{"id":"https://openalex.org/W2802329348","doi":null,"title":"Measurement System Analysis of Outside Micrometer for Non-Standard Temperature Conditions","display_name":"Measurement System Analysis of Outside Micrometer for Non-Standard Temperature Conditions","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2802329348","mag":"2802329348"},"language":"en","primary_location":{"id":"mag:2802329348","doi":null,"is_oa":false,"landing_page_url":"https://www.jetir.org/papers/JETIR1609004.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S2764944466","display_name":"Journal of Emerging Technologies and Innovative Research","issn_l":"2349-5162","issn":["2349-5162"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4322546156","host_organization_name":"Journal of Emerging Technologies and Innovative Research (JETIR)","host_organization_lineage":["https://openalex.org/P4322546156"],"host_organization_lineage_names":["Journal of Emerging Technologies and Innovative Research (JETIR)"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Journal of Emerging Technologies and Innovative Research","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044590548","display_name":"Zubair J. Palkar","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zubair J. Palkar","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082263076","display_name":"Vinay A. Kulkarni","orcid":"https://orcid.org/0000-0002-4753-8372","observed_orcids":["https://orcid.org/0000-0002-4753-8372"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Vinay A Kulkarni","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5065867265","display_name":"Maneetkumar Rangnath Dhanvijay","orcid":"https://orcid.org/0000-0002-9642-4611","observed_orcids":["https://orcid.org/0000-0002-9642-4611"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Maneetkumar R. Dhanvijay","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-9642-4611","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":"3","issue":"9","first_page":"20-25","last_page":"20-25"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.8403000235557556,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.8403000235557556,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.13750000298023224,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.014000000432133675,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-system-analysis","display_name":"measurement system analysis","score":0.9750000238418579},{"id":"https://openalex.org/keywords/temperature-variation","display_name":"temperature variation","score":0.6539999842643738},{"id":"https://openalex.org/keywords/bias","display_name":"bias","score":0.45899999141693115},{"id":"https://openalex.org/keywords/linearity","display_name":"linearity","score":0.9940000176429749},{"id":"https://openalex.org/keywords/dimensional-metrology","display_name":"dimensional metrology","score":0.7670000195503235},{"id":"https://openalex.org/keywords/statistical-process-control","display_name":"statistical process control","score":0.9229999780654907},{"id":"https://openalex.org/keywords/control-charts","display_name":"control charts","score":0.7979999780654907}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6743251085281372},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6565793752670288},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.634950578212738},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5369104743003845},{"id":"https://openalex.org/C171635847","wikidata":"https://www.wikidata.org/wiki/Q406983","display_name":"Micrometer","level":2,"score":0.5121817588806152},{"id":"https://openalex.org/C40976572","wikidata":"https://www.wikidata.org/wiki/Q2330873","display_name":"Gauge (firearms)","level":2,"score":0.4957753121852875},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4911153018474579},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4838789701461792},{"id":"https://openalex.org/C536315585","wikidata":"https://www.wikidata.org/wiki/Q7698332","display_name":"Temperature control","level":2,"score":0.4702170193195343},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.4298238754272461},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4286068081855774},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.4123249650001526},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3450535535812378},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.305828332901001},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.25444239377975464},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2534252107143402},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22661346197128296},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20228338241577148},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18481191992759705},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12463054060935974},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.09651437401771545},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:2802329348","doi":null,"is_oa":false,"landing_page_url":"https://www.jetir.org/papers/JETIR1609004.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S2764944466","display_name":"Journal of Emerging Technologies and Innovative Research","issn_l":"2349-5162","issn":["2349-5162"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4322546156","host_organization_name":"Journal of Emerging Technologies and Innovative Research (JETIR)","host_organization_lineage":["https://openalex.org/P4322546156"],"host_organization_lineage_names":["Journal of Emerging Technologies and Innovative Research (JETIR)"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"Journal of Emerging Technologies and Innovative Research","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2334068147"],"related_works":["https://openalex.org/W4391306556","https://openalex.org/W2033266900","https://openalex.org/W2901747149","https://openalex.org/W2086319933","https://openalex.org/W4391318881","https://openalex.org/W4412940657","https://openalex.org/W2950966485","https://openalex.org/W3110729383","https://openalex.org/W2014951383","https://openalex.org/W7052985170"],"abstract_inverted_index":{"Standard":[0],"atmospheric":[1],"conditions":[2],"for":[3,178],"precise":[4],"measurements":[5],"have":[6,20],"always":[7],"been":[8,21],"priority":[9],"in":[10,52,62,93,111,157],"metrology.":[11],"Industrial":[12],"lengths":[13],"defined":[14],"as":[15],"the":[16,41,48,59,71,88,91,99,122,131,145,148,152,179],"size":[17],"since":[18],"1931":[19],"measured":[22],"at":[23,46,107],"standard":[24],"reference":[25],"temperature":[26,38,53,110,127,150,173,180],"of":[27,90,147,159],"20\u00b0C.":[28],"As":[29],"it":[30],"is":[31,82,119,139],"practically":[32],"difficult":[33],"to":[34,55,66,75,84],"maintain":[35],"this":[37,76],"all":[39,47],"around":[40],"manufacturing":[42],"or":[43],"measurement":[44,63,94,125,155,174],"facility":[45],"time,":[49],"any":[50],"change":[51,61],"has":[54,65],"be":[56,67],"studied":[57],"and":[58,86,116,126,162,164],"resulting":[60],"process":[64,135],"accounted.":[68],"To":[69,129],"solve":[70],"challenges":[72],"arising":[73],"due":[74],"condition,":[77],"Measurement":[78],"system":[79,176],"analysis":[80,137],"(MSA)":[81],"used":[83],"locate":[85],"measure":[87],"spread":[89],"variation":[92],"system.":[95],"This":[96],"paper":[97,168],"presents":[98],"study":[100,118,130,143],"conducted":[101],"on":[102,121],"outside":[103],"micrometer":[104],"screw":[105],"gauge":[106],"varying":[108],"room":[109],"uncontrolled":[112],"measuring":[113],"facility.":[114],"Bias":[115],"Linearity":[117],"performed":[120],"recorded":[123,132,153],"dimensional":[124,154],"data.":[128],"data,":[133],"Statistical":[134],"control":[136,160],"(SPC)":[138],"also":[140,169],"performed.":[141],"The":[142,167],"shows":[144],"effect":[146],"non-standard":[149],"over":[151],"data":[156,181],"terms":[158],"charts":[161],"bias":[163],"linearity":[165],"values.":[166],"discusses":[170],"real":[171],"time":[172],"SCADA":[175],"application":[177],"collection.":[182]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2018-05-17T00:00:00"}