{"id":"https://openalex.org/W2906813044","doi":"https://doi.org/10.1049/iet-cdt.2018.5009","title":"Study of the monte\u2013carlo fault injection simulator to measure a fault derating","display_name":"Study of the monte\u2013carlo fault injection simulator to measure a fault derating","publication_year":2019,"publication_date":"2019-01-03","ids":{"openalex":"https://openalex.org/W2906813044","doi":"https://doi.org/10.1049/iet-cdt.2018.5009","mag":"2906813044"},"language":"en","primary_location":{"id":"doi:10.1049/iet-cdt.2018.5009","doi":"https://doi.org/10.1049/iet-cdt.2018.5009","is_oa":true,"landing_page_url":"https://doi.org/10.1049/iet-cdt.2018.5009","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/iet-cdt.2018.5009","source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-c","jufo-1","norway-1","oarl","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers & Digital Techniques","raw_type":"journal-article"},"parent_works":[],"lineage":["https://openalex.org/W2906813044"],"child_works_count":0,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/iet-cdt.2018.5009","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082346240","display_name":"Dongwoo Lee","orcid":"https://orcid.org/0000-0003-4071-8706","observed_orcids":["https://orcid.org/0000-0003-4071-8706"]},"institutions":[{"id":"https://openalex.org/I24456540","display_name":"Korea Aerospace University","ror":"https://ror.org/05jmm0651","country_code":"KR","type":"education","lineage":["https://openalex.org/I24456540"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong\u2010Woo Lee","raw_affiliation_strings":["Avionics Research Institute, Korea Aerospace University, Goyang-si, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0003-4071-8706","affiliations":[{"raw_affiliation_string":"Avionics Research Institute, Korea Aerospace University, Goyang-si, Republic of Korea","institution_ids":["https://openalex.org/I24456540"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014727786","display_name":"Jongwhoa Na","orcid":"https://orcid.org/0000-0002-6781-1874","observed_orcids":["https://orcid.org/0000-0002-6781-1874"]},"institutions":[{"id":"https://openalex.org/I24456540","display_name":"Korea Aerospace University","ror":"https://ror.org/05jmm0651","country_code":"KR","type":"education","lineage":["https://openalex.org/I24456540"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jong\u2010Whoa Na","raw_affiliation_strings":["School of Electronics and Information Engineering, Korea Aerospace University, Goyang-si, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Korea Aerospace University, Goyang-si, Republic of Korea","institution_ids":["https://openalex.org/I24456540"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5014727786"],"corresponding_institution_ids":["https://openalex.org/I24456540"],"apc_list":{"value":2210,"currency":"USD","value_usd":2210},"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.00285565,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":"13","issue":"3","first_page":"218","last_page":"223"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9692000150680542,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9692000150680542,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.027300000190734863,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/radiation-effects","display_name":"radiation effects","score":0.41999998688697815},{"id":"https://openalex.org/keywords/iscas85-benchmark-circuits","display_name":"ISCAS85 benchmark circuits","score":0.7910000085830688},{"id":"https://openalex.org/keywords/radiation-testing","display_name":"radiation testing","score":0.3310000002384186}],"concepts":[{"id":"https://openalex.org/C70500001","wikidata":"https://www.wikidata.org/wiki/Q1199915","display_name":"Derating","level":3,"score":0.863988995552063},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.7499797344207764},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7246284484863281},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.6721007823944092},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.667126476764679},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6375199556350708},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6340442299842834},{"id":"https://openalex.org/C2779030575","wikidata":"https://www.wikidata.org/wiki/Q827773","display_name":"Verilog","level":3,"score":0.6250490546226501},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.5936161875724792},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.5019083023071289},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39227497577667236},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.29680055379867554},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.2839851677417755},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.19982928037643433},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18760067224502563},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.18564018607139587},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.1559845507144928},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11563116312026978},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10509386658668518},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08896520733833313},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07803288102149963},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/iet-cdt.2018.5009","doi":"https://doi.org/10.1049/iet-cdt.2018.5009","is_oa":true,"landing_page_url":"https://doi.org/10.1049/iet-cdt.2018.5009","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/iet-cdt.2018.5009","source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-c","jufo-1","norway-1","oarl","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers & Digital Techniques","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1049/iet-cdt.2018.5009","doi":"https://doi.org/10.1049/iet-cdt.2018.5009","is_oa":true,"landing_page_url":"https://doi.org/10.1049/iet-cdt.2018.5009","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/iet-cdt.2018.5009","source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-c","jufo-1","norway-1","oarl","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers & Digital Techniques","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G4800519025","display_name":null,"funder_award_id":"10067079","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"}],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2906813044.pdf","grobid_xml":"https://content.openalex.org/works/W2906813044.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W1503456489","https://openalex.org/W1590251127","https://openalex.org/W1968315213","https://openalex.org/W1986722376","https://openalex.org/W1997310580","https://openalex.org/W2024923204","https://openalex.org/W2044936442","https://openalex.org/W2054113966","https://openalex.org/W2102627136","https://openalex.org/W2110228871","https://openalex.org/W2112173236","https://openalex.org/W2119530531","https://openalex.org/W2122526433","https://openalex.org/W2130940980","https://openalex.org/W2143154265","https://openalex.org/W2147082520","https://openalex.org/W2169184353","https://openalex.org/W2180580882","https://openalex.org/W2184134753","https://openalex.org/W2258854634","https://openalex.org/W2554646778","https://openalex.org/W3144286968"],"related_works":["https://openalex.org/W1555374769","https://openalex.org/W2755205790","https://openalex.org/W2135764108","https://openalex.org/W2594660560","https://openalex.org/W2396233435","https://openalex.org/W1922040203","https://openalex.org/W2008754772","https://openalex.org/W7100611390","https://openalex.org/W4256410614","https://openalex.org/W2363448481"],"abstract_inverted_index":{"The":[0],"SER":[1],"of":[2,43,63],"the":[3,13,25,38,44,54,61,68,75,83,88,102,105],"selected":[4],"circuits":[5],"can":[6,36],"be":[7],"determined":[8],"via":[9],"radiation":[10,20],"tests.":[11],"However,":[12],"time":[14,41,107],"and":[15,77,101],"costs":[16],"required":[17],"to":[18],"perform":[19,70],"tests":[21],"are":[22],"prohibitive.":[23],"Here,":[24],"authors":[26,69,89,103],"introduce":[27],"an":[28,91],"accelerated":[29,65],"Monte\u2013Carlo":[30],"fault":[31],"injection":[32],"(MCFI)":[33],"method":[34,47],"that":[35,52],"solve":[37],"slow":[39],"execution":[40,106],"problem":[42],"previous":[45,86],"MCFI":[46,66],"using":[48,74],"a":[49,71,98],"modified":[50],"simulator":[51],"uses":[53],"Verilog":[55],"Procedural":[56],"Interface":[57],"(VPI).":[58],"To":[59],"demonstrate":[60],"performance":[62],"authors\u2019":[64],"tool,":[67],"fault\u2010injection":[72],"campaign":[73],"ISCAS85":[76],"ITC99":[78],"benchmark":[79],"circuits.":[80],"Compared":[81],"with":[82,97],"results":[84],"from":[85],"studies,":[87],"obtain":[90],"accurate":[92],"logical":[93],"derating":[94],"rate":[95],"value":[96],"3%":[99],"variance,":[100],"accelerate":[104],"by":[108],"20":[109],"times":[110],"or":[111],"more.":[112]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-11-13T13:42:25.865203","created_date":"2019-01-11T00:00:00"}