{"id":"https://openalex.org/W2890657331","doi":"https://doi.org/10.1107/s1600576718017302","title":"Mapping of individual dislocations with dark-field X-ray microscopy","display_name":"Mapping of individual dislocations with dark-field X-ray microscopy","publication_year":2019,"publication_date":"2019-02-01","ids":{"openalex":"https://openalex.org/W2890657331","doi":"https://doi.org/10.1107/s1600576718017302","mag":"2890657331"},"language":"en","primary_location":{"id":"doi:10.1107/s1600576718017302","doi":"https://doi.org/10.1107/s1600576718017302","is_oa":true,"landing_page_url":"https://doi.org/10.1107/s1600576718017302","pdf_url":"https://journals.iucr.org/j/issues/2019/01/00/ks5610/ks5610.pdf","source":{"id":"https://openalex.org/S79162954","display_name":"Journal of Applied Crystallography","issn_l":"0021-8898","issn":["0021-8898","1600-5767"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Crystallography","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://journals.iucr.org/j/issues/2019/01/00/ks5610/ks5610.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002449956","display_name":"Anders Clemen Jakobsen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I96673099","display_name":"Technical University of Denmark","ror":"https://ror.org/04qtj9h94","country_code":"DK","type":"education","lineage":["https://openalex.org/I96673099"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"A.\u00a0C. Jakobsen","raw_affiliation_strings":["Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark","institution_ids":["https://openalex.org/I96673099"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013405714","display_name":"Hugh Simons","orcid":"https://orcid.org/0000-0002-3093-9241","observed_orcids":["https://orcid.org/0000-0002-3093-9241"]},"institutions":[{"id":"https://openalex.org/I96673099","display_name":"Technical University of Denmark","ror":"https://ror.org/04qtj9h94","country_code":"DK","type":"education","lineage":["https://openalex.org/I96673099"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"H. Simons","raw_affiliation_strings":["Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark","institution_ids":["https://openalex.org/I96673099"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078855596","display_name":"Wolfgang Ludwig","orcid":"https://orcid.org/0000-0002-3256-3831","observed_orcids":["https://orcid.org/0000-0002-3256-3831"]},"institutions":[{"id":"https://openalex.org/I2801997478","display_name":"European Synchrotron Radiation Facility","ror":"https://ror.org/02550n020","country_code":"FR","type":"facility","lineage":["https://openalex.org/I2801997478"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"W. Ludwig","raw_affiliation_strings":["European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS40220, 38043 Grenoble Cedex 9, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS40220, 38043 Grenoble Cedex 9, France","institution_ids":["https://openalex.org/I2801997478"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045954769","display_name":"Can Yildirim","orcid":"https://orcid.org/0000-0002-4969-0685","observed_orcids":["https://orcid.org/0000-0002-4969-0685"]},"institutions":[{"id":"https://openalex.org/I2801997478","display_name":"European Synchrotron Radiation Facility","ror":"https://ror.org/02550n020","country_code":"FR","type":"facility","lineage":["https://openalex.org/I2801997478"]},{"id":"https://openalex.org/I4210142458","display_name":"OnderzoeksCentrum voor de Aanwending van Staal","ror":"https://ror.org/04r9e1a13","country_code":"BE","type":"facility","lineage":["https://openalex.org/I4210142458"]}],"countries":["BE","FR"],"is_corresponding":false,"raw_author_name":"C. Yildirim","raw_affiliation_strings":["European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS40220, 38043 Grenoble Cedex 9, France","OCAS, J. F. Kennedylaan 3, 9060 Zelzate, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS40220, 38043 Grenoble Cedex 9, France","institution_ids":["https://openalex.org/I2801997478"]},{"raw_affiliation_string":"OCAS, J. F. Kennedylaan 3, 9060 Zelzate, Belgium","institution_ids":["https://openalex.org/I4210142458"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030909962","display_name":"Hanna