{"id":"https://openalex.org/W2804620730","doi":"https://doi.org/10.1109/iirw.2017.8361248","title":"Reliability and modeling: What to simulate and how?","display_name":"Reliability and modeling: What to simulate and how?","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2804620730","doi":"https://doi.org/10.1109/iirw.2017.8361248","mag":"2804620730"},"language":"en","primary_location":{"id":"doi:10.1109/iirw.2017.8361248","doi":"https://doi.org/10.1109/iirw.2017.8361248","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iirw.2017.8361248","pdf_url":null,"source":{"id":"https://openalex.org/S4210230073","display_name":"IEEE International Integrated Reliability Workshop final report","issn_l":"1930-8841","issn":["1930-8841","2374-8036"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Integrated Reliability Workshop (IIRW)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100422081","display_name":"Rui Zhang","orcid":"https://orcid.org/0000-0002-7610-2586","observed_orcids":["https://orcid.org/0000-0002-7610-2586"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Rui Zhang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015072881","display_name":"G. Verzellesi","orcid":"https://orcid.org/0000-0001-5770-6512","observed_orcids":["https://orcid.org/0000-0001-5770-6512"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Giovanni Verzellesi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033806395","display_name":"Giuseppina Puzzilli","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Giuseppina Puzzilli","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084672303","display_name":"Katja Puschkarsky","orcid":"https://orcid.org/0000-0001-7875-3270","observed_orcids":["https://orcid.org/0000-0001-7875-3270"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Katja Puschkarsky","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033887233","display_name":"Charles LaRow","orcid":"https://orcid.org/0009-0002-4335-5453","observed_orcids":["https://orcid.org/0009-0002-4335-5453"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Charles LaRow","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064002062","display_name":"Alexander L. Shluger","orcid":"https://orcid.org/0000-0002-2488-0896","observed_orcids":["https://orcid.org/0000-0002-2488-0896"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alexander Shluger","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032541869","display_name":"Yuri Tkachev","orcid":"https://orcid.org/0000-0002-3685-3625","observed_orcids":["https://orcid.org/0000-0002-3685-3625"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuri Tkachev","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019981169","display_name":"Marco Antonio Villena","orcid":"https://orcid.org/0000-0001-5547-3380","observed_orcids":["https://orcid.org/0000-0001-5547-3380"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Marco A. Villena","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025591564","display_name":"Kexin Yang","orcid":"https://orcid.org/0000-0002-3630-1003","observed_orcids":["https://orcid.org/0000-0002-3630-1003","https://orcid.org/0009-0001-1409-8470"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kexin Yang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5097946414","display_name":"Elnatan Metaev","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Elnatan Metaev","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068149790","display_name":"Milan Pe\u0161i\u0107","orcid":"https://orcid.org/0000-0002-1788-8945","observed_orcids":["https://orcid.org/0000-0002-1788-8945"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Milan Pesic","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109427087","display_name":"J. R. Lloyd","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jim Lloyd","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075905765","display_name":"Matt Ring","orcid":"https://orcid.org/0000-0002-4025-5644","observed_orcids":["https://orcid.org/0000-0002-4025-5644"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Matt Ring","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056130525","display_name":"Peter C. Paliwoda","orcid":"https://orcid.org/0000-0003-0341-2468","observed_orcids":["https://orcid.org/0000-0003-0341-2468"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Peter Paliwoda","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058844682","display_name":"Sheldon X.-D. Tan","orcid":"https://orcid.org/0000-0003-2119-6869","observed_orcids":["https://orcid.org/0000-0003-2119-6869"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sheldon Tan","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5007504207","display_name":"Chadwin Delin Young","orcid":"https://orcid.org/0000-0003-0690-7423","observed_orcids":["https://orcid.org/0000-0003-0690-7423"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chadwin Young","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5781,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55903337,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.8705999851226807,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.8705999851226807,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11195","display_name":"Simulation Techniques and Applications","score":0.0494999997317791,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13286","display_name":"Modeling and Simulation Systems","score":0.011800000444054604,"subfield":{"id":"https://openalex.org/subfields/2611","display_name":"Modeling and Simulation"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-simulation","display_name":"computer simulation","score":0.625},{"id":"https://openalex.org/keywords/information-needs","display_name":"information needs","score":0.38999998569488525}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7206434607505798},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6848330497741699},{"id":"https://openalex.org/C108215451","wikidata":"https://www.wikidata.org/wiki/Q7263963","display_name":"Simulation modeling","level":2,"score":0.5163244605064392},{"id":"https://openalex.org/C2781311116","wikidata":"https://www.wikidata.org/wiki/Q83306","display_name":"Group (periodic table)","level":2,"score":0.49353134632110596},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.34706002473831177},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C175444787","wikidata":"https://www.wikidata.org/wiki/Q39072","display_name":"Microeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iirw.2017.8361248","doi":"https://doi.org/10.1109/iirw.2017.8361248","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iirw.2017.8361248","pdf_url":null,"source":{"id":"https://openalex.org/S4210230073","display_name":"IEEE International Integrated Reliability Workshop final report","issn_l":"1930-8841","issn":["1930-8841","2374-8036"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Integrated Reliability Workshop (IIRW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7096934423","https://openalex.org/W4375843588","https://openalex.org/W1739755870","https://openalex.org/W7098850101","https://openalex.org/W4255519538","https://openalex.org/W4240107915","https://openalex.org/W2351443891","https://openalex.org/W4292492710","https://openalex.org/W2004474355","https://openalex.org/W7100709675"],"abstract_inverted_index":{"\u2022":[0,12,17,38,52],"The":[1],"deep":[2],"collaboration":[3,14],"between":[4],"the":[5,27,34,47,56,60],"experimental":[6,48],"and":[7,31],"simulation":[8,35,57],"groups":[9,19,36,40,49],"is":[10],"needed.":[11],"This":[13],"require":[15],"that:":[16],"Experimental":[18],"should":[20,41],"previously":[21],"know":[22,42],"what":[23,32,43],"kind":[24],"of":[25,45],"information":[26,33,46,61],"simulations":[28],"could":[29],"provide":[30],"need.":[37],"Simulation":[39],"type":[44],"can":[50],"provide.":[51],"We":[53],"need":[54],"adapt":[55],"level":[58],"to":[59],"we":[62],"are":[63],"looking":[64],"for.":[65]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2018-06-01T00:00:00"}