{"id":"https://openalex.org/W2889391007","doi":"https://doi.org/10.1109/ted.2018.2862918","title":"Analysis on Self-Heating Effects in Three-Stacked Nanoplate FET","display_name":"Analysis on Self-Heating Effects in Three-Stacked Nanoplate FET","publication_year":2018,"publication_date":"2018-08-29","ids":{"openalex":"https://openalex.org/W2889391007","doi":"https://doi.org/10.1109/ted.2018.2862918","mag":"2889391007"},"language":"en","primary_location":{"id":"doi:10.1109/ted.2018.2862918","doi":"https://doi.org/10.1109/ted.2018.2862918","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ted.2018.2862918","pdf_url":null,"source":{"id":"https://openalex.org/S162355128","display_name":"IEEE Transactions on Electron Devices","issn_l":"0018-9383","issn":["0018-9383","1557-9646"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","norway-2","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electron Devices","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100611375","display_name":"Hyunsuk Kim","orcid":"https://orcid.org/0000-0001-8874-7739","observed_orcids":["https://orcid.org/0000-0001-8874-7739"]},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunsuk Kim","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-8874-7739","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009441626","display_name":"Dokyun Son","orcid":"https://orcid.org/0000-0003-2204-5675","observed_orcids":["https://orcid.org/0000-0003-2204-5675"]},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dokyun Son","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-2204-5675","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061855785","display_name":"Ilho Myeong","orcid":"https://orcid.org/0000-0002-3662-0231","observed_orcids":["https://orcid.org/0000-0002-3662-0231","https://orcid.org/0009-0003-7343-7289"]},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ilho Myeong","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3662-0231","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000312879","display_name":"Myounggon Kang","orcid":"https://orcid.org/0000-0003-4132-0038","observed_orcids":["https://orcid.org/0000-0003-4132-0038"]},"institutions":[{"id":"https://openalex.org/I119575151","display_name":"Korea National University of Transportation","ror":"https://ror.org/03qqbe534","country_code":"KR","type":"education","lineage":["https://openalex.org/I119575151"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Myounggon Kang","raw_affiliation_strings":["Department of Electronics Engineering, Korea National University of Transportation, Chungju, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-4132-0038","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Korea National University of Transportation, Chungju, South Korea","institution_ids":["https://openalex.org/I119575151"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011216580","display_name":"Jongwook Jeon","orcid":"https://orcid.org/0000-0002-5232-650X","observed_orcids":["https://orcid.org/0000-0002-5232-650X","https://orcid.org/0000-0003-1159-584X"]},"institutions":[{"id":"https://openalex.org/I24062138","display_name":"Konkuk University","ror":"https://ror.org/025h1m602","country_code":"KR","type":"education","lineage":["https://openalex.org/I24062138"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongwook Jeon","raw_affiliation_strings":["Department of Electronics Engineering, Konkuk University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-5232-650X","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Konkuk University, Seoul, South Korea","institution_ids":["https://openalex.org/I24062138"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111914425","display_name":"Hyungcheol Shin","orcid":"https://orcid.org/0009-0004-8293-8859","observed_orcids":["https://orcid.org/0009-0004-8293-8859"]},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyungcheol Shin","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.8615,"has_fulltext":false,"cited_by_count":37,"citation_normalized_percentile":{"value":0.70606919,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"65","issue":"10","first_page":"4520","last_page":"4526"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/self-heating-effect","display_name":"self-heating","score":0.8679999709129333},{"id":"https://openalex.org/keywords/thermal-resistance-model","display_name":"thermal