{"id":"https://openalex.org/W2904092989","doi":"https://doi.org/10.1109/acpr.2017.34","title":"Fabric Defect Detection Algorithm Based on Convolution Neural Network and Low-Rank Representation","display_name":"Fabric Defect Detection Algorithm Based on Convolution Neural Network and Low-Rank Representation","publication_year":2017,"publication_date":"2017-11-01","ids":{"openalex":"https://openalex.org/W2904092989","doi":"https://doi.org/10.1109/acpr.2017.34","mag":"2904092989"},"language":"en","primary_location":{"id":"doi:10.1109/acpr.2017.34","doi":"https://doi.org/10.1109/acpr.2017.34","is_oa":false,"landing_page_url":"https://doi.org/10.1109/acpr.2017.34","pdf_url":null,"source":{"id":"https://openalex.org/S4306417740","display_name":"Asian Conference on Pattern Recognition","issn_l":"2327-0985","issn":["2327-0985"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 4th IAPR Asian Conference on Pattern Recognition (ACPR)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054410967","display_name":"Zhoufeng Liu","orcid":"https://orcid.org/0000-0002-2302-4879","observed_orcids":["https://orcid.org/0000-0002-2302-4879","https://orcid.org/0000-0002-8926-5165","https://orcid.org/0000-0003-0006-9959","https://orcid.org/0000-0003-0117-6318"]},"institutions":[{"id":"https://openalex.org/I132586189","display_name":"Zhongyuan University of Technology","ror":"https://ror.org/0360zcg91","country_code":"CN","type":"education","lineage":["https://openalex.org/I132586189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhoufeng Liu","raw_affiliation_strings":["School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I132586189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091242254","display_name":"Baorui Wang","orcid":"https://orcid.org/0000-0002-1735-031X","observed_orcids":["https://orcid.org/0000-0002-1735-031X"]},"institutions":[{"id":"https://openalex.org/I132586189","display_name":"Zhongyuan University of Technology","ror":"https://ror.org/0360zcg91","country_code":"CN","type":"education","lineage":["https://openalex.org/I132586189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baorui Wang","raw_affiliation_strings":["School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I132586189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100341679","display_name":"Chunlei Li","orcid":"https://orcid.org/0000-0001-6543-1838","observed_orcids":["https://orcid.org/0000-0001-6543-1838"]},"institutions":[{"id":"https://openalex.org/I132586189","display_name":"Zhongyuan University of Technology","ror":"https://ror.org/0360zcg91","country_code":"CN","type":"education","lineage":["https://openalex.org/I132586189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunlei Li","raw_affiliation_strings":["School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I132586189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017842484","display_name":"Bicao Li","orcid":"https://orcid.org/0000-0003-2275-0681","observed_orcids":["https://orcid.org/0000-0003-2275-0681"]},"institutions":[{"id":"https://openalex.org/I132586189","display_name":"Zhongyuan University of Technology","ror":"https://ror.org/0360zcg91","country_code":"CN","type":"education","lineage":["https://openalex.org/I132586189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bicao Li","raw_affiliation_strings":["School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I132586189"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103235626","display_name":"Xianghui Liu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I132586189","display_name":"Zhongyuan University of Technology","ror":"https://ror.org/0360zcg91","country_code":"CN","type":"education","lineage":["https://openalex.org/I132586189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianghui Liu","raw_affiliation_strings":["School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Zhongyuan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I132586189"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I132586189"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"465","last_page":"470"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fabric-defect-detection","display_name":"fabric defect detection","score":0.9990000128746033},{"id":"https://openalex.org/keywords/textile-quality-control","display_name":"textile quality control","score":0.9409999847412109},{"id":"https://openalex.org/keywords/convolutional-neural-networks","display_name":"convolutional neural networks","score":0.8529999852180481},{"id":"https://openalex.org/keywords/low-rank-representation","display_name":"low-rank representation","score":1.0},{"id":"https://openalex.org/keywords/sparse-matrices","display_name":"sparse matrices","score":0.4819999933242798},{"id":"https://openalex.org/keywords/saliency-maps","display_name":"saliency