{"id":"https://openalex.org/W2773159753","doi":"https://doi.org/10.1109/iecon.2017.8217302","title":"Fault detection and estimation for Markov jump linear systems with state delays","display_name":"Fault detection and estimation for Markov jump linear systems with state delays","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2773159753","doi":"https://doi.org/10.1109/iecon.2017.8217302","mag":"2773159753"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2017.8217302","doi":"https://doi.org/10.1109/iecon.2017.8217302","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8217302","pdf_url":null,"source":{"id":"https://openalex.org/S4210172894","display_name":"Annual Conference of the IEEE Industrial Electronics Society (IECON)","issn_l":"1553-572X","issn":["1553-572X","2577-1647"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100450554","display_name":"Hongyang Li","orcid":"https://orcid.org/0000-0001-9394-0015","observed_orcids":["https://orcid.org/0000-0001-9394-0015"]},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongyang Li","raw_affiliation_strings":["Department of Automation, Tsinghua University, Bejing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Bejing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042605160","display_name":"Xiao Hui He","orcid":"https://orcid.org/0000-0003-3998-7060","observed_orcids":["https://orcid.org/0000-0003-3998-7060","https://orcid.org/0000-0002-4588-0887"]},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao He","raw_affiliation_strings":["Department of Automation, Tsinghua University, Bejing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Bejing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"7433","last_page":"7438"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10046","display_name":"Stability and Control of Uncertain Systems","score":0.009200000204145908,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.0017000000225380063,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-detection","display_name":"fault detection","score":0.9879999756813049},{"id":"https://openalex.org/keywords/fault-estimation","display_name":"fault estimation","score":0.9990000128746033},{"id":"https://openalex.org/keywords/markovian-jump-systems","display_name":"Markovian jump systems","score":0.9990000128746033},{"id":"https://openalex.org/keywords/state-delay","display_name":"state delay","score":0.9240000247955322},{"id":"https://openalex.org/keywords/particle-filtering","display_name":"particle filter","score":0.9380000233650208},{"id":"https://openalex.org/keywords/kalman-filter-state-estimation","display_name":"Kalman filter state estimation","score":0.843999981880188},{"id":"https://openalex.org/keywords/sliding-window","display_name":"sliding window","score":0.652999997138977},{"id":"https://openalex.org/keywords/residual-generation","display_name":"residual generation","score":0.7400000095367432},{"id":"https://openalex.org/keywords/state-augmentation","display_name":"state augmentation","score":0.8040000200271606},{"id":"https://openalex.org/keywords/actuator-faults","display_name":"actuator faults","score":0.9340000152587891}],"concepts":[{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.7285985946655273},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.7212970852851868},{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.676455020904541},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5760790109634399},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5417585372924805},{"id":"https://openalex.org/C52421305","wikidata":"https://www.wikidata.org/wiki/Q1151499","display_name":"Particle filter","level":3,"score":0.5334439873695374},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.5323916673660278},{"id":"https://openalex.org/C2780695682","wikidata":"https://www.wikidata.org/wiki/Q4005959","display_name":"Jump","level":2,"score":0.5256929397583008},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.5210925340652466},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.5070192813873291},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.49413374066352844},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.48906001448631287},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.42582207918167114},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2588990330696106},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24932333827018738},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16144785284996033},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13379743695259094},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.09984317421913147},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0796387791633606},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2017.8217302","doi":"https://doi.org/10.1109/iecon.2017.8217302","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8217302","pdf_url":null,"source":{"id":"https://openalex.org/S4210172894","display_name":"Annual Conference of the IEEE Industrial Electronics Society (IECON)","issn_l":"1553-572X","issn":["1553-572X","2577-1647"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1595837842","https://openalex.org/W1632717336","https://openalex.org/W1816953083","https://openalex.org/W2007831174","https://openalex.org/W2014632329","https://openalex.org/W2022863828","https://openalex.org/W2030024491","https://openalex.org/W2060515809","https://openalex.org/W2061160706","https://openalex.org/W2065354259","https://openalex.org/W2074527205","https://openalex.org/W2087939182","https://openalex.org/W2094799033","https://openalex.org/W2112037042","https://openalex.org/W2118623933","https://openalex.org/W2123827648","https://openalex.org/W2137345842","https://openalex.org/W2160960823","https://openalex.org/W2160987092","https://openalex.org/W2191787728","https://openalex.org/W2253401090","https://openalex.org/W2263083964","https://openalex.org/W2315257342","https://openalex.org/W2342560477","https://openalex.org/W2422068714","https://openalex.org/W2569835417","https://openalex.org/W2593456435","https://openalex.org/W7071507867"],"related_works":["https://openalex.org/W1985772442","https://openalex.org/W2047733725","https://openalex.org/W2091369630","https://openalex.org/W2143436877","https://openalex.org/W2068806052","https://openalex.org/W1974002379","https://openalex.org/W2356348862","https://openalex.org/W3128541605","https://openalex.org/W1985811218","https://openalex.org/W2108635724"],"abstract_inverted_index":{"The":[0],"fault":[1,70,74],"detection":[2],"and":[3],"estimation":[4,54],"problems":[5],"are":[6,44],"investigated":[7],"for":[8,66],"a":[9,56],"class":[10],"of":[11,69,80,93],"Markov":[12,39],"jump":[13],"linear":[14],"systems":[15],"(MJLS)":[16],"with":[17],"state":[18,81],"delays":[19],"based":[20],"on":[21,47],"the":[22,29,38,42,48,53,62,67,73,78,91,94],"particle":[23,34],"filter.":[24,50],"For":[25],"MJLS":[26],"subjected":[27],"to":[28,36,52,89],"actuator":[30],"fault,":[31],"we":[32],"use":[33],"filter":[35],"estimate":[37],"parameter,":[40],"then":[41],"states":[43],"estimated":[45,76],"depended":[46],"Kalman":[49],"According":[51],"result,":[55],"residual":[57],"is":[58,75,87],"designed":[59,88],"by":[60],"using":[61],"sliding-time":[63],"window":[64],"technique":[65],"purpose":[68],"detection.":[71],"Then":[72],"in":[77],"way":[79],"augment":[82],"method.":[83,96],"A":[84],"simulation":[85],"experiment":[86],"illustrate":[90],"effectiveness":[92],"proposed":[95]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2017-12-22T00:00:00"}