{"id":"https://openalex.org/W2980908400","doi":"https://doi.org/10.1109/memsys.2019.8870821","title":"Statistics-Based Gas Sensor","display_name":"Statistics-Based Gas Sensor","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2980908400","doi":"https://doi.org/10.1109/memsys.2019.8870821","mag":"2980908400"},"language":"en","primary_location":{"id":"doi:10.1109/memsys.2019.8870821","doi":"https://doi.org/10.1109/memsys.2019.8870821","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memsys.2019.8870821","pdf_url":null,"source":{"id":"https://openalex.org/S4210233918","display_name":"IEEE International Conference on Micro Electro Mechanical Systems (MEMS)","issn_l":"1084-6999","issn":["1084-6999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017998494","display_name":"Shakir-ul Haque Khan","orcid":"https://orcid.org/0000-0002-2939-503X","observed_orcids":["https://orcid.org/0000-0002-2939-503X"]},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shakir-ul Haque Khan","raw_affiliation_strings":["Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA","institution_ids":["https://openalex.org/I223532165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065687012","display_name":"Aishwaryadev Banerjee","orcid":"https://orcid.org/0000-0002-4092-7471","observed_orcids":["https://orcid.org/0000-0002-4092-7471"]},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aishwaryadev Banerjee","raw_affiliation_strings":["Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA","institution_ids":["https://openalex.org/I223532165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048594562","display_name":"S. Broadbent","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samuel Broadbent","raw_affiliation_strings":["Department of Chemistry, University of Utah, Salt Lake City, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry, University of Utah, Salt Lake City, Utah, USA","institution_ids":["https://openalex.org/I223532165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043598981","display_name":"Ashrafuzzaman Bulbul","orcid":"https://orcid.org/0000-0002-2462-5115","observed_orcids":["https://orcid.org/0000-0002-2462-5115"]},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ashrafuzzaman Bulbul","raw_affiliation_strings":["Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA","institution_ids":["https://openalex.org/I223532165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057425522","display_name":"Michelle Camilla Simmons","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michelle Camilla Simmons","raw_affiliation_strings":["Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA","institution_ids":["https://openalex.org/I223532165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071580637","display_name":"Kyeong Heon Kim","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kyeong Heon Kim","raw_affiliation_strings":["Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA","institution_ids":["https://openalex.org/I223532165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036324157","display_name":"Carlos H. Mastrangelo","orcid":"https://orcid.org/0000-0002-2039-4698","observed_orcids":["https://orcid.org/0000-0002-2039-4698"]},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carlos H. Mastrangelo","raw_affiliation_strings":["Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA","institution_ids":["https://openalex.org/I223532165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076002630","display_name":"Ryan Looper","orcid":"https://orcid.org/0000-0003-1626-1363","observed_orcids":["https://orcid.org/0000-0003-1626-1363"]},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ryan Looper","raw_affiliation_strings":["Department of Chemistry, University of Utah, Salt Lake City, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Chemistry, University of Utah, Salt Lake City, Utah, USA","institution_ids":["https://openalex.org/I223532165"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031111874","display_name":"Hanseup Kim","orcid":"https://orcid.org/0000-0001-6576-5125","observed_orcids":["https://orcid.org/0000-0001-6576-5125"]},"institutions":[{"id":"https://openalex.org/I223532165","display_name":"University of Utah","ror":"https://ror.org/03r0ha626","country_code":"US","type":"education","lineage":["https://openalex.org/I223532165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hanseup Kim","raw_affiliation_strings":["Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah, USA","institution_ids":["https://openalex.org/I223532165"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I223532165"],"apc_list":null,"apc_paid":null,"fwci":3.5804,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.9408595,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9814000129699707,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9814000129699707,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11667","display_name":"Advanced