{"id":"https://openalex.org/W2921995309","doi":"https://doi.org/10.1088/1361-6501/ab1022","title":"Improvement of image reconstruction in electrical capacitance tomography (ECT) by sectorial sensitivity matrix using a K -means clustering algorithm","display_name":"Improvement of image reconstruction in electrical capacitance tomography (ECT) by sectorial sensitivity matrix using a K -means clustering algorithm","publication_year":2019,"publication_date":"2019-03-15","ids":{"openalex":"https://openalex.org/W2921995309","doi":"https://doi.org/10.1088/1361-6501/ab1022","mag":"2921995309"},"language":"en","primary_location":{"id":"doi:10.1088/1361-6501/ab1022","doi":"https://doi.org/10.1088/1361-6501/ab1022","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1361-6501/ab1022","pdf_url":null,"source":{"id":"https://openalex.org/S109302362","display_name":"Measurement Science and Technology","issn_l":"0957-0233","issn":["0957-0233","1361-6501"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","jufo-2","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Measurement Science and Technology","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043883808","display_name":"Panji Nursetia Darma","orcid":"https://orcid.org/0000-0001-9528-3100","observed_orcids":["https://orcid.org/0000-0001-9528-3100"]},"institutions":[{"id":"https://openalex.org/I159385669","display_name":"Chiba University","ror":"https://ror.org/01hjzeq58","country_code":"JP","type":"education","lineage":["https://openalex.org/I159385669"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"P N Darma","raw_affiliation_strings":["Graduate School of Science and Engineering, Div. Fundamental Engineering, Department Mechanical Engineering, Chiba University, 1-33, Inage-Ku, Chiba-Shi, Chiba, 263-0022, Japan"],"raw_orcid":"https://orcid.org/0000-0001-9528-3100","affiliations":[{"raw_affiliation_string":"Graduate School of Science and Engineering, Div. Fundamental Engineering, Department Mechanical Engineering, Chiba University, 1-33, Inage-Ku, Chiba-Shi, Chiba, 263-0022, Japan","institution_ids":["https://openalex.org/I159385669"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073924235","display_name":"Marlin Ramadhan Baidillah","orcid":"https://orcid.org/0000-0001-7876-2206","observed_orcids":["https://orcid.org/0000-0001-7876-2206"]},"institutions":[{"id":"https://openalex.org/I159385669","display_name":"Chiba University","ror":"https://ror.org/01hjzeq58","country_code":"JP","type":"education","lineage":["https://openalex.org/I159385669"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M R Baidillah","raw_affiliation_strings":["Graduate School of Science and Engineering, Div. Fundamental Engineering, Department Mechanical Engineering, Chiba University, 1-33, Inage-Ku, Chiba-Shi, Chiba, 263-0022, Japan"],"raw_orcid":"https://orcid.org/0000-0001-7876-2206","affiliations":[{"raw_affiliation_string":"Graduate School of Science and Engineering, Div. Fundamental Engineering, Department Mechanical Engineering, Chiba University, 1-33, Inage-Ku, Chiba-Shi, Chiba, 263-0022, Japan","institution_ids":["https://openalex.org/I159385669"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051019920","display_name":"Martin Wekesa Sifuna","orcid":"https://orcid.org/0000-0002-7610-7571","observed_orcids":["https://orcid.org/0000-0002-7610-7571"]},"institutions":[{"id":"https://openalex.org/I159385669","display_name":"Chiba University","ror":"https://ror.org/01hjzeq58","country_code":"JP","type":"education","lineage":["https://openalex.org/I159385669"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M W Sifuna","raw_affiliation_strings":["Graduate School of Science and Engineering, Div. Fundamental Engineering, Department Mechanical Engineering, Chiba University, 1-33, Inage-Ku, Chiba-Shi, Chiba, 263-0022, Japan"],"raw_orcid":"https://orcid.org/0000-0002-7610-7571","affiliations":[{"raw_affiliation_string":"Graduate School of Science and Engineering, Div. Fundamental Engineering, Department Mechanical Engineering, Chiba University, 1-33, Inage-Ku, Chiba-Shi, Chiba, 263-0022, Japan","institution_ids":["https://openalex.org/I159385669"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091856593","display_name":"Masahiro Takei","orcid":"https://orcid.org/0000-0003-3855-7202","observed_orcids":["https://orcid.org/0000-0003-3855-7202"]},"institutions":[{"id":"https://openalex.org/I159385669","display_name":"Chiba University","ror":"https://ror.org/01hjzeq58","country_code":"JP","type":"education","lineage":["https://openalex.org/I159385669"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M Takei","raw_affiliation_strings":["Graduate School of Science and Engineering, Div. Fundamental Engineering, Department Mechanical Engineering, Chiba University, 1-33, Inage-Ku, Chiba-Shi, Chiba, 263-0022, Japan"],"raw_orcid":"https://orcid.org/0000-0003-3855-7202","affiliations":[{"raw_affiliation_string":"Graduate School of Science and Engineering, Div. Fundamental Engineering, Department Mechanical Engineering, Chiba University, 1-33, Inage-Ku, Chiba-Shi, Chiba, 263-0022, Japan","institution_ids":["https://openalex.org/I159385669"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I159385669"],"apc_list":{"value":2700,"currency":"USD","value_usd":2700},"apc_paid":null,"fwci":2.0768,"has_fulltext":false,"cited_by_count":37,"citation_normalized_percentile":{"value":0.86822105,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"30","issue":"7","first_page":"075402","last_page":"075402"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"electrical capacitance tomography","score":1.0},{"id":"https://openalex.org/keywords/k-means-clustering","display_name":"K-means clustering","score":0.9940000176429749},{"id":"https://openalex.org/keywords/image-reconstruction","display_name":"image reconstruction","score":0.9319999814033508},{"id":"https://openalex.org/keywords/image-artifacts","display_name":"image