{"id":"https://openalex.org/W2899019356","doi":"https://doi.org/10.1515/msp-2018-0037","title":"High transparency and conductivity of heavily In-doped ZnO thin films deposited by dip-coating method","display_name":"High transparency and conductivity of heavily In-doped ZnO thin films deposited by dip-coating method","publication_year":2018,"publication_date":"2018-09-01","ids":{"openalex":"https://openalex.org/W2899019356","doi":"https://doi.org/10.1515/msp-2018-0037","mag":"2899019356"},"language":"en","primary_location":{"id":"doi:10.1515/msp-2018-0037","doi":"https://doi.org/10.1515/msp-2018-0037","is_oa":true,"landing_page_url":"https://doi.org/10.1515/msp-2018-0037","pdf_url":"https://content.sciendo.com/downloadpdf/journals/msp/36/3/article-p427.pdf","source":{"id":"https://openalex.org/S4210195564","display_name":"Materials Science-Poland","issn_l":"0137-1339","issn":["0137-1339","2083-1331","2083-134X"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310320322","host_organization_name":"De Gruyter Open","host_organization_lineage":["https://openalex.org/P4310320322","https://openalex.org/P4310313990"],"host_organization_lineage_names":["De Gruyter Open","De Gruyter"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science-Poland","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://content.sciendo.com/downloadpdf/journals/msp/36/3/article-p427.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045299486","display_name":"Sara Benzitouni","orcid":"https://orcid.org/0000-0002-3478-6182","observed_orcids":["https://orcid.org/0000-0002-3478-6182"]},"institutions":[{"id":"https://openalex.org/I3132180716","display_name":"Larbi Ben M'hidi University of Oum El Bouaghi","ror":"https://ror.org/0034tbg85","country_code":"DZ","type":"education","lineage":["https://openalex.org/I3132180716"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"S. Benzitouni","raw_affiliation_strings":["Laboratoire des Composants Actifs et Mat\u00e9riaux (LCAM) , Universit\u00e9 Larbi Ben M\u2019Hidi , Oum el Bouaghi 04000 , Algieria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire des Composants Actifs et Mat\u00e9riaux (LCAM) , Universit\u00e9 Larbi Ben M\u2019Hidi , Oum el Bouaghi 04000 , Algieria","institution_ids":["https://openalex.org/I3132180716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070034865","display_name":"Mourad Zaabat","orcid":"https://orcid.org/0000-0003-1983-6927","observed_orcids":["https://orcid.org/0000-0003-1983-6927"]},"institutions":[{"id":"https://openalex.org/I3132180716","display_name":"Larbi Ben M'hidi University of Oum El Bouaghi","ror":"https://ror.org/0034tbg85","country_code":"DZ","type":"education","lineage":["https://openalex.org/I3132180716"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"M. Zaabat","raw_affiliation_strings":["Laboratoire des Composants Actifs et Mat\u00e9riaux (LCAM) , Universit\u00e9 Larbi Ben M\u2019Hidi , Oum el Bouaghi 04000 , Algieria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire des Composants Actifs et Mat\u00e9riaux (LCAM) , Universit\u00e9 Larbi Ben M\u2019Hidi , Oum el Bouaghi 04000 , Algieria","institution_ids":["https://openalex.org/I3132180716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113653029","display_name":"A. Mahdjoub","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I3132180716","display_name":"Larbi Ben M'hidi University of Oum El Bouaghi","ror":"https://ror.org/0034tbg85","country_code":"DZ","type":"education","lineage":["https://openalex.org/I3132180716"]}],"countries":["DZ"],"is_corresponding":true,"raw_author_name":"A. Mahdjoub","raw_affiliation_strings":["Laboratoire des Mat\u00e9riaux et Structures des Syst\u00e8mes Electrom\u00e9caniques et leur Fiabilit\u00e9 (LMSSEF) , Universit\u00e9 Larbi Ben M\u2019Hidi , Oum el Bouaghi 04000 , Algieria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire des Mat\u00e9riaux et Structures des Syst\u00e8mes Electrom\u00e9caniques et leur Fiabilit\u00e9 (LMSSEF) , Universit\u00e9 Larbi Ben M\u2019Hidi , Oum el Bouaghi 04000 , Algieria","institution_ids":["https://openalex.org/I3132180716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072245684","display_name":"Ahlem Benaboud","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I3132180716","display_name":"Larbi Ben M'hidi University of Oum El Bouaghi","ror":"https://ror.org/0034tbg85","country_code":"DZ","type":"education","lineage":["https://openalex.org/I3132180716"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"A. Benaboud","raw_affiliation_strings":["Laboratoire des Composants Actifs et Mat\u00e9riaux (LCAM) , Universit\u00e9 Larbi Ben M\u2019Hidi , Oum el Bouaghi 04000 , Algieria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire des Composants Actifs et Mat\u00e9riaux (LCAM) , Universit\u00e9 Larbi Ben M\u2019Hidi , Oum el Bouaghi 04000 , Algieria","institution_ids":["https://openalex.org/I3132180716"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059369430","display_name":"Boubekeur\u200f