Chemical Sensor Technologies","score":0.00279999990016222,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.0012000000569969416,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gas-sensors","display_name":"gas sensors","score":0.7559999823570251},{"id":"https://openalex.org/keywords/on-off-switching","display_name":"on-off switching","score":0.6809999942779541},{"id":"https://openalex.org/keywords/sensor-reliability","display_name":"sensor reliability","score":0.8529999852180481},{"id":"https://openalex.org/keywords/sensor-repeatability","display_name":"sensor repeatability","score":0.6159999966621399},{"id":"https://openalex.org/keywords/normally-off-operation","display_name":"normally-off operation","score":0.7570000290870667},{"id":"https://openalex.org/keywords/ultra-low-power","display_name":"ultra-low power","score":0.824999988079071}],"concepts":[{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.6789458990097046},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6091824769973755},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4746164381504059},{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.43424177169799805},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.42687517404556274},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.41663068532943726},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.4129635691642761},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4126882553100586},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.31940555572509766},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2900289297103882},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17868533730506897},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14789193868637085},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/memsys.2019.8870821","doi":"https://doi.org/10.1109/memsys.2019.8870821","is_oa":false,"landing_page_url":"https://doi.org/10.1109/memsys.2019.8870821","pdf_url":null,"source":{"id":"https://openalex.org/S4210233918","display_name":"IEEE International Conference on Micro Electro Mechanical Systems (MEMS)","issn_l":"1084-6999","issn":["1084-6999"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1610677200","https://openalex.org/W1989950657","https://openalex.org/W1995599455","https://openalex.org/W2079296123","https://openalex.org/W2574505519","https://openalex.org/W2615167559","https://openalex.org/W2781776235","https://openalex.org/W4285719527","https://openalex.org/W6738612773"],"related_works":["https://openalex.org/W4285507374","https://openalex.org/W3015445945","https://openalex.org/W3210286539","https://openalex.org/W2492338556","https://openalex.org/W4409142876","https://openalex.org/W2080514166","https://openalex.org/W4405137143","https://openalex.org/W2921399309","https://openalex.org/W4296888843","https://openalex.org/W2896675743"],"abstract_inverted_index":{"This":[0],"paper":[1],"reports":[2],"a":[3,22,58],"new":[4],"proof-of-concept":[5],"gas":[6,14,18,34,60],"sensor":[7,61],"based":[8],"on":[9],"statistical":[10],"behavior":[11,28],"of":[12,21,80,100,128],"multiple":[13,51,66],"molecules.":[15,35],"The":[16,36,88,119],"reported":[17],"sensor,":[19],"consisting":[20],"tiny":[23],"gap,":[24],"provides":[25],"on/off":[26,105],"switching":[27,47],"as":[29,83,85],"it":[30],"captures":[31],"the":[32,41,70,78,81],"target":[33],"key":[37],"innovation":[38],"lies":[39],"in":[40,91,124],"fact":[42],"that":[43],"such":[44],"an":[45],"off/off":[46],"becomes":[48],"statistically-reliable":[49],"when":[50],"gaps":[52,71],"and":[53,76,94,114],"molecules":[54],"are":[55],"utilized.":[56],"Such":[57],"statistics-based":[59,98],"was":[62],"demonstrated":[63],"by":[64],"fabricating":[65],"nano-gap":[67],"arrays,":[68],"coating":[69],"with":[72],"specific":[73],"chemistry":[74],"linkers,":[75],"monitoring":[77],"reliability":[79],"performance":[82],"well":[84],"other":[86],"variables.":[87],"fabricated":[89,120],"sensors":[90,121],"1x1,":[92],"5x5":[93],"9x9":[95],"arrays":[96],"showed":[97],"trends":[99],"(1)":[101],"increasing":[102],"decisiveness":[103],"(sharper":[104],"slopes":[106],"vs.":[107],"concentrations),":[108],"(2)":[109],"decreasing":[110],"failures":[111],"(increasing":[112],"repeatability)":[113],"(3)":[115],"lower":[116],"off-switching":[117],"speed.":[118],"also":[122],"resulted":[123],"(4)":[125],"ultra-low":[126],"power":[127],"due":[129],"to":[130],"normally-off":[131],"operation.":[132]},"counts_by_year":[{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":2}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2019-10-25T00:00:00"}