{"id":"https://openalex.org/W2962490973","doi":"https://doi.org/10.1080/03772063.2019.1637788","title":"Impact of Interconnect Spacing on Crosstalk for Multi-layered Graphene Nanoribbon","display_name":"Impact of Interconnect Spacing on Crosstalk for Multi-layered Graphene Nanoribbon","publication_year":2019,"publication_date":"2019-07-11","ids":{"openalex":"https://openalex.org/W2962490973","doi":"https://doi.org/10.1080/03772063.2019.1637788","mag":"2962490973"},"language":"en","primary_location":{"id":"doi:10.1080/03772063.2019.1637788","doi":"https://doi.org/10.1080/03772063.2019.1637788","is_oa":false,"landing_page_url":"https://doi.org/10.1080/03772063.2019.1637788","pdf_url":null,"source":{"id":"https://openalex.org/S158263287","display_name":"IETE Journal of Research","issn_l":"0377-2063","issn":["0377-2063","0974-780X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IETE Journal of Research","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056882970","display_name":"Vijay Rao Kumbhare","orcid":"https://orcid.org/0000-0001-6941-2933","observed_orcids":["https://orcid.org/0000-0001-6941-2933"]},"institutions":[{"id":"https://openalex.org/I188963388","display_name":"International Institute of Information Technology","ror":"https://ror.org/02dernx73","country_code":"IN","type":"education","lineage":["https://openalex.org/I188963388"]},{"id":"https://openalex.org/I4387155265","display_name":"International Institute of Information Technology","ror":"https://ror.org/016kfyg29","country_code":"IN","type":"facility","lineage":["https://openalex.org/I4387155265"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Vijay Rao Kumbhare","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology","Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology, Naya Raipur 493 661, Chhattisgarh, India"],"raw_orcid":"https://orcid.org/0000-0001-6941-2933","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology","institution_ids":["https://openalex.org/I188963388","https://openalex.org/I4387155265"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology, Naya Raipur 493 661, Chhattisgarh, India","institution_ids":["https://openalex.org/I4387155265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027079487","display_name":"Punya Prasanna Paltani","orcid":"https://orcid.org/0000-0003-3848-2132","observed_orcids":["https://orcid.org/0000-0003-3848-2132"]},"institutions":[{"id":"https://openalex.org/I188963388","display_name":"International Institute of Information Technology","ror":"https://ror.org/02dernx73","country_code":"IN","type":"education","lineage":["https://openalex.org/I188963388"]},{"id":"https://openalex.org/I4387155265","display_name":"International Institute of Information Technology","ror":"https://ror.org/016kfyg29","country_code":"IN","type":"facility","lineage":["https://openalex.org/I4387155265"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Punya Prasanna Paltani","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology","Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology, Naya Raipur 493 661, Chhattisgarh, India"],"raw_orcid":"https://orcid.org/0000-0003-3848-2132","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology","institution_ids":["https://openalex.org/I188963388","https://openalex.org/I4387155265"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology, Naya Raipur 493 661, Chhattisgarh, India","institution_ids":["https://openalex.org/I4387155265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028265686","display_name":"Manoj Kumar Majumder","orcid":"https://orcid.org/0000-0002-6928-8191","observed_orcids":["https://orcid.org/0000-0002-6928-8191"]},"institutions":[{"id":"https://openalex.org/I188963388","display_name":"International Institute of Information Technology","ror":"https://ror.org/02dernx73","country_code":"IN","type":"education","lineage":["https://openalex.org/I188963388"]},{"id":"https://openalex.org/I4387155265","display_name":"International Institute of Information Technology","ror":"https://ror.org/016kfyg29","country_code":"IN","type":"facility","lineage":["https://openalex.org/I4387155265"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manoj Kumar Majumder","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology","Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology, Naya Raipur 493 661, Chhattisgarh, India"],"raw_orcid":"https://orcid.org/0000-0002-6928-8191","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology","institution_ids":["https://openalex.org/I188963388","https://openalex.org/I4387155265"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Dr. Shyama Prasad Mukherjee International Institute of Information Technology, Naya Raipur 493 661, Chhattisgarh, India","institution_ids":["https://openalex.org/I4387155265"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5056882970"],"corresponding_institution_ids":["https://openalex.org/I188963388","https://openalex.org/I4387155265"],"apc_list":null,"apc_paid":null,"fwci":1.1021,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.72780042,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"68","issue":"2","first_page":"1064","last_page":"1073"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.28049999475479126,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.28049999475479126,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.16300000250339508,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.12460000067949295,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crosstalk","display_name":"crosstalk","score":0.890999972820282},{"id":"https://openalex.org/keywords/interconnect-delay","display_name":"interconnect