Leemreize","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I3019169596","display_name":"Danish Technological Institute","ror":"https://ror.org/00n87rr37","country_code":"DK","type":"nonprofit","lineage":["https://openalex.org/I3019169596"]},{"id":"https://openalex.org/I96673099","display_name":"Technical University of Denmark","ror":"https://ror.org/04qtj9h94","country_code":"DK","type":"education","lineage":["https://openalex.org/I96673099"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"H. Leemreize","raw_affiliation_strings":["Danish Technological Institute, Kongsvang Alle 29, 8000 Aarhus, Denmark","Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Danish Technological Institute, Kongsvang Alle 29, 8000 Aarhus, Denmark","institution_ids":["https://openalex.org/I3019169596"]},{"raw_affiliation_string":"Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark","institution_ids":["https://openalex.org/I96673099"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045172193","display_name":"Lukas Porz","orcid":"https://orcid.org/0000-0003-3163-085X","observed_orcids":["https://orcid.org/0000-0003-3163-085X"]},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"L. Porz","raw_affiliation_strings":["Materialwissenschaft, TU Darmstadt, Alarich-Weiss-Strasse 2, 64287 Darmstadt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materialwissenschaft, TU Darmstadt, Alarich-Weiss-Strasse 2, 64287 Darmstadt, Germany","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090365365","display_name":"C. Detlefs","orcid":"https://orcid.org/0000-0003-2573-2286","observed_orcids":["https://orcid.org/0000-0003-2573-2286"]},"institutions":[{"id":"https://openalex.org/I2801997478","display_name":"European Synchrotron Radiation Facility","ror":"https://ror.org/02550n020","country_code":"FR","type":"facility","lineage":["https://openalex.org/I2801997478"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Detlefs","raw_affiliation_strings":["European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS40220, 38043 Grenoble Cedex 9, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS40220, 38043 Grenoble Cedex 9, France","institution_ids":["https://openalex.org/I2801997478"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076764691","display_name":"Henning Friis Poulsen","orcid":"https://orcid.org/0000-0001-7876-4113","observed_orcids":["https://orcid.org/0000-0001-7876-4113"]},"institutions":[{"id":"https://openalex.org/I96673099","display_name":"Technical University of Denmark","ror":"https://ror.org/04qtj9h94","country_code":"DK","type":"education","lineage":["https://openalex.org/I96673099"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"H.\u00a0F. Poulsen","raw_affiliation_strings":["Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark"],"raw_orcid":"https://orcid.org/0000-0001-7876-4113","affiliations":[{"raw_affiliation_string":"Department of Physics, Technical University of Denmark, 2800 Kongens Lyngby, Denmark","institution_ids":["https://openalex.org/I96673099"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3400,"currency":"USD","value_usd":3400},"apc_paid":null,"fwci":5.9492,"has_fulltext":true,"cited_by_count":62,"citation_normalized_percentile":{"value":0.97213833,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"52","issue":"1","first_page":"122","last_page":"132"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.9794999957084656,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.9794999957084656,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.01640000008046627,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.0012000000569969416,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dark-field-x-ray-microscopy","display_name":"dark-field X-ray microscopy","score":0.9869999885559082},{"id":"https://openalex.org/keywords/lattice-strain","display_name":"lattice strain","score":0.47699999809265137},{"id":"https://openalex.org/keywords/misfit-dislocations","display_name":"misfit dislocations","score":0.7639999985694885},{"id":"https://openalex.org/keywords/image-contrast","display_name":"image contrast","score":0.5659999847412109},{"id":"https://openalex.org/keywords/diamond-crystals","display_name":"diamond crystals","score":0.5659999847412109},{"id":"https://openalex.org/keywords/srtio3","display_name":"SrTiO3","score":0.8090000152587891},{"id":"https://openalex.org/keywords/bifeo3-thin-films","display_name":"BiFeO3 