{"id":"https://openalex.org/W2969769202","doi":"https://doi.org/10.1109/vlsi-tsa.2019.8804693","title":"Comprehensive Reliability Study of STT-MRAM Devices and Chips for Last Level Cache Applications (LLC) at 0x Nodes","display_name":"Comprehensive Reliability Study of STT-MRAM Devices and Chips for Last Level Cache Applications (LLC) at 0x Nodes","publication_year":2019,"publication_date":"2019-04-01","ids":{"openalex":"https://openalex.org/W2969769202","doi":"https://doi.org/10.1109/vlsi-tsa.2019.8804693","mag":"2969769202"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-tsa.2019.8804693","doi":"https://doi.org/10.1109/vlsi-tsa.2019.8804693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-tsa.2019.8804693","pdf_url":null,"source":{"id":"https://openalex.org/S7407086210","display_name":"International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Jian Zhu","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jian Zhu","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080388452","display_name":"Yuan-Jen Lee","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuan-Jen Lee","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016194063","display_name":"Huanlong Liu","orcid":"https://orcid.org/0000-0001-8796-7190","observed_orcids":["https://orcid.org/0000-0001-8796-7190"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Huanlong Liu","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076320971","display_name":"Son Le","orcid":"https://orcid.org/0000-0002-3969-0585","observed_orcids":["https://orcid.org/0000-0002-3969-0585"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Son Le","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084041247","display_name":"Jodi M. Iwata-Harms","orcid":"https://orcid.org/0000-0003-0961-4116","observed_orcids":["https://orcid.org/0000-0003-0961-4116"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jodi Iwata-Harms","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101950854","display_name":"Sahil J. Patel","orcid":"https://orcid.org/0009-0008-3256-2258","observed_orcids":["https://orcid.org/0009-0008-3256-2258","https://orcid.org/0000-0001-6702-0653"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sahil Patel","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047220242","display_name":"Ru-Ying Tong","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ru-Ying Tong","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103697304","display_name":"Vignesh Sundar","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Vignesh Sundar","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046876428","display_name":"Santiago Serrano-Guisan","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Santiago Serrano-Guisan","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024513621","display_name":"Dongna Shen","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dongna Shen","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103508880","display_name":"Renren He","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Renren He","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026508039","display_name":"Jesmin Haq","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jesmin Haq","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020124044","display_name":"Jeffrey W. Teng","orcid":"https://orcid.org/0000-0003-1578-3426","observed_orcids":["https://orcid.org/0000-0003-1578-3426"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jeffrey Teng","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"Vinh Lam","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Vinh Lam","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016284258","display_name":"Yi Yang","orcid":"https://orcid.org/0000-0002-1005-2387","observed_orcids":["https://orcid.org/0000-0002-1005-2387"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yi Yang","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100651132","display_name":"Yu-Jen Wang","orcid":"https://orcid.org/0000-0003-1229-3368","observed_orcids":["https://orcid.org/0000-0003-1229-3368"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yu-Jen Wang","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108690430","display_name":"Tom Zhong","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tom Zhong","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108079429","display_name":"Luc Thomas","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Luc Thomas","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103010278","display_name":"Hideaki Fukuzawa","orcid":"https://orcid.org/0000-0002-8306-8523","observed_orcids":["https://orcid.org/0000-0002-8306-8523"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hideaki Fukuzawa","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023943472","display_name":"Guenole Jan","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Guenole Jan","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075741135","display_name":"Po-Kang Wang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Po-Kang Wang","raw_affiliation_strings":["TDK-Headway Technologies, Inc., Milpitas, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TDK-Headway