{"id":"https://openalex.org/W3000609494","doi":"https://doi.org/10.1063/1.5125062","title":"Quantitative thermal measurement by the use of scanning thermal microscope and resistive thermal probes","display_name":"Quantitative thermal measurement by the use of scanning thermal microscope and resistive thermal probes","publication_year":2020,"publication_date":"2020-01-17","ids":{"openalex":"https://openalex.org/W3000609494","doi":"https://doi.org/10.1063/1.5125062","mag":"3000609494"},"language":"en","primary_location":{"id":"doi:10.1063/1.5125062","doi":"https://doi.org/10.1063/1.5125062","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.5125062","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032240914","display_name":"Jerzy Bodzenta","orcid":"https://orcid.org/0000-0002-9460-3798","observed_orcids":["https://orcid.org/0000-0002-9460-3798"]},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Jerzy Bodzenta","raw_affiliation_strings":["Institute of Physics, Silesian University of Technology 1 , Konarskiego 22B, 44-100 Gliwice, Poland"],"raw_orcid":"https://orcid.org/0000-0002-9460-3798","affiliations":[{"raw_affiliation_string":"Institute of Physics, Silesian University of Technology 1 , Konarskiego 22B, 44-100 Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079052234","display_name":"Anna Ka\u017amierczak-Ba\u0142ata","orcid":"https://orcid.org/0000-0002-3916-4366","observed_orcids":["https://orcid.org/0000-0002-3916-4366"]},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Anna Ka\u017amierczak-Ba\u0142ata","raw_affiliation_strings":["Institute of Physics, Silesian University of Technology 1 , Konarskiego 22B, 44-100 Gliwice, Poland"],"raw_orcid":"https://orcid.org/0000-0002-3916-4366","affiliations":[{"raw_affiliation_string":"Institute of Physics, Silesian University of Technology 1 , Konarskiego 22B, 44-100 Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082035348","display_name":"Kurt Harris","orcid":"https://orcid.org/0000-0002-7288-0882","observed_orcids":["https://orcid.org/0000-0002-7288-0882"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kurt Harris","raw_affiliation_strings":["Flibe Energy, Inc. 2 , 7800 Madison Blvd, Huntsville, Alabama 35806, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Flibe Energy, Inc. 2 , 7800 Madison Blvd, Huntsville, Alabama 35806, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5032240914"],"corresponding_institution_ids":["https://openalex.org/I119004910"],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":1.3622,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.78036325,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"127","issue":"3","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","score":0.8690999746322632,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","score":0.8690999746322632,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.09619999676942825,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.01360000018030405,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scanning-thermal-microscopy","display_name":"scanning thermal microscopy","score":0.9980000257492065},{"id":"https://openalex.org/keywords/thermal-conductivity-measurement","display_name":"thermal conductivity measurement","score":0.8429999947547913},{"id":"https://openalex.org/keywords/thermal-conductance","display_name":"thermal conductance","score":0.6899999976158142},{"id":"https://openalex.org/keywords/interfacial-thermal-resistance","display_name":"interfacial thermal resistance","score":0.9399999976158142},{"id":"https://openalex.org/keywords/temperature-distribution","display_name":"temperature distribution","score":0.8149999976158142},{"id":"https://openalex.org/keywords/heat-flux","display_name":"heat flux","score":0.906000018119812}],"concepts":[{"id":"https://openalex.org/C2776907800","wikidata":"https://www.wikidata.org/wiki/Q9357421","display_name":"Scanning thermal microscopy","level":3,"score":0.9827026724815369},{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.7857087850570679},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.6043941378593445},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.593307375907898},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5625215172767639},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5132553577423096},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.4952453672885895},{"id":"https://openalex.org/C102232406","wikidata":"https://www.wikidata.org/wiki/Q7783035","display_name":"Thermal conductivity measurement","level":3,"score":0.4861838221549988},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4620826244354248},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.4351341724395752},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4263015389442444},{"id":"https://openalex.org/C137693562","wikidata":"https://www.wikidata.org/wiki/Q899628","display_name":"Thermal resistance","level":3,"score":0.42468389868736267},{"id":"https://openalex.org/C172100665","wikidata":"https://www.wikidata.org/wiki/Q7465774","display_name":"Thermal conduction","level":2,"score":0.4216318130493164},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.39708420634269714},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.38969510793685913},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33035072684288025},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2839357256889343},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.17460784316062927},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.08362847566604614},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07804575562477112},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.5125062","doi":"https://doi.org/10.1063/1.5125062","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.5125062","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":106,"referenced_works":["https://openalex.org/W1424021","https://openalex.org/W49569234","https://openalex.org/W617293543","https://openalex.org/W1674528819","https://openalex.org/W1777674503","https://openalex.org/W1860438006","https://openalex.org/W1954676480","https://openalex.org/W1966116564