thin films","score":0.8579999804496765},{"id":"https://openalex.org/keywords/epitaxial-films","display_name":"epitaxial thin films","score":0.7049999833106995}],"concepts":[{"id":"https://openalex.org/C53120450","wikidata":"https://www.wikidata.org/wiki/Q899540","display_name":"Dark field microscopy","level":3,"score":0.8679460287094116},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.5976998209953308},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5094001889228821},{"id":"https://openalex.org/C2779328170","wikidata":"https://www.wikidata.org/wiki/Q34777","display_name":"X-ray","level":2,"score":0.505516767501831},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4788244068622589},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4074642062187195},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.3636813163757324},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.35799330472946167},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3305433988571167},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.21670779585838318},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09164673089981079},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1107/s1600576718017302","doi":"https://doi.org/10.1107/s1600576718017302","is_oa":true,"landing_page_url":"https://doi.org/10.1107/s1600576718017302","pdf_url":"https://journals.iucr.org/j/issues/2019/01/00/ks5610/ks5610.pdf","source":{"id":"https://openalex.org/S79162954","display_name":"Journal of Applied Crystallography","issn_l":"0021-8898","issn":["0021-8898","1600-5767"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Crystallography","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-02404526v1","doi":null,"is_oa":true,"landing_page_url":"https://hal.science/hal-02404526","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Applied Crystallography, 2019, 52 (1), pp.122-132. &#x27E8;10.1107/S1600576718017302&#x27E9;","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:pure.atira.dk:publications/38c06638-96da-48e0-8854-036f4f230371","doi":null,"is_oa":true,"landing_page_url":"https://orbit.dtu.dk/en/publications/38c06638-96da-48e0-8854-036f4f230371","pdf_url":null,"source":{"id":"https://openalex.org/S4306400705","display_name":"Technical University of Denmark, DTU Orbit (Technical University of Denmark, DTU)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I96673099","host_organization_name":"Technical University of Denmark","host_organization_lineage":["https://openalex.org/I96673099"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Jakobsen , A C , Simons , H , Ludwig , W , Yildirim , C , Leemreize , H , Porz , L , Detlefs , C &amp; Poulsen , H F 2019 , ' Mapping of individual dislocations with dark field x-ray microscopy ' , Journal of Applied Crystallography , vol. 52 , no. 1 , pp. 122-132 . https://doi.org/10.1107/S1600576718017302","raw_type":"article"},{"id":"pmh:oai:tubiblio.ulb.tu-darmstadt.de:123250","doi":null,"is_oa":false,"landing_page_url":"http://tubiblio.ulb.tu-darmstadt.de/123250/","pdf_url":null,"source":{"id":"https://openalex.org/S4377196390","display_name":"TUbilio (Technical University of Darmstadt)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I31512782","host_organization_name":"Technische Universit\u00e4t Darmstadt","host_organization_lineage":["https://openalex.org/I31512782"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Artikel"}],"best_oa_location":{"id":"doi:10.1107/s1600576718017302","doi":"https://doi.org/10.1107/s1600576718017302","is_oa":true,"landing_page_url":"https://doi.org/10.1107/s1600576718017302","pdf_url":"https://journals.iucr.org/j/issues/2019/01/00/ks5610/ks5610.pdf","source":{"id":"https://openalex.org/S79162954","display_name":"Journal of Applied Crystallography","issn_l":"0021-8898","issn":["0021-8898","1600-5767"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Crystallography","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G6113932591","display_name":"Diffraction Based Transmission X-ray Microscopy","funder_award_id":"291321","funder_id":"https://openalex.org/F4320338352","funder_display_name":"FP7 Ideas: European Research