delay","score":0.7139999866485596},{"id":"https://openalex.org/keywords/multiconductor-transmission-line-model","display_name":"multi-conductor transmission line model","score":0.9100000262260437},{"id":"https://openalex.org/keywords/coupling-capacitance","display_name":"coupling capacitance","score":0.9750000238418579},{"id":"https://openalex.org/keywords/equivalent-circuit-model","display_name":"equivalent circuit model","score":0.9049999713897705},{"id":"https://openalex.org/keywords/14-nm-technology-node","display_name":"14 nm technology node","score":0.7760000228881836}],"concepts":[{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.7545086145401001},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.611214280128479},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.592200517654419},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.5636475086212158},{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.5314202308654785},{"id":"https://openalex.org/C30080830","wikidata":"https://www.wikidata.org/wiki/Q169917","display_name":"Graphene","level":2,"score":0.4896607995033264},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47764623165130615},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.4673210680484772},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.44507113099098206},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.43405666947364807},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3067448139190674},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2612731158733368},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.22235152125358582},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19712942838668823},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18196141719818115},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1459294557571411},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/03772063.2019.1637788","doi":"https://doi.org/10.1080/03772063.2019.1637788","is_oa":false,"landing_page_url":"https://doi.org/10.1080/03772063.2019.1637788","pdf_url":null,"source":{"id":"https://openalex.org/S158263287","display_name":"IETE Journal of Research","issn_l":"0377-2063","issn":["0377-2063","0974-780X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IETE Journal of Research","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5378999710083008,"display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W170913323","https://openalex.org/W1504719809","https://openalex.org/W1968721958","https://openalex.org/W1972548120","https://openalex.org/W1985700440","https://openalex.org/W1986198500","https://openalex.org/W1989853749","https://openalex.org/W1997231270","https://openalex.org/W2018817566","https://openalex.org/W2025516544","https://openalex.org/W2026167865","https://openalex.org/W2034786938","https://openalex.org/W2045956059","https://openalex.org/W2059878167","https://openalex.org/W2072261845","https://openalex.org/W2072295327","https://openalex.org/W2081615948","https://openalex.org/W2125098229","https://openalex.org/W2146597111","https://openalex.org/W2151714550","https://openalex.org/W2155709168","https://openalex.org/W2160019980","https://openalex.org/W2239744244","https://openalex.org/W2312863266","https://openalex.org/W2317094662","https://openalex.org/W2461756996","https://openalex.org/W2513018297","https://openalex.org/W2910597419"],"related_works":["https://openalex.org/W2910597419","https://openalex.org/W1554156716","https://openalex.org/W2581385437","https://openalex.org/W2543848250","https://openalex.org/W2256964806","https://openalex.org/W2922275459","https://openalex.org/W2807881643","https://openalex.org/W3106879579","https://openalex.org/W2909431526","https://openalex.org/W1551902604"],"abstract_inverted_index":{"In":[0],"the":[1,5,16,20,28,42,68,83,87,99,107,110,125,132,149],"recent":[2],"research":[3],"world,":[4],"overall":[6,126],"system":[7],"performance":[8],"primarily":[9],"depends":[10],"on":[11,36],"interconnect":[12,119],"delay":[13,18,40,108,127],"instead":[14],"of":[15,25,70,95,112,156],"gate":[17],"at":[19,50,141],"nanoscale":[21],"regime.":[22],"The":[23],"impact":[24],"spacing":[26,81],"between":[27,82],"lines":[29],"and":[30,39,73,80,114,128,138],"shrinking":[31],"technology":[32,145],"are":[33,134],"rigorously":[34],"investigated":[35],"peak":[37,115,129],"noise":[38,116,130],"under":[41,109,131],"crosstalk":[43,113,133],"for":[44,117,152],"rough-edged":[45,55,157],"multi-layered":[46],"graphene":[47],"nanoribbon":[48],"(MLGNR)":[49],"global":[51,160],"lengths.":[52],"Using":[53,121],"a":[54,57,153],"MLGNR,":[56],"multi-conductor":[58],"transmission":[59],"line":[60],"(MTL)":[61],"model":[62,90,102],"is":[63,103],"accurately":[64],"demonstrated":[65],"by":[66,136],"considering":[67],"effect":[69],"coupling":[71],"capacitance":[72],"inter-layer":[74],"tunnelling":[75],"conductance.":[76],"By":[77],"incorporating":[78],"lengths":[79],"coupled":[84,118],"MLGNR":[85,158],"interconnect,":[86],"equivalent":[88,101],"electrical":[89],"exhibits":[91],"an":[92],"insignificant":[93],"error":[94],"0.91%":[96],"only.":[97],"Moreover,":[98],"proposed":[100],"used":[104],"to":[105,148],"demonstrate":[106],"influence":[111],"lines.":[120],"industry":[122],"standard":[123],"HSPICE,":[124],"reduced":[135],"45.1%":[137],"9%,":[139],"respectively":[140],"advanced":[142],"14":[143],"nm":[144,151],"in":[146],"comparison":[147],"32":[150],"fixed":[154],"layer":[155],"based":[159],"VLSI":[161],"interconnects.":[162]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":3}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2019-07-23T00:00:00"}