{"id":"https://openalex.org/W3011979600","doi":null,"title":"High spatial resolution mapping of porous silicon","display_name":"High spatial resolution mapping of porous silicon","publication_year":1993,"publication_date":"1993-01-01","ids":{"openalex":"https://openalex.org/W3011979600","mag":"3011979600"},"language":"en","primary_location":{"id":"mag:3011979600","doi":null,"is_oa":false,"landing_page_url":"https://researchwith.njit.edu/en/publications/high-spatial-resolution-mapping-of-porous-silicon","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019643074","display_name":"E. Ettedgui","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Ettedgui","raw_affiliation_strings":["University of Rochester"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Rochester","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005004006","display_name":"Chuan Xiao Peng","orcid":"https://orcid.org/0000-0002-4513-2491","observed_orcids":["https://orcid.org/0000-0002-4513-2491"]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chuan Peng","raw_affiliation_strings":["University of Rochester"],"raw_orcid":"https://orcid.org/0000-0002-4513-2491","affiliations":[{"raw_affiliation_string":"University of Rochester","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015849938","display_name":"L. Tsybeskov","orcid":"https://orcid.org/0000-0002-4514-6981","observed_orcids":["https://orcid.org/0000-0002-4514-6981"]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Tsybeskov","raw_affiliation_strings":["University of Rochester"],"raw_orcid":"https://orcid.org/0000-0002-4514-6981","affiliations":[{"raw_affiliation_string":"University of Rochester","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057036098","display_name":"Yongli Gao","orcid":"https://orcid.org/0000-0001-9765-5246","observed_orcids":["https://orcid.org/0000-0001-9765-5246"]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yongli Gao","raw_affiliation_strings":["University of Rochester"],"raw_orcid":"https://orcid.org/0000-0001-9765-5246","affiliations":[{"raw_affiliation_string":"University of Rochester","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086529820","display_name":"Philippe M. Fauchet","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Philippe M. Fauchet","raw_affiliation_strings":["University of Rochester"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Rochester","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054560944","display_name":"Gary E. Carver","orcid":"https://orcid.org/0000-0001-8124-3191","observed_orcids":["https://orcid.org/0000-0001-8124-3191"]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gary E. Carver","raw_affiliation_strings":["University of Rochester"],"raw_orcid":"https://orcid.org/0000-0001-8124-3191","affiliations":[{"raw_affiliation_string":"University of Rochester","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048906743","display_name":"Howard A. Mizes","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. A. Mizes","raw_affiliation_strings":["University of Rochester"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Rochester","institution_ids":["https://openalex.org/I5388228"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I5388228"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.4065764,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"173","last_page":"178"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12340","display_name":"Anodic Oxide Films and Nanostructures","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10666","display_name":"Photonic Crystals and Applications","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/porous-silicon","display_name":"porous silicon","score":1.0},{"id":"https://openalex.org/keywords/photoluminescence","display_name":"photoluminescence","score":0.8330000042915344},{"id":"https://openalex.org/keywords/spatially-resolved-photoluminescence","display_name":"spatially resolved photoluminescence","score":0.9750000238418579},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.8009999990463257},{"id":"https://openalex.org/keywords/columnar-microstructure","display_name":"columnar microstructure","score":0.6140000224113464},{"id":"https://openalex.org/keywords/multilayer-film-structure","display_name":"multilayer film structure","score":0.8220000267028809},{"id":"https://openalex.org/keywords/stress-fractures","display_name":"stress fractures","score":0.7350000143051147},{"id":"https://openalex.org/keywords/surface-morphology","display_name":"surface morphology","score":0.6290000081062317},{"id":"https://openalex.org/keywords/n-type-silicon","display_name":"n-type