{"id":"https://openalex.org/W3009869279","doi":"https://doi.org/10.1109/icaee47123.2019.9015158","title":"Characterization of SnO2 Thin Films Fabricated by Chemical Spray Pyrolysis","display_name":"Characterization of SnO2 Thin Films Fabricated by Chemical Spray Pyrolysis","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3009869279","doi":"https://doi.org/10.1109/icaee47123.2019.9015158","mag":"3009869279"},"language":"en","primary_location":{"id":"doi:10.1109/icaee47123.2019.9015158","doi":"https://doi.org/10.1109/icaee47123.2019.9015158","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icaee47123.2019.9015158","pdf_url":null,"source":{"id":"https://openalex.org/S4363608087","display_name":"International Conference on Advanced Electrical Engineering (ICAEE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on Advanced Electrical Engineering (ICAEE)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079407877","display_name":"Bouteina Bendahmane","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I125485651","display_name":"University Fr\u00e8res Mentouri Constantine 1","ror":"https://ror.org/017wv6808","country_code":"DZ","type":"education","lineage":["https://openalex.org/I125485651"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Bouteina Bendahmane","raw_affiliation_strings":["LEMEAMED Laboratory, Faculty of Science and Technology, Fr\u00e8res Mentouri University, Constantine, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LEMEAMED Laboratory, Faculty of Science and Technology, Fr\u00e8res Mentouri University, Constantine, Algeria","institution_ids":["https://openalex.org/I125485651"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065100379","display_name":"N.H. Touidjen","orcid":"https://orcid.org/0000-0002-2486-4044","observed_orcids":["https://orcid.org/0000-0002-2486-4044"]},"institutions":[{"id":"https://openalex.org/I125485651","display_name":"University Fr\u00e8res Mentouri Constantine 1","ror":"https://ror.org/017wv6808","country_code":"DZ","type":"education","lineage":["https://openalex.org/I125485651"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Nour El Houda Touidjen","raw_affiliation_strings":["LEMEAMED Laboratory, Faculty of Science and Technology, Fr\u00e8res Mentouri University, Constantine, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LEMEAMED Laboratory, Faculty of Science and Technology, Fr\u00e8res Mentouri University, Constantine, Algeria","institution_ids":["https://openalex.org/I125485651"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112227182","display_name":"Farida Mansour","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I125485651","display_name":"University Fr\u00e8res Mentouri Constantine 1","ror":"https://ror.org/017wv6808","country_code":"DZ","type":"education","lineage":["https://openalex.org/I125485651"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Farida Mansour","raw_affiliation_strings":["LEMEAMED Laboratory, Faculty of Science and Technology, Fr\u00e8res Mentouri University, Constantine, Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LEMEAMED Laboratory, Faculty of Science and Technology, Fr\u00e8res Mentouri University, Constantine, Algeria","institution_ids":["https://openalex.org/I125485651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I125485651"],"apc_list":null,"apc_paid":null,"fwci":1.0573,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.70573703,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"10","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9394999742507935,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9394999742507935,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":0.013100000098347664,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.011500000022351742,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sno2-thin-films","display_name":"SnO2 thin films","score":0.9200000166893005},{"id":"https://openalex.org/keywords/sno2","display_name":"SnO2","score":0.9049999713897705},{"id":"https://openalex.org/keywords/spray-pyrolysis","display_name":"spray