{"id":"https://openalex.org/W2965536596","doi":"https://doi.org/10.1017/s1431927619004215","title":"Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy \u2013 Scanning Electrochemical Microscopy (SICM-SECM)","display_name":"Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy \u2013 Scanning Electrochemical Microscopy (SICM-SECM)","publication_year":2019,"publication_date":"2019-08-01","ids":{"openalex":"https://openalex.org/W2965536596","doi":"https://doi.org/10.1017/s1431927619004215","mag":"2965536596"},"language":"en","primary_location":{"id":"doi:10.1017/s1431927619004215","doi":"https://doi.org/10.1017/s1431927619004215","is_oa":true,"landing_page_url":"https://doi.org/10.1017/s1431927619004215","pdf_url":"https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E716A8582C108E5D50074976FEF4472D/S1431927619004215a.pdf/div-class-title-simultaneous-topographical-and-electrochemical-mapping-using-scanning-ion-conductance-microscopy-scanning-electrochemical-microscopy-sicm-secm-div.pdf","source":{"id":"https://openalex.org/S98208149","display_name":"Microscopy and Microanalysis","issn_l":"1431-9276","issn":["1431-9276","1435-8115"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311648","host_organization_name":"Oxford University Press","host_organization_lineage":["https://openalex.org/P4310311648","https://openalex.org/P4310311647"],"host_organization_lineage_names":["Oxford University Press","University of Oxford"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microscopy and Microanalysis","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E716A8582C108E5D50074976FEF4472D/S1431927619004215a.pdf/div-class-title-simultaneous-topographical-and-electrochemical-mapping-using-scanning-ion-conductance-microscopy-scanning-electrochemical-microscopy-sicm-secm-div.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026349516","display_name":"Gabriela Mendoza","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Gabriela Mendoza","raw_affiliation_strings":["Park Systems, Reforma Latino, Ciudad de Mexico, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Park Systems, Reforma Latino, Ciudad de Mexico, Mexico","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060006336","display_name":"Byong Kim","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Byong Kim","raw_affiliation_strings":["Park Systems, Inc., Olcott St., Santa Clara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Park Systems, Inc., Olcott St., Santa Clara, CA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065172637","display_name":"Keibock Lee","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Keibock Lee","raw_affiliation_strings":["Park Systems, Inc., Olcott St., Santa Clara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Park Systems, Inc., Olcott St., Santa Clara, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5026349516"],"corresponding_institution_ids":[],"apc_list":{"value":2980,"currency":"USD","value_usd":2980},"apc_paid":null,"fwci":0.2473,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.38007011,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":"25","issue":"S2","first_page":"696","last_page":"697"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scanning-ion-conductance-microscopy","display_name":"scanning ion conductance microscopy","score":0.968999981880188},{"id":"https://openalex.org/keywords/scanning-electrochemical-microscopy","display_name":"scanning electrochemical microscopy","score":0.9959999918937683},{"id":"https://openalex.org/keywords/ion-sensitive-microelectrodes","display_name":"ion-sensitive microelectrodes","score":0.46700000762939453},{"id":"https://openalex.org/keywords/surface-topography","display_name":"surface topography","score":0.5559999942779541},{"id":"https://openalex.org/keywords/electrochemical-imaging","display_name":"electrochemical imaging","score":0.5529999732971191}],"concepts":[{"id":"https://openalex.org/C2779266040","wikidata":"https://www.wikidata.org/wiki/Q7430065","display_name":"Scanning electrochemical microscopy","level":4,"score":0.9787996411323547},{"id":"https://openalex.org/C16777580","wikidata":"https://www.wikidata.org/wiki/Q7430068","display_name":"Scanning ion-conductance microscopy","level":4,"score":0.7521870136260986},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.5999457240104675},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.571652889251709},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.5660721659660339},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.5307350754737854},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3492366075515747},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.3078017830848694},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3060210943222046},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.2445698082447052},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.22471770644187927},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.14426147937774658},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.05494576692581177},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.04114377498626709},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1017/s1431927619004215","doi":"https://doi.org/10.1017/s1431927619004215","is_oa":true,"landing_page_url":"https://doi.org/10.1017/s1431927619004215","pdf_url":"https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E716A8582C108E5D50074976FEF4472D/S1431927619004215a.pdf/div-class-title-simultaneous-topographical-and-electrochemical-mapping-using-scanning-ion-conductance-microscopy-scanning-electrochemical-microscopy-sicm-secm-div.pdf","source":{"id":"https://openalex.org/S98208149","display_name":"Microscopy and Microanalysis","issn_l":"1431-9276","issn":["1431-9276","1435-8115"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311648","host_organization_name":"Oxford University Press","host_organization_lineage":["https://openalex.org/P4310311648","https://openalex.org/P4310311647"],"host_organization_lineage_names":["Oxford University Press","University of Oxford"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microscopy and Microanalysis","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1017/s1431927619004215","doi":"https://doi.org/10.1017/s1431927619004215","is_oa":true,"landing_page_url":"https://doi.org/10.1017/s1431927619004215","pdf_url":"https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E716A8582C108E5D50074976FEF4472D/S1431927619004215a.pdf/div-class-title-simultaneous-topographical-and-electrochemical-mapping-using-scanning-ion-conductance-microscopy-scanning-electrochemical-microscopy-sicm-secm-div.pdf","source":{"id":"https://openalex.org/S98208149","display_name":"Microscopy and Microanalysis","issn_l":"1431-9276","issn":["1431-9276","1435-8115"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311648","host_organization_name":"Oxford University Press","host_organization_lineage":["https://openalex.org/P4310311648","https://openalex.org/P4310311647"],"host_organization_lineage_names":["Oxford University Press","University of Oxford"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microscopy and Microanalysis","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2965536596.pdf","grobid_xml":"https://content.openalex.org/works/W2965536596.grobid-xml"},"referenced_works_count":4,"referenced_works":["https://openalex.org/W1983684958","https://openalex.org/W2077813193","https://openalex.org/W2128302263","https://openalex.org/W2518818208"],"related_works":["https://openalex.org/W2255761310","https://openalex.org/W3036988713","https://openalex.org/W2024290901","https://openalex.org/W1969357101","https://openalex.org/W2506078453","https://openalex.org/W3012225970","https://openalex.org/W2266992495","https://openalex.org/W3111106264","https://openalex.org/W2316698458","https://openalex.org/W2754250204"],"abstract_inverted_index":{"Gabriela":[0],"Mendoza,":[1],"Byong":[2],"Kim,":[3],"Keibock":[4],"Lee;":[5],"Simultaneous":[6],"Topographical":[7],"and":[8],"Electrochemical":[9],"Mapping":[10],"using":[11],"Scanning":[12,17],"Ion":[13],"Conductance":[14],"Microscopy":[15],"\u2013":[16],"Electroche":[18]},"counts_by_year":[{"year":2022,"cited_by_count":2}],"updated_date":"2026-09-08T07:41:39.490200","created_date":"2019-08-13T00:00:00"}