{"id":"https://openalex.org/W2952552279","doi":"https://doi.org/10.1063/1.5095485","title":"Precise measurement of absolute Seebeck coefficient from Thomson effect using ac-dc technique","display_name":"Precise measurement of absolute Seebeck coefficient from Thomson effect using ac-dc technique","publication_year":2019,"publication_date":"2019-06-01","ids":{"openalex":"https://openalex.org/W2952552279","doi":"https://doi.org/10.1063/1.5095485","mag":"2952552279"},"language":"en","primary_location":{"id":"doi:10.1063/1.5095485","doi":"https://doi.org/10.1063/1.5095485","is_oa":true,"landing_page_url":"https://doi.org/10.1063/1.5095485","pdf_url":null,"source":{"id":"https://openalex.org/S189917590","display_name":"AIP Advances","issn_l":"2158-3226","issn":["2158-3226"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","ki-jl-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"AIP Advances","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1063/1.5095485","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024388326","display_name":"Yasutaka Amagai","orcid":"https://orcid.org/0000-0001-6816-8158","observed_orcids":["https://orcid.org/0000-0001-6816-8158"]},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]},{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Amagai","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan"],"raw_orcid":"https://orcid.org/0000-0001-6816-8158","affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"raw_affiliation_string":"2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan","institution_ids":["https://openalex.org/I135598925"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058816884","display_name":"Takeshi SHIMAZAKI","orcid":"https://orcid.org/0000-0003-4923-9525","observed_orcids":["https://orcid.org/0000-0003-4923-9525"]},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]},{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Shimazaki","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"raw_affiliation_string":"2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan","institution_ids":["https://openalex.org/I135598925"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023586429","display_name":"Kenjiro Okawa","orcid":"https://orcid.org/0000-0001-5324-594X","observed_orcids":["https://orcid.org/0000-0001-5324-594X"]},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]},{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Okawa","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan"],"raw_orcid":"https://orcid.org/0000-0001-5324-594X","affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"raw_affiliation_string":"2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan","institution_ids":["https://openalex.org/I135598925"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073180314","display_name":"Hiroyuki Fujiki","orcid":"https://orcid.org/0000-0001-6472-6693","observed_orcids":["https://orcid.org/0000-0001-6472-6693"]},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]},{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Fujiki","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"raw_affiliation_string":"2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan","institution_ids":["https://openalex.org/I135598925"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056157714","display_name":"Tatsuya Kawae","orcid":"https://orcid.org/0000-0002-6925-7897","observed_orcids":["https://orcid.org/0000-0002-6925-7897"]},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]},{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Kawae","raw_affiliation_strings":["Kyushu University Department of Applied Quantum Physics 2 , Fukuoka 819-0395, Japan","1National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu University Department of Applied Quantum Physics 2 , Fukuoka 819-0395, Japan","institution_ids":["https://openalex.org/I135598925"]},{"raw_affiliation_string":"1National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba 305-8563, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089866154","display_name":"Nobu\u2010Hisa Kaneko","orcid":"https://orcid.org/0000-0003-3857-7940","observed_orcids":["https://orcid.org/0000-0003-3857-7940"]},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]},{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N.-H. Kaneko","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ) 1 , Tsukuba 305-8563, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"raw_affiliation_string":"2Kyushu University Department of Applied Quantum Physics, Fukuoka 819-0395, Japan","institution_ids":["https://openalex.org/I135598925"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1350,"currency":"USD","value_usd":1350},"apc_paid":{"value":1350,"currency":"USD","value_usd":1350},"fwci":0.763,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.6329001,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"9","issue":"6","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.921999990940094},{"id":"https://openalex.org/keywords/thomson-effect","display_name":"Thomson effect","score":0.9129999876022339},{"id":"https://openalex.org/keywords/thermoelectric-materials","display_name":"thermoelectric materials","score":0.9430000185966492},{"id":"https://openalex.org/keywords/platinum","display_name":"platinum","score":0.6150000095367432},{"id":"https://openalex.org/keywords/joule-heating","display_name":"Joule heating","score":0.6940000057220459},{"id":"https://openalex.org/keywords/heat-loss-correction","display_name":"heat loss correction","score":0.8999999761581421},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.7829999923706055},{"id":"https://openalex.org/keywords/electrical-resistance","display_name":"electrical resistance","score":0.550000011920929},{"id":"https://openalex.org/keywords/thermocouples","display_name":"thermocouples","score":0.6579999923706055}],"concepts":[{"id":"https://openalex.org/C112625512","wikidata":"https://www.wikidata.org/wiki/Q1091448","display_name":"Seebeck