{"id":"https://openalex.org/W2808065093","doi":"https://doi.org/10.4028/www.scientific.net/msf.924.988","title":"Magnetic Field Sensing with 4H SiC Diodes: N vs P Implantation","display_name":"Magnetic Field Sensing with 4H SiC Diodes: N vs P Implantation","publication_year":2018,"publication_date":"2018-06-05","ids":{"openalex":"https://openalex.org/W2808065093","doi":"https://doi.org/10.4028/www.scientific.net/msf.924.988","mag":"2808065093"},"language":"en","primary_location":{"id":"doi:10.4028/www.scientific.net/msf.924.988","doi":"https://doi.org/10.4028/www.scientific.net/msf.924.988","is_oa":true,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/msf.924.988","pdf_url":null,"source":{"id":"https://openalex.org/S87940674","display_name":"Materials science forum","issn_l":"0255-5476","issn":["0255-5476","1662-9752","1662-9760"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1","poland-20"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"book series"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science Forum","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.4028/www.scientific.net/msf.924.988","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050641323","display_name":"Corey J. Cochrane","orcid":"https://orcid.org/0000-0002-4935-1472","observed_orcids":["https://orcid.org/0000-0002-4935-1472"]},"institutions":[{"id":"https://openalex.org/I122411786","display_name":"California Institute of Technology","ror":"https://ror.org/05dxps055","country_code":"US","type":"education","lineage":["https://openalex.org/I122411786"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Corey J. Cochrane","raw_affiliation_strings":["California Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"California Institute of Technology","institution_ids":["https://openalex.org/I122411786"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034419982","display_name":"Hannes Kraus","orcid":"https://orcid.org/0000-0003-1727-5644","observed_orcids":["https://orcid.org/0000-0003-1727-5644"]},"institutions":[{"id":"https://openalex.org/I122411786","display_name":"California Institute of Technology","ror":"https://ror.org/05dxps055","country_code":"US","type":"education","lineage":["https://openalex.org/I122411786"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hannes Kraus","raw_affiliation_strings":["California Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"California Institute of Technology","institution_ids":["https://openalex.org/I122411786"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013027572","display_name":"Philip G. Neudeck","orcid":"https://orcid.org/0000-0002-2968-4712","observed_orcids":["https://orcid.org/0000-0002-2968-4712"]},"institutions":[{"id":"https://openalex.org/I2799786008","display_name":"Glenn Research Center","ror":"https://ror.org/059fqnc42","country_code":"US","type":"facility","lineage":["https://openalex.org/I2799786008","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Philip G. Neudeck","raw_affiliation_strings":["NASA Glenn Research Center (GRS)"],"raw_orcid":"https://orcid.org/0000-0002-2968-4712","affiliations":[{"raw_affiliation_string":"NASA Glenn Research Center (GRS)","institution_ids":["https://openalex.org/I2799786008"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058385724","display_name":"David J. Spry","orcid":"https://orcid.org/0009-0002-3326-104X","observed_orcids":["https://orcid.org/0009-0002-3326-104X"]},"institutions":[{"id":"https://openalex.org/I2799786008","display_name":"Glenn Research Center","ror":"https://ror.org/059fqnc42","country_code":"US","type":"facility","lineage":["https://openalex.org/I2799786008","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David J. Spry","raw_affiliation_strings":["NASA Glenn Research Center"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NASA Glenn Research Center","institution_ids":["https://openalex.org/I2799786008"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009784216","display_name":"Ryan J. Waskiewicz","orcid":"https://orcid.org/0000-0003-2855-5043","observed_orcids":["https://orcid.org/0000-0003-2855-5043"]},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ryan J. Waskiewicz","raw_affiliation_strings":["Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026784274","display_name":"James P. Ashton","orcid":"https://orcid.org/0000-0002-8156-2261","observed_orcids":["https://orcid.org/0000-0002-8156-2261"]},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Ashton","raw_affiliation_strings":["Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011597387","display_name":"Patrick M. Lenahan","orcid":"https://orcid.org/0000-0002-8937-9904","observed_orcids":["https://orcid.org/0000-0002-8937-9904","https://orcid.org/0000-0001-9759-1027"]},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Patrick M. Lenahan","raw_affiliation_strings":["Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5050641323"],"corresponding_institution_ids":["https://openalex.org/I122411786"],"apc_list":null,"apc_paid":null,"fwci":0.1911,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.47939681,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"924","issue":null,"first_page":"988","last_page":"992"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.00559999980032444,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10478","display_name":"Diamond and Carbon-based Materials Research","score":0.0017999999690800905,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/4h-sic","display_name":"4H-SiC","score":0.9570000171661377},{"id":"https://openalex.org/keywords/silicon-carbide-diodes","display_name":"silicon