{"id":"https://openalex.org/W3013350371","doi":"https://doi.org/10.1109/icmtma50254.2020.00063","title":"Application in Insulator Infrared Image Denoising with Dual-Tree Complex Wavelet Transform","display_name":"Application in Insulator Infrared Image Denoising with Dual-Tree Complex Wavelet Transform","publication_year":2020,"publication_date":"2020-02-01","ids":{"openalex":"https://openalex.org/W3013350371","doi":"https://doi.org/10.1109/icmtma50254.2020.00063","mag":"3013350371"},"language":"en","primary_location":{"id":"doi:10.1109/icmtma50254.2020.00063","doi":"https://doi.org/10.1109/icmtma50254.2020.00063","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmtma50254.2020.00063","pdf_url":null,"source":{"id":"https://openalex.org/S4363607932","display_name":"International Conference on Measuring Technology and Mechatronics Automation (ICMTMA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 12th International Conference on Measuring Technology and Mechatronics Automation (ICMTMA)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084899622","display_name":"Yubing Chen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yubing Chen","raw_affiliation_strings":["North China Electric Power University International Education Institude, Beijing"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North China Electric Power University International Education Institude, Beijing","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100400043","display_name":"Fang Chen","orcid":"https://orcid.org/0000-0003-4971-8729","observed_orcids":["https://orcid.org/0000-0003-4971-8729","https://orcid.org/0000-0003-1926-3807","https://orcid.org/0000-0002-5319-4334","https://orcid.org/0009-0002-7258-2647","https://orcid.org/0009-0007-6907-5659"]},"institutions":[{"id":"https://openalex.org/I4405281489","display_name":"Changsha Electric Power Technical College","ror":"https://ror.org/04e6rry23","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405281489"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fang Chen","raw_affiliation_strings":["Electric and Engineering Department, Changsha Electric Power Technical College, Changsha Hunan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electric and Engineering Department, Changsha Electric Power Technical College, Changsha Hunan","institution_ids":["https://openalex.org/I4405281489"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"22","issue":null,"first_page":"249","last_page":"252"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/infrared-image-denoising","display_name":"infrared image denoising","score":0.8989999890327454},{"id":"https://openalex.org/keywords/dual-tree-complex-wavelet-transform","display_name":"dual-tree complex wavelet transform","score":0.996999979019165},{"id":"https://openalex.org/keywords/maximum-likelihood-estimation","display_name":"maximum likelihood estimation","score":0.925000011920929},{"id":"https://openalex.org/keywords/low-signal-to-noise-ratio","display_name":"low signal-to-noise ratio","score":0.8529999852180481},{"id":"https://openalex.org/keywords/image-detail-preservation","display_name":"image detail preservation","score":0.7179999947547913}],"concepts":[{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.6219546794891357},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.5626085996627808},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5604426860809326},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5359962582588196},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4671606123447418},{"id":"https://openalex.org/C2777885455","wikidata":"https://www.wikidata.org/wiki/Q5156615","display_name":"Complex wavelet transform","level":5,"score":0.4592743515968323},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.4525063931941986},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4189780354499817},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.41712355613708496},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.40923556685447693},{"id":"https://openalex.org/C155777637","wikidata":"https://www.wikidata.org/wiki/Q2736187","display_name":"Wavelet packet decomposition","level":4,"score":0.32272252440452576},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2534008324146271},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.23830324411392212},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.06567898392677307}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icmtma50254.2020.00063","doi":"https://doi.org/10.1109/icmtma50254.2020.00063","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmtma50254.2020.00063","pdf_url":null,"source":{"id":"https://openalex.org/S4363607932","display_name":"International Conference on Measuring Technology and Mechatronics Automation (ICMTMA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 12th International Conference on Measuring Technology and Mechatronics Automation (ICMTMA)","raw_type":"proceedings-article"},{"id":"mag:3092642215","doi":null,"is_oa":false,"landing_page_url":"https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=202002225422874618","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1967583991","https://openalex.org/W2065391104","https://openalex.org/W2100874022","https://openalex.org/W2119445186","https://openalex.org/W2129276048","https://openalex.org/W2386676498"],"related_works":["https://openalex.org/W2383698272","https://openalex.org/W2383876442","https://openalex.org/W2993395900","https://openalex.org/W2353959741","https://openalex.org/W2770306918","https://openalex.org/W2096799820","https://openalex.org/W2373279758","https://openalex.org/W2368368694","https://openalex.org/W2546250014","https://openalex.org/W2368830893"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,61],"obtain":[3],"a":[4,72,102],"clear":[5],"image":[6,13,29,66,81,91],"and":[7,37],"keep":[8],"the":[9,12,52,63,88,94,105,108],"details":[10],"of":[11,26,90,97,107],"as":[14,16],"complete":[15],"possible,":[17],"it":[18],"has":[19,71],"given":[20],"an":[21],"adaptive":[22,45],"noise":[23,74,98],"reduction":[24,75],"method":[25,41,47,70],"insulator":[27,64,78,110],"infrared":[28,79],"by":[30],"using":[31],"dual":[32],"tree":[33],"complex":[34],"wavelet":[35],"transform(DT-CWT)":[36],"Maximum":[38],"likelihood":[39],"estimation":[40],"based":[42],"on":[43,77],"local":[44],"window(LAWML)":[46],"in":[48],"this":[49],"paper.":[50],"At":[51],"same":[53,95],"time,":[54],"five":[55],"other":[56],"denoising":[57],"methods":[58],"are":[59],"used":[60],"process":[62],"thermal":[65,80],"with":[67,82],"noise.":[68],"The":[69],"good":[73],"effect":[76],"low":[83],"signal-to-noise":[84],"ratio.":[85],"It":[86,100],"ensures":[87],"integrity":[89],"information":[92],"at":[93],"time":[96],"reduction.":[99],"lays":[101],"foundation":[103],"for":[104],"accuracy":[106],"subsequent":[109],"pollution":[111],"level":[112],"identification.":[113]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2020-04-03T00:00:00"}