pyrolysis","score":0.8970000147819519},{"id":"https://openalex.org/keywords/annealing-temperature","display_name":"annealing temperature","score":0.9079999923706055},{"id":"https://openalex.org/keywords/tetragonal-rutile-structure","display_name":"tetragonal rutile structure","score":0.7850000262260437},{"id":"https://openalex.org/keywords/crystallite-size","display_name":"crystallite size","score":0.9549999833106995},{"id":"https://openalex.org/keywords/optical-band-gap","display_name":"optical band gap","score":0.8799999952316284},{"id":"https://openalex.org/keywords/optical-transmittance","display_name":"optical transmittance","score":0.8420000076293945},{"id":"https://openalex.org/keywords/surface-morphology","display_name":"surface morphology","score":0.7609999775886536},{"id":"https://openalex.org/keywords/grain-agglomeration","display_name":"grain agglomeration","score":0.859000027179718},{"id":"https://openalex.org/keywords/n-type-semiconductors","display_name":"n-type semiconductors","score":0.6380000114440918},{"id":"https://openalex.org/keywords/silica-glass-substrate","display_name":"silica glass substrate","score":0.7009999752044678}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7515667676925659},{"id":"https://openalex.org/C137637335","wikidata":"https://www.wikidata.org/wiki/Q899604","display_name":"Crystallite","level":2,"score":0.7480051517486572},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.6420097351074219},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6256797909736633},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.6118878126144409},{"id":"https://openalex.org/C40003534","wikidata":"https://www.wikidata.org/wiki/Q862228","display_name":"Raman spectroscopy","level":2,"score":0.5791500806808472},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.5735881328582764},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.44215941429138184},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.4398636519908905},{"id":"https://openalex.org/C2777889555","wikidata":"https://www.wikidata.org/wiki/Q320603","display_name":"Rutile","level":2,"score":0.42884695529937744},{"id":"https://openalex.org/C2779667129","wikidata":"https://www.wikidata.org/wiki/Q129163","display_name":"Tin dioxide","level":2,"score":0.42404791712760925},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.30330583453178406},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2580697238445282},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.20987582206726074},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.15993237495422363},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.11984682083129883},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.11247751116752625},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.07125464081764221},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.06531962752342224},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icaee47123.2019.9015158","doi":"https://doi.org/10.1109/icaee47123.2019.9015158","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icaee47123.2019.9015158","pdf_url":null,"source":{"id":"https://openalex.org/S4363608087","display_name":"International Conference on Advanced Electrical Engineering (ICAEE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on Advanced Electrical Engineering (ICAEE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1979159380","https://openalex.org/W1981165122","https://openalex.org/W2006568831","https://openalex.org/W2017539496","https://openalex.org/W2043425920","https://openalex.org/W2070061327","https://openalex.org/W2071559017","https://openalex.org/W2075234763","https://openalex.org/W2080114526","https://openalex.org/W2102170242","https://openalex.org/W2108428177","https://openalex.org/W2128491855","https://openalex.org/W2129698919","https://openalex.org/W2132402224","https://openalex.org/W2135231351","https://openalex.org/W2188509477","https://openalex.org/W2331489399","https://openalex.org/W2340209068","https://openalex.org/W2340846716","https://openalex.org/W2469491860","https://openalex.org/W2521107666","https://openalex.org/W2612804982","https://openalex.org/W2761163530","https://openalex.org/W2