Council"}],"funders":[{"id":"https://openalex.org/F4320313796","display_name":"Innovationsfonden","ror":"https://ror.org/00daj4111"},{"id":"https://openalex.org/F4320338352","display_name":"FP7 Ideas: European Research Council","ror":"https://ror.org/0472cxd90"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2890657331.pdf","grobid_xml":"https://content.openalex.org/works/W2890657331.grobid-xml"},"referenced_works_count":36,"referenced_works":["https://openalex.org/W617221602","https://openalex.org/W1503171527","https://openalex.org/W1839529464","https://openalex.org/W1976116251","https://openalex.org/W1986147083","https://openalex.org/W1989557764","https://openalex.org/W1993321047","https://openalex.org/W2001292730","https://openalex.org/W2005532131","https://openalex.org/W2007283964","https://openalex.org/W2012536660","https://openalex.org/W2013788783","https://openalex.org/W2016820029","https://openalex.org/W2022378295","https://openalex.org/W2027014494","https://openalex.org/W2030278212","https://openalex.org/W2037843910","https://openalex.org/W2049986789","https://openalex.org/W2060127202","https://openalex.org/W2064662287","https://openalex.org/W2069217794","https://openalex.org/W2069648520","https://openalex.org/W2070980179","https://openalex.org/W2084143989","https://openalex.org/W2088300220","https://openalex.org/W2090406335","https://openalex.org/W2105318991","https://openalex.org/W2116670302","https://openalex.org/W2157816645","https://openalex.org/W2252311859","https://openalex.org/W2573588097","https://openalex.org/W2589842662","https://openalex.org/W2759157763","https://openalex.org/W2809279263","https://openalex.org/W2891857004","https://openalex.org/W2898712814"],"related_works":["https://openalex.org/W4282939103","https://openalex.org/W4283161366","https://openalex.org/W2021082401","https://openalex.org/W2113205597","https://openalex.org/W3105023009","https://openalex.org/W3022025451","https://openalex.org/W99653359","https://openalex.org/W2001655186","https://openalex.org/W2768338647","https://openalex.org/W650275867"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"an":[3,29,73,82],"X-ray":[4,30],"microscopy":[5],"approach":[6,119],"for":[7,62],"mapping":[8,112],"deeply":[9],"embedded":[10],"dislocations":[11,45,153],"in":[12,33,78,84,106,135,154],"three":[13,123],"dimensions":[14],"using":[15],"a":[16,20,93,127,131,141,148,155,164],"monochromatic":[17],"beam":[18,54],"with":[19],"low":[21],"divergence.":[22],"Magnified":[23],"images":[24],"are":[25,56,60,178],"acquired":[26],"by":[27],"inserting":[28],"objective":[31,71],"lens":[32],"the":[34,42,63,67,70,85,90,170,175],"diffracted":[35],"beam.":[36],"The":[37,118],"strain":[38,115],"fields":[39],"close":[40],"to":[41,48],"core":[43],"of":[44,69,89,96,113,125,130,151,174],"give":[46],"rise":[47],"scattering":[49],"at":[50,172],"angles":[51],"where":[52],"weak":[53],"conditions":[55],"obtained.":[57],"Analytical":[58],"expressions":[59],"derived":[61],"image":[64],"contrast.":[65],"While":[66],"use":[68],"implies":[72],"integration":[74],"over":[75],"two":[76],"directions":[77],"reciprocal":[79],"space,":[80],"scanning":[81],"aperture":[83],"back":[86],"focal":[87],"plane":[88],"microscope":[91],"allows":[92],"reciprocal-space":[94],"resolution":[95],"\u0394":[97],"Q":[98,100],"/":[99],"<":[101],"5":[102],"\u00d7":[103],"10":[104],"\u22125":[105],"all":[107],"directions,":[108],"ultimately":[109],"enabling":[110],"high-precision":[111],"lattice":[114],"and":[116,147],"tilt.":[117],"is":[120],"demonstrated":[121],"on":[122,140,163],"types":[124],"samples:":[126],"multi-scale":[128],"study":[129,150],"large":[132],"diamond":[133],"crystal":[134],"transmission,":[136],"magnified":[137],"section":[138],"topography":[139],"140":[142],"\u00b5m-thick":[143],"SrTiO":[144],"3":[145,159],"sample":[146],"reflection":[149],"misfit":[152],"120":[156],"nm-thick":[157],"BiFeO":[158],"film":[160],"epitaxially":[161],"grown":[162],"thick":[165],"substrate.":[166],"With":[167],"optimal":[168],"contrast,":[169],"half-widths":[171],"half-maximum":[173],"dislocation":[176],"lines":[177],"200":[179],"nm.":[180]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":12},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":3}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2025-10-10T00:00:00"}