{"id":"https://openalex.org/W3010363380","doi":"https://doi.org/10.1109/rteict46194.2019.9016746","title":"Design and Verification of ECC Scheme to optimize area and tester time in OTP ROM Controller","display_name":"Design and Verification of ECC Scheme to optimize area and tester time in OTP ROM Controller","publication_year":2019,"publication_date":"2019-05-01","ids":{"openalex":"https://openalex.org/W3010363380","doi":"https://doi.org/10.1109/rteict46194.2019.9016746","mag":"3010363380"},"language":"en","primary_location":{"id":"doi:10.1109/rteict46194.2019.9016746","doi":"https://doi.org/10.1109/rteict46194.2019.9016746","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rteict46194.2019.9016746","pdf_url":null,"source":{"id":"https://openalex.org/S4306498424","display_name":"International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082695279","display_name":"H Divva","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4389425378","display_name":"R.V. College of Engineering","ror":"https://ror.org/041re0e60","country_code":"IN","type":"education","lineage":["https://openalex.org/I4389425378"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"H Divva","raw_affiliation_strings":["Department of ECE, R V College of Engineering, Bengaluru 59, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, R V College of Engineering, Bengaluru 59, India","institution_ids":["https://openalex.org/I4389425378"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002438751","display_name":"Arunkumar P Chavan","orcid":"https://orcid.org/0000-0001-8056-8795","observed_orcids":["https://orcid.org/0000-0001-8056-8795"]},"institutions":[{"id":"https://openalex.org/I4389425378","display_name":"R.V. College of Engineering","ror":"https://ror.org/041re0e60","country_code":"IN","type":"education","lineage":["https://openalex.org/I4389425378"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Arunkumar P Chavan","raw_affiliation_strings":["Department of ECE, R V College of Engineering, Bengaluru 59, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, R V College of Engineering, Bengaluru 59, India","institution_ids":["https://openalex.org/I4389425378"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013941527","display_name":"Shubha Krishnamurthy","orcid":"https://orcid.org/0009-0006-8087-7137","observed_orcids":["https://orcid.org/0009-0006-8087-7137"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shubha Krishnamurthy","raw_affiliation_strings":["Qualcomm India Pvt Limited, Bengaluru 48, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm India Pvt Limited, Bengaluru 48, India","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7956,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.70134117,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"151","last_page":"155"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.7387999892234802,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.7387999892234802,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.1289999932050705,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.06199999898672104,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/efuse","display_name":"eFuse","score":0.7979999780654907},{"id":"https://openalex.org/keywords/electromigration","display_name":"electromigration","score":0.7710000276565552},{"id":"https://openalex.org/keywords/forward-error-correction","display_name":"forward error correction","score":0.7839999794960022},{"id":"https://openalex.org/keywords/hamming-codes","display_name":"Hamming codes","score":0.9620000123977661},{"id":"https://openalex.org/keywords/checksums","display_name":"checksums","score":0.9580000042915344},{"id":"https://openalex.org/keywords/reduction-of-area","display_name":"area reduction","score":0.7039999961853027},{"id":"https://openalex.org/keywords/memory-controller-design","display_name":"memory controller