{"id":"https://openalex.org/W2950072095","doi":"https://doi.org/10.1109/access.2019.2923316","title":"Single and Sequential Sampling Plans for Multi-Attribute Products and Multi-Class Lot in Reliability Test","display_name":"Single and Sequential Sampling Plans for Multi-Attribute Products and Multi-Class Lot in Reliability Test","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2950072095","doi":"https://doi.org/10.1109/access.2019.2923316","mag":"2950072095"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2923316","doi":"https://doi.org/10.1109/access.2019.2923316","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2923316","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08737712.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["anvur-scientific","cwts-core","doaj","jufo-1","ki-jl-1","norway-1","oarl","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08737712.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004981099","display_name":"Xian Qiong Zhao","orcid":"https://orcid.org/0000-0002-5674-1663","observed_orcids":["https://orcid.org/0000-0002-5674-1663"]},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xian Zhao","raw_affiliation_strings":["School of Management and Economics, Beijing Institute of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-5674-1663","affiliations":[{"raw_affiliation_string":"School of Management and Economics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100420080","display_name":"Siqi Wang","orcid":"https://orcid.org/0000-0002-8134-9508","observed_orcids":["https://orcid.org/0000-0002-8134-9508","https://orcid.org/0009-0003-1479-3072","https://orcid.org/0009-0003-6773-0120"]},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siqi Wang","raw_affiliation_strings":["School of Management and Economics, Beijing Institute of Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Management and Economics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100318677","display_name":"Leping Sun","orcid":"https://orcid.org/0000-0002-2460-1949","observed_orcids":["https://orcid.org/0000-0002-2460-1949"]},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Leping Sun","raw_affiliation_strings":["School of Management and Economics, Beijing Institute of Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Management and Economics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I125839683"],"apc_list":{"value":1750,"currency":"USD","value_usd":1750},"apc_paid":{"value":1750,"currency":"USD","value_usd":1750},"fwci":1.1739,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.81591131,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"7","issue":null,"first_page":"81145","last_page":"81155"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.8550000190734863,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.8550000190734863,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.08609999716281891,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.006599999964237213,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-sampling-plan","display_name":"single sampling plan","score":0.8629999756813049},{"id":"https://openalex.org/keywords/sequential-sampling-plans","display_name":"sequential sampling plans","score":0.996999979019165},{"id":"https://openalex.org/keywords/reliability-testing","display_name":"reliability testing","score":0.8669999837875366},{"id":"https://openalex.org/keywords/finite-markov-chain-imbedding","display_name":"finite Markov chain imbedding","score":0.8550000190734863},{"id":"https://openalex.org/keywords/sampling-plan-design","display_name":"sampling plan design","score":0.8230000138282776}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7125469446182251},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6726558208465576},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6628610491752625},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.6289608478546143},{"id":"https://openalex.org/C2776505523","wikidata":"https://www.wikidata.org/wiki/Q4785468","display_name":"Plan (archaeology)","level":2,"score":0.6045407056808472},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.5942753553390503},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.5713406205177307},{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.5638184547424316},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5512802600860596},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5114854574203491},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.37419670820236206},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23290392756462097},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.2291940152645111},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22793525457382202},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.14764124155044556},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12170520424842834},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2923316","doi":"https://doi.org/10.1109/access.2019.2923316","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2923316","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08737712.