{"id":"https://openalex.org/W2903045461","doi":"https://doi.org/10.23919/eumc.2018.8541771","title":"Characterization and Modeling of Epitaxially Grown BST on a Conducting Oxide Electrode","display_name":"Characterization and Modeling of Epitaxially Grown BST on a Conducting Oxide Electrode","publication_year":2018,"publication_date":"2018-09-01","ids":{"openalex":"https://openalex.org/W2903045461","doi":"https://doi.org/10.23919/eumc.2018.8541771","mag":"2903045461"},"language":"en","primary_location":{"id":"doi:10.23919/eumc.2018.8541771","doi":"https://doi.org/10.23919/eumc.2018.8541771","is_oa":false,"landing_page_url":"https://doi.org/10.23919/eumc.2018.8541771","pdf_url":null,"source":{"id":"https://openalex.org/S4363607964","display_name":"European Microwave Conference (EuMC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 48th European Microwave Conference (EuMC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047093910","display_name":"Dominik Walk","orcid":"https://orcid.org/0000-0001-5161-1395","observed_orcids":["https://orcid.org/0000-0001-5161-1395"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"D. Walk","raw_affiliation_strings":["Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088547008","display_name":"Patrick Salg","orcid":"https://orcid.org/0000-0002-6208-0136","observed_orcids":["https://orcid.org/0000-0002-6208-0136"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Salg","raw_affiliation_strings":["Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070117835","display_name":"Daniel Kienemund","orcid":"https://orcid.org/0000-0001-5161-174X","observed_orcids":["https://orcid.org/0000-0001-5161-174X"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"D. Kienemund","raw_affiliation_strings":["Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034413004","display_name":"Aldin Radetinac","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Radetinac","raw_affiliation_strings":["Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049810440","display_name":"Lukas Zeinar","orcid":"https://orcid.org/0000-0003-4012-6057","observed_orcids":["https://orcid.org/0000-0003-4012-6057"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"L. Zeinar","raw_affiliation_strings":["Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101935674","display_name":"Christian Schuster","orcid":"https://orcid.org/0000-0002-1007-6602","observed_orcids":["https://orcid.org/0000-0002-1007-6602"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Schuster","raw_affiliation_strings":["Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021220947","display_name":"Philipp Komissinskiy","orcid":"https://orcid.org/0000-0003-1891-3011","observed_orcids":["https://orcid.org/0000-0003-1891-3011"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Komissinskiy","raw_affiliation_strings":["Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066626434","display_name":"Lambert Alff","orcid":"https://orcid.org/0000-0001-8185-4275","observed_orcids":["https://orcid.org/0000-0001-8185-4275"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"L. Alff","raw_affiliation_strings":["Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fachgebiet D\u00fcnne Schichten, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063219110","display_name":"Rolf Jakoby","orcid":"https://orcid.org/0000-0001-6568-830X","observed_orcids":["https://orcid.org/0000-0001-6568-830X"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R. Jakoby","raw_affiliation_strings":["Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053995587","display_name":"Holger Maune","orcid":"https://orcid.org/0000-0002-2216-4319","observed_orcids":["https://orcid.org/0000-0002-2216-4319"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H. Maune","raw_affiliation_strings":["Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Mikrowellentechnik und Photonik, Technische Universit\u00e4t Darmstadt, Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I31512782"],"apc_list":null,"apc_paid":null,"fwci":3.3893,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.91840731,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"563","last_page":"566"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9603999853134155,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9603999853134155,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11608","display_name":"Dielectric materials and actuators","score":0.007000000216066837,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10886","display_name":"Multiferroics and related materials","score":0.0052999998442828655,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/barium-strontium-titanate","display_name":"barium strontium titanate","score":0.9649999737739563},{"id":"https://openalex.org/keywords/epitaxial-films","display_name":"epitaxial thin films","score":0.8659999966621399},{"id":"https://openalex.org/keywords/electromagnetic-simulation","display_name":"electromagnetic simulation","score":0.8320000171661377},{"id":"https://openalex.org/keywords/quality-factor","display_name":"quality factor","score":0.8650000095367432},{"id":"https://openalex.org/keywords/permittivity-extraction","display_name":"permittivity extraction","score":0.7440000176429749},{"id":"https://openalex.org/keywords/leakage-current","display_name":"leakage current","score":0.8199999928474426},{"id":"https://openalex.org/keywords/dielectric-characterization","display_name":"dielectric