{"id":"https://openalex.org/W2896473822","doi":"https://doi.org/10.1109/mecatronics.2018.8495682","title":"Robust Printing Defect Detection on 3D Textured Surfaces by Multiple Paired Pixel Consistency of Orientation Codes","display_name":"Robust Printing Defect Detection on 3D Textured Surfaces by Multiple Paired Pixel Consistency of Orientation Codes","publication_year":2018,"publication_date":"2018-09-01","ids":{"openalex":"https://openalex.org/W2896473822","doi":"https://doi.org/10.1109/mecatronics.2018.8495682","mag":"2896473822"},"language":"en","primary_location":{"id":"doi:10.1109/mecatronics.2018.8495682","doi":"https://doi.org/10.1109/mecatronics.2018.8495682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mecatronics.2018.8495682","pdf_url":null,"source":{"id":"https://openalex.org/S7407104834","display_name":"France-Japan and Europe-Asia Congress on Mechatronics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 12th France-Japan and 10th Europe-Asia Congress on Mechatronics","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069219056","display_name":"Sheng Xiang","orcid":"https://orcid.org/0000-0002-5183-7076","observed_orcids":["https://orcid.org/0000-0002-5183-7076"]},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sheng Xiang","raw_affiliation_strings":["Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Japan","institution_ids":["https://openalex.org/I205349734"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039034303","display_name":"Yaping Yan","orcid":"https://orcid.org/0000-0002-1933-732X","observed_orcids":["https://orcid.org/0000-0002-1933-732X"]},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yaping Yan","raw_affiliation_strings":["Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Japan","institution_ids":["https://openalex.org/I205349734"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072962468","display_name":"Hirokazu Asano","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hirokazu Asano","raw_affiliation_strings":["HUAWEI TECHNOLOGIES JAPAN K.K., Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HUAWEI TECHNOLOGIES JAPAN K.K., Kanagawa, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112391977","display_name":"Shunrichi Kaneko","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shunrichi Kaneko","raw_affiliation_strings":["Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Japan","institution_ids":["https://openalex.org/I205349734"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8335,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.65109961,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"373","last_page":"378"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visual-inspection","display_name":"visual inspection","score":0.6859999895095825},{"id":"https://openalex.org/keywords/illumination-variation","display_name":"illumination variation","score":0.6600000262260437},{"id":"https://openalex.org/keywords/defect-localization","display_name":"defect localization","score":0.6039999723434448}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.8166224360466003},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7566785216331482},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.7043263912200928},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6906731724739075},{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.6466149091720581},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6354707479476929},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.5807380080223083},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.43777209520339966},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4133138954639435},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18133553862571716},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.08064356446266174},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mecatronics.2018.8495682","doi":"https://doi.org/10.1109/mecatronics.2018.8495682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mecatronics.2018.8495682","pdf_url":null,"source":{"id":"https://openalex.org/S7407104834","display_name":"France-Japan and Europe-Asia Congress on Mechatronics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 12th France-Japan and 10th Europe-Asia Congress on Mechatronics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1975551334","https://openalex.org/W2027131580","https://openalex.org/W2034851609","https://openalex.org/W2037982060","https://openalex.org/W2071355008","https://openalex.org/W2097946161","https://openalex.org/W2120969424","https://openalex.org/W2125867201","https://openalex.org/W2127116182","https://openalex.org/W2164331010","https://openalex.org/W2286998565","https://openalex.org/W2498167518"],"related_works":["https://openalex.org/W3092054340","https://openalex.org/W3011959335","https://openalex.org/W2903396697","https://openalex.org/W2898039405","https://openalex.org/W2972875638","https://openalex.org/W2525211876","https://openalex.org/W3175056534","https://openalex.org/W4297664894","https://openalex.org/W2351817809","https://openalex.org/W7160919644"],"abstract_inverted_index":{"A":[0],"new":[1],"method":[2,119],"for":[3,31,85,109,120],"defect":[4,121],"detection":[5],"in":[6],"3D":[7,17,67],"textured":[8,18,68],"(SHIBO)":[9],"surface":[10],"is":[11,45,64,84,97],"proposed.":[12],"In":[13],"the":[14,49,101,114,117],"presence":[15],"of":[16,38,54,73,116],"surfaces,":[19],"and/or":[20],"illumination":[21],"change":[22],"such":[23,42],"as":[24,37],"shadowing":[25],"or":[26],"highlighting,":[27],"many":[28],"conventional":[29],"ways":[30],"visual":[32],"inspection":[33,122],"have":[34],"been":[35],"proved":[36],"some":[39],"troubles.":[40],"For":[41],"purposes,":[43],"it":[44],"proposed":[46,118],"to":[47,58,98],"utilize":[48],"orientation":[50],"code":[51],"based":[52,89],"consistence":[53],"multiple":[55,91],"pixel":[56,93,103],"pairs":[57],"detect":[59],"defects":[60],"on":[61,66,90],"character":[62],"which":[63],"printed":[65],"surface.":[69],"This":[70],"algorithm":[71],"consists":[72],"two":[74],"stages,":[75],"they":[76],"are":[77],"training":[78],"stage":[79,83,96],"and":[80,123],"detectingstage.":[81],"Training":[82],"making":[86],"defect-free":[87],"model":[88],"paired":[92],"consistency.":[94],"Detecting":[95],"identify":[99],"whether":[100],"target":[102],"match":[104],"its":[105],"model.":[106],"Experimental":[107],"results":[108],"real":[110],"products":[111],"image":[112],"demonstrate":[113],"effectiveness":[115],"location.":[124]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2018-10-26T00:00:00"}