{"id":"https://openalex.org/W2884022129","doi":"https://doi.org/10.11591/ijece.v8i6.pp5071-5079","title":"Hilbert Based Testing of ADC Differential Non-linearity Using Wavelet Transform Algorithms","display_name":"Hilbert Based Testing of ADC Differential Non-linearity Using Wavelet Transform Algorithms","publication_year":2018,"publication_date":"2018-12-01","ids":{"openalex":"https://openalex.org/W2884022129","doi":"https://doi.org/10.11591/ijece.v8i6.pp5071-5079","mag":"2884022129"},"language":"en","primary_location":{"id":"doi:10.11591/ijece.v8i6.pp5071-5079","doi":"https://doi.org/10.11591/ijece.v8i6.pp5071-5079","is_oa":true,"landing_page_url":"https://doi.org/10.11591/ijece.v8i6.pp5071-5079","pdf_url":"http://ijece.iaescore.com/index.php/IJECE/article/download/10599/11361","source":{"id":"https://openalex.org/S2764532672","display_name":"International Journal of Electrical and Computer Engineering (IJECE)","issn_l":"2088-8708","issn":["2088-8708"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310315009","host_organization_name":"Institute of Advanced Engineering and Science (IAES)","host_organization_lineage":["https://openalex.org/P4310315009"],"host_organization_lineage_names":["Institute of Advanced Engineering and Science (IAES)"],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Electrical and Computer Engineering (IJECE)","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"http://ijece.iaescore.com/index.php/IJECE/article/download/10599/11361","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051385364","display_name":"Emad A. Awada","orcid":"https://orcid.org/0000-0003-3271-7105","observed_orcids":["https://orcid.org/0000-0003-3271-7105"]},"institutions":[{"id":"https://openalex.org/I146367977","display_name":"Applied Science Private University","ror":"https://ror.org/01ah6nb52","country_code":"JO","type":"education","lineage":["https://openalex.org/I146367977"]}],"countries":["JO"],"is_corresponding":true,"raw_author_name":"Emad A. Awada","raw_affiliation_strings":["Applied Science Private University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Science Private University","institution_ids":["https://openalex.org/I146367977"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5051385364"],"corresponding_institution_ids":["https://openalex.org/I146367977"],"apc_list":null,"apc_paid":null,"fwci":0.4784,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.61447507,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":97},"biblio":{"volume":"8","issue":"6","first_page":"5071","last_page":"5071"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.38989999890327454,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.38989999890327454,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.35179999470710754,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.19840000569820404,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analog-to-digital-converter-testing","display_name":"analog-to-digital converter testing","score":0.9290000200271606},{"id":"https://openalex.org/keywords/differential-nonlinearity","display_name":"differential nonlinearity","score":0.9490000009536743},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"integral nonlinearity","score":0.9120000004768372},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"wavelet transform","score":0.8659999966621399},{"id":"https://openalex.org/keywords/hilbert-transform","display_name":"Hilbert transform","score":0.8949999809265137},{"id":"https://openalex.org/keywords/test-data-reduction","display_name":"test data reduction","score":0.3840000033378601}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7581275105476379},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6976660490036011},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6659122705459595},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5131447911262512},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.49456092715263367},{"id":"https://openalex.org/C71217194","wikidata":"https://www.wikidata.org/wiki/Q575958","display_name":"Differential nonlinearity","level":3,"score":0.43861401081085205},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4119122624397278},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2897379994392395},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.20504599809646606},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08026215434074402},{"id":"https://openalex.org/C4305246","wikidata":"https://www.wikidata.org/wiki/Q3885225","display_name":"Least significant bit","level":2,"score":0.07287207245826721},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.11591/ijece.v8i6.pp5071-5079","doi":"https://doi.org/10.11591/ijece.v8i6.pp5071-5079","is_oa":true,"landing_page_url":"https://doi.org/10.11591/ijece.v8i6.pp5071-5079","pdf_url":"http://ijece.iaescore.com/index.php/IJECE/article/download/10599/11361","source":{"id":"https://openalex.org/S2764532672","display_name":"International Journal of Electrical and Computer Engineering (IJECE)","issn_l":"2088-8708","issn":["2088-8708"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310315009","host_organization_name":"Institute of Advanced Engineering and Science (IAES)","host_organization_lineage":["https://openalex.org/P4310315009"],"host_organization_lineage_names":["Institute of Advanced Engineering and Science (IAES)"],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Electrical and Computer Engineering (IJECE)","raw_type":"journal-article"},{"id":"pmh:oai:ojs.www.iaescore.com:article/10599","doi":null,"is_oa":true,"landing_page_url":"http://www.iaescore.com/journals/index.php/IJECE/article/view/10599","pdf_url":null,"source":{"id":"https://openalex.org/S2764855249","display_name":"Indonesian Journal of Electrical Engineering and Computer Science","issn_l":"2502-4752","issn":["2502-4752","2502-4760"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1","poland-20","russia-white-list-2"],"host_organization":"https://openalex.org/P4310315009","host_organization_name":"Institute of Advanced Engineering and Science (IAES)","host_organization_lineage":["https://openalex.org/P4310315009"],"host_organization_lineage_names":["Institute of Advanced Engineering and Science (IAES)"],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Journal of Electrical and Computer Engineering (IJECE); Vol 8, No 6: December 2018 (Part II); 5071-5079","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.11591/ijece.v8i6.pp5071-5079","doi":"https://doi.org/10.11591/ijece.v8i6.pp5071-5079","is_oa":true,"landing_page_url":"https://doi.org/10.11591/ijece.v8i6.pp5071-5079","pdf_url":"http://ijece.iaescore.com/index.php/IJECE/article/download/10599/11361","source":{"id":"https://openalex.org/S2764532672","display_name":"International Journal of Electrical and Computer Engineering (IJECE)","issn_l":"2088-8708","issn":["2088-8708"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310315009","host_organization_name":"Institute of Advanced Engineering and Science (IAES)","host_organization_lineage":["https://openalex.org/P4310315009"],"host_organization_lineage_names":["Institute of Advanced Engineering and Science (IAES)"],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Electrical and Computer Engineering (IJECE)","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320316734","display_name":"Applied Science Private University","ror":"https://ror.org/01ah6nb52"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2884022129.pdf","grobid_xml":"https://content.openalex.org/works/W2884022129.grobid-xml"},"referenced_works_count":20,"referenced_works":["https://openalex.org/W1515439600","https://openalex.org/W1595487661","https://openalex.org/W1894890291","https://openalex.org/W1921385837","https://openalex.org/W2040645736","https://openalex.org/W2082462112","https://openalex.org/W2115755118","https://openalex.org/W2117767511","https://openalex.org/W2152910532","https://openalex.org/W2164768915","https://openalex.org/W2167648985","https://openalex.org/W2482041658","https://openalex.org/W2496434170","https://openalex.org/W2548737254","https://openalex.org/W2560447975","https://openalex.org/W2616036741","https://openalex.org/W2777450395","https://openalex.org/W2794476895","https://openalex.org/W2805660991","https://openalex.org/W3127500035"],"related_works":["https://openalex.org/W2152910532","https://openalex.org/W1598971514","https://openalex.org/W4210466215","https://openalex.org/W2950655850","https://openalex.org/W4226264019","https://openalex.org/W2475544434","https://openalex.org/W2077109626","https://openalex.org/W2101218599","https://openalex.org/W2150011256","https://openalex.org/W2167648985"],"abstract_inverted_index":{"In":[0,104],"testing":[1,50,75,87,92,102,107,115],"Mixed":[2],"Signal":[3],"Devices":[4],"such":[5,18,33,53],"as":[6,19,54],"Analog":[7,13,63],"to":[8,12,28,64],"Digital":[9,11,65],"and":[10,22,40,67,100,122],"Converters,":[14],"some":[15],"dynamic":[16,51],"parameters,":[17],"Differential":[20,55],"Non-Linearity":[21,56],"Integral":[23],"Non-linearity,":[24],"are":[25],"very":[26],"critical":[27],"evaluating":[29],"devises":[30],"performance.":[31],"However,":[32],"analysis":[34],"has":[35],"been":[36],"notorious":[37],"for":[38,120],"complexity":[39],"massive":[41],"compiling":[42,97],"process.":[43,83],"Therefore,":[44],"this":[45],"research":[46],"will":[47,109],"focus":[48],"on":[49,73,81],"parameters":[52],"by":[57,94],"simulating":[58],"numerous":[59],"numbers":[60],"of":[61,77,117],"bits":[62],"Converters":[66],"test":[68],"the":[69,91,113],"output":[70],"signals":[71],"base":[72],"new":[74,86,106],"algorithms":[76,119],"Wavelet":[78],"transform":[79],"based":[80],"Hilbert":[82],"Such":[84],"a":[85],"algorithm":[88],"should":[89],"enhance":[90],"process":[93,116],"using":[95],"less":[96],"data":[98],"samples":[99],"prompt":[101],"results.":[103],"addition,":[105],"results":[108],"be":[110],"compared":[111],"with":[112],"conventional":[114],"Histogram":[118],"accuracy":[121],"enactment.":[123]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":3}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2018-08-03T00:00:00"}