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["anvur-scientific","cwts-core","doaj","jufo-1","ki-jl-1","norway-1","oarl","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:8d7195368e9e425d939dca1b274f7350","doi":null,"is_oa":true,"landing_page_url":"https://doaj.org/article/8d7195368e9e425d939dca1b274f7350","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 81145-81155 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2923316","doi":"https://doi.org/10.1109/access.2019.2923316","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2923316","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08737712.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["anvur-scientific","cwts-core","doaj","jufo-1","ki-jl-1","norway-1","oarl","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"id":"https://metadata.un.org/sdg/9","score":0.4699999988079071,"display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[{"id":"https://openalex.org/G7646931856","display_name":"\u591a\u7b49\u7ea7\u6279\u8d28\u91cf\u8ba1\u6570\u62bd\u6837\u68c0\u9a8c\u7406\u8bba\u4e0e\u65b9\u6cd5\u7814\u7a76","funder_award_id":"71572014","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2950072095.pdf","grobid_xml":"https://content.openalex.org/works/W2950072095.grobid-xml"},"referenced_works_count":32,"referenced_works":["https://openalex.org/W193959474","https://openalex.org/W202333686","https://openalex.org/W344409084","https://openalex.org/W1587704223","https://openalex.org/W1786260784","https://openalex.org/W1967288153","https://openalex.org/W1980544768","https://openalex.org/W1988469986","https://openalex.org/W1988725147","https://openalex.org/W1998477131","https://openalex.org/W2018790486","https://openalex.org/W2023252602","https://openalex.org/W2036427829","https://openalex.org/W2051145716","https://openalex.org/W2099758246","https://openalex.org/W2100172060","https://openalex.org/W2186894208","https://openalex.org/W2267175877","https://openalex.org/W2319359198","https://openalex.org/W2334003991","https://openalex.org/W2776759394","https://openalex.org/W2792533535","https://openalex.org/W2796819551","https://openalex.org/W2803201668","https://openalex.org/W2810313597","https://openalex.org/W2900610074","https://openalex.org/W2902178350","https://openalex.org/W2908467252","https://openalex.org/W2909601745","https://openalex.org/W3011881808","https://openalex.org/W3015829885","https://openalex.org/W6775454472"],"related_works":["https://openalex.org/W2973657036","https://openalex.org/W2334003991","https://openalex.org/W2053627152","https://openalex.org/W182986643","https://openalex.org/W2466348281","https://openalex.org/W2186894208","https://openalex.org/W4236112915","https://openalex.org/W4285124790","https://openalex.org/W2913062067","https://openalex.org/W2071929216"],"abstract_inverted_index":{"Reliability":[0],"tests":[1],"are":[2,125,133,146,153],"always":[3],"conducted":[4],"to":[5,33,55,87],"evaluate":[6],"and":[7,25,50,60,80,95,102,113,120,148],"improve":[8],"the":[9,17,35,58,61,68,76,107,137,149,161],"reliability":[10,36],"of":[11,37,109],"critical":[12],"engineering":[13,38],"equipment.":[14],"Considering":[15],"that":[16],"one":[18,47],"hundred":[19],"percent":[20],"inspection":[21],"is":[22,31,53],"too":[23],"expensive":[24],"time-consuming,":[26],"an":[27],"effective":[28],"sampling":[29,97,118,123,157],"plan":[30,119,124,158],"required":[32],"assess":[34],"products.":[39],"Generally,":[40],"a":[41,116,121],"product":[42,59],"usually":[43],"has":[44],"more":[45],"than":[46],"quality":[48],"characteristic,":[49],"sometimes":[51],"it":[52],"necessary":[54],"classify":[56],"both":[57],"lot":[62,82],"into":[63],"multiple":[64],"classes.":[65],"However,":[66],"in":[67,89,106],"previous":[69],"research,":[70],"very":[71],"few":[72],"scholars":[73],"have":[74],"considered":[75],"multi-attribute":[77,100],"multi-category":[78],"products":[79,101,112],"multi-class":[81,103],"simultaneously.":[83],"This":[84],"paper":[85],"aims":[86],"fill":[88],"this":[90],"gap":[91],"by":[92,135,159],"proposing":[93],"single":[94,117],"sequential":[96,122],"plans":[98],"for":[99,155],"lot.":[104],"Specifically,":[105],"case":[108],"two-attribute":[110],"three-category":[111],"three-class":[114],"lot,":[115],"presented,":[126],"respectively.":[127],"The":[128],"extended":[129],"operating":[130,162],"characteristic":[131,163],"functions":[132],"derived":[134],"using":[136],"finite":[138],"Markov":[139],"chain":[140],"imbedding":[141],"approach.":[142],"Two":[143],"designing":[144],"methods":[145],"proposed":[147],"corresponding":[150],"optimization":[151],"models":[152],"constructed":[154],"each":[156],"analyzing":[160],"surfaces.":[164]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3}],"updated_date":"2026-10-24T09:50:30.924529","created_date":"2019-06-27T00:00:00"}