carbide diodes","score":0.7940000295639038},{"id":"https://openalex.org/keywords/magnetic-sensing","display_name":"magnetic field sensing","score":0.9300000071525574},{"id":"https://openalex.org/keywords/electrically-detected-magnetic-resonance","display_name":"electrically detected magnetic resonance","score":0.9269999861717224},{"id":"https://openalex.org/keywords/nitrogen-ion-implantation","display_name":"nitrogen ion implantation","score":0.8659999966621399},{"id":"https://openalex.org/keywords/phosphorus-ion-implantation","display_name":"phosphorus implantation","score":1.0},{"id":"https://openalex.org/keywords/structural-defects","display_name":"structural defects","score":0.6899999976158142},{"id":"https://openalex.org/keywords/radiation-hardness","display_name":"radioresistance","score":0.6460000276565552},{"id":"https://openalex.org/keywords/high-energy-electron-irradiation","display_name":"high-energy electron irradiation","score":0.6990000009536743},{"id":"https://openalex.org/keywords/p-n-junction","display_name":"p-n junction","score":0.45500001311302185}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.831100344657898},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.7198415994644165},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.700110673904419},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.6527571082115173},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.6032865047454834},{"id":"https://openalex.org/C41823505","wikidata":"https://www.wikidata.org/wiki/Q1436752","display_name":"Ion implantation","level":3,"score":0.5815233588218689},{"id":"https://openalex.org/C153428861","wikidata":"https://www.wikidata.org/wiki/Q152749","display_name":"Radiation damage","level":3,"score":0.5229181051254272},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4386003911495209},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.4139666259288788},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.37110549211502075},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3323385715484619},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15925660729408264},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.4028/www.scientific.net/msf.924.988","doi":"https://doi.org/10.4028/www.scientific.net/msf.924.988","is_oa":true,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/msf.924.988","pdf_url":null,"source":{"id":"https://openalex.org/S87940674","display_name":"Materials science forum","issn_l":"0255-5476","issn":["0255-5476","1662-9752","1662-9760"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1","poland-20"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"book series"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science Forum","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.4028/www.scientific.net/msf.924.988","doi":"https://doi.org/10.4028/www.scientific.net/msf.924.988","is_oa":true,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/msf.924.988","pdf_url":null,"source":{"id":"https://openalex.org/S87940674","display_name":"Materials science forum","issn_l":"0255-5476","issn":["0255-5476","1662-9752","1662-9760"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1","poland-20"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"book series"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science Forum","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332375","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1743147310","https://openalex.org/W1973151701","https://openalex.org/W1974973006","https://openalex.org/W1977687753","https://openalex.org/W1980583020","https://openalex.org/W2028250504","https://openalex.org/W2036547226","https://openalex.org/W2050277956","https://openalex.org/W2051374540","https://openalex.org/W2054478046","https://openalex.org/W2219271107","https://openalex.org/W2406220994","https://openalex.org/W2415412389","https://openalex.org/W2650507256","https://openalex.org/W3106365531"],"related_works":["https://openalex.org/W4401634094","https://openalex.org/W4393227496","https://openalex.org/W7208472048","https://openalex.org/W7214357359","https://openalex.org/W2406220994","https://openalex.org/W3211519961","https://openalex.org/W4409156657","https://openalex.org/W3001674182","https://openalex.org/W7146753661","https://openalex.org/W4379520383"],"abstract_inverted_index":{"We":[0,32],"explore":[1],"the":[2,19,27,43,56,71],"magnetic":[3,38,49,102],"sensing":[4,73,104],"capabilities":[5],"of":[6],"two":[7],"4H-SiC":[8,98],"n+p":[9],"diodes":[10],"fabricated":[11],"by":[12],"NASA":[13],"Glenn":[14],"which":[15],"only":[16],"differ":[17],"in":[18,75,105],"implanted":[20],"ion":[21],"species,":[22],"nitrogen":[23],"and":[24,26],"phosphorus,":[25],"implant":[28],"activation":[29],"annealing":[30],"time.":[31],"use":[33],"low-and":[34],"high-field":[35],"electrically":[36],"detected":[37],"resonance":[39],"(EDMR)":[40],"to":[41,47,54,64,69,88,93],"investigate":[42],"defect":[44,72],"structure":[45],"used":[46],"sense":[48],"fields":[50],"as":[51,53],"well":[52],"evaluate":[55,70],"sensitivity.":[57],"In":[58],"addition,":[59],"we":[60],"expose":[61],"these":[62],"devices":[63],"high":[65],"energy":[66],"electron":[67],"radiation":[68,78],"capability":[74],"a":[76,95],"harsh":[77,106],"environment.":[79],"The":[80],"results":[81],"from":[82],"this":[83],"work":[84],"will":[85],"allow":[86],"us":[87],"tailor":[89],"our":[90],"processing":[91],"methods":[92],"design":[94],"more":[96],"optimal":[97],"pn":[99],"diode":[100],"for":[101],"field":[103],"environments.":[107]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2018-06-21T00:00:00"}