{"id":"https://openalex.org/W2889524778","doi":"https://doi.org/10.1109/ted.2018.2864623","title":"Compact Scalable Modeling of Chipless RFID Tag Based on High-Impedance Surface","display_name":"Compact Scalable Modeling of Chipless RFID Tag Based on High-Impedance Surface","publication_year":2018,"publication_date":"2018-08-28","ids":{"openalex":"https://openalex.org/W2889524778","doi":"https://doi.org/10.1109/ted.2018.2864623","mag":"2889524778"},"language":"en","primary_location":{"id":"doi:10.1109/ted.2018.2864623","doi":"https://doi.org/10.1109/ted.2018.2864623","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ted.2018.2864623","pdf_url":null,"source":{"id":"https://openalex.org/S162355128","display_name":"IEEE Transactions on Electron Devices","issn_l":"0018-9383","issn":["0018-9383","1557-9646"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","norway-2","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electron Devices","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Na Chen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4391768253","display_name":"State Key Laboratory of Millimeter Waves","ror":"https://ror.org/02q1v5910","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]},{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Na Chen","raw_affiliation_strings":["State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015877369","display_name":"Yizhu Shen","orcid":"https://orcid.org/0000-0002-6544-2868","observed_orcids":["https://orcid.org/0000-0002-6544-2868","https://orcid.org/0000-0003-1428-5978"]},"institutions":[{"id":"https://openalex.org/I4391768253","display_name":"State Key Laboratory of Millimeter Waves","ror":"https://ror.org/02q1v5910","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]},{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yizhu Shen","raw_affiliation_strings":["State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0003-1428-5978","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046048672","display_name":"Guoqing Dong","orcid":"https://orcid.org/0000-0001-7222-4730","observed_orcids":["https://orcid.org/0000-0001-7222-4730"]},"institutions":[{"id":"https://openalex.org/I4391768253","display_name":"State Key Laboratory of Millimeter Waves","ror":"https://ror.org/02q1v5910","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]},{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoqing Dong","raw_affiliation_strings":["State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091827081","display_name":"Sanming Hu","orcid":"https://orcid.org/0000-0003-1167-2307","observed_orcids":["https://orcid.org/0000-0003-1167-2307"]},"institutions":[{"id":"https://openalex.org/I4391768253","display_name":"State Key Laboratory of Millimeter Waves","ror":"https://ror.org/02q1v5910","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]},{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sanming Hu","raw_affiliation_strings":["State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0003-1167-2307","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I4391768253","https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":1.4693,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.84458624,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"66","issue":"1","first_page":"200","last_page":"206"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.9413999915122986,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.9413999915122986,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.03929999843239784,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.0019000000320374966,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chipless-rfid-tag","display_name":"chipless RFID tag","score":0.9110000133514404},{"id":"https://openalex.org/keywords/high-impedance-surface","display_name":"high impedance surface","score":0.9869999885559082},{"id":"https://openalex.org/keywords/scalable-modeling","display_name":"scalable modeling","score":0.7509999871253967},{"id":"https://openalex.org/keywords/radar-cross-section","display_name":"radar cross section","score":0.8270000219345093},{"id":"https://openalex.org/keywords/polarizability","display_name":"polarizability","score":0.9549999833106995},{"id":"https://openalex.org/keywords/surface-current-distribution","display_name":"surface current distribution","score":0.9990000128746033}],"concepts":[{"id":"https://openalex.org/C2775974325","wikidata":"https://www.wikidata.org/wiki/Q16154688","display_name":"Chipless RFID","level":3,"score":0.9815852642059326},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.7090858221054077},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6582246422767639},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6414263248443604},{"id":"https://openalex.org/C204222849","wikidata":"https://www.wikidata.org/wiki/Q104954","display_name":"Radio-frequency identification","level":2,"score":0.589809775352478},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5376236438751221},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.505973756313324},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4468758702278137},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.41793346405029297},{"id":"https://openalex.org/C101457746","wikidata":"https://www.wikidata.org/wiki/Q560430","display_name":"Radar cross-section","level":3,"score":0.4138167202472687},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.40026095509529114},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.38982507586479187},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.34482860565185547},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3041708469390869},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.20157259702682495},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15526962280273438},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ted.2018.2864623","doi":"https://doi.org/10.1109/ted.2018.2864623","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ted.2018.2864623","pdf_url":null,"source":{"id":"https://openalex.org/S162355128","display_name":"IEEE Transactions on Electron Devices","issn_l":"0018-9383","issn":["0018-9383","1557-9646"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","norway-2","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electron Devices","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G1739656325","display_name":null,"funder_award_id":"61831006","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4726831032","display_name":null,"funder_award_id":"61701111","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8656093574","display_name":null,"funder_award_id":"61701112","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W29163754","https://openalex.org/W1522573321","https://openalex.org/W1549287041","https://openalex.org/W1550026935","https://openalex.org/W1982337069","https://openalex.org/W2009141478","https://openalex.org/W2014906282","https://openalex.org/W2016703028","https://openalex.org/W2021688873","https://openalex.org/W2024913388","https://openalex.org/W2105328180","https://openalex.org/W2116724477","https://openalex.org/W2123049816","https://openalex.org/W2139696726","https://openalex.org/W2149323194","https://openalex.org/W2168552293","https://openalex.org/W2462587267","https://openalex.org/W2557881482","https://openalex.org/W2765941026","https://openalex.org/W2773182087","https://openalex.org/W2778247278","https://openalex.org/W2790847842"],"related_works":["https://openalex.org/W2598065076","https://openalex.org/W3161592593","https://openalex.org/W2803892450","https://openalex.org/W2955166636","https://openalex.org/W2987927931","https://openalex.org/W4296911498","https://openalex.org/W2763160418","https://openalex.org/W3194241529","https://openalex.org/W2286698087","https://openalex.org/W2075560320"],"abstract_inverted_index":{"This":[0,13,104],"paper":[1],"proposes":[2],"a":[3,69],"compact":[4,14,42,105],"model":[5,16,107],"for":[6],"chipless":[7,36,48,71,109],"radio":[8],"frequency":[9],"identification":[10],"(RFID)":[11],"tag.":[12,37],"scalable":[15,106],"consists":[17],"of":[18,23,34,47,93,108,124],"capacitors,":[19],"inductors,":[20],"and":[21,87],"resistors":[22],"which":[24],"their":[25],"values":[26],"are":[27],"directly":[28],"described":[29],"by":[30,53],"the":[31,35,66,102,115,125],"physical":[32,94],"dimension":[33],"Moreover,":[38],"based":[39,56,74],"on":[40,57,75],"this":[41],"model,":[43,68],"radar":[44],"cross":[45],"section":[46],"RFID":[49,72,110],"tag":[50,73,111,116],"is":[51,79],"predicted,":[52],"analyzing":[54],"polarizability":[55],"surface":[58,77],"current":[59],"distribution":[60],"in":[61],"different":[62],"modes.":[63],"To":[64],"validate":[65],"proposed":[67],"5-bit":[70],"high-impedance":[76],"(HIS)":[78],"presented,":[80],"with":[81],"good":[82],"agreement":[83],"among":[84],"modeled,":[85],"simulated,":[86],"measured":[88],"results.":[89],"A":[90],"wide":[91],"range":[92],"parameters":[95],"have":[96],"also":[97,119],"been":[98],"validated":[99],"to":[100],"show":[101],"scalability.":[103],"not":[112],"only":[113],"simplifies":[114],"design,":[117],"but":[118],"provides":[120],"an":[121],"insight":[122],"understanding":[123],"HIS":[126],"structure.":[127]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2018-09-07T00:00:00"}