artifacts","score":0.9419999718666077},{"id":"https://openalex.org/keywords/permittivity-distribution","display_name":"permittivity distribution","score":0.8970000147819519},{"id":"https://openalex.org/keywords/low-signal-to-noise-ratio","display_name":"low signal-to-noise ratio","score":0.8849999904632568}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.8115854263305664},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6604889631271362},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.5613979697227478},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5558597445487976},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.48256340622901917},{"id":"https://openalex.org/C139945424","wikidata":"https://www.wikidata.org/wiki/Q1940696","display_name":"Mean squared error","level":2,"score":0.46421054005622864},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.43812233209609985},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.4337961673736572},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.4211537539958954},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.41267693042755127},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3860172927379608},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3165019154548645},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.22592610120773315},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2221774160861969},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.19983571767807007},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1863529086112976},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18294695019721985},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12463146448135376},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0925220251083374},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1088/1361-6501/ab1022","doi":"https://doi.org/10.1088/1361-6501/ab1022","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1361-6501/ab1022","pdf_url":null,"source":{"id":"https://openalex.org/S109302362","display_name":"Measurement Science and Technology","issn_l":"0957-0233","issn":["0957-0233","1361-6501"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","cwts-core","jufo-2","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Measurement Science and Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G3262110352","display_name":"Establishment of micro thrombus monitoring method in blood flow by microwave process tomography method","funder_award_id":"16H02312","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1598748684","https://openalex.org/W1932901626","https://openalex.org/W1966831530","https://openalex.org/W1978679709","https://openalex.org/W1979724394","https://openalex.org/W1987971958","https://openalex.org/W2027810834","https://openalex.org/W2048329488","https://openalex.org/W2057374330","https://openalex.org/W2070738097","https://openalex.org/W2083728432","https://openalex.org/W2092787046","https://openalex.org/W2108863971","https://openalex.org/W2136175564","https://openalex.org/W2153527995","https://openalex.org/W2162826080","https://openalex.org/W2164413137","https://openalex.org/W2181924187","https://openalex.org/W2330998253","https://openalex.org/W2530307286","https://openalex.org/W2594988164","https://openalex.org/W2602211382","https://openalex.org/W2756143996","https://openalex.org/W2804666262"],"related_works":["https://openalex.org/W4380482615","https://openalex.org/W2386283089","https://openalex.org/W2292454309","https://openalex.org/W7160876507","https://openalex.org/W2677558758","https://openalex.org/W3194685127","https://openalex.org/W2071532314","https://openalex.org/W2026284863","https://openalex.org/W2594152062","https://openalex.org/W2352619162"],"abstract_inverted_index":{"Abstract":[0],"A":[1],"sectorial":[2,34,88,103,150],"sensitivity":[3,35,61,89,104,147,151],"matrix":[4,36,62,90,105,152],"using":[5],"a":[6,111],"K":[7],"-means":[8],"clustering":[9],"algorithm":[10],"has":[11,153],"been":[12],"proposed":[13,33],"for":[14,19],"electrical":[15],"capacitance":[16,185],"tomography":[17],"(ECT)":[18],"accurate":[20],"determination":[21],"of":[22,41,86,156,181,186,194,196,201],"permittivity":[23,195],"distribution":[24],"in":[25,135,166],"the":[26,29,38,42,47,76,87,100,102,107,136,145,161,175,183,187,191,197,202],"inclusion":[27,43,188,198],"within":[28],"background":[30],"area.":[31],"The":[32,59,84,149],"clusters":[37],"pixel":[39],"position":[40],"area":[44],"to":[45,53,70,75,144,163,190,199],"minimize":[46],"soft":[48],"field":[49,82],"effect":[50],"that":[51,200],"leads":[52],"image":[54,72,131],"artifacts":[55,73],"and":[56,79,96,113,122,128,138],"blurred":[57],"images.":[58],"standard":[60,146],"is":[63,67,91,170,179],"nonlinear":[64,80],"thus":[65],"it":[66],"not":[68],"easy":[69],"eliminate":[71],"due":[74,189],"noise":[77,164],"signal":[78,162],"electric":[81],"propagation.":[83],"performance":[85,158],"evaluated":[92],"through":[93],"numerical":[94],"simulation":[95,137],"experimental":[97,139],"studies.":[98],"From":[99],"results,":[101],"improves":[106],"reconstructed":[108],"images":[109],"with":[110],"42.92%":[112],"67.12%":[114],"lower":[115,130],"root":[116],"mean":[117],"square":[118],"error":[119,132],"RMSE,":[120],"1.66%":[121],"16.16%":[123],"higher":[124],"correlation":[125],"coefficient":[126],"CC,":[127],"21.37%":[129],"IE":[133],"values":[134],"studies":[140],"respectively":[141],"as":[142],"compared":[143],"matrix.":[148],"an":[154,167],"advantage":[155],"high":[157],"even":[159],"when":[160],"ratio":[165,193],"ECT":[168],"system":[169],"low.":[171],"Under":[172],"such":[173],"conditions,":[174],"present":[176],"normalization":[177],"method":[178],"incapable":[180],"calculating":[182],"normalized":[184],"low":[192],"background.":[203]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":7}],"updated_date":"2026-09-27T08:07:27.782135","created_date":"2019-03-22T00:00:00"}