{"id":"https://openalex.org/W2783173335","doi":"https://doi.org/10.1002/adfm.201705250","title":"Ferroelectricity in Polar Polymer\u2010Based FETs: A Hysteresis Analysis","display_name":"Ferroelectricity in Polar Polymer\u2010Based FETs: A Hysteresis Analysis","publication_year":2018,"publication_date":"2018-01-15","ids":{"openalex":"https://openalex.org/W2783173335","doi":"https://doi.org/10.1002/adfm.201705250","mag":"2783173335","pmid":"https://pubmed.ncbi.nlm.nih.gov/31080381","pmcid":"https://www.ncbi.nlm.nih.gov/pmc/articles/6508614"},"language":"en","primary_location":{"id":"doi:10.1002/adfm.201705250","doi":"https://doi.org/10.1002/adfm.201705250","is_oa":false,"landing_page_url":"https://doi.org/10.1002/adfm.201705250","pdf_url":null,"source":{"id":"https://openalex.org/S135204980","display_name":"Advanced Functional Materials","issn_l":"1616-301X","issn":["1616-301X","1616-3028"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","ki-jl-3","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Functional Materials","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6508614","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082712910","display_name":"Vasileia Georgiou","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I162714631","display_name":"George Mason University","ror":"https://ror.org/02jqj7156","country_code":"US","type":"education","lineage":["https://openalex.org/I162714631"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vasileia Georgiou","raw_affiliation_strings":["Department of Electrical and Computer Engineering, George Mason University, 4400 University Drive, Fairfax, VA, 22030 USA","Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, George Mason University, 4400 University Drive, Fairfax, VA, 22030 USA","institution_ids":["https://openalex.org/I162714631"]},{"raw_affiliation_string":"Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054135802","display_name":"Dmitry B. Veksler","orcid":"https://orcid.org/0000-0001-6082-1191","observed_orcids":["https://orcid.org/0000-0001-6082-1191"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dmitry Veksler","raw_affiliation_strings":["Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079177496","display_name":"Jason Paul Campbell","orcid":"https://orcid.org/0000-0002-3406-1165","observed_orcids":["https://orcid.org/0000-0002-3406-1165"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jason P. Campbell","raw_affiliation_strings":["Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054295725","display_name":"Pragya Rasmi Shrestha","orcid":"https://orcid.org/0000-0001-9499-7822","observed_orcids":["https://orcid.org/0000-0001-9499-7822"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210097074","display_name":"Theiss Research","ror":"https://ror.org/00scjnx30","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210097074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pragya R. Shrestha","raw_affiliation_strings":["Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA","Theiss Research, 7411 Eads Avenue, La Jolla, CA, 92037 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Theiss Research, 7411 Eads Avenue, La Jolla, CA, 92037 USA","institution_ids":["https://openalex.org/I4210097074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070965384","display_name":"Jason Thomas Ryan","orcid":"https://orcid.org/0000-0003-4501-0969","observed_orcids":["https://orcid.org/0000-0003-4501-0969"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jason T. Ryan","raw_affiliation_strings":["Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082528426","display_name":"D.E. Ioannou","orcid":"https://orcid.org/0000-0003-3831-9378","observed_orcids":["https://orcid.org/0000-0003-3831-9378"]},"institutions":[{"id":"https://openalex.org/I162714631","display_name":"George Mason University","ror":"https://ror.org/02jqj7156","country_code":"US","type":"education","lineage":["https://openalex.org/I162714631"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dimitris E. Ioannou","raw_affiliation_strings":["Department of Electrical and Computer Engineering, George Mason University, 4400 University Drive, Fairfax, VA, 22030 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, George Mason University, 4400 University Drive, Fairfax, VA, 22030 USA","institution_ids":["https://openalex.org/I162714631"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023990409","display_name":"Kin P. Cheung","orcid":"https://orcid.org/0000-0003-2210-9907","observed_orcids":["https://orcid.org/0000-0003-2210-9907"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kin P. Cheung","raw_affiliation_strings":["Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, MD, 20899 USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5023990409"],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":{"value":5790,"currency":"USD","value_usd":5790},"apc_paid":null,"fwci":0.7643,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.68277213,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"28","issue":"10","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11608","display_name":"Dielectric materials and actuators","score":0.002099999925121665,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectric-field-effect-transistors","display_name":"ferroelectric field-effect transistors","score":0.9599999785423279},{"id":"https://openalex.org/keywords/polar-polymers","display_name":"polar polymers","score":0.9430000185966492},{"id":"https://openalex.org/keywords/ferroelectric-polarization","display_name":"ferroelectric polarization","score":0.8849999904632568},{"id":"https://openalex.org/keywords/charge-trapping","display_name":"charge trapping","score":0.9520000219345093},{"id":"https://openalex.org/keywords/mobile-ions","display_name":"mobile ions","score":0.9200000166893005},{"id":"https://openalex.org/keywords/flatband-voltage-shift","display_name":"flatband voltage shift","score":0.9629999995231628},{"id":"https://openalex.org/keywords/temperature-dependence","display_name":"temperature