maps","score":0.8610000014305115},{"id":"https://openalex.org/keywords/defect-segmentation","display_name":"defect segmentation","score":0.35100001096725464}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7015733122825623},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6848716735839844},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6822922229766846},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.6366745829582214},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.636014461517334},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.580000102519989},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.5606834888458252},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5378420352935791},{"id":"https://openalex.org/C164226766","wikidata":"https://www.wikidata.org/wiki/Q7293202","display_name":"Rank (graph theory)","level":2,"score":0.533134937286377},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.5083121657371521},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.4665963649749756},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.45980799198150635},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3905634880065918},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.36604005098342896},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.35875096917152405},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18981659412384033},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/acpr.2017.34","doi":"https://doi.org/10.1109/acpr.2017.34","is_oa":false,"landing_page_url":"https://doi.org/10.1109/acpr.2017.34","pdf_url":null,"source":{"id":"https://openalex.org/S4306417740","display_name":"Asian Conference on Pattern Recognition","issn_l":"2327-0985","issn":["2327-0985"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 4th IAPR Asian Conference on Pattern Recognition (ACPR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1736339626","https://openalex.org/W1840106123","https://openalex.org/W2002574940","https://openalex.org/W2020236530","https://openalex.org/W2037951414","https://openalex.org/W2041719651","https://openalex.org/W2049893410","https://openalex.org/W2082233783","https://openalex.org/W2103212315","https://openalex.org/W2122662811","https://openalex.org/W2129238487","https://openalex.org/W2169029660","https://openalex.org/W2348239616","https://openalex.org/W2370844328","https://openalex.org/W2391008898","https://openalex.org/W2514405712","https://openalex.org/W2611328865","https://openalex.org/W3158785904","https://openalex.org/W4255391993","https://openalex.org/W6929385289"],"related_works":["https://openalex.org/W3009260410","https://openalex.org/W3162494462","https://openalex.org/W2802862311","https://openalex.org/W4206151495","https://openalex.org/W3158662360","https://openalex.org/W2921163360","https://openalex.org/W2766021674","https://openalex.org/W2944105089","https://openalex.org/W3199091160","https://openalex.org/W2776411535"],"abstract_inverted_index":{"To":[0],"accurately":[1],"detect":[2],"the":[3,7,28,47,57,74,84,92,102,107,112,120,146,150],"fabric":[4,51,113,130],"defects":[5],"in":[6,40],"textile":[8],"quality":[9],"control":[10],"process,":[11],"this":[12],"paper":[13],"proposed":[14],"a":[15,63],"novel":[16],"detection":[17,147],"method":[18],"based":[19],"on":[20],"convolution":[21],"neural":[22],"network(CNN)":[23],"and":[24,34,55,79,86,139,145],"low-rank":[25,67,78],"representation(LRR).":[26],"First,":[27],"characteristics":[29],"of":[30,38,50],"multiple":[31],"nonlinear":[32],"transformations":[33],"multi-level":[35],"abstraction":[36],"ability":[37],"images":[39,52],"deep":[41],"learning":[42],"are":[43,60,125],"used":[44,99],"to":[45,72,100,110],"characterize":[46],"multi-layer":[48],"features":[49,59,121],"using":[53],"CNN,":[54],"then":[56],"extracted":[58,122],"concentrated":[61],"into":[62,77],"feature":[64,75,142],"matrix.":[65],"Second,":[66],"representation":[68],"model":[69],"is":[70,98],"adopted":[71],"divide":[73],"matrix":[76,109],"sparse":[80,108],"matrices,":[81],"which":[82],"indicate":[83],"background":[85],"salient":[87],"object":[88],"defects,":[89],"respectively.":[90],"Finally,":[91],"iterative":[93],"optimal":[94],"threshold":[95],"segmentation":[96],"algorithm":[97],"segment":[101],"saliency":[103],"maps":[104],"generated":[105],"by":[106,123],"locate":[111],"defect":[114],"region.":[115],"Experimental":[116],"results":[117,148],"show":[118],"that":[119],"CNN":[124],"more":[126],"suitable":[127],"for":[128],"characterizing":[129],"texture":[131],"than":[132],"traditional":[133],"methods,":[134],"such":[135],"as":[136],"HOG,":[137],"LBP,":[138],"other":[140],"hand-crafted":[141],"extraction":[143],"method,":[144],"outperforms":[149],"state-of-the-art.":[151]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":2}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2018-12-22T00:00:00"}