Boudine","orcid":"https://orcid.org/0000-0002-6917-5373","observed_orcids":["https://orcid.org/0000-0002-6917-5373"]},"institutions":[{"id":"https://openalex.org/I125485651","display_name":"University Fr\u00e8res Mentouri Constantine 1","ror":"https://ror.org/017wv6808","country_code":"DZ","type":"education","lineage":["https://openalex.org/I125485651"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"B. Boudine","raw_affiliation_strings":["Laboratoire de Cristallographie , Universit\u00e9 de Constantine 1 , Constantine 25000 , Algieria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire de Cristallographie , Universit\u00e9 de Constantine 1 , Constantine 25000 , Algieria","institution_ids":["https://openalex.org/I125485651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5113653029"],"corresponding_institution_ids":["https://openalex.org/I3132180716"],"apc_list":null,"apc_paid":null,"fwci":0.8746,"has_fulltext":true,"cited_by_count":17,"citation_normalized_percentile":{"value":0.6907048,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"36","issue":"3","first_page":"427","last_page":"434"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/indium-doped-zinc-oxide","display_name":"indium-doped zinc oxide","score":0.9710000157356262},{"id":"https://openalex.org/keywords/transparent-conducting-oxides","display_name":"transparent conducting oxides","score":0.8500000238418579},{"id":"https://openalex.org/keywords/dip-coating","display_name":"dip coating","score":0.718999981880188},{"id":"https://openalex.org/keywords/optical-transmittance","display_name":"optical transmittance","score":0.953000009059906},{"id":"https://openalex.org/keywords/electrical-conductivity","display_name":"electrical conductivity","score":0.9660000205039978},{"id":"https://openalex.org/keywords/grain-size","display_name":"grain size","score":0.7459999918937683},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"surface roughness","score":0.9819999933242798},{"id":"https://openalex.org/keywords/crystallinity","display_name":"crystallinity","score":0.7409999966621399},{"id":"https://openalex.org/keywords/wurtzite-structure","display_name":"wurtzite structure","score":0.8610000014305115},{"id":"https://openalex.org/keywords/carrier-concentration","display_name":"carrier concentration","score":0.8709999918937683},{"id":"https://openalex.org/keywords/indium-content","display_name":"indium content","score":0.5099999904632568}],"concepts":[{"id":"https://openalex.org/C3045981","wikidata":"https://www.wikidata.org/wiki/Q8039317","display_name":"Wurtzite crystal structure","level":3,"score":0.8889060020446777},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8869050741195679},{"id":"https://openalex.org/C46275449","wikidata":"https://www.wikidata.org/wiki/Q2458815","display_name":"Crystallinity","level":2,"score":0.7358444929122925},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.6680885553359985},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.615184485912323},{"id":"https://openalex.org/C150493377","wikidata":"https://www.wikidata.org/wiki/Q1427863","display_name":"Transmittance","level":2,"score":0.611426591873169},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.5593758225440979},{"id":"https://openalex.org/C543292547","wikidata":"https://www.wikidata.org/wiki/Q1094","display_name":"Indium","level":2,"score":0.5026094913482666},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.49638277292251587},{"id":"https://openalex.org/C192191005","wikidata":"https://www.wikidata.org/wiki/Q466491","display_name":"Grain size","level":2,"score":0.4625200033187866},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.376767098903656},{"id":"https://openalex.org/C535196362","wikidata":"https://www.wikidata.org/wiki/Q758","display_name":"Zinc","level":2,"score":0.327924907207489},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.32464930415153503},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.29160141944885254},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2383553683757782},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.11248376965522766},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1515/msp-2018-0037","doi":"https://doi.org/10.1515/msp-2018-0037","is_oa":true,"landing_page_url":"https://doi.org/10.1515/msp-2018-0037","pdf_url":"https://content.sciendo.com/downloadpdf/journals/msp/36/3/article-p427.pdf","source":{"id":"https://openalex.org/S4210195564","display_name":"Materials Science-Poland","issn_l":"0137-1339","issn":["0137-1339","2083-1331","2083-134X"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310320322","host_organization_name":"De Gruyter Open","host_organization_lineage":["https://openalex.org/P4310320322","https://openalex.org/P4310313990"],"host_organization_lineage_names":["De Gruyter Open","De Gruyter"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science-Poland","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:83a9404478234a1991cf72f34b910c8f","doi":null,"is_oa":false,"landing_page_url":"https://doaj.org/article/83a9404478234a1991cf72f34b910c8f","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Materials Science-Poland, Vol 36, Iss 