{"id":"https://openalex.org/W2808517693","doi":"https://doi.org/10.1016/j.matpr.2018.02.031","title":"Effect of oxygen gas flow rate on phase transformation and morphology of vanadium oxide thin films","display_name":"Effect of oxygen gas flow rate on phase transformation and morphology of vanadium oxide thin films","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2808517693","doi":"https://doi.org/10.1016/j.matpr.2018.02.031","mag":"2808517693"},"language":"en","primary_location":{"id":"doi:10.1016/j.matpr.2018.02.031","doi":"https://doi.org/10.1016/j.matpr.2018.02.031","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.matpr.2018.02.031","pdf_url":null,"source":{"id":"https://openalex.org/S2898407351","display_name":"Materials Today Proceedings","issn_l":"2214-7853","issn":["2214-7853"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Today: Proceedings","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023060010","display_name":"Tanattha Rattana","orcid":"https://orcid.org/0000-0003-3198-7365","observed_orcids":["https://orcid.org/0000-0003-3198-7365"]},"institutions":[{"id":"https://openalex.org/I129488602","display_name":"Burapha University","ror":"https://ror.org/01ff74m36","country_code":"TH","type":"education","lineage":["https://openalex.org/I129488602"]}],"countries":["TH"],"is_corresponding":true,"raw_author_name":"T. Rattana","raw_affiliation_strings":["Department of Physics, Faculty of Science, Burapha University, Chonburi 20130, Thailand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Faculty of Science, Burapha University, Chonburi 20130, Thailand","institution_ids":["https://openalex.org/I129488602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007873471","display_name":"Sumetha Suwanboon","orcid":"https://orcid.org/0000-0002-7960-5365","observed_orcids":["https://orcid.org/0000-0002-7960-5365"]},"institutions":[{"id":"https://openalex.org/I131868736","display_name":"Prince of Songkla University","ror":"https://ror.org/0575ycz84","country_code":"TH","type":"education","lineage":["https://openalex.org/I131868736"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"S. Suwanboon","raw_affiliation_strings":["Department of Materials Science and Technology, Faculty of Science, Prince of Songkla University, Songkhla 90110, Thailand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Technology, Faculty of Science, Prince of Songkla University, Songkhla 90110, Thailand","institution_ids":["https://openalex.org/I131868736"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108446814","display_name":"C. Kedkaew","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I60837268","display_name":"King Mongkut's University of Technology Thonburi","ror":"https://ror.org/0057ax056","country_code":"TH","type":"education","lineage":["https://openalex.org/I60837268"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"C. Kedkaew","raw_affiliation_strings":["Department of Physics, Faculty of Science, King Mongkut\u2019s Univerisity of Technology Thonburi, Bangkok 10140, Thailand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Faculty of Science, King Mongkut\u2019s Univerisity of Technology Thonburi, Bangkok 10140, Thailand","institution_ids":["https://openalex.org/I60837268"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5023060010"],"corresponding_institution_ids":["https://openalex.org/I129488602"],"apc_list":{"value":200,"currency":"USD","value_usd":200},"apc_paid":null,"fwci":0.1543,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.31641588,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":"5","issue":"6","first_page":"13870","last_page":"13873"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.003100000089034438,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":0.0026000000070780516,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/vanadium-oxide-thin-films","display_name":"vanadium oxide thin films","score":0.9240000247955322},{"id":"https://openalex.org/keywords/oxygen-flow-rate","display_name":"oxygen flow rate","score":0.9539999961853027},{"id":"https://openalex.org/keywords/phase-transformation","display_name":"phase transformation","score":0.9869999885559082},{"id":"https://openalex.org/keywords/surface-morphology","display_name":"surface morphology","score":0.8489999771118164},{"id":"https://openalex.org/keywords/microstructure","display_name":"microstructure","score":0.9169999957084656},{"id":"https://openalex.org/keywords/lattice-structures","display_name":"lattice structures","score":0.800000011920929},{"id":"https://openalex.org/keywords/reactive-dc-magnetron-sputtering","display_name":"reactive DC magnetron sputtering","score":0.921999990940094},{"id":"https://openalex.org/keywords/glass-substrates","display_name":"glass substrates","score":0.4090000092983246}],"concepts":[{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.7780614495277405},{"id":"https://openalex.org/C39546656","wikidata":"https://www.wikidata.org/wiki/Q904573","display_name":"Diffractometer","level":3,"score":0.7488082051277161},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7323300242424011},{"id":"https://openalex.org/C61427134","wikidata":"https://www.wikidata.org/wiki/Q847609","display_name":"Sputter deposition","level":4,"score":0.6231381297111511},{"id":"https://openalex.org/C2776820632","wikidata":"https://www.wikidata.org/wiki/Q1660493","display_name":"Vanadium oxide","level":3,"score":0.6196306347846985},{"id":"https://openalex.org/C504678139","wikidata":"https://www.wikidata.org/wiki/Q722","display_name":"Vanadium","level":2,"score":0.6171895861625671},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.5437309741973877},{"id":"https://openalex.org/C40003534","wikidata":"https://www.wikidata.org/wiki/Q862228","display_name":"Raman spectroscopy","level":2,"score":0.5374423265457153},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.49717429280281067},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.48365604877471924},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.46550920605659485},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.445385605096817},{"id":"https://openalex.org/C172120300","wikidata":"https://www.wikidata.org/wiki/Q1134348","display_name":"Volumetric flow rate","level":2,"score":0.41166234016418457},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.39896225929260254},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.21704062819480896},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.192339688539505},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.17684686183929443},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.1721968650817871},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1363978385925293},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.matpr.2018.02.031","doi":"https://doi.org/10.1016/j.matpr.2018.02.031","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.matpr.2018.02.031","pdf_url":null,"source":{"id":"https://openalex.org/S2898407351","display_name":"Materials Today Proceedings","issn_l":"2214-7853","issn":["2214-7853"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Today: Proceedings","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1571015630","https://openalex.org/W1967753006","https://openalex.org/W1976550917","https://openalex.org/W1993088960","https://openalex.org/W2005824128","https://openalex.org/W2006753030","https://openalex.org/W2010286689","https://openalex.org/W2027780232","https://openalex.org/W2042205667","https://openalex.org/W2060055202","https://openalex.org/W2061287164","https://openalex.org/W2163554273"],"related_works":["https://openalex.org/W4406098498","https://openalex.org/W2586358324","https://openalex.org/W2302356513","https://openalex.org/W2472398273","https://openalex.org/W2007903757","https://openalex.org/W4405624175","https://openalex.org/W4210681421","https://openalex.org/W2392740321","https://openalex.org/W1995320692","https://openalex.org/W7160781125"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2018-06-21T00:00:00"}