coefficient","level":3,"score":0.7788064479827881},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.760789692401886},{"id":"https://openalex.org/C168068576","wikidata":"https://www.wikidata.org/wiki/Q190241","display_name":"Thermocouple","level":2,"score":0.7186124920845032},{"id":"https://openalex.org/C106889404","wikidata":"https://www.wikidata.org/wiki/Q6294587","display_name":"Joule effect","level":3,"score":0.641678512096405},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.6157140135765076},{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.5738633275032043},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5227320790290833},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.4922248423099518},{"id":"https://openalex.org/C207365445","wikidata":"https://www.wikidata.org/wiki/Q15020929","display_name":"Thermoelectric materials","level":3,"score":0.4879557490348816},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4697425961494446},{"id":"https://openalex.org/C117926987","wikidata":"https://www.wikidata.org/wiki/Q210009","display_name":"Joule heating","level":2,"score":0.46817582845687866},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.45474717020988464},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3494011461734772},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.286622017621994},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24862024188041687},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.10244050621986389},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1063/1.5095485","doi":"https://doi.org/10.1063/1.5095485","is_oa":true,"landing_page_url":"https://doi.org/10.1063/1.5095485","pdf_url":null,"source":{"id":"https://openalex.org/S189917590","display_name":"AIP Advances","issn_l":"2158-3226","issn":["2158-3226"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","ki-jl-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"AIP Advances","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a425faef771840cf801aba59d6974341","doi":null,"is_oa":true,"landing_page_url":"https://doaj.org/article/a425faef771840cf801aba59d6974341","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"AIP Advances, Vol 9, Iss 6, Pp 065312-065312-6 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1063/1.5095485","doi":"https://doi.org/10.1063/1.5095485","is_oa":true,"landing_page_url":"https://doi.org/10.1063/1.5095485","pdf_url":null,"source":{"id":"https://openalex.org/S189917590","display_name":"AIP Advances","issn_l":"2158-3226","issn":["2158-3226"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","ki-jl-1","norway-1","oarl","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"AIP Advances","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G2966873934","display_name":"Development of Novel Measurement Method for Absolute Seebeck Coefficient","funder_award_id":"15K21659","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320322093","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1966212087","https://openalex.org/W1971057916","https://openalex.org/W1973558699","https://openalex.org/W1992195043","https://openalex.org/W1993916849","https://openalex.org/W1994560194","https://openalex.org/W1996770345","https://openalex.org/W2024014027","https://openalex.org/W2033930290","https://openalex.org/W2053888723","https://openalex.org/W2074202603","https://openalex.org/W2891812940","https://openalex.org/W4254618394"],"related_works":["https://openalex.org/W2515287535","https://openalex.org/W1998133243","https://openalex.org/W4412915768","https://openalex.org/W2111296319","https://openalex.org/W2891812940","https://openalex.org/W3151323306","https://openalex.org/W2390191966","https://openalex.org/W2053888723","https://openalex.org/W2316585776","https://openalex.org/W2035390424"],"abstract_inverted_index":{"The":[0,13,117,182],"Seebeck":[1,15],"coefficient":[2,16],"is":[3,23,167,188,216],"the":[4,20,31,34,44,58,65,84,100,114,121,129,134,137,195,199,203,207],"most":[5,168],"widely":[6,169],"measured":[7,138],"property":[8],"specific":[9],"to":[10,26,46,125,211],"thermoelectric":[11],"materials.":[12],"absolute":[14],"S":[17,62,150,184],"determined":[18],"from":[19,43,194],"Thomson":[21,66,200],"effect":[22,67,201],"highly":[24],"sensitive":[25],"systematic":[27],"errors":[28],"incurred":[29],"in":[30],"determination":[32],"of":[33,61,106,120,136,152,161,179,186],"material":[35],"thermal":[36,89],"conductivity":[37,90],"and":[38,40,78,91,102,109,144,205],"geometry":[39,92],"heat":[41,122,126],"loss":[42,123],"sample":[45],"surroundings":[47],"caused":[48,112],"by":[49,99,113],"temperature":[50,110,139,160],"differences.":[51],"Here,":[52],"we":[53],"report":[54],"a":[55,159,172],"technique":[56,73],"for":[57,86,141,164],"precision":[59],"measurement":[60,208],"based":[63],"on":[64],"using":[68,198],"an":[69,149,175,212],"ac-dc":[70],"technique.":[71],"This":[72],"utilizes":[74],"accurate":[75,88],"equivalent-amplitude":[76],"ac":[77,143],"dc":[79,145],"currents,":[80],"which":[81,166,215],"can":[82,96],"eliminate":[83],"need":[85],"acquiring":[87],"values.":[93],"These":[94],"parameters":[95,105],"be":[97],"replaced":[98],"precisely":[101],"readily":[103],"measurable":[104],"electrical":[107],"resistance":[108],"changes":[111,140],"Joule":[115],"effect.":[116],"correction":[118],"term":[119],"owing":[124],"transfer":[127],"via":[128],"thermocouple":[130],"vanishes":[131],"upon":[132],"calculating":[133],"ratio":[135],"both":[142],"excitations.":[146],"We":[147],"obtain":[148],"value":[151,185],"-4.8":[153],"\u03bcV/K":[154,157],"\u00b1":[155],"0.2":[156],"at":[158],"300":[162],"K":[163],"platinum,":[165],"used":[170],"as":[171],"reference,":[173],"with":[174,191],"expanded":[176],"relative":[177],"uncertainty":[178,209],"4%":[180],"(2\u03c3).":[181],"obtained":[183,193],"Pt":[187],"closely":[189],"consistent":[190],"that":[192],"conventional":[196],"method":[197],"within":[202],"uncertainty,":[204],"importantly,":[206],"improves":[210],"acceptable":[213],"level,":[214],"four":[217],"times":[218],"more":[219],"precise.":[220]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2019-06-27T00:00:00"}