{"id":"https://openalex.org/W2998463550","doi":"https://doi.org/10.1109/ictc46691.2019.8939905","title":"Development of Edge-based Deep Learning Prediction Model for Defect Prediction in Manufacturing Process","display_name":"Development of Edge-based Deep Learning Prediction Model for Defect Prediction in Manufacturing Process","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2998463550","doi":"https://doi.org/10.1109/ictc46691.2019.8939905","mag":"2998463550"},"language":"en","primary_location":{"id":"doi:10.1109/ictc46691.2019.8939905","doi":"https://doi.org/10.1109/ictc46691.2019.8939905","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ictc46691.2019.8939905","pdf_url":null,"source":{"id":"https://openalex.org/S4363607740","display_name":"International Conference on Information and Communication Technology Convergence (ICTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on Information and Communication Technology Convergence (ICTC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103061149","display_name":"Kyung-Taek Lee","orcid":"https://orcid.org/0000-0003-3408-4102","observed_orcids":["https://orcid.org/0000-0003-3408-4102"]},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyung-Taek Lee","raw_affiliation_strings":["Korea Electronics Technology Institute, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute, Seoul, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059882287","display_name":"Youn-Sung Lee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youn-Sung Lee","raw_affiliation_strings":["Korea Electronics Technology Institute, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute, Seoul, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033164436","display_name":"Hyoseok Yoon","orcid":"https://orcid.org/0000-0002-9907-0775","observed_orcids":["https://orcid.org/0000-0002-9907-0775"]},"institutions":[{"id":"https://openalex.org/I36738375","display_name":"Hanshin University","ror":"https://ror.org/039fgyk85","country_code":"KR","type":"education","lineage":["https://openalex.org/I36738375"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyoseok Yoon","raw_affiliation_strings":["Division of Computer Engineering, Hanshin University, Osan-si, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Computer Engineering, Hanshin University, Osan-si, Korea","institution_ids":["https://openalex.org/I36738375"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.8646,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.8633822,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"248","last_page":"250"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7070000171661377,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7070000171661377,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.24220000207424164,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14484","display_name":"Technology and Data Analysis","score":0.008799999952316284,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-prediction","display_name":"fault prediction","score":0.9810000061988831},{"id":"https://openalex.org/keywords/edge-computing","display_name":"edge computing","score":0.8960000276565552},{"id":"https://openalex.org/keywords/on-device-inference","display_name":"on-device inference","score":0.6150000095367432},{"id":"https://openalex.org/keywords/convolutional-neural-networks","display_name":"convolutional neural networks","score":0.7509999871253967},{"id":"https://openalex.org/keywords/deep-neural-network","display_name":"deep neural network","score":0.6769999861717224},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"support vector machine","score":0.9869999885559082},{"id":"https://openalex.org/keywords/manufacturing-process-parameters","display_name":"production parameters","score":0.6650000214576721},{"id":"https://openalex.org/keywords/product-quality-prediction","display_name":"product quality prediction","score":0.9079999923706055},{"id":"https://openalex.org/keywords/real-time-defect-detection","display_name":"real-time defect detection","score":0.6570000052452087},{"id":"https://openalex.org/keywords/production-cost-reduction","display_name":"production cost reduction","score":0.8949999809265137}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6639564633369446},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6597233414649963},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.6396628618240356},{"id":"https://openalex.org/C45804977","wikidata":"https://www.wikidata.org/wiki/Q7239673","display_name":"Predictive modelling","level":2,"score":0.5439049005508423},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5427629351615906},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5178504586219788},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.42212191224098206},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.3737175464630127},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33400940895080566},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2490207552909851},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ictc46691.2019.8939905","doi":"https://doi.org/10.1109/ictc46691.2019.8939905","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ictc46691.2019.8939905","pdf_url":null,"source":{"id":"https://openalex.org/S4363607740","display_name":"International Conference on Information and Communication Technology Convergence (ICTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on Information and Communication Technology Convergence (ICTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.7207000255584717,"id":"https://metadata.un.org/sdg/9"}],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2286365479","https://openalex.org/W3154157565"],"related_works":["https://openalex.org/W2961085424","https://openalex.org/W4376453582","https://openalex.org/W4224009465","https://openalex.org/W3147033875","https://openalex.org/W4306674287","https://openalex.org/W4286629047","https://openalex.org/W1568390478","https://openalex.org/W4318612353","https://openalex.org/W4390939596","https://openalex.org/W4389829534"],"abstract_inverted_index":{"In":[0,49,93],"a":[1,98,149],"series":[2],"of":[3,18,25,33,47,55],"lens":[4,21,26],"module":[5,27],"manufacturing":[6,29,41,57,106],"process":[7,12,30,35],"for":[8,126],"mobile":[9],"cameras,":[10],"many":[11,32],"parameters":[13,36,42],"affect":[14],"the":[15,19,56,68,105,110,134],"final":[16],"quality":[17,112,127],"manufactured":[20],"module.":[22],"Defect":[23],"prediction":[24,84,118,128,131,142],"in":[28,82,90],"using":[31,113,120],"these":[34],"can":[37,62],"help":[38],"design":[39],"efficient":[40],"at":[43,51],"an":[44,52],"early":[45,53],"stage":[46,54],"production.":[48],"addition,":[50],"process,":[58],"predicted":[59],"defect":[60,141],"products":[61],"be":[63],"discarded":[64],"without":[65],"going":[66],"to":[67,100,138,144],"next":[69],"stage,":[70],"thereby":[71],"avoiding":[72],"unnecessary":[73],"additional":[74],"costs.":[75],"Many":[76],"existing":[77],"approaches":[78,125],"use":[79],"shallow":[80],"architectures":[81],"their":[83],"models":[85,119],"that":[86,154],"cannot":[87],"learn":[88],"features":[89],"multi-parameters":[91],"sufficiently.":[92],"this":[94],"paper,":[95],"we":[96,147],"propose":[97,148],"method":[99],"improve":[101,145],"productivity":[102],"and":[103,123,151],"reduce":[104],"cost":[107],"by":[108],"predicting":[109],"product":[111],"deep":[114],"learning.":[115],"We":[116],"designed":[117],"SVM,":[121],"DNN":[122],"CNN":[124,130],"where":[129],"model":[132],"showed":[133],"best":[135],"performance.":[136],"Furthermore,":[137],"enable":[139],"real-time":[140],"on-device":[143],"productivity,":[146],"low-cost":[150],"edge-based":[152],"solution":[153],"does":[155],"not":[156],"rely":[157],"on":[158],"expensive":[159],"server":[160],"or":[161],"cloud":[162],"solution.":[163]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2}],"updated_date":"2026-10-05T09:50:58.205359","created_date":"2025-10-10T00:00:00"}