Technologies, Inc., Milpitas, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.691,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.6761872,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"95","issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9564999938011169,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9564999938011169,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.012500000186264515,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.0032999999821186066,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stt-mram","display_name":"STT-MRAM","score":0.9300000071525574},{"id":"https://openalex.org/keywords/magnetic-tunnel-junctions","display_name":"magnetic tunnel junctions","score":0.781000018119812},{"id":"https://openalex.org/keywords/soft-breakdown","display_name":"soft breakdown","score":0.9760000109672546},{"id":"https://openalex.org/keywords/hard-breakdown","display_name":"hard breakdown","score":1.0},{"id":"https://openalex.org/keywords/write-margin","display_name":"write margin","score":0.8679999709129333},{"id":"https://openalex.org/keywords/resistance-area-product","display_name":"resistance-area product","score":0.8840000033378601},{"id":"https://openalex.org/keywords/endurance","display_name":"endurance","score":0.5709999799728394},{"id":"https://openalex.org/keywords/last-level-cache","display_name":"last-level cache","score":0.8149999976158142},{"id":"https://openalex.org/keywords/sram-replacement","display_name":"SRAM replacement","score":0.8920000195503235},{"id":"https://openalex.org/keywords/device-reliability","display_name":"device reliability","score":0.675000011920929},{"id":"https://openalex.org/keywords/chip-reliability","display_name":"chip reliability","score":0.5180000066757202}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.9165648221969604},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.759446382522583},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6079186797142029},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.5866634249687195},{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.5370259881019592},{"id":"https://openalex.org/C152909973","wikidata":"https://www.wikidata.org/wiki/Q7804816","display_name":"Time-dependent gate oxide breakdown","level":5,"score":0.519163966178894},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4676135778427124},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.4674058258533478},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.4112865924835205},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40267422795295715},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39099323749542236},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.325761616230011},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.32095932960510254},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.2659359574317932},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2353501319885254},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23508352041244507},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1997251808643341},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15959885716438293},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.11732086539268494},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0988788902759552},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.07464078068733215},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06966811418533325},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.06529441475868225},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2361726","wikidata":"https://www.wikidata.org/wiki/Q5527031","display_name":"Gate oxide","level":4,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-tsa.2019.8804693","doi":"https://doi.org/10.1109/vlsi-tsa.2019.8804693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-tsa.2019.8804693","pdf_url":null,"source":{"id":"https://openalex.org/S7407086210","display_name":"International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2023789407"],"related_works":["https://openalex.org/W1980459528","https://openalex.org/W2584580867","https://openalex.org/W3161514139","https://openalex.org/W1985887979","https://openalex.org/W2945507128","https://openalex.org/W2518635392","https://openalex.org/W1927295660","https://openalex.org/W1495468309","https://openalex.org/W2014178805","https://openalex.org/W7157992698"],"abstract_inverted_index":{"To":[0],"consider":[1],"STT-MRAM":[2,23],"as":[3],"an":[4],"SRAM":[5],"replacement,":[6],"the":[7,10,39,60,64,69,75],"reliability":[8,84],"of":[9,20,22,42,49,74],"MTJ":[11],"devices":[12,44],"has":[13],"to":[14,62,86],"be":[15],"demonstrated.":[16],"A":[17],"comprehensive":[18],"study":[19],"degradation":[21],"magnetic":[24],"tunnel":[25,76],"junction":[26],"barrier":[27],"under":[28],"stress":[29],"is":[30,36],"presented":[31],"in":[32],"this":[33],"paper.":[34],"It":[35],"found":[37],"that":[38],"breakdown":[40,51,56],"mechanism":[41],"such":[43],"follows":[45],"a":[46],"consistent":[47],"path":[48],"soft":[50],"(SBD)":[52],"followed":[53],"by":[54,67],"hard":[55],"(HBD).":[57],"We":[58],"discuss":[59],"strategy":[61],"improve":[63],"write":[65],"margin":[66],"reducing":[68],"resistance":[70],"area":[71],"product":[72],"(RA)":[73],"barrier.":[77],"Finally,":[78],"we":[79],"link":[80],"our":[81,92],"single":[82],"device":[83],"studies":[85,89],"similar":[87],"endurance":[88],"performed":[90],"on":[91],"fully":[93],"functional":[94],"chips.":[95]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-10-29T09:56:32.521200","created_date":"2019-08-29T00:00:00"}