{"id":"https://openalex.org/W2906706355","doi":"https://doi.org/10.1109/ultsym.2018.8579650","title":"Nonlinear Behavior of Contact Resonance Atomic Force Microscopy Due to Stick-Slip Phenomena","display_name":"Nonlinear Behavior of Contact Resonance Atomic Force Microscopy Due to Stick-Slip Phenomena","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2906706355","doi":"https://doi.org/10.1109/ultsym.2018.8579650","mag":"2906706355"},"language":"en","primary_location":{"id":"doi:10.1109/ultsym.2018.8579650","doi":"https://doi.org/10.1109/ultsym.2018.8579650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ultsym.2018.8579650","pdf_url":null,"source":{"id":"https://openalex.org/S4393917990","display_name":"IEEE International Ultrasonics Symposium","issn_l":"1948-5719","issn":["1948-5719"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Ultrasonics Symposium (IUS)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://resolver.sub.uni-goettingen.de/purl?gro-2/135748","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110760066","display_name":"M. Kalyan Phani","orcid":"https://orcid.org/0000-0002-9764-5117","observed_orcids":["https://orcid.org/0000-0002-9764-5117"]},"institutions":[{"id":"https://openalex.org/I4405252587","display_name":"OP Jindal University","ror":"https://ror.org/036t3bd25","country_code":"IN","type":"education","lineage":["https://openalex.org/I4405252587"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"M Kalyan Phani","raw_affiliation_strings":["Department of Metallurgical and Materials Engineering, OP Jindal University, Raigarh, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Metallurgical and Materials Engineering, OP Jindal University, Raigarh, India","institution_ids":["https://openalex.org/I4405252587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027184702","display_name":"V. Pfahl","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I74656192","display_name":"University of G\u00f6ttingen","ror":"https://ror.org/01y9bpm73","country_code":"DE","type":"education","lineage":["https://openalex.org/I74656192"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Victor Pfahl","raw_affiliation_strings":["Georg-August-Universit\u00e4t, I. Physikalisches Institut, G\u00f5ttingen, Germany","I. Physikalisches Institut, Georg-August-Universit\u00e4t, G\u00f5ttingen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georg-August-Universit\u00e4t, I. Physikalisches Institut, G\u00f5ttingen, Germany","institution_ids":["https://openalex.org/I74656192"]},{"raw_affiliation_string":"I. Physikalisches Institut, Georg-August-Universit\u00e4t, G\u00f5ttingen, Germany","institution_ids":["https://openalex.org/I74656192"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033879215","display_name":"Chengfu Ma","orcid":"https://orcid.org/0000-0002-6813-1459","observed_orcids":["https://orcid.org/0000-0002-6813-1459"]},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengfu Ma","raw_affiliation_strings":["Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006582751","display_name":"Anish Kumar","orcid":"https://orcid.org/0000-0002-8219-1095","observed_orcids":["https://orcid.org/0000-0002-8219-1095","https://orcid.org/0009-0003-0852-0270"]},"institutions":[{"id":"https://openalex.org/I2802630050","display_name":"Indira Gandhi Centre for Atomic Research","ror":"https://ror.org/05tkzma19","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I2802630050","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anish Kumar","raw_affiliation_strings":["Metallurgical and Materials Group, Indira Gandhi Centre for Atomic Research, Kalpakkam, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Metallurgical and Materials Group, Indira Gandhi Centre for Atomic Research, Kalpakkam, India","institution_ids":["https://openalex.org/I2802630050"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086707889","display_name":"Walter Arnold","orcid":"https://orcid.org/0000-0003-3588-8719","observed_orcids":["https://orcid.org/0000-0003-3588-8719"]},"institutions":[{"id":"https://openalex.org/I91712215","display_name":"Saarland University","ror":"https://ror.org/01jdpyv68","country_code":"DE","type":"education","lineage":["https://openalex.org/I91712215"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W Arnold","raw_affiliation_strings":["Department of Materials Science and Engineering, Saarland University, Saarbriicken, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Saarland University, Saarbriicken, Germany","institution_ids":["https://openalex.org/I91712215"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024145949","display_name":"Konrad H. Samwer","orcid":"https://orcid.org/0000-0003-4266-449X","observed_orcids":["https://orcid.org/0000-0003-4266-449X"]},"institutions":[{"id":"https://openalex.org/I74656192","display_name":"University of G\u00f6ttingen","ror":"https://ror.org/01y9bpm73","country_code":"DE","type":"education","lineage":["https://openalex.org/I74656192"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"K