{"id":"https://openalex.org/W2940314599","doi":"https://doi.org/10.1186/s40679-019-0065-1","title":"Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope","display_name":"Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope","publication_year":2019,"publication_date":"2019-03-09","ids":{"openalex":"https://openalex.org/W2940314599","doi":"https://doi.org/10.1186/s40679-019-0065-1","mag":"2940314599"},"language":"en","primary_location":{"id":"doi:10.1186/s40679-019-0065-1","doi":"https://doi.org/10.1186/s40679-019-0065-1","is_oa":true,"landing_page_url":"https://doi.org/10.1186/s40679-019-0065-1","pdf_url":"https://ascimaging.springeropen.com/track/pdf/10.1186/s40679-019-0065-1","source":{"id":"https://openalex.org/S3035757904","display_name":"Advanced Structural and Chemical Imaging","issn_l":"2198-0926","issn":["2198-0926"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Structural and Chemical Imaging","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ascimaging.springeropen.com/track/pdf/10.1186/s40679-019-0065-1","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056291574","display_name":"Cheng Sun","orcid":"https://orcid.org/0000-0001-9540-1509","observed_orcids":["https://orcid.org/0000-0001-9540-1509"]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Cheng Sun","raw_affiliation_strings":["Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Karlsruhe, Germany","Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Engesserstr. 7, 76131, Karlsruhe, Germany"],"raw_orcid":"https://orcid.org/0000-0001-9540-1509","affiliations":[{"raw_affiliation_string":"Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Engesserstr. 7, 76131, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013020798","display_name":"Erich Max M\u00fcller","orcid":"https://orcid.org/0000-0002-6048-0005","observed_orcids":["https://orcid.org/0000-0002-6048-0005"]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Erich M\u00fcller","raw_affiliation_strings":["Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Karlsruhe, Germany","Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Engesserstr. 7, 76131, Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Engesserstr. 7, 76131, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001422219","display_name":"Matthias Meffert","orcid":"https://orcid.org/0000-0001-5637-9791","observed_orcids":["https://orcid.org/0000-0001-5637-9791"]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Matthias Meffert","raw_affiliation_strings":["Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Karlsruhe, Germany","Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Engesserstr. 7, 76131, Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Engesserstr. 7, 76131, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029790706","display_name":"Dagmar Gerthsen","orcid":"https://orcid.org/0000-0003-2406-5805","observed_orcids":["https://orcid.org/0000-0003-2406-5805"]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dagmar Gerthsen","raw_affiliation_strings":["Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Karlsruhe, Germany","Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Engesserstr. 7, 76131, Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Laboratorium f\u00fcr Elektronenmikroskopie, Karlsruher Institut f\u00fcr Technologie (KIT), Engesserstr. 7, 76131, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5056291574"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":{"value":1350,"currency":"USD","value_usd":1350},"apc_paid":{"value":880,"currency":"EUR","value_usd":949},"fwci":2.6481,"has_fulltext":true,"cited_by_count":47,"citation_normalized_percentile":{"value":0.91272345,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"5","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.00989999994635582,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.003100000089034438,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crystal-defects","display_name":"crystal defects","score":0.7720000147819519},{"id":"https://openalex.org/keywords/dislocations","display_name":"dislocations","score":0.9909999966621399},{"id":"https://openalex.org/keywords/stacking-faults","display_name":"stacking faults","score":0.9990000128746033},{"id":"https://openalex.org/keywords/scanning-transmission-electron-microscopy","display_name":"scanning transmission electron microscopy","score":0.925000011920929},{"id":"https://openalex.org/keywords/scanning-electron-microscopy","display_name":"scanning electron