{"id":"https://openalex.org/W2979558317","doi":"https://doi.org/10.1007/s10836-019-05825-9","title":"RSBST: an Accelerated Automated Software-Based Self-Test Synthesis for Processor Testing","display_name":"RSBST: an Accelerated Automated Software-Based Self-Test Synthesis for Processor Testing","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2979558317","doi":"https://doi.org/10.1007/s10836-019-05825-9","mag":"2979558317"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-019-05825-9","doi":"https://doi.org/10.1007/s10836-019-05825-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05825-9","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-c","cwts-core","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081993397","display_name":"Vasudevan Madampu Suryasarman","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1317621060","display_name":"Indian Institute of Technology Guwahati","ror":"https://ror.org/0022nd079","country_code":"IN","type":"education","lineage":["https://openalex.org/I1317621060"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vasudevan Madampu Suryasarman","raw_affiliation_strings":["Department of Computer Science and Engineering, IIT, Guwahati, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, IIT, Guwahati, India","institution_ids":["https://openalex.org/I1317621060"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052215348","display_name":"Santosh Biswas","orcid":"https://orcid.org/0000-0003-3020-4154","observed_orcids":["https://orcid.org/0000-0003-3020-4154"]},"institutions":[{"id":"https://openalex.org/I1317621060","display_name":"Indian Institute of Technology Guwahati","ror":"https://ror.org/0022nd079","country_code":"IN","type":"education","lineage":["https://openalex.org/I1317621060"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Santosh Biswas","raw_affiliation_strings":["Department of Computer Science and Engineering, IIT, Guwahati, India"],"raw_orcid":"https://orcid.org/0000-0003-3020-4154","affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, IIT, Guwahati, India","institution_ids":["https://openalex.org/I1317621060"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068756243","display_name":"Aryabartta Sahu","orcid":"https://orcid.org/0000-0002-5453-5022","observed_orcids":["https://orcid.org/0000-0002-5453-5022"]},"institutions":[{"id":"https://openalex.org/I1317621060","display_name":"Indian Institute of Technology Guwahati","ror":"https://ror.org/0022nd079","country_code":"IN","type":"education","lineage":["https://openalex.org/I1317621060"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Aryabartta Sahu","raw_affiliation_strings":["Department of Computer Science and Engineering, IIT, Guwahati, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, IIT, Guwahati, India","institution_ids":["https://openalex.org/I1317621060"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5052215348"],"corresponding_institution_ids":["https://openalex.org/I1317621060"],"apc_list":{"value":2690,"currency":"USD","value_usd":2690},"apc_paid":null,"fwci":0.5075,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.69902913,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":94},"biblio":{"volume":"35","issue":"5","first_page":"695","last_page":"714"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.7080000042915344,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.7080000042915344,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.28439998626708984,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.002899999963119626,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/processor-testing","display_name":"processor testing","score":0.9129999876022339},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"fault coverage","score":0.7260000109672546},{"id":"https://openalex.org/keywords/mips-processor","display_name":"MIPS processor","score":0.7110000252723694}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6231764554977417},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.550156831741333},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.5133932828903198},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4952777922153473},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4342363476753235},{"id":"https://openalex.org/C169168650","wikidata":"https://www.wikidata.org/wiki/Q1675637","display_name":"Keyword-driven testing","level":5,"score":0.4256628155708313},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.37103894352912903},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3516243100166321},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.3328840732574463},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32011061906814575},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.21764445304870605},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18352890014648438},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.16458040475845337},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-019-05825-9","doi":"https://doi.org/10.1007/s10836-019-05825-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05825-9","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-c","cwts-core","dongbi-c","jufo-1","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W53227076","https://openalex.org/W1595498733","https://openalex.org/W1603601577","https://openalex.org/W1876406499","https://openalex.org/W1891950198","https://openalex.org/W1965015817","https://openalex.org/W1995595470","https://openalex.org/W1995827686","https://openalex.org/W2010508810","https://openalex.org/W2031110496","https://openalex.org/W2046596625","https://openalex.org/W2057694122","https://openalex.org/W2080434551","https://openalex.org/W2084666366","https://openalex.org/W2099986372","https://openalex.org/W2103363686","https://openalex.org/W2109678242","https://openalex.org/W2111059199","https://openalex.org/W2111785162","https://openalex.org/W2115795793","https://openalex.org/W2120623098","https://openalex.org/W2126042558","https://openalex.org/W2127795505","https://openalex.org/W2133854172","https://openalex.org/W2137064798","https://openalex.org/W2142268541","https://openalex.org/W2155341425","https://openalex.org/W2156278309","https://openalex.org/W2162696040","https://openalex.org/W2166139631","https://openalex.org/W2167273147","https://openalex.org/W2170296906","https://openalex.org/W2293394215","https://openalex.org/W2334801967","https://openalex.org/W2345356835","https://openalex.org/W2561238474","https://openalex.org/W2785444671","https://openalex.org/W2945654400","https://openalex.org/W4234340808","https://openalex.org/W4237548557","https://openalex.org/W4240141845","https://openalex.org/W4242469033"],"related_works":["https://openalex.org/W2945654400","https://openalex.org/W2785444671","https://openalex.org/W2463298697","https://openalex.org/W2126042558","https://openalex.org/W2115386046","https://openalex.org/W2275559829","https://openalex.org/W1985755600","https://openalex.org/W2016407546","https://openalex.org/W2792567960","https://openalex.org/W121821412"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2019-10-18T00:00:00"}