{"id":"https://openalex.org/W2935454897","doi":"https://doi.org/10.3390/app9071283","title":"Fastest Thickness Measurements with a Terahertz Time-Domain System Based on Electronically Controlled Optical Sampling","display_name":"Fastest Thickness Measurements with a Terahertz Time-Domain System Based on Electronically Controlled Optical Sampling","publication_year":2019,"publication_date":"2019-03-27","ids":{"openalex":"https://openalex.org/W2935454897","doi":"https://doi.org/10.3390/app9071283","mag":"2935454897"},"language":"en","primary_location":{"id":"doi:10.3390/app9071283","doi":"https://doi.org/10.3390/app9071283","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/app9071283","pdf_url":"https://www.mdpi.com/2076-3417/9/7/1283/pdf?version=1554203014","source":{"id":"https://openalex.org/S4210205812","display_name":"Applied Sciences","issn_l":"2076-3417","issn":["2076-3417"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","doaj","norway-1","oarl","poland-100","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Sciences","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/2076-3417/9/7/1283/pdf?version=1554203014","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079343697","display_name":"Milad Yahyapour","orcid":"https://orcid.org/0000-0001-7213-3724","observed_orcids":["https://orcid.org/0000-0001-7213-3724"]},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]},{"id":"https://openalex.org/I4210095416","display_name":"Toptica Photonics (Germany)","ror":"https://ror.org/00t9ms296","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210095416"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Milad Yahyapour","raw_affiliation_strings":["Friedrich-Alexander University Erlangen N\u00fcrnberg, 91058 Erlangen, Germany","TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany","Friedrich-Alexander University Erlangen N\u00fcrnberg, 91058 Erlangen, Germany; TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany"],"raw_orcid":"https://orcid.org/0000-0001-7213-3724","affiliations":[{"raw_affiliation_string":"Friedrich-Alexander University Erlangen N\u00fcrnberg, 91058 Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]},{"raw_affiliation_string":"TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany","institution_ids":["https://openalex.org/I4210095416"]},{"raw_affiliation_string":"Friedrich-Alexander University Erlangen N\u00fcrnberg, 91058 Erlangen, Germany; TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany","institution_ids":["https://openalex.org/I181369854","https://openalex.org/I4210095416"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043588255","display_name":"Angelika Jahn","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210095416","display_name":"Toptica Photonics (Germany)","ror":"https://ror.org/00t9ms296","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210095416"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Angelika Jahn","raw_affiliation_strings":["TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany","institution_ids":["https://openalex.org/I4210095416"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079213608","display_name":"Katja Dutzi","orcid":"https://orcid.org/0000-0002-5135-0620","observed_orcids":["https://orcid.org/0000-0002-5135-0620"]},"institutions":[{"id":"https://openalex.org/I4210095416","display_name":"Toptica Photonics (Germany)","ror":"https://ror.org/00t9ms296","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210095416"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Katja Dutzi","raw_affiliation_strings":["TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany"],"raw_orcid":"https://orcid.org/0000-0002-5135-0620","affiliations":[{"raw_affiliation_string":"TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany","institution_ids":["https://openalex.org/I4210095416"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058712826","display_name":"Thomas Puppe","orcid":"https://orcid.org/0000-0002-1724-9019","observed_orcids":["https://orcid.org/0000-0002-1724-9019"]},"institutions":[{"id":"https://openalex.org/I4210095416","display_name":"Toptica Photonics (Germany)","ror":"https://ror.org/00t9ms296","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210095416"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Puppe","raw_affiliation_strings":["TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany"],"raw_orcid":"https://orcid.org/0000-0002-1724-9019","affiliations":[{"raw_affiliation_string":"TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany","institution_ids":["https://openalex.org/I4210095416"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022326362","display_name":"P. Leisching","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210095416","display_name":"Toptica Photonics (Germany)","ror":"https://ror.org/00t9ms296","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210095416"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Patrick Leisching","raw_affiliation_strings":["TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany","institution_ids":["https://openalex.org/I4210095416"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045546590","display_name":"Bernhard Schmau\u00df","orcid":"https://orcid.org/0000-0002-6615-370X","observed_orcids":["https://orcid.org/0000-0002-6615-370X"]},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bernhard Schmauss","raw_affiliation_strings":["Friedrich-Alexander University Erlangen N\u00fcrnberg, 91058 Erlangen, Germany"],"raw_orcid":"https://orcid.org/0000-0002-6615-370X","affiliations":[{"raw_affiliation_string":"Friedrich-Alexander University Erlangen N\u00fcrnberg, 91058 Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067921799","display_name":"Nico Vieweg","orcid":"https://orcid.org/0009-0006-1470-5142","observed_orcids":["https://orcid.org/0009-0006-1470-5142"]},"institutions":[{"id":"https://openalex.org/I4210095416","display_name":"Toptica Photonics (Germany)","ror":"https://ror.org/00t9ms296","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210095416"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Nico Vieweg","raw_affiliation_strings":["TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany","institution_ids":["https://openalex.org/I4210095416"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041646904","display_name":"Anselm J. Deninger","orcid":"https://orcid.org/0000-0002-2241-0903","observed_orcids":["https://orcid.org/0000-0002-2241-0903"]},"institutions":[{"id":"https://openalex.org/I4210095416","display_name":"Toptica Photonics (Germany)","ror":"https://ror.org/00t9ms296","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210095416"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Anselm Deninger","raw_affiliation_strings":["TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TOPTICA Photonics AG, Lochhamer Schlag 19, 82166 Gr\u00e4felfing, Germany","institution_ids":["https://openalex.org/I4210095416"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5079343697"],"corresponding_institution_ids":["https://openalex.org/I181369854","https://openalex.org/I4210095416"],"apc_list":{"value":1500,"currency":"CHF","value_usd":1520},"apc_paid":{"value":1500,"currency":"CHF","value_usd":1520},"fwci":3.2507,"has_fulltext":true,"cited_by_count":66,"citation_normalized_percentile":{"value":0.92829931,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"9","issue":"7","first_page":"1283","last_page":"1283"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10566","display_name":"Laser-Matter Interactions and Applications","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/terahertz-time-domain-spectroscopy","display_name":"terahertz time-domain spectroscopy","score":0.9679999947547913},{"id":"https://openalex.org/keywords/thickness-measurement","display_name":"thickness measurement","score":0.75},{"id":"https://openalex.org/keywords/measurement-speed","display_name":"measurement speed","score":0.6909999847412109},{"id":"https://openalex.org/keywords/silicon-wafers","display_name":"silicon wafers","score":0.8899999856948853},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"signal-to-noise ratio","score":0.9139999747276306}],"concepts":[{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.8794710636138916},{"id":"https://openalex.org/C205817836","wikidata":"https://www.wikidata.org/wiki/Q7701527","display_name":"Terahertz time-domain spectroscopy","level":4,"score":0.6195746660232544},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5845030546188354},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.5442050695419312},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.518263578414917},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.4998056888580322},{"id":"https://openalex.org/C171635847","wikidata":"https://www.wikidata.org/wiki/Q406983","display_name":"Micrometer","level":2,"score":0.48854860663414},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4878235161304474},{"id":"https://openalex.org/C77887725","wikidata":"https://www.wikidata.org/wiki/Q17157147","display_name":"Terahertz spectroscopy and technology","level":3,"score":0.48012280464172363},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4266887605190277},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4077121913433075},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22955089807510376},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.19725292921066284},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.11750149726867676},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.3390/app9071283","doi":"https://doi.org/10.3390/app9071283","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/app9071283","pdf_url":"https://www.mdpi.com/2076-3417/9/7/1283/pdf?version=1554203014","source":{"id":"https://openalex.org/S4210205812","display_name":"Applied