characterization","score":0.6069999933242798},{"id":"https://openalex.org/keywords/defect-density","display_name":"defect density","score":0.5569999814033508}],"concepts":[{"id":"https://openalex.org/C15485314","wikidata":"https://www.wikidata.org/wiki/Q467463","display_name":"Varicap","level":4,"score":0.8532513976097107},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7711503505706787},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6743156909942627},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.6664829850196838},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6409561038017273},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.5920438766479492},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.5295031070709229},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.516946017742157},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4776434004306793},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4310850203037262},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.4260118901729584},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.41260826587677},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2569900155067444},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2072242796421051},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10104221105575562},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.23919/eumc.2018.8541771","doi":"https://doi.org/10.23919/eumc.2018.8541771","is_oa":false,"landing_page_url":"https://doi.org/10.23919/eumc.2018.8541771","pdf_url":null,"source":{"id":"https://openalex.org/S4363607964","display_name":"European Microwave Conference (EuMC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 48th European Microwave Conference (EuMC)","raw_type":"proceedings-article"},{"id":"pmh:oai:tubiblio.ulb.tu-darmstadt.de:111395","doi":null,"is_oa":false,"landing_page_url":"http://tubiblio.ulb.tu-darmstadt.de/111395/","pdf_url":null,"source":{"id":"https://openalex.org/S4377196390","display_name":"TUbilio (Technical University of Darmstadt)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I31512782","host_organization_name":"Technische Universit\u00e4t Darmstadt","host_organization_lineage":["https://openalex.org/I31512782"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Konferenzver\u00f6ffentlichung"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6100000143051147}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1607361739","https://openalex.org/W1678470872","https://openalex.org/W1972139148","https://openalex.org/W1994400358","https://openalex.org/W2033183160","https://openalex.org/W2076927690","https://openalex.org/W2091041127","https://openalex.org/W2100034852","https://openalex.org/W2107078581","https://openalex.org/W2118451830","https://openalex.org/W2142530600","https://openalex.org/W2142915162","https://openalex.org/W2169600326","https://openalex.org/W2560025493","https://openalex.org/W2587896014","https://openalex.org/W3146843868","https://openalex.org/W4205259921","https://openalex.org/W4230183566","https://openalex.org/W6793684074"],"related_works":["https://openalex.org/W2062881472","https://openalex.org/W3216548552","https://openalex.org/W2498090544","https://openalex.org/W2955171543","https://openalex.org/W1982040370","https://openalex.org/W1603773331","https://openalex.org/W2091485363","https://openalex.org/W2287154167","https://openalex.org/W2438383427","https://openalex.org/W1630724365"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,10,71],"characterization":[4,29],"technique":[5],"and":[6,25,36,41,155],"an":[7],"EM-model":[8],"for":[9,48,55,113,145],"thin":[11,147],"film":[12,80],"BST50":[13],"varactor":[14,59,116],"grown":[15],"on":[16,140],"the":[17,23,45,49,134],"oxide":[18,115],"electrode":[19],"material":[20],"SMO,":[21],"describing":[22],"benefits":[24],"limits":[26],"of":[27,120],"this":[28,56,114],"technique.":[30],"Effective":[31],"capacitance,":[32],"Q":[33,53,103,118],"factor,":[34],"ESR":[35],"leakage":[37],"current":[38],"are":[39],"evaluated":[40],"analyzed":[42],"to":[43,106,122,136],"understand":[44],"dominating":[46],"mechanisms":[47],"overall":[50],"characteristic.":[51],"The":[52,65,82,97],"factor":[54],"13.3":[57],"pF":[58],"is":[60,68,94],"20.5":[61],"at":[62,84,124,160],"1":[63,125],"GHz.":[64],"extracted":[66],"permittivity":[67],"365,":[69],"indicating":[70],"good":[72],"BST":[73,139,148],"crystal":[74],"quality":[75],"despite":[76],"only":[77],"80":[78],"nm":[79],"thickness.":[81],"tunability":[83,159],"battery":[85],"voltage":[86,91,163],"level":[87],"3.7":[88,165],"V":[89],"bias":[90],"(\\pmb46":[92],"V/\u03bcm)":[93],"67.8":[95],"%.":[96],"EM":[98],"model":[99],"shows":[100],"very":[101,146,151,157,161],"high":[102,111,158],"factors":[104,119],"up":[105,121],"6":[107],"GHz,":[108,126],"revealing":[109],"outstandingly":[110],"potential":[112],"with":[117,150],"70":[123],"while":[127],"still":[128],"maintaining":[129],"its":[130],"large":[131],"tunability.":[132],"Hence,":[133],"ability":[135],"epitaxially":[137],"grow":[138],"structurally":[141],"similar":[142],"SMO":[143],"allows":[144],"thicknesses":[149],"low":[152,162],"defect":[153],"density,":[154],"thus,":[156],"below":[164],"volts.":[166]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2019,"cited_by_count":3}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2025-10-10T00:00:00"}