","https://openalex.org/W1966747782","https://openalex.org/W1968494623","https://openalex.org/W1968958402","https://openalex.org/W1969605222","https://openalex.org/W1971788312","https://openalex.org/W1973323361","https://openalex.org/W1976431068","https://openalex.org/W1981210380","https://openalex.org/W1982646499","https://openalex.org/W1987298756","https://openalex.org/W1988782035","https://openalex.org/W1990537846","https://openalex.org/W1991390282","https://openalex.org/W1991718959","https://openalex.org/W1992328011","https://openalex.org/W1994680977","https://openalex.org/W1998875368","https://openalex.org/W2000370597","https://openalex.org/W2001417949","https://openalex.org/W2004206571","https://openalex.org/W2004476250","https://openalex.org/W2008938901","https://openalex.org/W2009957458","https://openalex.org/W2010667775","https://openalex.org/W2012654556","https://openalex.org/W2013173141","https://openalex.org/W2029034047","https://openalex.org/W2031888695","https://openalex.org/W2032695760","https://openalex.org/W2033276893","https://openalex.org/W2033515476","https://openalex.org/W2036784309","https://openalex.org/W2038280177","https://openalex.org/W2038366815","https://openalex.org/W2041962405","https://openalex.org/W2042056247","https://openalex.org/W2042995710","https://openalex.org/W2044568529","https://openalex.org/W2045647932","https://openalex.org/W2046369002","https://openalex.org/W2047261715","https://openalex.org/W2053370613","https://openalex.org/W2055987005","https://openalex.org/W2056415244","https://openalex.org/W2057036132","https://openalex.org/W2057567599","https://openalex.org/W2057742146","https://openalex.org/W2059471165","https://openalex.org/W2066791254","https://openalex.org/W2066821669","https://openalex.org/W2066896114","https://openalex.org/W2068968904","https://openalex.org/W2069200279","https://openalex.org/W2070047387","https://openalex.org/W2070860659","https://openalex.org/W2070944549","https://openalex.org/W2072791426","https://openalex.org/W2077736554","https://openalex.org/W2080059803","https://openalex.org/W2083069940","https://openalex.org/W2086778233","https://openalex.org/W2089889416","https://openalex.org/W2091830839","https://openalex.org/W2093610165","https://openalex.org/W2094240247","https://openalex.org/W2094599071","https://openalex.org/W2098049879","https://openalex.org/W2113016723","https://openalex.org/W2115262483","https://openalex.org/W2119089023","https://openalex.org/W2142707065","https://openalex.org/W2154639772","https://openalex.org/W2156471624","https://openalex.org/W2166475097","https://openalex.org/W2212718842","https://openalex.org/W2221701648","https://openalex.org/W2312880737","https://openalex.org/W2320320203","https://openalex.org/W2324975347","https://openalex.org/W2329323614","https://openalex.org/W2332590376","https://openalex.org/W2413371640","https://openalex.org/W2472129647","https://openalex.org/W2472879889","https://openalex.org/W2553247638","https://openalex.org/W2581612407","https://openalex.org/W2600767236","https://openalex.org/W2743471639","https://openalex.org/W2747679831","https://openalex.org/W2775897852","https://openalex.org/W2809766867","https://openalex.org/W2901386556","https://openalex.org/W2951612134","https://openalex.org/W2969810329","https://openalex.org/W2971910994","https://openalex.org/W3027562185","https://openalex.org/W3104448920","https://openalex.org/W3150248096"],"related_works":["https://openalex.org/W1860438006","https://openalex.org/W2510480815","https://openalex.org/W2119089023","https://openalex.org/W2735291854","https://openalex.org/W2221701648","https://openalex.org/W2969810329","https://openalex.org/W2734207214","https://openalex.org/W2715643174","https://openalex.org/W4366083531","https://openalex.org/W1524168942"],"abstract_inverted_index":{"Scanning":[0],"thermal":[1,9,31,113,126,132,137,148,207],"microscopy":[2,27],"(SThM)":[3],"is":[4,77,88,105,142,162],"the":[5,15,21,30,36,48,58,65,72,75,81,85,91,100,103,112,116,120,123,130,140,144,147,151,178,203,206],"only":[6],"method":[7,19],"for":[8,115,198,224],"measurements":[10,167,227],"providing":[11],"spatial":[12],"resolution":[13],"in":[14,55,99,177],"nanometer":[16],"range.":[17],"The":[18,107,157],"combines":[20],"topographical":[22],"imaging":[23],"of":[24,33,38,146,159,171,195,202,214,217],"atomic":[25],"force":[26],"(AFM)":[28],"with":[29],"characterization":[32,194],"samples":[34],"by":[35],"use":[37],"specially":[39],"designed":[40],"AFM":[41],"probes":[42,196],"having":[43],"a":[44,211],"temperature":[45,59,82,109,172],"sensor":[46],"near":[47],"apex.":[49],"Measurements":[50],"can":[51,154],"be":[52,155],"carried":[53],"out":[54],"two":[56],"modes:":[57],"contrast":[60,67],"(or":[61,68],"passive)":[62],"mode":[63],"and":[64,80,102,122,134,174,205,222],"conductance":[66,114,127],"active)":[69],"mode.":[70],"In":[71,90],"first":[73,190],"mode,":[74,93],"probe":[76,104,108,121],"not":[78],"heated":[79],"distribution":[83,145,173],"on":[84,111,129,150],"sample":[86,101,131,152],"surface":[87,153],"measured.":[89],"second":[92],"there":[94],"are":[95,228],"no":[96],"heat":[97,117,175],"sources":[98],"heated.":[106],"depends":[110,128],"exchange":[118],"between":[119],"sample.":[124],"This":[125,181],"conductivity":[133,149,208],"probe-sample":[135,179],"interfacial":[136],"resistance.":[138],"If":[139],"latter":[141],"constant,":[143],"obtained.":[156],"principle":[158],"qualitative":[160],"SThM":[161,187,225],"quite":[163],"simple.":[164],"However,":[165],"quantitative":[166],"require":[168],"rigorous":[169],"analysis":[170],"fluxes":[176],"system.":[180],"paper":[182],"provides":[183],"basic":[184],"information":[185],"about":[186],"starting":[188],"from":[189],"principles,":[191],"through":[192],"instrumentation,":[193],"used":[197],"measurements,":[199,209],"general":[200],"theory":[201],"temperature,":[204],"to":[210],"few":[212],"examples":[213],"practical":[215],"applications":[216],"this":[218],"method.":[219],"Finally,":[220],"perspectives":[221],"challenges":[223],"based":[226],"discussed.":[229]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2020-01-23T00:00:00"}