{"id":"https://openalex.org/W3002483643","doi":null,"title":"Development of a Low-Temperature Scanning Field Emission Microscope with Spin Polarization Analysis","display_name":"Development of a Low-Temperature Scanning Field Emission Microscope with Spin Polarization Analysis","publication_year":2019,"publication_date":"2019-08-01","ids":{"openalex":"https://openalex.org/W3002483643","mag":"3002483643"},"language":"en","primary_location":{"id":"mag:3002483643","doi":null,"is_oa":false,"landing_page_url":"https://www.research-collection.ethz.ch/handle/20.500.11850/393443","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067858452","display_name":"Ann\u2010Katrin Thamm","orcid":"https://orcid.org/0000-0002-6601-7783","observed_orcids":["https://orcid.org/0000-0002-6601-7783"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ann\u2010Katrin Thamm","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-6601-7783","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004525042","display_name":"T. Michlmayr","orcid":"https://orcid.org/0000-0001-7120-2337","observed_orcids":["https://orcid.org/0000-0001-7120-2337"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. Michlmayr","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0001-7120-2337","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076824255","display_name":"U. Ramsperger","orcid":"https://orcid.org/0000-0003-4424-2418","observed_orcids":["https://orcid.org/0000-0003-4424-2418"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"U. Ramsperger","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0003-4424-2418","affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5005884566","display_name":"D. Pescia","orcid":"https://orcid.org/0000-0001-7436-418X","observed_orcids":["https://orcid.org/0000-0001-7436-418X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Pescia","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"235","last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.8115000128746033,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.8115000128746033,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.07559999823570251,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.07540000230073929,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-temperature-scanning-electron-microscopy","display_name":"low-temperature scanning electron microscopy","score":0.7480000257492065},{"id":"https://openalex.org/keywords/field-emission-microscopy","display_name":"field emission microscopy","score":0.4169999957084656}],"concepts":[{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.510330855846405},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.5096924304962158},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4576003849506378},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.39634832739830017},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3549438714981079},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.21571403741836548},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:3002483643","doi":null,"is_oa":false,"landing_page_url":"https://www.research-collection.ethz.ch/handle/20.500.11850/393443","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3089244693","https://openalex.org/W167269853","https://openalex.org/W2618949104","https://openalex.org/W6891219587","https://openalex.org/W2287438399","https://openalex.org/W7098837918","https://openalex.org/W2785113326","https://openalex.org/W2901422209","https://openalex.org/W2494467731","https://openalex.org/W1897670644"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T04:12:42.849631","created_date":"2020-01-30T00:00:00"}