{"id":"https://openalex.org/W2965033748","doi":null,"title":"See the E-Waste! Training Visual Intelligence to See Dense Circuit Boards for Recycling","display_name":"See the E-Waste! Training Visual Intelligence to See Dense Circuit Boards for Recycling","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2965033748","mag":"2965033748"},"language":"en","primary_location":{"id":"mag:2965033748","doi":null,"is_oa":false,"landing_page_url":"https://openaccess.thecvf.com/content_CVPRW_2019/papers/cv4gc/Jahanian_See_the_E-Waste_Training_Visual_Intelligence_to_See_Dense_Circuit_CVPRW_2019_paper.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4210176548","display_name":"IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings","issn_l":"1063-6919","issn":["1063-6919","2332-564X","2575-7075"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Computer Vision and Pattern Recognition","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006710857","display_name":"Ali Jahanian","orcid":"https://orcid.org/0000-0003-2292-4135","observed_orcids":["https://orcid.org/0000-0003-2292-4135"]},"institutions":[{"id":"https://openalex.org/I48379061","display_name":"Shahid Beheshti University","ror":"https://ror.org/0091vmj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I48379061"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Ali Jahanian","raw_affiliation_strings":["Shahid Beheshti University, Tehran, Iran"],"raw_orcid":"https://orcid.org/0000-0003-2292-4135","affiliations":[{"raw_affiliation_string":"Shahid Beheshti University, Tehran, Iran","institution_ids":["https://openalex.org/I48379061"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002849078","display_name":"Quang Hoai Le","orcid":"https://orcid.org/0000-0003-3832-9525","observed_orcids":["https://orcid.org/0000-0003-3832-9525"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Quang Hoai Le","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0003-3832-9525","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086271665","display_name":"Kamal Youcef\u2010Toumi","orcid":"https://orcid.org/0000-0001-6755-1534","observed_orcids":["https://orcid.org/0000-0001-6755-1534"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kamal Youcef\u2010Toumi","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, United States"],"raw_orcid":"https://orcid.org/0000-0001-6755-1534","affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, United States","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056458774","display_name":"Dzmitry Tsetserukou","orcid":"https://orcid.org/0000-0001-8055-5345","observed_orcids":["https://orcid.org/0000-0001-8055-5345"]},"institutions":[{"id":"https://openalex.org/I125989756","display_name":"Skolkovo Institute of Science and Technology","ror":"https://ror.org/03f9nc143","country_code":"RU","type":"education","lineage":["https://openalex.org/I125989756"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Dzmitry Tsetserukou","raw_affiliation_strings":["Skolkovo Institute of Science and Technology, Skolkovo, Russia"],"raw_orcid":"https://orcid.org/0000-0001-8055-5345","affiliations":[{"raw_affiliation_string":"Skolkovo Institute of Science and Technology, Skolkovo, Russia","institution_ids":["https://openalex.org/I125989756"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0652,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.77732735,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"0","last_page":"0"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12017","display_name":"Recycling and Waste Management Techniques","score":0.9643999934196472,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Waste Management and Disposal"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12017","display_name":"Recycling and Waste Management Techniques","score":0.9643999934196472,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Waste Management and Disposal"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.02239999920129776,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.008100000210106373,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-waste","display_name":"electronic waste","score":0.6930000185966492},{"id":"https://openalex.org/keywords/visual-intelligence","display_name":"visual intelligence","score":0.652999997138977},{"id":"https://openalex.org/keywords/recycling","display_name":"recycling","score":0.44600000977516174},{"id":"https://openalex.org/keywords/image-classification","display_name":"image classification","score":0.38999998569488525},{"id":"https://openalex.org/keywords/e-waste-recycling","display_name":"e-waste recycling","score":0.5680000185966492}],"concepts":[{"id":"https://openalex.org/C2777211547","wikidata":"https://www.wikidata.org/wiki/Q17141490","display_name":"Training (meteorology)","level":2,"score":0.6239603757858276},{"id":"https://openalex.org/C2910637783","wikidata":"https://www.wikidata.org/wiki/Q205821","display_name":"Circuit training","level":2,"score":0.5085254907608032},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49864840507507324},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.4150840640068054},{"id":"https://openalex.org/C99508421","wikidata":"https://www.wikidata.org/wiki/Q2678675","display_name":"Physical medicine and rehabilitation","level":1,"score":0.14301612973213196},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10819852352142334},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.10293322801589966},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2965033748","doi":null,"is_oa":false,"landing_page_url":"https://openaccess.thecvf.com/content_CVPRW_2019/papers/cv4gc/Jahanian_See_the_E-Waste_Training_Visual_Intelligence_to_See_Dense_Circuit_CVPRW_2019_paper.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4210176548","display_name":"IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings","issn_l":"1063-6919","issn":["1063-6919","2332-564X","2575-7075"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Computer Vision and Pattern Recognition","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.833299994468689,"id":"https://metadata.un.org/sdg/12"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W105270443","https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W1901129140","https://openalex.org/W1903029394","https://openalex.org/W1910619957","https://openalex.org/W1910657905","https://openalex.org/W2102605133","https://openalex.org/W2103504761","https://openalex.org/W2194775991","https://openalex.org/W2508741746","https://openalex.org/W2565639579","https://openalex.org/W2605482930","https://openalex.org/W2755304890","https://openalex.org/W2962872526","https://openalex.org/W2963150697","https://openalex.org/W2963307106","https://openalex.org/W2963857746","https://openalex.org/W3021180345"],"related_works":["https://openalex.org/W7167511209","https://openalex.org/W4402425760","https://openalex.org/W4410644765","https://openalex.org/W2962982450","https://openalex.org/W3209247633","https://openalex.org/W4413063275","https://openalex.org/W4389636008","https://openalex.org/W3137498650","https://openalex.org/W7166649762","https://openalex.org/W6987242415"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2}],"updated_date":"2026-11-01T11:40:01.658920","created_date":"2019-08-13T00:00:00"}