Samwer","raw_affiliation_strings":["Georg-August-Universit\u00e4t, I. Physikalisches Institut, G\u00f5ttingen, Germany","I. Physikalisches Institut, Georg-August-Universit\u00e4t, G\u00f5ttingen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georg-August-Universit\u00e4t, I. Physikalisches Institut, G\u00f5ttingen, Germany","institution_ids":["https://openalex.org/I74656192"]},{"raw_affiliation_string":"I. Physikalisches Institut, Georg-August-Universit\u00e4t, G\u00f5ttingen, Germany","institution_ids":["https://openalex.org/I74656192"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11799","display_name":"Adhesion, Friction, and Surface Interactions","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/contact-resonance-atomic-force-microscopy","display_name":"contact resonance atomic force microscopy","score":0.9049999713897705},{"id":"https://openalex.org/keywords/stick-slip","display_name":"stick-slip","score":0.7580000162124634},{"id":"https://openalex.org/keywords/duffing-oscillator","display_name":"Duffing oscillator","score":0.8360000252723694},{"id":"https://openalex.org/keywords/contact-damping","display_name":"contact damping","score":0.699999988079071},{"id":"https://openalex.org/keywords/contact-stiffness","display_name":"contact stiffness","score":0.722000002861023},{"id":"https://openalex.org/keywords/elastic-modulus","display_name":"elastic modulus","score":0.5260000228881836},{"id":"https://openalex.org/keywords/excitation-amplitude","display_name":"excitation amplitude","score":0.7910000085830688},{"id":"https://openalex.org/keywords/normal-force","display_name":"normal force","score":0.6679999828338623},{"id":"https://openalex.org/keywords/tip-sample-contact","display_name":"tip-sample contact","score":0.5460000038146973},{"id":"https://openalex.org/keywords/friction-coefficient","display_name":"friction coefficient","score":0.6050000190734863},{"id":"https://openalex.org/keywords/softening-behavior","display_name":"softening behavior","score":0.5180000066757202}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7849366068840027},{"id":"https://openalex.org/C141354745","wikidata":"https://www.wikidata.org/wiki/Q17227","display_name":"Cantilever","level":2,"score":0.7503535747528076},{"id":"https://openalex.org/C71246147","wikidata":"https://www.wikidata.org/wiki/Q16029538","display_name":"Non-contact atomic force microscopy","level":4,"score":0.7094769477844238},{"id":"https://openalex.org/C43826995","wikidata":"https://www.wikidata.org/wiki/Q17014103","display_name":"Atomic force acoustic microscopy","level":5,"score":0.6013125777244568},{"id":"https://openalex.org/C195268267","wikidata":"https://www.wikidata.org/wiki/Q1928883","display_name":"Slip (aerodynamics)","level":2,"score":0.5803812742233276},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.5178821086883545},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5159347653388977},{"id":"https://openalex.org/C2781098093","wikidata":"https://www.wikidata.org/wiki/Q85787439","display_name":"Softening","level":2,"score":0.511569082736969},{"id":"https://openalex.org/C139210041","wikidata":"https://www.wikidata.org/wiki/Q2145840","display_name":"Resonance (particle physics)","level":2,"score":0.5070545673370361},{"id":"https://openalex.org/C2779372316","wikidata":"https://www.wikidata.org/wiki/Q569057","display_name":"Stiffness","level":2,"score":0.4895559251308441},{"id":"https://openalex.org/C81302111","wikidata":"https://www.wikidata.org/wiki/Q2916417","display_name":"Contact force","level":2,"score":0.4705510437488556},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.46266961097717285},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.4387253224849701},{"id":"https://openalex.org/C2780569836","wikidata":"https://www.wikidata.org/wiki/Q1306226","display_name":"Nanoindenter","level":3,"score":0.4317161440849304},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.4069070816040039},{"id":"https://openalex.org/C181635281","wikidata":"https://www.wikidata.org/wiki/Q2799395","display_name":"Magnetic force microscope","level":4,"score":0.3948153555393219},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.3791006803512573},{"id":"https://openalex.org/C43486711","wikidata":"https://www.wikidata.org/wiki/Q192005","display_name":"Elastic modulus","level":2,"score":0.37866461277008057},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.31426405906677246},{"id":"https://openalex.org/C83898325","wikidata":"https://www.wikidata.org/wiki/Q1324110","display_name":"Kelvin probe force microscope","level":3,"score":0.2801947593688965},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.23995095491409302},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.19511809945106506},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1884635090827942},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12154275178909302},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.11485424637794495},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ultsym.2018.8579650","doi":"https://doi.org/10.1109/ultsym.2018.8579650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ultsym.2018.8579650","pdf_url":null,"source":{"id":"https://openalex.org/S4393917990","display_name":"IEEE