{"id":"https://openalex.org/W280354828","doi":null,"title":"Reliability analysis of power electronics for heavy hybrid vehicle applications","display_name":"Reliability analysis of power electronics for heavy hybrid vehicle applications","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W280354828","mag":"280354828"},"language":"en","primary_location":{"id":"pmh:oai:publications.lib.chalmers.se:211413","doi":null,"is_oa":true,"landing_page_url":"http://studentarbeten.chalmers.se/publication/211413-reliability-analysis-of-power-electronics-for-heavy-hybrid-vehicle-applications","pdf_url":"http://studentarbeten.chalmers.se/publication/211413-reliability-analysis-of-power-electronics-for-heavy-hybrid-vehicle-applications","source":{"id":"https://openalex.org/S4377196470","display_name":"Chalmers Publication Library (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text.Thesis.Masters.H"},"volume":null,"type":"dissertation","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://studentarbeten.chalmers.se/publication/211413-reliability-analysis-of-power-electronics-for-heavy-hybrid-vehicle-applications","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023084261","display_name":"Str\u00e4ngberg Martin","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Str\u00e4ngberg Martin","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5023084261"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9487000107765198,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9487000107765198,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.02500000037252903,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.009999999776482582,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-electronics-reliability","display_name":"power electronics reliability","score":0.9810000061988831},{"id":"https://openalex.org/keywords/igbt","display_name":"IGBT","score":0.7829999923706055},{"id":"https://openalex.org/keywords/diodes","display_name":"diodes","score":0.7760000228881836},{"id":"https://openalex.org/keywords/power-cycling","display_name":"power cycling","score":0.7620000243186951},{"id":"https://openalex.org/keywords/thermal-cycling","display_name":"thermal cycling","score":0.6430000066757202},{"id":"https://openalex.org/keywords/lifetime-prediction","display_name":"lifetime prediction","score":0.7360000014305115},{"id":"https://openalex.org/keywords/temperature-swing","display_name":"temperature swing","score":0.7900000214576721},{"id":"https://openalex.org/keywords/power-modules","display_name":"power modules","score":0.47200000286102295}],"concepts":[{"id":"https://openalex.org/C2777900271","wikidata":"https://www.wikidata.org/wiki/Q17105337","display_name":"Power cycling","level":4,"score":0.9033360481262207},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.7660200595855713},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.7530359029769897},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6996855735778809},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.645618200302124},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5459299683570862},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.5339454412460327},{"id":"https://openalex.org/C177564732","wikidata":"https://www.wikidata.org/wiki/Q7698333","display_name":"Temperature cycling","level":3,"score":0.5000417232513428},{"id":"https://openalex.org/C141812795","wikidata":"https://www.wikidata.org/wiki/Q7236534","display_name":"Power module","level":3,"score":0.47495245933532715},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.47217029333114624},{"id":"https://openalex.org/C30239060","wikidata":"https://www.wikidata.org/wiki/Q5253111","display_name":"Delamination (geology)","level":4,"score":0.4533788561820984},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.44946202635765076},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.4484430253505707},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.44590675830841064},{"id":"https://openalex.org/C65655974","wikidata":"https://www.wikidata.org/wiki/Q14867674","display_name":"Swing","level":2,"score":0.4137251079082489},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2515650987625122},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16632625460624695},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.1347920000553131},{"id":"https://openalex.org/C58097730","wikidata":"https://www.wikidata.org/wiki/Q176318","display_name":"Subduction","level":3,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C77928131","wikidata":"https://www.wikidata.org/wiki/Q193343","display_name":"Tectonics","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:oai:publications.lib.chalmers.se:211413","doi":null,"is_oa":true,"landing_page_url":"http://studentarbeten.chalmers.se/publication/211413-reliability-analysis-of-power-electronics-for-heavy-hybrid-vehicle-applications","pdf_url":"http://studentarbeten.chalmers.se/publication/211413-reliability-analysis-of-power-electronics-for-heavy-hybrid-vehicle-applications","source":{"id":"https://openalex.org/S4377196470","display_name":"Chalmers