resistance model","score":0.6029999852180481},{"id":"https://openalex.org/keywords/heat-flux","display_name":"heat flux","score":0.6899999976158142},{"id":"https://openalex.org/keywords/figure-of-merit-optimization","display_name":"figure of merit optimization","score":0.7210000157356262},{"id":"https://openalex.org/keywords/finfet-comparison","display_name":"FinFET comparison","score":0.8080000281333923},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"ring oscillator","score":0.7120000123977661},{"id":"https://openalex.org/keywords/device-reliability","display_name":"device reliability","score":0.4659999907016754}],"concepts":[{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.5196553468704224},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.35368606448173523},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.1747366487979889}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ted.2018.2862918","doi":"https://doi.org/10.1109/ted.2018.2862918","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ted.2018.2862918","pdf_url":null,"source":{"id":"https://openalex.org/S162355128","display_name":"IEEE Transactions on Electron Devices","issn_l":"0018-9383","issn":["0018-9383","1557-9646"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","norway-2","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Electron Devices","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309545","display_name":"Synopsys","ror":"https://ror.org/013by2m91"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1490038213","https://openalex.org/W1520445231","https://openalex.org/W1587386427","https://openalex.org/W1970774663","https://openalex.org/W1979428197","https://openalex.org/W1981123924","https://openalex.org/W1983748953","https://openalex.org/W2060945231","https://openalex.org/W2069810555","https://openalex.org/W2097655600","https://openalex.org/W2104249499","https://openalex.org/W2291787259","https://openalex.org/W2583600757","https://openalex.org/W2587700568","https://openalex.org/W2591285794","https://openalex.org/W2744406216"],"related_works":["https://openalex.org/W4404645689","https://openalex.org/W3011049494","https://openalex.org/W3030426841","https://openalex.org/W2886262657","https://openalex.org/W4376624516","https://openalex.org/W3036581040","https://openalex.org/W2896009780","https://openalex.org/W4220976555","https://openalex.org/W2580846898","https://openalex.org/W4206941705"],"abstract_inverted_index":{"In":[0,16,71],"this":[1],"paper,":[2],"self-heating":[3],"effects":[4],"(SHEs)":[5],"in":[6,105,136],"three-stacked":[7],"nanoplate":[8,53,81,108],"FETs":[9],"were":[10,140],"investigated":[11],"through":[12],"the":[13,22,32,44,63,67,87,89,106,113,121,129,137],"TCAD":[14],"simulation.":[15],"order":[17],"to":[18,42,48],"obtain":[19],"high":[20],"reliability,":[21],"evaluation":[23],"of":[24,46,69,74],"SHEs":[25,39,47,135],"was":[26,40,59,83,100,132],"performed":[27],"after${I}_{D}$\u2013${V}_{G}$curve":[28],"fitting":[29],"based":[30],"on":[31,38,86,97],"experimental":[33],"data.":[34],"First,":[35],"general":[36],"analysis":[37],"conducted":[41],"confirm":[43],"influence":[45],"electrical":[49,57],"characteristics.":[50],"The":[51,102],"optimized":[52],"width":[54],"for":[55],"great":[56],"properties":[58],"proposed":[60],"by":[61],"using":[62],"figure-of-merit":[64],"factor":[65],"under":[66],"consideration":[68],"SHEs.":[70],"addition,":[72],"difference":[73],"heat":[75],"flux":[76],"between":[77],"FinFET":[78],"and":[79,134],"stacked":[80,107],"FET":[82,109],"analyzed.":[84],"Based":[85],"analysis,":[88],"two-step":[90],"thermal":[91],"resistance":[92],"(${R}_{\\text":[93],"{th}}$)":[94],"model":[95,119],"depending":[96],"drain":[98],"voltage":[99],"proposed.":[101],"two-step${R}_{\\text":[103],"{th}}$model":[104,131],"matched":[110],"well":[111],"with":[112,128],"Berkeley":[114],"short-channel":[115],"IGFET":[116],"model\u2014common":[117],"multigate":[118],"compared":[120],"other${R}_{\\text":[122],"{th}}$models.":[123],"A":[124],"seven-stage":[125],"ring":[126],"oscillator":[127],"proposed${R}_{\\text":[130],"demonstrated,":[133],"circuit":[138],"level":[139],"confirmed.":[141]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2018-09-07T00:00:00"}