microscopy","score":0.7419999837875366},{"id":"https://openalex.org/keywords/gan","display_name":"GaN","score":0.7509999871253967},{"id":"https://openalex.org/keywords/burgers-vector","display_name":"Burgers vector","score":0.9639999866485596},{"id":"https://openalex.org/keywords/displacement-vectors","display_name":"displacement vectors","score":0.9200000166893005},{"id":"https://openalex.org/keywords/reciprocity-theorem","display_name":"reciprocity theorem","score":0.7609999775886536},{"id":"https://openalex.org/keywords/specimen-orientation","display_name":"specimen orientation","score":0.4749999940395355},{"id":"https://openalex.org/keywords/ccd-detector","display_name":"CCD detector","score":0.8569999933242798}],"concepts":[{"id":"https://openalex.org/C193016168","wikidata":"https://www.wikidata.org/wiki/Q874835","display_name":"Scanning transmission electron microscopy","level":3,"score":0.8583278059959412},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6877200603485107},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.6677886247634888},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.6042253971099854},{"id":"https://openalex.org/C33347731","wikidata":"https://www.wikidata.org/wiki/Q285210","display_name":"Stacking","level":2,"score":0.5975306034088135},{"id":"https://openalex.org/C178423520","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Conventional transmission electron microscope","level":4,"score":0.5957812666893005},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.5414964556694031},{"id":"https://openalex.org/C75806775","wikidata":"https://www.wikidata.org/wiki/Q5358194","display_name":"Electron tomography","level":4,"score":0.5233451724052429},{"id":"https://openalex.org/C206744179","wikidata":"https://www.wikidata.org/wiki/Q623093","display_name":"Burgers vector","level":3,"score":0.500452995300293},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4991319179534912},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.48336881399154663},{"id":"https://openalex.org/C77557913","wikidata":"https://www.wikidata.org/wiki/Q864822","display_name":"Electron diffraction","level":3,"score":0.4434003531932831},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.43497219681739807},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.4305270314216614},{"id":"https://openalex.org/C93877712","wikidata":"https://www.wikidata.org/wiki/Q132560","display_name":"Electron microscope","level":2,"score":0.4277491867542267},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.417211651802063},{"id":"https://openalex.org/C144783951","wikidata":"https://www.wikidata.org/wiki/Q907728","display_name":"Energy filtered transmission electron microscopy","level":4,"score":0.41501161456108093},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.35616210103034973},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.17008048295974731},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.13065436482429504},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.12487444281578064},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11132246255874634},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.05374309420585632},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.050922006368637085},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1186/s40679-019-0065-1","doi":"https://doi.org/10.1186/s40679-019-0065-1","is_oa":true,"landing_page_url":"https://doi.org/10.1186/s40679-019-0065-1","pdf_url":"https://ascimaging.springeropen.com/track/pdf/10.1186/s40679-019-0065-1","source":{"id":"https://openalex.org/S3035757904","display_name":"Advanced Structural and Chemical Imaging","issn_l":"2198-0926","issn":["2198-0926"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Structural and Chemical Imaging","raw_type":"journal-article"},{"id":"pmh:oai:EVASTAR-Karlsruhe.de:1000099840","doi":null,"is_oa":true,"landing_page_url":"https://publikationen.bibliothek.kit.edu/1000099840","pdf_url":null,"source":{"id":"https://openalex.org/S4306401992","display_name":"Repository KITopen (Karlsruhe Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I102335020","host_organization_name":"Karlsruhe Institute of Technology","host_organization_lineage":["https://openalex.org/I102335020"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced structural and chemical imaging, 5 (1), 1-9","raw_type":"info:eu-repo/semantics/article"},{"id":"doi:10.5445/ir/1000099840","doi":"https://doi.org/10.5445/ir/1000099840","is_oa":true,"landing_page_url":"https://doi.org/10.5445/ir/1000099840","pdf_url":null,"source":{"id":"https://openalex.org/S7407052948","display_name":"KITopen","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I102335020","host_organization_name":"Karlsruhe