design","score":0.39500001072883606}],"concepts":[{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.8669548630714417},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6446936130523682},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6235300302505493},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3735392391681671},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3359241485595703},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2383001446723938},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/rteict46194.2019.9016746","doi":"https://doi.org/10.1109/rteict46194.2019.9016746","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rteict46194.2019.9016746","pdf_url":null,"source":{"id":"https://openalex.org/S4306498424","display_name":"International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1981469302","https://openalex.org/W2068539906","https://openalex.org/W2084569385","https://openalex.org/W2120860473","https://openalex.org/W2142903700","https://openalex.org/W4244254292"],"related_works":["https://openalex.org/W1984706327","https://openalex.org/W1575237072","https://openalex.org/W1977361282","https://openalex.org/W2592569505","https://openalex.org/W1548935572","https://openalex.org/W1520945777","https://openalex.org/W2033062473","https://openalex.org/W2112359095","https://openalex.org/W1565984148","https://openalex.org/W2315545069"],"abstract_inverted_index":{"The":[0,39,62,240],"One":[1,258],"Time":[2,259],"Programmable":[3,260],"ROM":[4],"consists":[5,11],"of":[6,8,12,20,41,50,59,81,83,91,143,169,257,279],"bitcells":[7],"efuse":[9],"which":[10,31,220,231],"programming":[13],"transistor":[14],"and":[15,48,70,106,119,177,197,205,236,247,252,267],"Fuse":[16,24],"Link.":[17],"High":[18],"densities":[19],"current":[21,158,195],"through":[22,36],"the":[23,27,37,57,94,112,144,148,157,190,194,222,234,255,280,289],"link,":[25],"causes":[26],"metal":[28,63],"to":[29,66,78,88,104,124,208],"electromigrate":[30],"creates":[32],"high":[33,162],"resistance":[34,40],"path":[35],"fuse.":[38],"an":[42,203,214],"unblown":[43,95],"fuse":[44,53,128,145,151,228],"is":[45,54,134,192,202,218,282,294],"very":[46,174],"less":[47],"that":[49,139,193,277],"a":[51,79,84,89,120,126,137],"blown":[52,85],"more":[55],"in":[56,93,101,135,291],"order":[58],"kilo":[60],"ohms.":[61],"fuses":[64],"tend":[65],"regrow":[67],"over":[68],"time":[69,238,293],"usage.":[71],"In":[72,211],"digital":[73],"logic,":[74],"this":[75,212],"would":[76],"translate":[77],"value":[80,90],"1":[82,187],"fuse,":[86],"flipping":[87],"0":[92],"state.":[96],"Redundancy":[97],"techniques":[98],"are":[99,184],"used":[100],"OTP":[102],"controller":[103],"correct":[105],"detect":[107],"such":[108,136],"errors.":[109],"It":[110],"borrows":[111],"FEC":[113,198],"63/56":[114],"(Forward":[115],"Error":[116],"Correction)":[117],"scheme":[118,200,217],"shadow":[121,196],"redundancy":[122,224],"technique":[123],"provide":[125],"redundant":[127],"for":[129,244],"every":[130],"regular":[131],"fuse-the":[132],"protection":[133],"way":[138],"even":[140],"if":[141],"one":[142],"bits":[146],"fail,":[147],"other":[149],"good":[150,175],"bit":[152],"will":[153],"help.":[154],"But":[155],"with":[156,226],"stable":[159],"fabrication":[160],"technology,":[161],"Stress":[163],"Test":[164],"samples":[165],"on":[166],"different":[167],"wafers":[168],"various":[170],"technologies":[171],"have":[172],"shown":[173],"yield":[176],"no":[178],"aging":[179],"related":[180],"errors,":[181],"i.e":[182],"errors":[183],"lesser":[185],"than":[186],"ppm.":[188],"Hence":[189],"inference":[191],"ECC":[199,216],"employed":[201],"overkill":[204],"implementation":[206],"need":[207],"be":[209],"reconsidered.":[210],"paper,":[213],"alternative":[215],"developed":[219,251],"provides":[221],"recommended":[223],"support":[225],"fewer":[227],"bits,":[229],"by":[230],"we":[232],"achieve":[233],"area":[235,278],"tester":[237,292],"reduction.":[239],"Register":[241],"Transfer":[242],"Logic":[243],"Hamming":[245],"Code":[246],"Checksum":[248],"has":[249,271],"been":[250,272],"integrated":[253],"into":[254],"architecture":[256],"Read":[261],"Only":[262],"Memory":[263],"Controller.":[264],"Core":[265],"level":[266,269],"chip":[268],"verification":[270],"done.":[273],"Synthesis":[274],"results":[275],"show":[276],"memory":[281],"reduced":[283],"from":[284,295],"0.19":[285],"mm2to":[286],"0.12":[287],"mm2and":[288],"reduction":[290],"1000-1200":[296],"ms.":[297]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2020-03-13T00:00:00"}