{"id":"https://openalex.org/W2885084580","doi":"https://doi.org/10.18494/sam.2018.1868","title":"31.6 pJ/Conversion-step Energy-efficient 16-bit Successive Approximation Register Capacitance-to-digital Converter in a 0.18 \u03bcm CMOS Process","display_name":"31.6 pJ/Conversion-step Energy-efficient 16-bit Successive Approximation Register Capacitance-to-digital Converter in a 0.18 \u03bcm CMOS Process","publication_year":2018,"publication_date":"2018-08-14","ids":{"openalex":"https://openalex.org/W2885084580","doi":"https://doi.org/10.18494/sam.2018.1868","mag":"2885084580"},"language":"en","primary_location":{"id":"doi:10.18494/sam.2018.1868","doi":"https://doi.org/10.18494/sam.2018.1868","is_oa":true,"landing_page_url":"https://doi.org/10.18494/sam.2018.1868","pdf_url":"https://myukk.org/SM2017/sm_pdf/SM1633.pdf","source":{"id":"https://openalex.org/S139116023","display_name":"Sensors and Materials","issn_l":"0914-4935","issn":["0914-4935","2435-0869"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4360969191","host_organization_name":"MYU K.K.","host_organization_lineage":["https://openalex.org/P4360969191"],"host_organization_lineage_names":["MYU K.K."],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors and Materials","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://myukk.org/SM2017/sm_pdf/SM1633.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037715104","display_name":"Youngwoon Ko","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I196345858","display_name":"Chungnam National University","ror":"https://ror.org/0227as991","country_code":"KR","type":"education","lineage":["https://openalex.org/I196345858"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngwoon Ko","raw_affiliation_strings":["Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea","institution_ids":["https://openalex.org/I196345858"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058611096","display_name":"Hyungseup Kim","orcid":"https://orcid.org/0000-0001-8428-9435","observed_orcids":["https://orcid.org/0000-0001-8428-9435"]},"institutions":[{"id":"https://openalex.org/I196345858","display_name":"Chungnam National University","ror":"https://ror.org/0227as991","country_code":"KR","type":"education","lineage":["https://openalex.org/I196345858"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyungseup Kim","raw_affiliation_strings":["Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea","institution_ids":["https://openalex.org/I196345858"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023808978","display_name":"Yeongjin Mun","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I196345858","display_name":"Chungnam National University","ror":"https://ror.org/0227as991","country_code":"KR","type":"education","lineage":["https://openalex.org/I196345858"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yeongjin Mun","raw_affiliation_strings":["Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea","institution_ids":["https://openalex.org/I196345858"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041177256","display_name":"Byeoncheol Lee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I196345858","display_name":"Chungnam National University","ror":"https://ror.org/0227as991","country_code":"KR","type":"education","lineage":["https://openalex.org/I196345858"]},{"id":"https://openalex.org/I4210164985","display_name":"National NanoFab Center","ror":"https://ror.org/05k1va520","country_code":"KR","type":"facility","lineage":["https://openalex.org/I157485424","https://openalex.org/I4210164985"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byeoncheol Lee","raw_affiliation_strings":["Department of Electronics Engineering , Chungnam National University , Daejeon , Republic of Korea , in 2017 ,","Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea","National Nanofab Center , Deajeon 34141 , Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering , Chungnam National University , Daejeon , Republic of Korea , in 2017 ,","institution_ids":["https://openalex.org/I196345858"]},{"raw_affiliation_string":"Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea","institution_ids":["https://openalex.org/I196345858"]},{"raw_affiliation_string":"National Nanofab Center , Deajeon 34141 , Republic of Korea","institution_ids":["https://openalex.org/I4210164985"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042118753","display_name":"Gyungtae Kim","orcid":"https://orcid.org/0009-0000-7137-7911","observed_orcids":["https://orcid.org/0009-0000-7137-7911"]},"institutions":[{"id":"https://openalex.org/I4210164985","display_name":"National NanoFab Center","ror":"https://ror.org/05k1va520","country_code":"KR","type":"facility","lineage":["https://openalex.org/I157485424","https://openalex.org/I4210164985"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gyungtae Kim","raw_affiliation_strings":["National Nanofab Center, Deajeon 34141, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Nanofab Center, Deajeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I4210164985"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112394017","display_name":"Woo Suk Sul","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210164985","display_name":"National NanoFab Center","ror":"https://ror.org/05k1va520","country_code":"KR","type":"facility","lineage":["https://openalex.org/I157485424","https://openalex.org/I4210164985"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Woo Suk Sul","raw_affiliation_strings":["National Nanofab Center , Deajeon 34141 , Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Nanofab Center , Deajeon 34141 , Republic of Korea","institution_ids":["https://openalex.org/I4210164985"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048192583","display_name":"Boung Ju Lee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I196345858","display_name":"Chungnam National University","ror":"https://ror.org/0227as991","country_code":"KR","type":"education","lineage":["https://openalex.org/I196345858"]},{"id":"https://openalex.org/I4210164985","display_name":"National NanoFab Center","ror":"https://ror.org/05k1va520","country_code":"KR","type":"facility","lineage":["https://openalex.org/I157485424","https://openalex.org/I4210164985"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Boung