{"id":"https://openalex.org/W2901147385","doi":null,"title":"Dual RF assisted Pulsed Laser Deposition of Transitional Metal Nitride Thin Films.","display_name":"Dual RF assisted Pulsed Laser Deposition of Transitional Metal Nitride Thin Films.","publication_year":2018,"publication_date":"2018-11-07","ids":{"openalex":"https://openalex.org/W2901147385","mag":"2901147385"},"language":"en","primary_location":{"id":"mag:2901147385","doi":null,"is_oa":false,"landing_page_url":"http://absimage.aps.org/image/GEC18/MWS_GEC18-2018-020005.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S2764664775","display_name":"Bulletin of the American Physical Society","issn_l":"0003-0503","issn":["0003-0503"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Bulletin of the American Physical Society","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087942831","display_name":"Heman Bhuyan","orcid":"https://orcid.org/0000-0002-6432-6654","observed_orcids":["https://orcid.org/0000-0002-6432-6654"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"H. Bhuyan","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-6432-6654","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101433412","display_name":"Partha Saikia","orcid":"https://orcid.org/0000-0003-0107-9200","observed_orcids":["https://orcid.org/0000-0003-0107-9200"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Partha Saikia","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0003-0107-9200","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071193337","display_name":"Miguel Escalona","orcid":"https://orcid.org/0000-0001-8777-6474","observed_orcids":["https://orcid.org/0000-0001-8777-6474"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Escalona","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0001-8777-6474","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091598255","display_name":"Mario Favre","orcid":"https://orcid.org/0000-0002-2146-2920","observed_orcids":["https://orcid.org/0000-0002-2146-2920"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Favre","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-2146-2920","affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108362846","display_name":"Edmundo Wyndham","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Edmundo Wyndham","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010518216","display_name":"Julian Schulze","orcid":"https://orcid.org/0000-0001-7929-5734","observed_orcids":["https://orcid.org/0000-0001-7929-5734"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Julian Schulze","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0001-7929-5734","affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5064312076","display_name":"Felipe Veloso","orcid":"https://orcid.org/0000-0002-6703-5449","observed_orcids":["https://orcid.org/0000-0002-6703-5449"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Felipe Veloso","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-6703-5449","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10526879,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.7753999829292297,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.7753999829292297,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.031199999153614044,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.022600000724196434,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pulsed-laser-deposition","display_name":"pulsed laser deposition","score":0.9810000061988831},{"id":"https://openalex.org/keywords/thin-films","display_name":"thin films","score":0.8410000205039978},{"id":"https://openalex.org/keywords/nitride-thin-films","display_name":"nitride thin films","score":0.5239999890327454}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7993305325508118},{"id":"https://openalex.org/C37982897","wikidata":"https://www.wikidata.org/wiki/Q901321","display_name":"Pulsed laser deposition","level":3,"score":0.6777564883232117},{"id":"https://openalex.org/C194760766","wikidata":"https://www.wikidata.org/wiki/Q410851","display_name":"Nitride","level":3,"score":0.6073782444000244},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5621746182441711},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5354663729667664},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.4968455135822296},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.496512234210968},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.465747207403183},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.4201497435569763},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.27459046244621277},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.2567364573478699},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17549169063568115},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.04879310727119446},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.036951810121536255},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2901147385","doi":null,"is_oa":false,"landing_page_url":"http://absimage.aps.org/image/GEC18/MWS_GEC18-2018-020005.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S2764664775","display_name":"Bulletin of the American Physical Society","issn_l":"0003-0503","issn":["0003-0503"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Bulletin of the American Physical Society","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7052153118","https://openalex.org/W2920696038","https://openalex.org/W2275592080","https://openalex.org/W2601098823","https://openalex.org/W7028047786","https://openalex.org/W6986778509","https://openalex.org/W7208619339","https://openalex.org/W3012524782","https://openalex.org/W2580125129","https://openalex.org/W2927450018"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-02T10:15:12.560889","created_date":"2018-11-29T00:00:00"}