{"id":"https://openalex.org/W2771237702","doi":"https://doi.org/10.1109/isscc.1995.535461","title":"A 35 ns-cycle-time 3.3 V-only 32 Mb NAND flash EEPROM","display_name":"A 35 ns-cycle-time 3.3 V-only 32 Mb NAND flash EEPROM","publication_year":2002,"publication_date":"2002-11-19","ids":{"openalex":"https://openalex.org/W2771237702","doi":"https://doi.org/10.1109/isscc.1995.535461","mag":"2771237702"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.1995.535461","doi":"https://doi.org/10.1109/isscc.1995.535461","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.1995.535461","pdf_url":null,"source":{"id":"https://openalex.org/S4210210374","display_name":"Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference","issn_l":"0193-6530","issn":["0193-6530","2376-8606"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings ISSCC '95 - International Solid-State Circuits Conference","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108839389","display_name":"K. Imamiya","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Imamiya","raw_affiliation_strings":["Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP","Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Y. Iwata","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y. Iwata","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113704582","display_name":"Y. Sugiura","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Sugiura","raw_affiliation_strings":["Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090578339","display_name":"Hiroshi Nakamura","orcid":"https://orcid.org/0009-0005-6505-1903","observed_orcids":["https://orcid.org/0009-0005-6505-1903"]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Nakamura","raw_affiliation_strings":["ULSl Research Center, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ULSl Research Center, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075685400","display_name":"H. Oodaira","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Oodaira","raw_affiliation_strings":["ULSl Research Center, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ULSl Research Center, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023430328","display_name":"M. Momodomi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Momodomi","raw_affiliation_strings":["Memoly Division, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Memoly Division, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111625903","display_name":"Yoshiyuki Ito","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Ito","raw_affiliation_strings":["Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111961771","display_name":"T. Watanabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Watanabe","raw_affiliation_strings":["Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":null,"display_name":"H. Araki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Araki","raw_affiliation_strings":["Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063902337","display_name":"K. Narita","orcid":"https://orcid.org/0000-0002-3867-8234","observed_orcids":["https://orcid.org/0000-0002-3867-8234"]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Narita","raw_affiliation_strings":["Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":null,"display_name":"K. Masuda","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Masuda","raw_affiliation_strings":["Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Device Engineering Laboratory, TOSHIBA Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111676830","display_name":"J. Miyamoto","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Miyamoto","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9253,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.79228623,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"130","last_page":"131,"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.6352999806404114,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.6352999806404114,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.21690000593662262,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.09719999879598618,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nand-flash-memory","display_name":"NAND flash memory","score":0.8859999775886536},{"id":"https://openalex.org/keywords/flash-eeprom","display_name":"flash EEPROM","score":0.8199999928474426},{"id":"https://openalex.org/keywords/pipelined-architecture","display_name":"pipelined architecture","score":0.6499999761581421},{"id":"https://openalex.org/keywords/threshold-voltage-distribution","display_name":"threshold voltage distribution","score":0.8769999742507935},{"id":"https://openalex.org/keywords/low-voltage-cmos","display_name":"low-voltage CMOS","score":0.7260000109672546}],"concepts":[{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.8572613596916199},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.7519114017486572},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.716537356376648},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6882959604263306},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.6777943968772888},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.6207455396652222},{"id":"https://openalex.org/C163980746","wikidata":"https://www.wikidata.org/wiki/Q378210","display_name":"EPROM","level":2,"score":0.5491663217544556},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.509182870388031},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.47874730825424194},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3671730160713196},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2921237647533417},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27954375743865967},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13807961344718933},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1100068986415863},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.10526034235954285},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06526580452919006},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.1995.535461","doi":"https://doi.org/10.1109/isscc.1995.535461","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.1995.535461","pdf_url":null,"source":{"id":"https://openalex.org/S4210210374","display_name":"Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference","issn_l":"0193-6530","issn":["0193-6530","2376-8606"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings ISSCC '95 - International Solid-State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2116241742","https://openalex.org/W2180025811","https://openalex.org/W4231453560","https://openalex.org/W2119648972","https://openalex.org/W2148311138","https://openalex.org/W3150929849","https://openalex.org/W2567632312","https://openalex.org/W2108812743","https://openalex.org/W1921542996","https://openalex.org/W1688855493"],"abstract_inverted_index":{"A":[0],"32":[1],"Mb":[2],"NAND":[3],"type":[4],"flash":[5],"EEPROM":[6],"in":[7],"0.425":[8],"/spl":[9],"mu/m":[10],"CMOS":[11],"achieves":[12],"35":[13],"ns":[14],"cycle":[15],"time":[16,64],"for":[17,70,75],"data":[18,22,53],"read-out":[19,37],"and":[20,32],"programming":[21],"load":[23],"by":[24,47,65],"adopting":[25,66],"a":[26,51],"pipeline":[27],"scheme.":[28],"Metal-strapped":[29],"select":[30],"gates":[31],"boosted":[33],"word":[34],"line":[35],"reduce":[36],"access":[38],"time.":[39,81],"Tight-programmed":[40],"cell":[41],"Vth":[42],"distribution":[43],"can":[44,58],"be":[45,59],"realized":[46],"program":[48],"verify,":[49],"using":[50],"simplified":[52],"register":[54],"circuit.":[55],"Multiple":[56],"blocks":[57],"erased":[60],"at":[61],"the":[62],"same":[63],"erase":[67,80],"block":[68,77],"registers":[69],"each":[71],"block.":[72],"Simultaneous-erase":[73],"verify":[74],"one":[76],"reduces":[78],"total":[79],"All":[82],"funtions":[83],"require":[84],"only":[85],"3.3":[86],"V":[87],"power":[88],"supply.":[89]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-06T10:28:23.643775","created_date":"2017-12-22T00:00:00"}