Ju Lee","raw_affiliation_strings":["Department of Electronics Engineering , Chungnam National University , Daejeon , Republic of Korea , in 2017 ,","Department of Electronics Engineering , Chungnam National University , Deajeon 34134 , Republic of Korea","National Nanofab Center, Deajeon 34141, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering , Chungnam National University , Daejeon , Republic of Korea , in 2017 ,","institution_ids":["https://openalex.org/I196345858"]},{"raw_affiliation_string":"Department of Electronics Engineering , Chungnam National University , Deajeon 34134 , Republic of Korea","institution_ids":["https://openalex.org/I196345858"]},{"raw_affiliation_string":"National Nanofab Center, Deajeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I4210164985"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039327059","display_name":"Hyoungho Ko","orcid":"https://orcid.org/0000-0001-5348-3585","observed_orcids":["https://orcid.org/0000-0001-5348-3585"]},"institutions":[{"id":"https://openalex.org/I196345858","display_name":"Chungnam National University","ror":"https://ror.org/0227as991","country_code":"KR","type":"education","lineage":["https://openalex.org/I196345858"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hyoungho Ko","raw_affiliation_strings":["Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Chungnam National University, Deajeon 34134, Republic of Korea","institution_ids":["https://openalex.org/I196345858"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5039327059"],"corresponding_institution_ids":["https://openalex.org/I196345858"],"apc_list":{"value":99360,"currency":"JPY","value_usd":748},"apc_paid":{"value":99360,"currency":"JPY","value_usd":748},"fwci":0.0957,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.38684438,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"30","issue":"8","first_page":"1765","last_page":"1765"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.0024999999441206455,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance-to-digital-converter","display_name":"capacitance-to-digital converter","score":0.9470000267028809},{"id":"https://openalex.org/keywords/successive-approximation-register","display_name":"successive approximation register","score":0.9679999947547913},{"id":"https://openalex.org/keywords/16-bit-adc","display_name":"16-bit ADC","score":0.8080000281333923},{"id":"https://openalex.org/keywords/energy-efficiency","display_name":"energy efficiency","score":0.7160000205039978},{"id":"https://openalex.org/keywords/low-power-analog-to-digital-conversion","display_name":"low-power analog-to-digital conversion","score":0.8009999990463257},{"id":"https://openalex.org/keywords/0-18-mum-cmos","display_name":"0.18 \u03bcm CMOS","score":0.9580000042915344}],"concepts":[{"id":"https://openalex.org/C2779235478","wikidata":"https://www.wikidata.org/wiki/Q286576","display_name":"Register (sociolinguistics)","level":2,"score":0.7114412784576416},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.6441037654876709},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5990822911262512},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5792551636695862},{"id":"https://openalex.org/C142311740","wikidata":"https://www.wikidata.org/wiki/Q1066177","display_name":"Shaping","level":2,"score":0.5605434775352478},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5369659662246704},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.5000410079956055},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49363791942596436},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.470813125371933},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4281054735183716},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3802972137928009},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.369284451007843},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.2911040782928467},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21326935291290283},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1997300684452057},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15431413054466248},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.18494/sam.2018.1868","doi":"https://doi.org/10.18494/sam.2018.1868","is_oa":true,"landing_page_url":"https://doi.org/10.18494/sam.2018.1868","pdf_url":"https://myukk.org/SM2017/sm_pdf/SM1633.pdf","source":{"id":"https://openalex.org/S139116023","display_name":"Sensors and Materials","issn_l":"0914-4935","issn":["0914-4935","2435-0869"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4360969191","host_organization_name":"MYU K.K.","host_organization_lineage":["https://openalex.org/P4360969191"],"host_organization_lineage_names":["MYU K.K."],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors and Materials","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.18494/sam.2018.1868","doi":"https://doi.org/10.18494/sam.2018.1868","is_oa":true,"landing_page_url":"https://doi.org/10.18494/sam.2018.1868","pdf_url":"https://myukk.org/SM2017/sm_pdf/SM1633.pdf","source":{"id":"https://openalex.org/S139116023","display_name":"Sensors and Materials","issn_l":"0914-4935","issn":["0914-4935","2435-0869"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-d","jufo-1","norway-1","oarl","poland-20","russia-white-list-3"],"host_organization":"https://openalex.org/P4360969191","host_organization_name":"MYU K.K.","host_organization_lineage":["https://openalex.org/P4360969191"],"host_organization_lineage_names":["MYU K.K."],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors and Materials","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2885084580.pdf","grobid_xml":"https://content.openalex.org/works/W2885084580.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2946705319","https://openalex.org/W2347028567","https://openalex.org/W3113437232","https://openalex.org/W7133301377","https://openalex.org/W2552852934","https://openalex.org/W2277284421","https://openalex.org/W2036796449","https://openalex.org/W3197428838","https://openalex.org/W2089395619","https://openalex.org/W4408998745"],"abstract_inverted_index":{"capacitance-to-digital":[0],"converter":[1],"(":[2]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2018-08-22T00:00:00"}