790081833","https://openalex.org/W2792627810","https://openalex.org/W2954453525","https://openalex.org/W4234503225","https://openalex.org/W4255318648","https://openalex.org/W4285719527","https://openalex.org/W6719764473","https://openalex.org/W6727015780","https://openalex.org/W6765186273"],"related_works":["https://openalex.org/W2484982236","https://openalex.org/W7223012200","https://openalex.org/W3110087917","https://openalex.org/W3110551302","https://openalex.org/W7133885742","https://openalex.org/W2062091560","https://openalex.org/W2975470069","https://openalex.org/W7140042677","https://openalex.org/W4322579657","https://openalex.org/W4281633546"],"abstract_inverted_index":{"In":[0,32],"the":[1,79,144,153,167,219,231,254,280],"last":[2],"few":[3],"years,":[4],"synthesis":[5,290],"of":[6,15,63,75,85,156,162,191,260,283],"inexpensive":[7],"tin":[8,114],"dioxide":[9,115],"films":[10,36,56,86,117,159,176,233,286],"gained":[11],"a":[12,20,28,119],"big":[13],"deal":[14],"interest,":[16],"because":[17],"they":[18],"have":[19,87,224],"large":[21,235],"optical":[22,83,222,236],"band":[23],"gap":[24,237],"(Eg>3":[25],"eV),":[26],"and":[27,68,82,105,263,278],"n-type":[29],"semiconductor":[30],"behavior.":[31],"this":[33,264,272],"work,":[34],"SnO2thin":[35],"were":[37,57,146,193],"deposited":[38,232],"at":[39,61,245],"400":[40,64],"\u00b0C":[41,67,70],"on":[42,78],"Silica":[43],"glass":[44],"(SiO2)":[45],"substrates":[46],"during":[47],"30":[48],"min":[49],"by":[50,136,195,251,268],"spray":[51],"pyrolysis":[52],"technique.":[53],"Then,":[54],"prepared":[55],"annealed":[58,175],"in":[59,166,180,287],"air":[60],"temperatures":[62],"\u00b0C,":[65],"450":[66],"500":[69,246],"for":[71,293],"1h.":[72],"The":[73,124],"effect":[74],"annealing":[76,129,244,261],"treatments":[77],"structural,":[80],"morphological,":[81],"properties":[84],"been":[88],"studied":[89],"using":[90],"X-Ray":[91],"Diffraction":[92],"(XRD),":[93],"Raman":[94,137],"scattering":[95,138],"spectroscopy,":[96],"Scanning":[97],"Electron":[98],"Microscopy":[99,103],"(SEM),":[100],"Atomic":[101],"Force":[102],"(AFM),":[104],"UV-Visible":[106],"spectrophotometry,":[107],"respectively.":[108],"X-ray":[109,198],"diffraction":[110],"patterns":[111],"indicated":[112],"that":[113,143,221,253],"thin":[116,285],"had":[118],"polycrystalline":[120],"tetragonal":[121],"rutile":[122],"structure.":[123],"crystallite":[125],"size":[126],"increases":[127],"with":[128,148,258],"temperature.":[130],"This":[131,248],"study":[132,249],"was":[133,266],"also":[134],"confirmed":[135,267],"characterization.":[139],"Morphological":[140],"analysis":[141],"showed":[142,160,250],"grains":[145],"agglomerated":[147],"an":[149],"island-like":[150],"structure":[151],"over":[152],"entire":[154],"surface":[155],"substrates.":[157],"As-deposited":[158],"agglomerates":[161],"different":[163],"shapes":[164],"varying":[165,182],"range":[168],"0.2":[169],"\u03bcm":[170,185],"-":[171],"1":[172],"\u03bcm,":[173],"while":[174],"revealed":[177,225],"ones":[178],"spherical":[179],"shape":[181],"from":[183,207,210],"0.6":[184],"to":[186,213,276,289],"1.2":[187],"\u03bcm.":[188],"Elementary":[189],"composition":[190],"samples":[192],"observed":[194],"energy":[196],"dispersive":[197],"spectroscopy":[199],"(EDX).":[200],"Root":[201],"Mean":[202],"Squared":[203],"high":[204],"(RMS)":[205],"obtained":[206],"AFM":[208],"decreased":[209],"212":[211],"nm":[212,215],"202":[214],"after":[216,243],"annealing.":[217],"Despite":[218],"fact":[220],"characteristics":[223],"low":[226],"transmittance":[227],"values":[228],"(\u2248":[229],"27%),":[230],"exhibited":[234],"(Eg":[238],"\u2248":[239],"3.75":[240],"eV)":[241],"even":[242],"\u00b0C.":[247],"XRD":[252],"crystallites":[255],"sizes":[256],"increased":[257],"increasing":[259],"temperature":[262],"result":[265],"SEM":[269],"analysis.":[270],"Also,":[271],"work":[273],"can":[274],"help":[275],"improve":[277],"control":[279],"deposition":[281],"parameters":[282],"SnO2sprayed":[284],"order":[288],"promising":[291],"materials":[292],"energy.":[294]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2020-03-13T00:00:00"}