,103],"{\\rho":[71],"}_{c}$)":[72],"yielding":[73],"combination":[75],"annealing":[77],"conditions.":[78],"The":[79],"results":[80,142],"suggest":[81],"introduction":[84],"improves":[90],"overall":[92],"conductance":[93],"[product":[94],"sheet":[96],"carrier":[97],"density":[98],"(${n}_{s}$)":[99],"electron":[101],"mobility":[102],"{\\mu":[104],"}$)]":[105],"up":[108],"to$3.5\\times":[109],"10^{15}\\,\\,\\text{V}^{-1}\\text{s}^{-1}$compared":[110],"to$9\\times":[111],"10^{14}\\,\\,\\text{V}^{-1}\\text{s}^{-1}$in":[112],"non-yttria":[114],"spacer-based":[115,130],"MCO.":[116],"current":[121,137],"(${I}_{d}$)\u2013drain":[122],"voltage":[123],"(${V}_{d}$)":[124],"characteristic":[125],"as-developed":[128],"HFET":[132],"shows":[133],"high":[135],"value":[138],"(~400":[139],"mA/mm).":[140],"These":[141],"establish":[143],"DIBS-grown":[145],"as":[148],"viable":[150],"option":[151],"low-cost":[153],"HFETs":[154],"necessary":[155],"large-scale":[160],"HFET-based":[161],"power":[162],"sensor":[164],"devices.":[165]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-10-08T09:06:37.294493","created_date":"2020-05-13T00:00:00"}