{"id":"https://openalex.org/W3016992064","doi":"https://doi.org/10.1166/jnn.2020.17615","title":"Effect of High-Speed Blade Coating on Electrical Characteristics in Polymer Based Transistors","display_name":"Effect of High-Speed Blade Coating on Electrical Characteristics in Polymer Based Transistors","publication_year":2020,"publication_date":"2020-04-17","ids":{"openalex":"https://openalex.org/W3016992064","doi":"https://doi.org/10.1166/jnn.2020.17615","mag":"3016992064","pmid":"https://pubmed.ncbi.nlm.nih.gov/32331122"},"language":"en","primary_location":{"id":"doi:10.1166/jnn.2020.17615","doi":"https://doi.org/10.1166/jnn.2020.17615","is_oa":false,"landing_page_url":"https://doi.org/10.1166/jnn.2020.17615","pdf_url":null,"source":{"id":"https://openalex.org/S133947007","display_name":"Journal of Nanoscience and Nanotechnology","issn_l":"1533-4880","issn":["1533-4880","1533-4899"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","poland-40"],"host_organization":"https://openalex.org/P4310321646","host_organization_name":"American Scientific Publishers","host_organization_lineage":["https://openalex.org/P4310321646"],"host_organization_lineage_names":["American Scientific Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Nanoscience and Nanotechnology","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021397782","display_name":"Jun-Ik Park","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jun-Ik Park","raw_affiliation_strings":["School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070795531","display_name":"Hyun\u2010Seok Jeong","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyun-Seok Jeong","raw_affiliation_strings":["School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085319005","display_name":"Premkumar Vincent","orcid":"https://orcid.org/0000-0002-5002-3978","observed_orcids":["https://orcid.org/0000-0002-5002-3978"]},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Premkumar Vincent","raw_affiliation_strings":["School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006922414","display_name":"Ji-Hwan Park","orcid":"https://orcid.org/0000-0002-7764-0917","observed_orcids":["https://orcid.org/0000-0002-7764-0917"]},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihwan Park","raw_affiliation_strings":["School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110533501","display_name":"Do-Kyung Kim","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Do-Kyung Kim","raw_affiliation_strings":["School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080721285","display_name":"Jaewon Jang","orcid":"https://orcid.org/0000-0003-1908-0015","observed_orcids":["https://orcid.org/0000-0003-1908-0015","https://orcid.org/0009-0004-4540-0478","https://orcid.org/0000-0002-6729-5486"]},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaewon Jang","raw_affiliation_strings":["School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009572787","display_name":"In Man Kang","orcid":"https://orcid.org/0000-0002-7726-9740","observed_orcids":["https://orcid.org/0000-0002-7726-9740"]},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"In Man Kang","raw_affiliation_strings":["School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100740728","display_name":"Hyeok Kim","orcid":"https://orcid.org/0000-0003-2164-2849","observed_orcids":["https://orcid.org/0000-0003-2164-2849"]},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyeok Kim","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University, Jinju 52828, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University, Jinju 52828, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027372746","display_name":"Yun\u2010Hi Kim","orcid":"https://orcid.org/0000-0001-8856-4414","observed_orcids":["https://orcid.org/0000-0001-8856-4414","https://orcid.org/0000-0001-7818-1903"]},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yun-Hi Kim","raw_affiliation_strings":["Department of Chemistry and Research Institute for Natural Science, Gyeongsang National University, Jinju 52828, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry and Research Institute for Natural Science, Gyeongsang National University, Jinju 52828, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Philippe Lang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210124942","display_name":"Interfaces Traitements Organisation et Dynamique des Syst\u00e8mes","ror":"https://ror.org/03edms940","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I204730241","https://openalex.org/I4210124942","https://openalex.org/I4210128300"]},{"id":"https://openalex.org/I4387154366","display_name":"Universit\u00e9 Paris Diderot","ror":"https://ror.org/02n7qrg46","country_code":"FR","type":"education","lineage":["https://openalex.org/I204730241","https://openalex.org/I4387154366"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Philippe Lang","raw_affiliation_strings":["ITODYS, CNRS UMR 7086, Universit\u00e9 Paris Diderot (Paris 7), 75205 Paris CEDEX 13, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ITODYS, CNRS UMR 7086, Universit\u00e9 Paris Diderot (Paris 7), 75205 Paris CEDEX 13, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210124942","https://openalex.org/I4387154366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076101798","display_name":"Jin\u2010Hyuk Bae","orcid":"https://orcid.org/0000-0003-3217-1309","observed_orcids":["https://orcid.org/0000-0003-3217-1309"]},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin-Hyuk Bae","raw_affiliation_strings":["School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2577,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.49668978,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"20","issue":"9","first_page":"5486","last_page":"5490"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.003700000001117587,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10660","display_name":"Conducting polymers and applications","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tape-casting","display_name":"tape casting","score":0.8629999756813049},{"id":"https://openalex.org/keywords/coating-speed","display_name":"coating speed","score":0.9629999995231628},{"id":"https://openalex.org/keywords/field-effect-mobility","display_name":"field-effect mobility","score":0.9570000171661377},{"id":"https://openalex.org/keywords/threshold-voltage-shift","display_name":"threshold voltage shift","score":0.9279999732971191},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.9300000071525574},{"id":"https://openalex.org/keywords/organic-electronics","display_name":"organic electronics","score":0.41600000858306885}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.9155628681182861},{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.7914872765541077},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.5893297791481018},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.5844080448150635},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.5600225925445557},{"id":"https://openalex.org/C2776132848","wikidata":"https://www.wikidata.org/wiki/Q3045036","display_name":"Blade (archaeology)","level":2,"score":0.5507326722145081},{"id":"https://openalex.org/C521977710","wikidata":"https://www.wikidata.org/wiki/Q81163","display_name":"Polymer","level":2,"score":0.4966946244239807},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.42497518658638},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.38491305708885193},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.36030417680740356},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.1577397584915161},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09589973092079163},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.08375412225723267},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1166/jnn.2020.17615","doi":"https://doi.org/10.1166/jnn.2020.17615","is_oa":false,"landing_page_url":"https://doi.org/10.1166/jnn.2020.17615","pdf_url":null,"source":{"id":"https://openalex.org/S133947007","display_name":"Journal of Nanoscience and Nanotechnology","issn_l":"1533-4880","issn":["1533-4880","1533-4899"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","poland-40"],"host_organization":"https://openalex.org/P4310321646","host_organization_name":"American Scientific Publishers","host_organization_lineage":["https://openalex.org/P4310321646"],"host_organization_lineage_names":["American Scientific Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Nanoscience and Nanotechnology","raw_type":"journal-article"},{"id":"pmid:32331122","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/32331122","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of nanoscience and nanotechnology","raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2955700635","https://openalex.org/W3135061081","https://openalex.org/W1981349995","https://openalex.org/W2088117098","https://openalex.org/W2078221728","https://openalex.org/W2788460747","https://openalex.org/W2992164880","https://openalex.org/W2047772686","https://openalex.org/W3083128507","https://openalex.org/W2606072613"],"abstract_inverted_index":{"We":[0],"explore":[1],"the":[2,18,22,25,32,47,57,65,74,83],"effect":[3],"of":[4,11,24,49],"high-speed":[5],"blade":[6],"coating":[7,75],"on":[8,46],"electrical":[9],"characteristics":[10],"conjugated":[12],"polymer-based":[13],"thin-film":[14,27],"transistors":[15],"(TFTs).":[16],"As":[17,56],"blade-coating":[19,54,58,107],"speed":[20,59,76],"increased,":[21],"thickness":[23],"polymer":[26],"was":[28,35,94],"naturally":[29],"increased":[30,60,68],"while":[31],"surface":[33],"roughness":[34],"found":[36],"to":[37,62,69,88,99,104],"be":[38],"unchanged.":[39],"Polymer":[40],"TFTs":[41],"show":[42],"two":[43],"remarkable":[44],"tendencies":[45],"magnitude":[48],"field-effect":[50,84],"mobility":[51,67,85],"with":[52,102],"increasing":[53],"speed.":[55,108],"up":[61],"2":[63,81],"mm/s,":[64,82],"fieldeffect":[66],"4.72":[70],"cm2V\u22121s\u22121.":[71,90],"However,":[72],"when":[73],"reached":[77],"6":[78],"mm/s":[79],"beyond":[80],"rather":[86],"decreased":[87],"3.18":[89],"The":[91],"threshold":[92],"voltage":[93],"positively":[95],"shifted":[96],"from":[97],"2.09":[98],"8.29":[100],"V":[101],"respect":[103],"increase":[105],"in":[106]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2026-10-22T18:32:59.640997","created_date":"2020-04-24T00:00:00"}