{"id":"https://openalex.org/W2883501814","doi":"https://doi.org/10.1088/1681-7575/aad388","title":"A charge integrator amplifier and trap detector for pico-joule laser pulse energy measurement","display_name":"A charge integrator amplifier and trap detector for pico-joule laser pulse energy measurement","publication_year":2018,"publication_date":"2018-07-16","ids":{"openalex":"https://openalex.org/W2883501814","doi":"https://doi.org/10.1088/1681-7575/aad388","mag":"2883501814"},"language":"en","primary_location":{"id":"doi:10.1088/1681-7575/aad388","doi":"https://doi.org/10.1088/1681-7575/aad388","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1681-7575/aad388","pdf_url":null,"source":{"id":"https://openalex.org/S7291761","display_name":"Metrologia","issn_l":"0026-1394","issn":["0026-1394","1681-7575"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrologia","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5107989032","display_name":"M. G. White","orcid":"https://orcid.org/0000-0003-0915-1924","observed_orcids":["https://orcid.org/0000-0003-0915-1924"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"M G White","raw_affiliation_strings":["National Institute of Standards and Technology, Boulder, CO 80303, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Boulder, CO 80303, United States of America","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027959451","display_name":"Geiland Porrovecchio","orcid":"https://orcid.org/0000-0002-4765-5675","observed_orcids":["https://orcid.org/0000-0002-4765-5675"]},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd metrologick\u00fd institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"government","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":true,"raw_author_name":"G Porrovecchio","raw_affiliation_strings":["Czech Metrology Institute, LFM, V Botanice 4, Praha 5, Czechia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Czech Metrology Institute, LFM, V Botanice 4, Praha 5, Czechia","institution_ids":["https://openalex.org/I4210124866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015329581","display_name":"David J. Livigni","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D Livigni","raw_affiliation_strings":["National Institute of Standards and Technology, Boulder, CO 80303, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Boulder, CO 80303, United States of America","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006393393","display_name":"Rodney W. Leonhardt","orcid":"https://orcid.org/0000-0002-5951-0473","observed_orcids":["https://orcid.org/0000-0002-5951-0473"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"R Leonhardt","raw_affiliation_strings":["National Institute of Standards and Technology, Boulder, CO 80303, United States of America"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Boulder, CO 80303, United States of America","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":null,"display_name":"M Smid","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd metrologick\u00fd institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"government","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":true,"raw_author_name":"M Smid","raw_affiliation_strings":["Czech Metrology Institute, LFM, V Botanice 4, Praha 5, Czechia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Czech Metrology Institute, LFM, V Botanice 4, Praha 5, Czechia","institution_ids":["https://openalex.org/I4210124866"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5006393393","https://openalex.org/A5015329581","https://openalex.org/A5027959451","https://openalex.org/A5107989032"],"corresponding_institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I4210124866"],"apc_list":{"value":3325,"currency":"USD","value_usd":3325},"apc_paid":null,"fwci":0.6307,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.73386949,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":96},"biblio":{"volume":"55","issue":"5","first_page":"699","last_page":"705"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.5863999724388123,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.5863999724388123,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.12409999966621399,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.1151999980211258,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-pulse-energy-measurement","display_name":"laser pulse energy measurement","score":0.9810000061988831},{"id":"https://openalex.org/keywords/high-repetition-rate-lasers","display_name":"high repetition rate lasers","score":0.7289999723434448},{"id":"https://openalex.org/keywords/charge-to-voltage-conversion","display_name":"charge-to-voltage conversion","score":0.6110000014305115},{"id":"https://openalex.org/keywords/differential-evolution","display_name":"differential evolution","score":0.6269999742507935},{"id":"https://openalex.org/keywords/nist-traceability","display_name":"NIST traceability","score":0.7129999995231628},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.7599999904632568}],"concepts":[{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6350821256637573},{"id":"https://openalex.org/C169076538","wikidata":"https://www.wikidata.org/wiki/Q1800062","display_name":"Charge amplifier","level":5,"score":0.586700439453125},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5094600319862366},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4884583055973053},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.4810509979724884},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.47818830609321594},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.46377888321876526},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4615168273448944},{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.4447849690914154},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.44007208943367004},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.43165016174316406},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1088/1681-7575/aad388","doi":"https://doi.org/10.1088/1681-7575/aad388","is_oa":false,"landing_page_url":"https://doi.org/10.1088/1681-7575/aad388","pdf_url":null,"source":{"id":"https://openalex.org/S7291761","display_name":"Metrologia","issn_l":"0026-1394","issn":["0026-1394","1681-7575"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrologia","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W799729901","https://openalex.org/W1595159159","https://openalex.org/W1966670488","https://openalex.org/W2024359171","https://openalex.org/W2037060561","https://openalex.org/W2039015539","https://openalex.org/W2145463507"],"related_works":["https://openalex.org/W2039015539","https://openalex.org/W2007683443","https://openalex.org/W1965395476","https://openalex.org/W4311916256","https://openalex.org/W2325262746","https://openalex.org/W2369563873","https://openalex.org/W2059529730","https://openalex.org/W2044459051","https://openalex.org/W2140853611","https://openalex.org/W2056418610"],"abstract_inverted_index":{"Abstract":[0],"We":[1],"report":[2],"the":[3,66,87,91,95,99,113,117,119,128,144,160],"characterisation":[4],"and":[5,68,94,122,146,171],"calibration":[6,96],"of":[7,90,98,116],"a":[8,31,43,54,70],"new":[9,129,166],"laser":[10,51,130,148],"pulse":[11,18,52,64,81,131,149],"energy":[12,19,82,132,150],"measurement":[13,20,163],"device,":[14],"developed":[15],"for":[16,112,174],"pico-joule":[17],"at":[21],"repetition":[22],"rates":[23],"up":[24],"to":[25,53,80,108,142],"1":[26],"kHz.":[27],"The":[28,57,124],"device":[29,167],"comprises":[30],"charge":[32,41,55,63,100],"integration":[33],"amplifier":[34,59,120],"operating":[35],"in":[36],"conjunction":[37],"with":[38,136],"an":[39,49],"input":[40],"source;":[42],"light":[44],"trapping":[45],"photo-detector,":[46],"which":[47],"converts":[48],"incident":[50],"pulse.":[56],"novel":[58],"individually":[60],"integrates":[61],"each":[62],"from":[65,139],"source":[67],"outputs":[69],"corresponding":[71],"20-bit":[72],"resolution":[73],"digital":[74],"signal.":[75],"This":[76,165],"signal":[77],"is":[78,106],"converted":[79],"through":[83],"post":[84],"processing,":[85],"knowing":[86],"absolute":[88],"responsivity":[89],"photodiode":[92],"detector":[93],"factors":[97],"amplifier.":[101],"A":[102],"differential":[103],"evolution":[104],"algorithm":[105],"used":[107],"determine":[109],"optimised":[110],"values":[111,125],"feedback":[114],"capacitors":[115],"amplifier,":[118],"gain":[121],"offset.":[123],"measured":[126],"by":[127,153],"meter":[133],"were":[134,157],"compared":[135],"those":[137],"obtained":[138],"measurements":[140],"traceable":[141],"both":[143],"high":[145],"low-level":[147],"scales":[151],"maintained":[152],"NIST,":[154],"Boulder.":[155],"These":[156],"consistent":[158],"within":[159],"combined":[161],"expanded":[162],"uncertainty.":[164],"offers":[168],"lower":[169],"uncertainty":[170],"portability,":[172],"suitable":[173],"field":[175],"use.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2018-08-03T00:00:00"}