silicon","score":0.5640000104904175},{"id":"https://openalex.org/keywords/growth-conditions","display_name":"growth conditions","score":0.3449999988079071}],"concepts":[{"id":"https://openalex.org/C85080765","wikidata":"https://www.wikidata.org/wiki/Q614893","display_name":"Photoluminescence","level":2,"score":0.804747462272644},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7496855854988098},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.6602123975753784},{"id":"https://openalex.org/C142259097","wikidata":"https://www.wikidata.org/wiki/Q5891314","display_name":"Homogeneity (statistics)","level":2,"score":0.5990580320358276},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.575850784778595},{"id":"https://openalex.org/C2776685891","wikidata":"https://www.wikidata.org/wiki/Q428660","display_name":"Porous silicon","level":3,"score":0.5745546817779541},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.5691512227058411},{"id":"https://openalex.org/C6648577","wikidata":"https://www.wikidata.org/wiki/Q622669","display_name":"Porosity","level":2,"score":0.5566325783729553},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.5403400659561157},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.5384004712104797},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.47764718532562256},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4693288207054138},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.45526909828186035},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4271215796470642},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.38109585642814636},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.36475569009780884},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.328056275844574},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2366640567779541},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.18249976634979248},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05747640132904053},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.056765198707580566},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:3011979600","doi":null,"is_oa":false,"landing_page_url":"https://researchwith.njit.edu/en/publications/high-spatial-resolution-mapping-of-porous-silicon","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2011565895","https://openalex.org/W1971681427","https://openalex.org/W2085263959","https://openalex.org/W2006514059","https://openalex.org/W1974751183","https://openalex.org/W2107616590","https://openalex.org/W7008718222","https://openalex.org/W2327700075","https://openalex.org/W1996451847","https://openalex.org/W2043912917"],"abstract_inverted_index":{"Porous":[0],"silicon":[1],"(PSI)":[2],"samples":[3,96,170],"with":[4,62,97,181],"high":[5],"photoluminescence":[6,23],"(PL)":[7],"efficiency":[8],"were":[9],"examined":[10],"using":[11,146],"microscopic":[12],"mapping":[13],"techniques":[14],"including":[15],"scanning":[16],"election":[17],"microscopy":[18,154],"(SEM)":[19],"and":[20,37,54,99,123,156],"spatially":[21],"resolved":[22],"(SRPL).":[24],"Studies":[25],"of":[26,34,41,49,58,69,78,89,94,106,113,126,137,143,159,162,165,187],"the":[27,32,35,38,42,46,50,67,79,95,102,107,114,121,141,160,185],"growth":[28],"conditions":[29],"indicate":[30],"that":[31,169],"homogeneity":[33],"PL":[36,85,122],"surface":[39,142,161],"roughness":[40],"sample":[43,61,81],"depend":[44],"on":[45,66,86,140,174,184],"preparation":[47],"procedure":[48],"PSI":[51,64,108,115,144,163],"layer.":[52],"SEM":[53,100,147,157],"spatially-resolved":[55],"reflectance":[56],"scans":[57],"an":[59],"n-type":[60],"a":[63,73,87],"layer":[65],"order":[68,186],"100":[70,188],"\u03bcm":[71],"reveal":[72,168],"highly":[74],"fractured":[75],"surface.":[76],"SRPL":[77,98],"same":[80],"shows":[82],"non":[83],"uniform":[84],"scale":[88,177],"5":[90],"\u03bcm.":[91],"Cross-sectional":[92],"analysis":[93],"reveals":[101],"intricate":[103],"multilayer":[104],"structure":[105],"film.":[109],"The":[110],"top":[111],"portion":[112],"film":[116],"is":[117,124],"largely":[118],"responsible":[119],"for":[120],"composed":[125],"isolated":[127],"column-like":[128],"structures.":[129],"We":[130],"have":[131],"also":[132],"observed":[133],"cross-shaped":[134],"structures":[135,183],"reminiscent":[136],"stress":[138],"fractures":[139],"films":[145,164],"or":[148],"optical":[149],"microscopy.":[150],"Furthermore,":[151],"atomic":[152],"force":[153],"(AFM)":[155],"measurements":[158],"intermediate":[166],"thickness":[167],"which":[171],"appear":[172],"smooth":[173],"l\u03bcm":[176],"are":[178],"actually":[179],"covered":[180],"clumped":[182],"to":[189],"150":[190],"nm.":[191]},"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2020-03-23T00:00:00"}