International Ultrasonics Symposium","issn_l":"1948-5719","issn":["1948-5719"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Ultrasonics Symposium (IUS)","raw_type":"proceedings-article"},{"id":"pmh:oai:publications.goettingen-research-online.de:2/135748","doi":null,"is_oa":true,"landing_page_url":"https://resolver.sub.uni-goettingen.de/purl?gro-2/135748","pdf_url":null,"source":{"id":"https://openalex.org/S4306401634","display_name":"GoeScholar  The Publication Server of the Georg-August-Universit\u00e4t G\u00f6ttingen (Georg-August-Universit\u00e4t G\u00f6ttingen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210122495","host_organization_name":"Asklepios Klinik St. Georg","host_organization_lineage":["https://openalex.org/I4210122495"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:publications.goettingen-research-online.de:2/135748","doi":null,"is_oa":true,"landing_page_url":"https://resolver.sub.uni-goettingen.de/purl?gro-2/135748","pdf_url":null,"source":{"id":"https://openalex.org/S4306401634","display_name":"GoeScholar  The Publication Server of the Georg-August-Universit\u00e4t G\u00f6ttingen (Georg-August-Universit\u00e4t G\u00f6ttingen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210122495","host_organization_name":"Asklepios Klinik St. Georg","host_organization_lineage":["https://openalex.org/I4210122495"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1569210791","https://openalex.org/W1597262849","https://openalex.org/W1885071015","https://openalex.org/W1967113794","https://openalex.org/W1993969439","https://openalex.org/W1995266434","https://openalex.org/W2001601438","https://openalex.org/W2064271797","https://openalex.org/W2075638646","https://openalex.org/W2076639337","https://openalex.org/W2090706244","https://openalex.org/W2092007554","https://openalex.org/W2143990257","https://openalex.org/W2158237415","https://openalex.org/W2440303277","https://openalex.org/W2581866201","https://openalex.org/W2605556207","https://openalex.org/W2888136911"],"related_works":["https://openalex.org/W2888136911","https://openalex.org/W2009696811","https://openalex.org/W2064819376","https://openalex.org/W4210514270","https://openalex.org/W2034578466","https://openalex.org/W1980259678","https://openalex.org/W2018383696","https://openalex.org/W1976026955","https://openalex.org/W1966095125","https://openalex.org/W2073362770"],"abstract_inverted_index":{"Contact-resonance":[0],"atomic":[1],"force":[2],"microscopy":[3,12],"(CR-AFM)":[4],"has":[5],"emerged":[6],"as":[7],"an":[8,34],"advanced":[9],"scanning":[10],"probe":[11],"technique":[13],"for":[14],"characterizing":[15],"materials":[16],"with":[17],"lateral":[18],"resolutions":[19],"down":[20],"to":[21,58,86,96,120,144,158],"5":[22],"nm.":[23],"In":[24,94],"CR-AFM":[25],"the":[26,38,44,47,60,66,70,80,88,91,97,101,104,112,115,121,148,154,164,168,174,183,189,198,203,210],"AFM":[27],"cantilever":[28,48],"may":[29],"be":[30,56,84],"excited":[31],"either":[32],"by":[33,43],"ultrasonic":[35],"transducer":[36],"beneath":[37],"sample":[39],"(AFAM":[40],"mode)":[41],"or":[42,109],"piezoelement":[45],"on":[46,163,197],"chip":[49],"(UAFM":[50],"mode).":[51],"The":[52,77,125,140,160,177,206],"contact-resonance":[53],"frequency":[54],"can":[55,83],"used":[57,85],"derive":[59],"tip-sample":[61,92],"contact":[62,123,138,155],"stiffness":[63],"and":[64,103,192],"in-turn":[65],"elastic":[67],"modulus":[68],"of":[69,79,90,111,150,153,167,185,200,209,216],"material":[71,102,175],"under":[72,135],"examination":[73],"after":[74],"proper":[75],"calibration.":[76],"width":[78],"resonance":[81],"curve":[82],"measure":[87],"damping":[89],"contact.":[93],"addition":[95],"internal":[98],"friction":[99,165],"in":[100,202,214],"air":[105],"damping,":[106],"partial":[107],"slip":[108],"sliding":[110,161],"tip":[113,169],"at":[114,130,181],"surface":[116],"also":[117],"contributes":[118],"significantly":[119],"measured":[122],"damping.":[124],"CR":[126,204],"curves":[127],"become":[128],"nonlinear":[129,145],"high":[131],"excitation":[132,186],"amplitudes":[133],"while":[134],"relatively":[136],"low":[137],"forces.":[139],"transition":[141],"from":[142,156],"linear":[143],"behavior":[146,208],"indicates":[147],"onset":[149],"mechanical":[151],"yielding":[152],"sticking":[157],"sliding.":[159],"depends":[162],"coefficient":[166],"material,":[170],"usually":[171],"Si,":[172],"against":[173],"examined.":[176],"present":[178],"study":[179],"aims":[180],"understanding":[182],"influence":[184],"amplitude":[187],"(causing":[188],"tangential":[190],"force)":[191,196],"applied":[193],"load":[194],"(normal":[195],"appearance":[199],"nonlinearities":[201],"curves.":[205],"softening":[207],"CRs":[211],"is":[212],"analyzed":[213],"terms":[215],"a":[217],"Duffing":[218],"oscillator.":[219]},"counts_by_year":[{"year":2024,"cited_by_count":7}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2019-01-11T00:00:00"}