{"id":"https://openalex.org/W2805259484","doi":"https://doi.org/10.1016/j.nimb.2018.05.017","title":"Application of \u2018Storing Matter\u2019 technique in SIMS depth profile analysis","display_name":"Application of \u2018Storing Matter\u2019 technique in SIMS depth profile analysis","publication_year":2018,"publication_date":"2018-05-30","ids":{"openalex":"https://openalex.org/W2805259484","doi":"https://doi.org/10.1016/j.nimb.2018.05.017","mag":"2805259484"},"language":"en","primary_location":{"id":"doi:10.1016/j.nimb.2018.05.017","doi":"https://doi.org/10.1016/j.nimb.2018.05.017","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.nimb.2018.05.017","pdf_url":null,"source":{"id":"https://openalex.org/S113542562","display_name":"Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms","issn_l":"0168-583X","issn":["0168-583X","1872-9584"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090354984","display_name":"M. Mi\u015bnik","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I169333911","display_name":"Gda\u0144sk University of Technology","ror":"https://ror.org/006x4sc24","country_code":"PL","type":"education","lineage":["https://openalex.org/I169333911"]},{"id":"https://openalex.org/I4210105040","display_name":"\u0141ukasiewicz Research Network - Tele and Radio Research Institute","ror":"https://ror.org/01bkj6835","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210105040","https://openalex.org/I4210129336"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"M. Mi\u015bnik","raw_affiliation_strings":["Gda\u0144sk University of Technology, Faculty of Technical Physics and Applied Mathematics, Department of Atomic, Molecular and Optical Physics, Narutowicza 11/12, 80-233 Gda\u0144sk, Poland","Institute of Tele and Radio Technology, Ratuszowa 11, 03-450 Warszawa, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Gda\u0144sk University of Technology, Faculty of Technical Physics and Applied Mathematics, Department of Atomic, Molecular and Optical Physics, Narutowicza 11/12, 80-233 Gda\u0144sk, Poland","institution_ids":["https://openalex.org/I169333911"]},{"raw_affiliation_string":"Institute of Tele and Radio Technology, Ratuszowa 11, 03-450 Warszawa, Poland","institution_ids":["https://openalex.org/I4210105040"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038122817","display_name":"P. Konarski","orcid":"https://orcid.org/0000-0003-0655-6336","observed_orcids":["https://orcid.org/0000-0003-0655-6336"]},"institutions":[{"id":"https://openalex.org/I4210105040","display_name":"\u0141ukasiewicz Research Network - Tele and Radio Research Institute","ror":"https://ror.org/01bkj6835","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210105040","https://openalex.org/I4210129336"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"P. Konarski","raw_affiliation_strings":["Institute of Tele and Radio Technology, Ratuszowa 11, 03-450 Warszawa, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Tele and Radio Technology, Ratuszowa 11, 03-450 Warszawa, Poland","institution_ids":["https://openalex.org/I4210105040"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030426446","display_name":"A. Zawada","orcid":"https://orcid.org/0009-0004-2686-9828","observed_orcids":["https://orcid.org/0009-0004-2686-9828"]},"institutions":[{"id":"https://openalex.org/I2800249161","display_name":"Military University of Technology in Warsaw","ror":"https://ror.org/05fct5h31","country_code":"PL","type":"education","lineage":["https://openalex.org/I2800249161"]},{"id":"https://openalex.org/I4210105040","display_name":"\u0141ukasiewicz Research Network - Tele and Radio Research Institute","ror":"https://ror.org/01bkj6835","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210105040","https://openalex.org/I4210129336"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"A. Zawada","raw_affiliation_strings":["Institute of Tele and Radio Technology, Ratuszowa 11, 03-450 Warszawa, Poland","Military University of Technology, Kaliskiego 2, 00-908 Warszawa, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Tele and Radio Technology, Ratuszowa 11, 03-450 Warszawa, Poland","institution_ids":["https://openalex.org/I4210105040"]},{"raw_affiliation_string":"Military University of Technology, Kaliskiego 2, 00-908 Warszawa, Poland","institution_ids":["https://openalex.org/I2800249161"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021340157","display_name":"Joachim A\u017cgin","orcid":"https://orcid.org/0000-0002-4217-2332","observed_orcids":["https://orcid.org/0000-0002-4217-2332"]},"institutions":[{"id":"https://openalex.org/I2800249161","display_name":"Military University of Technology in Warsaw","ror":"https://ror.org/05fct5h31","country_code":"PL","type":"education","lineage":["https://openalex.org/I2800249161"]},{"id":"https://openalex.org/I4210105040","display_name":"\u0141ukasiewicz Research Network - Tele and Radio Research Institute","ror":"https://ror.org/01bkj6835","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210105040","https://openalex.org/I4210129336"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"J. A\u017cgin","raw_affiliation_strings":["Institute of Tele and Radio Technology, Ratuszowa 11, 03-450 Warszawa, Poland","Military University of Technology, Kaliskiego 2, 00-908 Warszawa, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Tele and Radio Technology, Ratuszowa 11, 03-450 