3, Pp 427-434 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1515/msp-2018-0037","doi":"https://doi.org/10.1515/msp-2018-0037","is_oa":true,"landing_page_url":"https://doi.org/10.1515/msp-2018-0037","pdf_url":"https://content.sciendo.com/downloadpdf/journals/msp/36/3/article-p427.pdf","source":{"id":"https://openalex.org/S4210195564","display_name":"Materials Science-Poland","issn_l":"0137-1339","issn":["0137-1339","2083-1331","2083-134X"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","poland-70","russia-white-list-3"],"host_organization":"https://openalex.org/P4310320322","host_organization_name":"De Gruyter Open","host_organization_lineage":["https://openalex.org/P4310320322","https://openalex.org/P4310313990"],"host_organization_lineage_names":["De Gruyter Open","De Gruyter"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science-Poland","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2899019356.pdf","grobid_xml":"https://content.openalex.org/works/W2899019356.grobid-xml"},"referenced_works_count":43,"referenced_works":["https://openalex.org/W378256193","https://openalex.org/W415329110","https://openalex.org/W1744210417","https://openalex.org/W1930822899","https://openalex.org/W1966323501","https://openalex.org/W1975237236","https://openalex.org/W1979056121","https://openalex.org/W1994057248","https://openalex.org/W1995802276","https://openalex.org/W2001848482","https://openalex.org/W2004945162","https://openalex.org/W2005488287","https://openalex.org/W2022753294","https://openalex.org/W2030984961","https://openalex.org/W2034414525","https://openalex.org/W2055691448","https://openalex.org/W2057393875","https://openalex.org/W2057997267","https://openalex.org/W2063632311","https://openalex.org/W2071283847","https://openalex.org/W2072098138","https://openalex.org/W2077836727","https://openalex.org/W2088300846","https://openalex.org/W2088357490","https://openalex.org/W2095584959","https://openalex.org/W2097908037","https://openalex.org/W2109622617","https://openalex.org/W2111048112","https://openalex.org/W2116530746","https://openalex.org/W2137209069","https://openalex.org/W2137291229","https://openalex.org/W2140987589","https://openalex.org/W2145168235","https://openalex.org/W2156609560","https://openalex.org/W2167802173","https://openalex.org/W2252700656","https://openalex.org/W2299983527","https://openalex.org/W2311247412","https://openalex.org/W2359932297","https://openalex.org/W2406365815","https://openalex.org/W2468361082","https://openalex.org/W2480732259","https://openalex.org/W2594400758"],"related_works":["https://openalex.org/W2581899368","https://openalex.org/W2795682675","https://openalex.org/W1983516033","https://openalex.org/W2062702327","https://openalex.org/W2023208296","https://openalex.org/W2056573889","https://openalex.org/W4378836299","https://openalex.org/W2369236951","https://openalex.org/W1978121426","https://openalex.org/W862498633"],"abstract_inverted_index":{"Abstract":[0],"Heavily":[1],"In":[2,26,68,116,123],"doped":[3],"zinc":[4],"oxide":[5],"(IZO)":[6],"thin":[7],"films":[8,58,72],"were":[9,59],"deposited":[10,57],"on":[11,28,40],"glass":[12],"substrates":[13],"by":[14],"dip-coating":[15],"method":[16],"with":[17,113,121,140,160],"different":[18],"concentrations":[19],"of":[20,24,36,43,55,87,92,164],"indium.":[21],"The":[22,52,74,97,118],"effect":[23,50],"heavy":[25],"doping":[27,69],"the":[29,41,62,71,80,89,93,114,130,137,145,149,155],"structural,":[30],"morphological,":[31],"optical":[32,76],"and":[33,48,154,179],"electrical":[34],"properties":[35],"ZnO":[37,63,107],"was":[38],"discussed":[39],"basis":[42],"XRD,":[44],"AFM,":[45],"UV-Vis":[46],"spectra":[47],"Hall":[49],"measurements.":[51],"diffraction":[53],"patterns":[54],"all":[56,134],"indexed":[60],"to":[61,108],"wurtzite":[64],"structure.":[65],"However,":[66],"high":[67],"damaged":[70],"crystallinity.":[73],"highest":[75,150],"transmittance":[77,151],"observed":[78],"in":[79,129],"visible":[81],"region":[82],"(>93":[83],"%)":[84,153],"exceeded":[85],"that":[86],"ITO:":[88],"absolute":[90],"rival":[91],"most":[94],"commercial":[95],"TCOs.":[96],"grain":[98],"size":[99],"significantly":[100],"decreased":[101,120],"from":[102],"140":[103],"nm":[104,110],"for":[105,111,176],"undoped":[106],"17.1":[109],"IZO":[112],"greatest":[115],"ratio.":[117],"roughness":[119],"increasing":[122],"atomic":[124],"ratio,":[125],"indicating":[126],"an":[127],"improvement":[128],"surface":[131],"quality.":[132],"Among":[133],"synthesized":[135],"films,":[136],"sample":[138],"obtained":[139],"11":[141],"at.%":[142],"indium":[143],"showed":[144],"best":[146],"TCO":[147],"properties:":[148],"(93.5":[152],"lowest":[156],"resistivity":[157],"(0.41":[158],"\u03a9cm)":[159],"a":[161,173],"carrier":[162],"concentration":[163],"2.4":[165],"\u00d7":[166],"1017":[167],"cm\u22123.":[168],"These":[169],"results":[170],"could":[171],"be":[172],"promising":[174],"solution":[175],"possible":[177],"photonic":[178],"optoelectronic":[180],"applications.":[181]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2018-11-09T00:00:00"}