Institute of Technology","host_organization_lineage":["https://openalex.org/I102335020"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article-journal"}],"best_oa_location":{"id":"doi:10.1186/s40679-019-0065-1","doi":"https://doi.org/10.1186/s40679-019-0065-1","is_oa":true,"landing_page_url":"https://doi.org/10.1186/s40679-019-0065-1","pdf_url":"https://ascimaging.springeropen.com/track/pdf/10.1186/s40679-019-0065-1","source":{"id":"https://openalex.org/S3035757904","display_name":"Advanced Structural and Chemical Imaging","issn_l":"2198-0926","issn":["2198-0926"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Structural and Chemical Imaging","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G2225374720","display_name":null,"funder_award_id":"GE 841/20-2","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"}],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2940314599.pdf","grobid_xml":"https://content.openalex.org/works/W2940314599.grobid-xml"},"referenced_works_count":28,"referenced_works":["https://openalex.org/W191904760","https://openalex.org/W594651831","https://openalex.org/W1630760783","https://openalex.org/W1979511119","https://openalex.org/W1979687064","https://openalex.org/W2009299752","https://openalex.org/W2010212030","https://openalex.org/W2015024259","https://openalex.org/W2020150195","https://openalex.org/W2044602859","https://openalex.org/W2047207014","https://openalex.org/W2048842005","https://openalex.org/W2048847268","https://openalex.org/W2075991069","https://openalex.org/W2079863484","https://openalex.org/W2083989739","https://openalex.org/W2085882781","https://openalex.org/W2086933304","https://openalex.org/W2130059686","https://openalex.org/W2223082135","https://openalex.org/W2322975748","https://openalex.org/W2520172554","https://openalex.org/W2772180516","https://openalex.org/W2795314517","https://openalex.org/W2805328871","https://openalex.org/W3022233233","https://openalex.org/W6609725040","https://openalex.org/W6610814043"],"related_works":["https://openalex.org/W2520172554","https://openalex.org/W6921088228","https://openalex.org/W2009299752","https://openalex.org/W2186364472","https://openalex.org/W3035898170","https://openalex.org/W2562259834","https://openalex.org/W2772180516","https://openalex.org/W2901169089","https://openalex.org/W3153663045","https://openalex.org/W2764119854"],"abstract_inverted_index":{"Abstract":[0],"Dislocations":[1],"and":[2,35,119,144],"stacking":[3,36,50,120],"faults":[4,51,121],"are":[5,159],"important":[6],"crystal":[7],"defects,":[8],"because":[9],"they":[10],"strongly":[11],"influence":[12],"material":[13],"properties.":[14],"As":[15],"of":[16,32,43,49,58,117,151],"now,":[17],"transmission":[18,85],"electron":[19,86,130,175],"microscopy":[20,87],"(TEM)":[21],"is":[22,134],"the":[23,30,39,56,59,81,149,163],"most":[24],"frequently":[25,100],"used":[26,101],"technique":[27],"to":[28,103,161],"study":[29],"properties":[31],"single":[33],"dislocations":[34,44,118],"faults.":[37],"Specifically,":[38],"Burgers":[40],"vector":[41,47,77],"b":[42],"or":[45],"displacement":[46],"R":[48],"can":[52,89],"be":[53,91],"determined":[54],"on":[55,80],"basis":[57],"g\u00b7b":[60,110],"=":[61,64,111,114],"n":[62,112],"(g\u00b7R":[63,113],"n)":[65,115],"criterion":[66],"by":[67,124],"setting":[68],"up":[69,102],"different":[70],"two-beam":[71],"diffraction":[72,153],"conditions":[73],"with":[74,136],"an":[75],"imaging":[76,126],"g.":[78],"Based":[79],"reciprocity":[82],"theorem,":[83],"scanning":[84,129,174],"(STEM)":[88],"also":[90],"applied":[92],"for":[93,148],"defect":[94],"characterization,":[95],"but":[96],"has":[97,167],"been":[98,169],"less":[99],"now.":[104],"In":[105],"this":[106],"work,":[107],"we":[108],"demonstrate":[109],"analyses":[116],"in":[122,127,172],"GaN":[123],"STEM":[125,138],"a":[128,137,145,173],"microscope.":[131,176],"The":[132,155],"instrument":[133],"equipped":[135],"detector,":[139],"double-tilt":[140],"TEM":[141],"specimen":[142,164],"holder,":[143],"charge-coupled-device":[146],"camera":[147],"acquisition":[150],"on-axis":[152],"patterns.":[154],"latter":[156],"two":[157],"accessories":[158],"mandatory":[160],"control":[162],"orientation,":[165],"which":[166],"not":[168],"possible":[170],"before":[171]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":8}],"updated_date":"2026-11-13T13:42:25.865203","created_date":"2019-04-25T00:00:00"}