Warszawa, Poland","institution_ids":["https://openalex.org/I4210105040"]},{"raw_affiliation_string":"Military University of Technology, Kaliskiego 2, 00-908 Warszawa, Poland","institution_ids":["https://openalex.org/I2800249161"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5090354984"],"corresponding_institution_ids":["https://openalex.org/I169333911","https://openalex.org/I4210105040"],"apc_list":{"value":2810,"currency":"USD","value_usd":2810},"apc_paid":null,"fwci":0.3684,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.52104451,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":94},"biblio":{"volume":"450","issue":null,"first_page":"153","last_page":"156"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/secondary-ion-mass-spectrometry","display_name":"secondary ion mass spectrometry","score":0.921999990940094},{"id":"https://openalex.org/keywords/depth-profiling","display_name":"depth profiling","score":0.6909999847412109},{"id":"https://openalex.org/keywords/matrix-effects","display_name":"matrix effects","score":0.9779999852180481},{"id":"https://openalex.org/keywords/sputtering","display_name":"sputtering","score":0.6079999804496765},{"id":"https://openalex.org/keywords/ionization-efficiency","display_name":"ionization efficiency","score":0.8759999871253967},{"id":"https://openalex.org/keywords/rotating-collector","display_name":"rotating collector","score":0.6159999966621399},{"id":"https://openalex.org/keywords/metal-oxide-interface","display_name":"metal-oxide interface","score":0.6539999842643738},{"id":"https://openalex.org/keywords/aluminum-coating","display_name":"aluminum coating","score":0.625},{"id":"https://openalex.org/keywords/layered-structure","display_name":"layered structure","score":0.5370000004768372}],"concepts":[{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.8511860370635986},{"id":"https://openalex.org/C77671233","wikidata":"https://www.wikidata.org/wiki/Q556046","display_name":"Secondary ion mass spectrometry","level":3,"score":0.6639484167098999},{"id":"https://openalex.org/C187529661","wikidata":"https://www.wikidata.org/wiki/Q3943651","display_name":"Static secondary-ion mass spectrometry","level":4,"score":0.6344477534294128},{"id":"https://openalex.org/C198291218","wikidata":"https://www.wikidata.org/wiki/Q190382","display_name":"Ionization","level":3,"score":0.5759488344192505},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.55452960729599},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.551008939743042},{"id":"https://openalex.org/C50774322","wikidata":"https://www.wikidata.org/wiki/Q644248","display_name":"Ion beam","level":3,"score":0.5501686334609985},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5325322151184082},{"id":"https://openalex.org/C513153333","wikidata":"https://www.wikidata.org/wiki/Q663","display_name":"Aluminium","level":2,"score":0.49234139919281006},{"id":"https://openalex.org/C162356407","wikidata":"https://www.wikidata.org/wiki/Q180809","display_name":"Mass spectrometry","level":2,"score":0.4919126033782959},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.49185657501220703},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.4834462106227875},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.42772746086120605},{"id":"https://openalex.org/C58312451","wikidata":"https://www.wikidata.org/wiki/Q4817200","display_name":"Atom (system on chip)","level":2,"score":0.4214757978916168},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3626400828361511},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.35398173332214355},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.21791982650756836},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.20984849333763123},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14958268404006958},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0928419828414917},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.07423555850982666},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.nimb.2018.05.017","doi":"https://doi.org/10.1016/j.nimb.2018.05.017","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.nimb.2018.05.017","pdf_url":null,"source":{"id":"https://openalex.org/S113542562","display_name":"Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms","issn_l":"0168-583X","issn":["0168-583X","1872-9584"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G341963353","display_name":null,"funder_award_id":"DI2013 013943","funder_id":"https://openalex.org/F4320322733","funder_display_name":"Ministerstwo Edukacji i Nauki"}],"funders":[{"id":"https://openalex.org/F4320322733","display_name":"Ministerstwo Edukacji i Nauki","ror":"https://ror.org/05dwvd537"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2008485431","https://openalex.org/W2013282964","https://openalex.org/W2016987479","https://openalex.org/W2017765390","https://openalex.org/W2033005767","https://openalex.org/W2034368898","https://openalex.org/W2153902374","https://openalex.org/W2173081695"],"related_works":["https://openalex.org/W1977275499","https://openalex.org/W2332906127","https://openalex.org/W1985771994","https://openalex.org/W214567893","https://openalex.org/W2154541443","https://openalex.org/W2008485431","https://openalex.org/W2153902374","https://openalex.org/W2145153742","https://openalex.org/W2018882463","https://openalex.org/W2113026850"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-09-21T07:43:02.447757","created_date":"2018-06-13T00:00:00"}