{"id":"https://openalex.org/W2947528232","doi":"https://doi.org/10.1109/apec.2019.8721888","title":"Cancellation of Leakage Currents through Power Module Baseplate Capacitance","display_name":"Cancellation of Leakage Currents through Power Module Baseplate Capacitance","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2947528232","doi":"https://doi.org/10.1109/apec.2019.8721888","mag":"2947528232"},"language":"en","primary_location":{"id":"doi:10.1109/apec.2019.8721888","doi":"https://doi.org/10.1109/apec.2019.8721888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apec.2019.8721888","pdf_url":null,"source":{"id":"https://openalex.org/S4210177957","display_name":"Conference proceedings/Conference proceedings - IEEE Applied Power Electronics Conference and Exposition","issn_l":"1048-2334","issn":["1048-2334","2470-6647"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Applied Power Electronics Conference and Exposition (APEC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013323957","display_name":"Aaron D. Brovont","orcid":"https://orcid.org/0000-0003-3171-8042","observed_orcids":["https://orcid.org/0000-0003-3171-8042"]},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aaron D. Brovont","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054233675","display_name":"Andrew N. Lemmon","orcid":"https://orcid.org/0000-0002-3934-3735","observed_orcids":["https://orcid.org/0000-0002-3934-3735"]},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew N. Lemmon","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054955948","display_name":"Christopher D. New","orcid":"https://orcid.org/0000-0002-1182-9039","observed_orcids":["https://orcid.org/0000-0002-1182-9039"]},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christopher New","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089814042","display_name":"Blake W. Nelson","orcid":"https://orcid.org/0000-0003-3167-2398","observed_orcids":["https://orcid.org/0000-0003-3167-2398"]},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Blake W. Nelson","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055507066","display_name":"Brian T. DeBoi","orcid":"https://orcid.org/0000-0002-3774-990X","observed_orcids":["https://orcid.org/0000-0002-3774-990X"]},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brian T. DeBoi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Alabama, Tuscaloosa, AL, USA","institution_ids":["https://openalex.org/I17301866"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I17301866"],"apc_list":null,"apc_paid":null,"fwci":1.9802,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.84832708,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"527","last_page":"533"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.0044999998062849045,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/common-mode-leakage-current","display_name":"common-mode leakage current","score":0.8180000185966492},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductors","display_name":"wide bandgap semiconductors","score":0.9559999704360962},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"electromagnetic compatibility","score":0.5950000286102295},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"electromagnetic interference","score":0.5460000038146973},{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"parasitic capacitance","score":0.765999972820282},{"id":"https://openalex.org/keywords/compensating-capacitors","display_name":"compensating capacitors","score":0.8399999737739563},{"id":"https://openalex.org/keywords/multi-chip-power-modules","display_name":"multi-chip power modules","score":0.7919999957084656}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7303460240364075},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6735977530479431},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.5627106428146362},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.556943953037262},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5423593521118164},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.5356158018112183},{"id":"https://openalex.org/C189714311","wikidata":"https://www.wikidata.org/wiki/Q1530371","display_name":"Common-mode signal","level":4,"score":0.5031532645225525},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.48800650238990784},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4598688781261444},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3911479115486145},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3617110550403595},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3208954930305481},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2536298632621765},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21834903955459595},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.06301349401473999},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.0},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/apec.2019.8721888","doi":"https://doi.org/10.1109/apec.2019.8721888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/apec.2019.8721888","pdf_url":null,"source":{"id":"https://openalex.org/S4210177957","display_name":"Conference proceedings/Conference proceedings - IEEE Applied Power Electronics Conference and Exposition","issn_l":"1048-2334","issn":["1048-2334","2470-6647"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Applied Power Electronics Conference and Exposition (APEC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1513208538","https://openalex.org/W1546076600","https://openalex.org/W1936860086","https://openalex.org/W1958732636","https://openalex.org/W1980768991","https://openalex.org/W2041799510","https://openalex.org/W2071583789","https://openalex.org/W2086397266","https://openalex.org/W2104340804","https://openalex.org/W2113285975","https://openalex.org/W2113500488","https://openalex.org/W2114330130","https://openalex.org/W2114692364","https://openalex.org/W2137177335","https://openalex.org/W2168882421","https://openalex.org/W2407611874","https://openalex.org/W2562037026","https://openalex.org/W2562521052","https://openalex.org/W2565030360","https://openalex.org/W2728197854","https://openalex.org/W2765702588","https://openalex.org/W2766235784","https://openalex.org/W2768972240","https://openalex.org/W2770804862","https://openalex.org/W2783927809","https://openalex.org/W6677319568"],"related_works":["https://openalex.org/W2978932302","https://openalex.org/W4388819686","https://openalex.org/W4386057877","https://openalex.org/W2803053899","https://openalex.org/W3185402250","https://openalex.org/W2770804862","https://openalex.org/W4407316589","https://openalex.org/W4390416153","https://openalex.org/W4310803297","https://openalex.org/W4405718156"],"abstract_inverted_index":{"The":[0,146],"fast":[1],"edge":[2],"rates":[3],"achievable":[4],"by":[5,102,120],"wide-bandgap":[6],"semiconductors":[7],"can":[8,24,95],"produce":[9],"significant":[10],"common-mode":[11,22,38,56],"leakage":[12,81,93],"currents":[13,23],"through":[14,83],"the":[15,49,63,66,71,75,80,84,88,112,133,157],"baseplates":[16],"of":[17,36,51,65,107,123,136,160],"encompassing":[18],"power":[19,46,140],"modules.":[20],"Such":[21],"lead":[25],"to":[26,132,151],"elevated":[27],"electromagnetic":[28],"signatures.":[29],"This":[30],"paper":[31],"provides":[32],"a":[33,41,52,104,121,137,143],"theoretical":[34],"treatment":[35],"this":[37,92,161],"behavior":[39,159],"for":[40,111],"typical":[42],"SiC":[43],"half-bridge":[44,53,144],"multi-chip":[45,139],"module":[47,72,85,141],"in":[48,126,153],"context":[50],"inverter.":[54,145],"A":[55],"equivalent":[57],"model":[58,89,147],"is":[59],"produced":[60],"that":[61,78,91],"identifies":[62],"distribution":[64,106],"parasitic":[67],"baseplate":[68,109],"capacitance":[69,110],"across":[70],"terminals":[73,135],"as":[74],"principal":[76],"factor":[77],"controls":[79],"current":[82,94],"baseplate.":[86],"Furthermore,":[87],"predicts":[90],"be":[96,152],"manipulated":[97],"and":[98],"even":[99],"canceled":[100],"out":[101],"achieving":[103],"prescribed":[105],"said":[108],"system":[113],"under":[114],"investigation.":[115],"These":[116],"predictions":[117,148],"are":[118,130,149],"validated":[119],"set":[122],"empirical":[124],"studies":[125],"which":[127],"compensating":[128],"capacitors":[129],"affixed":[131],"external":[134],"commercial":[138],"comprising":[142],"shown":[150],"good":[154],"agreement":[155],"with":[156],"measured":[158],"system.":[162]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2019-06-07T00:00:00"}