{"id":"https://openalex.org/W2808565460","doi":"https://doi.org/10.1016/j.sna.2018.05.035","title":"An improved sensor for the magnetic susceptibility imaging technique for detecting impurities in non-ferromagnetic materials","display_name":"An improved sensor for the magnetic susceptibility imaging technique for detecting impurities in non-ferromagnetic materials","publication_year":2018,"publication_date":"2018-06-15","ids":{"openalex":"https://openalex.org/W2808565460","doi":"https://doi.org/10.1016/j.sna.2018.05.035","mag":"2808565460"},"language":"en","primary_location":{"id":"doi:10.1016/j.sna.2018.05.035","doi":"https://doi.org/10.1016/j.sna.2018.05.035","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sna.2018.05.035","pdf_url":null,"source":{"id":"https://openalex.org/S16945967","display_name":"Sensors and Actuators A Physical","issn_l":"0924-4247","issn":["0924-4247","1873-3069"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors and Actuators A: Physical","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051555626","display_name":"Xiucheng Liu","orcid":"https://orcid.org/0000-0002-1067-8734","observed_orcids":["https://orcid.org/0000-0002-1067-8734"]},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiucheng Liu","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Pengfei Xing","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengfei Xing","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107343387","display_name":"Bhaawan Gupta","orcid":"https://orcid.org/0000-0002-9624-7563","observed_orcids":["https://orcid.org/0000-0002-9624-7563"]},"institutions":[{"id":"https://openalex.org/I48430043","display_name":"Institut National des Sciences Appliqu\u00e9es de Lyon","ror":"https://ror.org/050jn9y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I48430043"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Bhaawan Gupta","raw_affiliation_strings":["Univ Lyon, INSA-Lyon, LGEF, EA682, F-69621, Villeurbanne, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ Lyon, INSA-Lyon, LGEF, EA682, F-69621, Villeurbanne, France","institution_ids":["https://openalex.org/I48430043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076646726","display_name":"Bin Wu","orcid":"https://orcid.org/0000-0001-8144-6263","observed_orcids":["https://orcid.org/0000-0001-8144-6263"]},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bin Wu","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007973058","display_name":"Jie-Ming Yang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jieming Yang","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100769123","display_name":"Jiaying Zhang","orcid":"https://orcid.org/0000-0001-7308-5090","observed_orcids":["https://orcid.org/0000-0001-7308-5090"]},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaying Zhang","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088224587","display_name":"Benjamin Ducharne","orcid":"https://orcid.org/0000-0002-2046-211X","observed_orcids":["https://orcid.org/0000-0002-2046-211X"]},"institutions":[{"id":"https://openalex.org/I48430043","display_name":"Institut National des Sciences Appliqu\u00e9es de Lyon","ror":"https://ror.org/050jn9y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I48430043"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Benjamin Ducharne","raw_affiliation_strings":["Univ Lyon, INSA-Lyon, LGEF, EA682, F-69621, Villeurbanne, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ Lyon, INSA-Lyon, LGEF, EA682, F-69621, Villeurbanne, France","institution_ids":["https://openalex.org/I48430043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083125200","display_name":"Ningxiang Yang","orcid":"https://orcid.org/0000-0002-9693-7062","observed_orcids":["https://orcid.org/0000-0002-9693-7062"]},"institutions":[{"id":"https://openalex.org/I4210107371","display_name":"Guangdong Special Equipment Inspection and Research Institute","ror":"https://ror.org/01wtjkn81","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210107371"]},{"id":"https://openalex.org/I4210117186","display_name":"Guangdong Province Special Equipment Testing and Research Institute Zhuhai Testing Institute","ror":"https://ror.org/023byrq13","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210117186"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ningxiang Yang","raw_affiliation_strings":["Zhuhai Branch, Guangdong Institute of Special Equipment Inspection and Research, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhuhai Branch, Guangdong Institute of Special Equipment Inspection and Research, People\u2019s Republic of China","institution_ids":["https://openalex.org/I4210107371","https://openalex.org/I4210117186"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005076728","display_name":"Cunfu He","orcid":"https://orcid.org/0000-0002-3798-4723","observed_orcids":["https://orcid.org/0000-0002-3798-4723"]},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cunfu He","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, People\u2019s Republic of China","institution_ids":["https://openalex.org/I37796252"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5076646726"],"corresponding_institution_ids":["https://openalex.org/I37796252"],"apc_list":{"value":3750,"currency":"USD","value_usd":3750},"apc_paid":null,"fwci":0.0957,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.38684438,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"279","issue":null,"first_page":"240","last_page":"247"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.5536999702453613,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.5536999702453613,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.2957000136375427,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.023499999195337296,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/impurity-detection","display_name":"impurity