Sciences","issn_l":"2076-3417","issn":["2076-3417"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","doaj","norway-1","oarl","poland-100","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Sciences","raw_type":"journal-article"},{"id":"pmh:oai:ub.uni-erlangen.de-opus:11852","doi":null,"is_oa":true,"landing_page_url":"https://opus4.kobv.de/opus4-fau/files/11852/applsci-09-01283-v2.pdf","pdf_url":"https://opus4.kobv.de/opus4-fau/files/11852/applsci-09-01283-v2.pdf","source":{"id":"https://openalex.org/S4306401636","display_name":"OPUS Repository (Kooperativer Bibliotheksverbund Berlin-Brandenburg)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"article"},{"id":"pmh:oai:doaj.org/article:5bdaa3c36cf8442681b339cf5ccc5b70","doi":null,"is_oa":false,"landing_page_url":"https://doaj.org/article/5bdaa3c36cf8442681b339cf5ccc5b70","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Applied Sciences, Vol 9, Iss 7, p 1283 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.3390/app9071283","doi":"https://doi.org/10.3390/app9071283","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/app9071283","pdf_url":"https://www.mdpi.com/2076-3417/9/7/1283/pdf?version=1554203014","source":{"id":"https://openalex.org/S4210205812","display_name":"Applied Sciences","issn_l":"2076-3417","issn":["2076-3417"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","doaj","norway-1","oarl","poland-100","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Sciences","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2935454897.pdf","grobid_xml":"https://content.openalex.org/works/W2935454897.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W1973535191","https://openalex.org/W1977261100","https://openalex.org/W1982294160","https://openalex.org/W1985430737","https://openalex.org/W1987300370","https://openalex.org/W1997920385","https://openalex.org/W2009196315","https://openalex.org/W2010863563","https://openalex.org/W2018498210","https://openalex.org/W2018892005","https://openalex.org/W2030313992","https://openalex.org/W2032524875","https://openalex.org/W2037018413","https://openalex.org/W2049670300","https://openalex.org/W2069610939","https://openalex.org/W2077527127","https://openalex.org/W2084369434","https://openalex.org/W2089431436","https://openalex.org/W2094341144","https://openalex.org/W2095758757","https://openalex.org/W2096230140","https://openalex.org/W2124723870","https://openalex.org/W2126442445","https://openalex.org/W2133151341","https://openalex.org/W2155859097","https://openalex.org/W2160397925","https://openalex.org/W2161509819","https://openalex.org/W2165787319","https://openalex.org/W2168672956","https://openalex.org/W2171475618","https://openalex.org/W2585170842","https://openalex.org/W4206050372","https://openalex.org/W6645888514"],"related_works":["https://openalex.org/W2899496608","https://openalex.org/W3009659170","https://openalex.org/W7133295124","https://openalex.org/W2161509819","https://openalex.org/W3210877705","https://openalex.org/W4309213072","https://openalex.org/W2059614409","https://openalex.org/W2090372387","https://openalex.org/W4200147498","https://openalex.org/W2982247363"],"abstract_inverted_index":{"We":[0,75],"apply":[1],"a":[2,23,47,51,65,71,93],"fast":[3],"terahertz":[4,28,43,67],"time-domain":[5,105],"spectroscopy":[6],"(TDS)":[7],"system":[8,44,69],"based":[9],"on":[10],"electronically":[11],"controlled":[12],"optical":[13],"sampling":[14],"(ECOPS)":[15],"to":[16,61,104],"contact-free":[17],"thickness":[18,38,90],"gauging.":[19],"Our":[20],"setup":[21,101],"achieves":[22],"measurement":[24,39,85],"speed":[25],"of":[26,57,92],"1600":[27],"pulse":[29],"traces":[30],"per":[31],"second,":[32],"which\u2014to":[33],"our":[34],"knowledge\u2014represents":[35],"the":[36,58,84,99],"fastest":[37],"performed":[40],"with":[41,64,102],"any":[42],"to-date.":[45],"Using":[46],"silicon":[48],"wafer":[49],"as":[50],"test":[52],"sample,":[53],"we":[54,88],"compare":[55],"data":[56],"ECOPS":[59,100],"experiment":[60],"results":[62,82],"obtained":[63],"conventional":[66],"TDS":[68],"and":[70,97,110],"mechanical":[72],"micrometer":[73],"gauge.":[74],"show":[76],"that":[77],"all":[78],"systems":[79],"provide":[80],"consistent":[81],"within":[83],"accuracy.":[86],"Moreover,":[87],"perform":[89],"measurements":[91],"rapidly":[94],"moving":[95],"sample":[96],"characterize":[98],"respect":[103],"dynamic":[106],"range,":[107],"signal-to-noise":[108],"ratio,":[109],"spectral":[111],"properties.":[112]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":14},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":6}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2019-04-11T00:00:00"}