Publication Library (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text.Thesis.Masters.H"},{"id":"mag:280354828","doi":null,"is_oa":false,"landing_page_url":"https://odr.chalmers.se/bitstream/20.500.12380/211413/1/211413.pdf","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:publications.lib.chalmers.se:211413","doi":null,"is_oa":true,"landing_page_url":"http://studentarbeten.chalmers.se/publication/211413-reliability-analysis-of-power-electronics-for-heavy-hybrid-vehicle-applications","pdf_url":"http://studentarbeten.chalmers.se/publication/211413-reliability-analysis-of-power-electronics-for-heavy-hybrid-vehicle-applications","source":{"id":"https://openalex.org/S4377196470","display_name":"Chalmers Publication Library (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text.Thesis.Masters.H"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8485000133514404},{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6773999929428101}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W280354828.pdf","grobid_xml":"https://content.openalex.org/works/W280354828.grobid-xml"},"referenced_works_count":13,"referenced_works":["https://openalex.org/W1573847156","https://openalex.org/W1902751038","https://openalex.org/W2010549488","https://openalex.org/W2023096650","https://openalex.org/W2054966155","https://openalex.org/W2064741800","https://openalex.org/W2091871839","https://openalex.org/W2105557297","https://openalex.org/W2108776657","https://openalex.org/W2157909183","https://openalex.org/W2165842238","https://openalex.org/W2278943062","https://openalex.org/W3203011645"],"related_works":["https://openalex.org/W2042074682","https://openalex.org/W7043551478","https://openalex.org/W1917284643","https://openalex.org/W2010549488","https://openalex.org/W2114545648","https://openalex.org/W2901593561","https://openalex.org/W7034157181","https://openalex.org/W2088520408","https://openalex.org/W2155458461","https://openalex.org/W4406119358"],"abstract_inverted_index":{"The":[0,17,59,102,141,170],"purpose":[1],"of":[2,10,20,130,149,168,172,203,263,276],"the":[3,8,21,39,44,47,52,55,70,77,86,98,111,123,127,156,160,166,173,185,199,205,208,210,218,223,227,237,242,251,259,287],"thesis":[4],"report":[5,60],"is":[6,68,73,84,89,100,107,115,126,192,212,229],"analyze":[7],"reliability":[9],"power":[11,22,48,64,82],"electronics":[12,23,49],"for":[13,104,119,132,291],"heavy":[14,295],"hybrid":[15,296],"vehicles.":[16],"failure":[18,238],"modes":[19],"are":[24,57,143,159,248,289],"investigated,":[25],"along":[26],"with":[27,30,38,145,152,273],"lifetime":[28,40,171,220,228],"analysis":[29],"respect":[31],"to":[32,164,217,256,284],"different":[33],"current":[34,99],"levels":[35],"and":[36,54,80,110,179,189,207,281],"compared":[37,216],"information":[41],"provided":[42],"by":[43,92,241],"manufacturer.":[45],"In":[46],"module":[50],"both":[51,204],"IGBTs":[53],"diodes":[56],"tested.":[58],"focuses":[61],"on":[62,147,184],"active":[63,81],"cycling.":[65],"Passive":[66],"cycling":[67,83,268],"when":[69,85,215,258],"test":[71,87,252],"object":[72,88],"thermally":[74],"cycled":[75],"from":[76],"surrounding":[78],"temperature":[79,186,201,225],"heated":[90],"up":[91,106],"a":[93,139,193,294],"current,":[94],"during":[95],"cool":[96],"down":[97,113],"stopped.":[101],"time":[103,114,121,134,148,154,246],"heating":[105],"2":[108,116,150],"s":[109],"cooling":[112],"s,":[117],"generally":[118],"short":[120],"cycles":[122,182],"bond":[124,157,243],"wire":[125],"major":[128],"cause":[129,167],"failure,":[131],"longer":[133,230,245],"periods":[135,247],"solder":[136,264],"delamination":[137],"becomes":[138],"problem.":[140],"tests":[142,277,283],"done":[144,255],"an":[146,196],"seconds,":[151],"this":[153],"cycle":[155],"wires":[158],"part":[161],"most":[162],"likely":[163],"be":[165,254,270],"failure.":[169],"modules":[174,260,288],"varied":[175],"between":[176],"56":[177],"000":[178,181],"380":[180],"depending":[183],"swing,":[187,202],"\u0394T,":[188],"if":[190,250,286],"it":[191,234],"diode":[194,206],"or":[195],"IGBT.":[197],"For":[198,222],"highest":[200],"IGBT,":[209],"result":[211],"as":[213,279],"expected":[214],"manufacturers":[219],"curve.":[221],"other":[224,274],"swings":[226],"than":[231],"expected.":[232],"Since":[233],"seems":[235],"that":[236],"were":[239],"caused":[240],"wires,":[244],"needed":[249],"should":[253,269],"find":[257],"fails":[261],"because":[262],"delamination.":[265],"Also":[266],"passive":[267],"investigated":[271],"together":[272],"types":[275],"such":[278],"vibration":[280],"chemical":[282],"investigate":[285],"suitable":[290],"operation":[292],"in":[293],"vehicle.":[297]},"counts_by_year":[],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}