detection","score":0.7540000081062317},{"id":"https://openalex.org/keywords/non-ferromagnetic-materials","display_name":"non-ferromagnetic materials","score":0.9380000233650208},{"id":"https://openalex.org/keywords/hall-effect-sensors","display_name":"Hall effect sensors","score":0.6480000019073486},{"id":"https://openalex.org/keywords/304-stainless-steel","display_name":"304 stainless steel","score":0.8529999852180481},{"id":"https://openalex.org/keywords/aluminum","display_name":"aluminum","score":0.8330000042915344},{"id":"https://openalex.org/keywords/photosensitive-resin","display_name":"photosensitive resin","score":0.6840000152587891},{"id":"https://openalex.org/keywords/lateral-resolution","display_name":"lateral resolution","score":0.6200000047683716}],"concepts":[{"id":"https://openalex.org/C141354745","wikidata":"https://www.wikidata.org/wiki/Q17227","display_name":"Cantilever","level":2,"score":0.8247889280319214},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.7981064319610596},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7681668996810913},{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.6744166016578674},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.5899154543876648},{"id":"https://openalex.org/C107637996","wikidata":"https://www.wikidata.org/wiki/Q1431247","display_name":"Hall effect sensor","level":3,"score":0.5872650742530823},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.5698222517967224},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5354917645454407},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5196148753166199},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.45943328738212585},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4377591907978058},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4221614599227905},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3382265567779541},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.3289623260498047},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.20218172669410706},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.1717144250869751},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15263628959655762},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.11223617196083069},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.10452920198440552},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08498650789260864},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.sna.2018.05.035","doi":"https://doi.org/10.1016/j.sna.2018.05.035","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sna.2018.05.035","pdf_url":null,"source":{"id":"https://openalex.org/S16945967","display_name":"Sensors and Actuators A Physical","issn_l":"0924-4247","issn":["0924-4247","1873-3069"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors and Actuators A: Physical","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-01822792v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-01822792","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors and Actuators A: Physical , 2018, 279, pp.240 - 247. ⟨10.1016/j.sna.2018.05.035⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G3786619018","display_name":"\u590d\u6742\u94a2\u7d22\u6ce2\u52a8\u529b\u5b66\u5206\u6790\u4e0e\u5e94\u529b\u3001\u7f3a\u9677\u68c0\u6d4b\u5173\u952e\u6280\u672f\u7814\u7a76","funder_award_id":"11132002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4833291160","display_name":null,"funder_award_id":"11527801","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5818706331","display_name":null,"funder_award_id":"11402008","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W30939731","https://openalex.org/W75647888","https://openalex.org/W1876091999","https://openalex.org/W1968747082","https://openalex.org/W1997263522","https://openalex.org/W2038739837","https://openalex.org/W2061827493","https://openalex.org/W2061999648","https://openalex.org/W2070912207","https://openalex.org/W2077532578","https://openalex.org/W2079896540","https://openalex.org/W2091567885","https://openalex.org/W2105286773","https://openalex.org/W2120257723","https://openalex.org/W2130006660","https://openalex.org/W2134158441","https://openalex.org/W2140749965","https://openalex.org/W2149636309","https://openalex.org/W2166207675","https://openalex.org/W2189709317","https://openalex.org/W2465921064","https://openalex.org/W2520832790","https://openalex.org/W2551742439","https://openalex.org/W2563712954","https://openalex.org/W2593514298","https://openalex.org/W2650447257","https://openalex.org/W2772613299","https://openalex.org/W2889368301","https://openalex.org/W3082284567"],"related_works":["https://openalex.org/W3167230630","https://openalex.org/W2899070428","https://openalex.org/W2889368301","https://openalex.org/W2743270688","https://openalex.org/W1994268816","https://openalex.org/W2248671773","https://openalex.org/W4360895650","https://openalex.org/W2147810779","https://openalex.org/W2043673305","https://openalex.org/W1528186638"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-10-25T09:29:13.331239","created_date":"2018-06-21T00:00:00"}