dependence","score":0.8809999823570251}],"concepts":[{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.8738839626312256},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8527908325195312},{"id":"https://openalex.org/C123299182","wikidata":"https://www.wikidata.org/wiki/Q190837","display_name":"Hysteresis","level":2,"score":0.6050399541854858},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.6013210415840149},{"id":"https://openalex.org/C29705727","wikidata":"https://www.wikidata.org/wiki/Q294562","display_name":"Polar","level":2,"score":0.5447640419006348},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4995565414428711},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4730859398841858},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.47243934869766235},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.4652581810951233},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3849893808364868},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.38285505771636963},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.18954509496688843},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10451066493988037},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08227363228797913},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1002/adfm.201705250","doi":"https://doi.org/10.1002/adfm.201705250","is_oa":false,"landing_page_url":"https://doi.org/10.1002/adfm.201705250","pdf_url":null,"source":{"id":"https://openalex.org/S135204980","display_name":"Advanced Functional Materials","issn_l":"1616-301X","issn":["1616-301X","1616-3028"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","ki-jl-3","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Functional Materials","raw_type":"journal-article"},{"id":"pmid:31080381","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/31080381","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced functional materials","raw_type":"Journal Article"},{"id":"pmh:oai:pubmedcentral.nih.gov:6508614","doi":null,"is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6508614","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Adv Funct Mater","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:pubmedcentral.nih.gov:6508614","doi":null,"is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6508614","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Adv Funct Mater","raw_type":"Text"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G71215278","display_name":"GLASSY-POLYMER ELECTRET RANDOM ACCESS MEMORY (GERAM)","funder_award_id":"70NANB14H263","funder_id":"https://openalex.org/F4320332178","funder_display_name":"National Institute of Standards and Technology"}],"funders":[{"id":"https://openalex.org/F4320309029","display_name":"George Mason University","ror":"https://ror.org/02jqj7156"},{"id":"https://openalex.org/F4320332178","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416"},{"id":"https://openalex.org/F4320332378","display_name":"Langley Research Center","ror":"https://ror.org/0399mhs52"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1661368752","https://openalex.org/W1986046994","https://openalex.org/W2005522572","https://openalex.org/W2014355890","https://openalex.org/W2016751021","https://openalex.org/W2033440673","https://openalex.org/W2043047058","https://openalex.org/W2056130702","https://openalex.org/W2057119784","https://openalex.org/W2068595610","https://openalex.org/W2072285360","https://openalex.org/W2077935768","https://openalex.org/W2081014415","https://openalex.org/W2082379969","https://openalex.org/W2090837115","https://openalex.org/W2109278351","https://openalex.org/W2133106529","https://openalex.org/W2144993900","https://openalex.org/W2150766277","https://openalex.org/W2161211596","https://openalex.org/W2279885852","https://openalex.org/W2402576525","https://openalex.org/W2516855981","https://openalex.org/W3104546771"],"related_works":["https://openalex.org/W2754140762","https://openalex.org/W2036296421","https://openalex.org/W1997611215","https://openalex.org/W4388666665","https://openalex.org/W4406136153","https://openalex.org/W2610719011","https://openalex.org/W2136781865","https://openalex.org/W2341049093","https://openalex.org/W3106953930","https://openalex.org/W2015979739"],"abstract_inverted_index":{"Abstract":[0],"There":[1],"is":[2,26,61,116,136,149],"an":[3],"increasing":[4],"number":[5],"of":[6,19,31,42,52,86,105,140,164],"reports":[7],"on":[8],"polar":[9,127],"polymer\u2010based":[10,128],"ferroelectric":[11,33,38,147,165],"field":[12],"effect":[13,39,81,163],"transistors":[14],"(FeFETs),":[15],"where":[16],"the":[17,20,29,32,43,50,56,74,79,87,94,111,162],"hysteresis":[18,96,135],"drain":[21],"current\u2013gate":[22],"voltage":[23,100],"(Id\u2013Vg)":[24],"curve":[25],"investigated":[27],"as":[28,46,90,92,102],"result":[30],"polarization":[34,80,148,166],"effect.":[35],"However,":[36],"separating":[37],"from":[40],"many":[41],"factors":[44,76],"(such":[45],"charge":[47,141],"injection/trapping":[48],"and":[49,64,97,107,143],"presence":[51],"mobile":[53,144],"ions":[54],"in":[55,82,167],"polymer)":[57],"that":[58],"confound":[59],"interpretation":[60],"still":[62],"confusing":[63],"controversial.":[65],"This":[66,114,154],"work":[67],"presents":[68],"a":[69,103,138],"methodology":[70,115,155],"to":[71,159],"reliably":[72],"identify":[73],"confounding":[75],"which":[77],"obscure":[78],"FeFETs.":[83,129,168],"Careful":[84],"observation":[85],"Id\u2013Vg":[88,95],"curves,":[89],"well":[91],"monitoring":[93],"flat":[98],"band":[99],"shift":[101],"function":[104],"temperature":[106,126,134],"sweep":[108],"frequency,":[109],"identifies":[110],"dominant":[112],"mechanism.":[113],"demonstrated":[117],"by":[118],"using":[119],"15":[120],"nm":[121],"thick":[122],"high":[123],"glass":[124],"transition":[125],"In":[130],"these":[131],"devices,":[132],"room":[133],"largely":[137],"consequence":[139],"trapping":[142],"ions,":[145],"while":[146],"observed":[150],"at":[151],"elevated":[152],"temperatures.":[153],"can":[156],"be":[157],"used":[158],"unambiguously":[160],"prove":[161]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2018-01-26T00:00:00"}